JPH03273123A - Spatial temperature measurement system - Google Patents
Spatial temperature measurement systemInfo
- Publication number
- JPH03273123A JPH03273123A JP7197490A JP7197490A JPH03273123A JP H03273123 A JPH03273123 A JP H03273123A JP 7197490 A JP7197490 A JP 7197490A JP 7197490 A JP7197490 A JP 7197490A JP H03273123 A JPH03273123 A JP H03273123A
- Authority
- JP
- Japan
- Prior art keywords
- light
- temperature
- sensor
- mirror
- space
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000009529 body temperature measurement Methods 0.000 title claims description 14
- 230000003287 optical effect Effects 0.000 claims abstract description 26
- 230000005284 excitation Effects 0.000 claims description 2
- 239000013307 optical fiber Substances 0.000 abstract description 13
- 239000000463 material Substances 0.000 abstract description 6
- 238000006243 chemical reaction Methods 0.000 abstract description 5
- 238000004364 calculation method Methods 0.000 description 7
- 238000010586 diagram Methods 0.000 description 5
- 239000011521 glass Substances 0.000 description 5
- 238000004020 luminiscence type Methods 0.000 description 4
- 239000000126 substance Substances 0.000 description 4
- 239000000758 substrate Substances 0.000 description 4
- 230000000694 effects Effects 0.000 description 2
- 238000005424 photoluminescence Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 229910052724 xenon Inorganic materials 0.000 description 2
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 2
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 238000004378 air conditioning Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 229920003023 plastic Polymers 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
- 230000000638 stimulation Effects 0.000 description 1
Landscapes
- Measuring Temperature Or Quantity Of Heat (AREA)
- Radiation Pyrometers (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、空間の温度分布を計測する非接触型の空間温
度計測システムに関するものである。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a non-contact spatial temperature measurement system for measuring temperature distribution in a space.
従来より、温度計測システムとして１例えばフォトルミ
ネセンスを利用した接触型の光フアイバサーモメータが
知られている。2. Description of the Related Art Conventionally, a contact type optical fiber thermometer using photoluminescence has been known as a temperature measurement system.
この種の温度計測システムは、測定器内の光源（キセノ
ンランプ、ＬＤ 、ＬＥＤ）から放射された光が光フア
イバケーブル内を透過し、被測定物と接触させる先端部
の半導体蛍光物質系センサ部に達すると、センサはこの
光を吸収して励起され、吸収した光とは全く異なる波長
の別の光を放射する。そして、別の復路を通るか、また
は同じ光フアイバケーブルを復路として測定器内へ返信
される。この返信光の波長はセンサの感知温度によって
異なるので、測定器はこの波長の違いを分光分析演算処
理する。すなわち、返信光は波長分波器を経てフォトダ
イオードにより検知され、参照光などと比較演算されて
液晶デイスプレィなどに温度が表示される。In this type of temperature measurement system, light emitted from a light source (xenon lamp, LD, LED) inside the measuring device passes through an optical fiber cable and comes into contact with a semiconductor fluorescent material sensor at the tip. When this happens, the sensor absorbs this light and becomes excited, emitting another light at a completely different wavelength than the absorbed light. Then, it is sent back into the measuring instrument through another return route or through the same optical fiber cable. Since the wavelength of this returned light differs depending on the temperature sensed by the sensor, the measuring instrument processes this difference in wavelength through spectroscopic analysis and calculation. That is, the returned light passes through a wavelength demultiplexer, is detected by a photodiode, is compared with a reference light, and the temperature is displayed on a liquid crystal display or the like.
しかしながら、この種の接触型の温度計測システムでは
、不特定個所に点在する被測定物の温度を計測する場合
、その都度、光フアイバケーブルを引き廻してその先端
部のセンサを被測定物に接触させることによって温度測
定が可能になるが、このようなものでは、近年の分布計
測や面から更に立体空間における温度計測の要請に対し
て対応できないという問題があった。However, in this type of contact-type temperature measurement system, when measuring the temperature of objects to be measured scattered at unspecified locations, each time an optical fiber cable is routed and the sensor at the tip is connected to the object to be measured. Although it is possible to measure temperature by making contact, this type of device has a problem in that it cannot meet the recent demands for distribution measurement and temperature measurement in a three-dimensional space.
例えば、スタジオなど観客員数立体室内の空間温度を考
えた場合、立体階層起伏の多い室内にはエアコンなどの
空調設備の吹出口が整備されているが、その空間各所の
温度分布は様々な値になっている。この温度分布を検出
できればそれに応じて最適な空調制御が可能となる。し
かしながら、このような空間各債所の温度分布の計測は
、従来の接触型の温度計測システムでは実大かつ複雑と
なって実施は極めて困難であった。For example, when considering the spatial temperature in a three-dimensional room with a large number of spectators, such as a studio, air outlets for air conditioners such as air conditioners are installed in rooms with many undulating three-dimensional floors, but the temperature distribution in various parts of the space varies. It has become. If this temperature distribution can be detected, optimal air conditioning control can be performed accordingly. However, it has been extremely difficult to measure the temperature distribution of each space in a conventional contact-type temperature measurement system due to its large size and complexity.
このような課題を解決するために、本発明による空間温
度計測システムは、光を出射する光出射手段と、出射光
を参照光と投光とに分割するとともに投光を空間に出射
する光学系と、空間内に配置され投光を受光して温度に
応じて励起変化した投光とは異なる波長強度の受信光を
光学系に出射するセンサと、光学系からの参照光と受信
光を受光して電気信号に変換し演算を行なって受信光の
波長からセンサの温度を測定する温度計測手段とを有し
ている。In order to solve such problems, the space temperature measurement system according to the present invention includes a light emitting means that emits light, an optical system that divides the emitted light into a reference light and a projected light, and emits the projected light into the space. and a sensor placed in the space that receives the projected light and emits the received light with a different wavelength intensity from the projected light, which is excited and changed according to the temperature, to the optical system, and receives the reference light and received light from the optical system. and a temperature measuring means for measuring the temperature of the sensor from the wavelength of the received light by converting it into an electrical signal and performing calculations.
また、センサを複数設け、投光器で各センサ部位に走査
分配するようにした。In addition, a plurality of sensors were provided, and a light projector was used to scan and distribute the light to each sensor site.
本発明においては、光学系から放射される投光が空間に
設置されたセンナに入射すると、このセンサ内の温度に
応じた別な波長を誘発し、この光は元の光路に放射され
、この光が受信側の光学系に入射されてセンサの温度、
すなわち、センサが設置された空間の温度が測定できる
。In the present invention, when the projected light emitted from the optical system enters a sensor installed in space, it induces a different wavelength depending on the temperature inside this sensor, and this light is emitted to the original optical path, When light enters the optical system on the receiving side, the temperature of the sensor,
That is, the temperature of the space where the sensor is installed can be measured.
センサを複数設ければ、空間の温度分布が測定できる。If multiple sensors are provided, the temperature distribution in the space can be measured.
以下、本発明を図面に示した実施例を用いて詳細に説明
する。Hereinafter, the present invention will be explained in detail using embodiments shown in the drawings.
第１図は本発明に係る空間温度計測システムの一実施例
による構成を示すブロック図である。FIG. 1 is a block diagram showing the configuration of an embodiment of a space temperature measurement system according to the present invention.
同図において、１０は温度計測を行たう測定器であり、
この測定器１０には、例えばキセノンランプ光又はレー
ザ光などの光源光Ｌ１を発生させるための光源１１と、
その投光レンズ１２および光フィルタＦ１と、後述する
光学系から入射される参照光Ｌ２と受信光Ｌ３とをそれ
ぞれ電気信号に変換する光電変換部１３．１４と、変換
された各電気信号を比較演算する演算部１５と、その演
算結果を計測温度として数値表示する表示部１６とが設
けられている。In the figure, 10 is a measuring device for measuring temperature;
This measuring instrument 10 includes a light source 11 for generating light source light L1 such as xenon lamp light or laser light,
The light projecting lens 12 and optical filter F1 are compared with photoelectric converters 13 and 14 that convert reference light L2 and received light L3 incident from an optical system described later into electrical signals, respectively, and each of the converted electrical signals is compared. A calculation unit 15 that performs calculations and a display unit 16 that numerically displays the calculation results as measured temperatures are provided.
２０は各種の光を入出射させて往復の光路制御を行なう
光学系であり、この光学系２０には、投光レンズ１２を
介して入射されたレーザ光Ｌ１を所定方向に反射させる
ミラー２１と、このミラー２１の反射光を参照光Ｌ２と
投光Ｌ３とに分割するビームスプリッタ２２と、参照光
Ｌ２の投光レンズ２３および光フィルタＦ２と、投光Ｌ
３を所定の方向に反射させるミラ一部２４と、後述する
受信光Ｌ４を集光して測定器１０側に出射させる集光レ
ンズ２５と、ミラ一部２４で反射された投光Ｌ３を室内
空間の所定範囲の方向にわたってサーボ機構により駆動
され走査を行なうスキャンミラー２６とが設けられてい
る。Reference numeral 20 denotes an optical system that controls the reciprocating optical path by inputting and outputting various types of light, and this optical system 20 includes a mirror 21 that reflects the laser beam L1 that has entered through the projection lens 12 in a predetermined direction. , a beam splitter 22 that splits the reflected light of this mirror 21 into a reference light L2 and a light projection L3, a light projection lens 23 and an optical filter F2 for the reference light L2, and a light projection L2.
3 in a predetermined direction, a condensing lens 25 that collects received light L4 (described later) and emits it to the measuring instrument 10 side, and a mirror part 24 that reflects light L3 reflected by the mirror part 24 into the room. A scan mirror 26 is provided which is driven by a servo mechanism to perform scanning over a predetermined range of directions in space.
３０は光学系２０から離れて室内の温度測定領域空間に
、その受光面をスキャンミラー２６の方向に向けて設置
された複数のセンサ３１〜３４からなるセンサ部である
。これらのセンサ３１〜３４は、スキャンミラー２６か
ら出射された投光Ｌ３を受けると、センサ内の後記する
半導体蛍光物質３０ｂがルミネセンス作用により励起さ
れて異なる波長（周波数）の受信光Ｌ４を入射光の入射
方向と同じ方向に向けて回帰反射する。Reference numeral 30 denotes a sensor section consisting of a plurality of sensors 31 to 34, which is installed in an indoor temperature measurement area space away from the optical system 20, with its light-receiving surface facing toward the scan mirror 26. When these sensors 31 to 34 receive the projected light L3 emitted from the scan mirror 26, a semiconductor fluorescent substance 30b (described later) inside the sensor is excited by luminescence, and the received light L4 of a different wavelength (frequency) is incident thereon. The light is reflected back in the same direction as the incident direction.
この各センサは、例えば、事務所内では机、４Ｆ＃子、
書棚、ロッカ、事務機器、床面、壁面などの適当な場所
に設定する。適当な場所とは、各機器の取扱いの邪魔に
ならず、かつ、スキャンミラー２６の方向に幾何光学的
に面する場所である。また、スタジオ、劇場、ホールな
どでは、座席の椅子の上に設けられた座席番号プレート
の位置、′４路段々が適当である。さらに、天井から細
い棒で下げられたマイクや照明器具等に設けることもで
きる。また、空間内でなく壁や床などに設けることもで
きる。For example, in an office, each sensor may be placed on a desk, 4th floor child,
Set it in an appropriate location such as a bookshelf, locker, office equipment, floor, or wall. An appropriate location is a location that does not interfere with the handling of each device and faces geometrically in the direction of the scan mirror 26. In addition, in studios, theaters, halls, etc., the appropriate location for seat number plates on the seats is the 4th step. Furthermore, it can also be installed on a microphone, lighting equipment, etc. that is hung from the ceiling with a thin rod. Moreover, it can also be provided not within the space but on a wall or floor.
第２ＦＭ（ａ）はセンサ３１の側面断面図であり、透光
性のガラス基板３０ａと、入射する投光Ｌ３を吸収する
とその入射光の刺激により励起された別の光（ルミネセ
ンス光）、すなわち受信光Ｌ４を発光する蛍光物Ｗ層３
０ｂと、入射光である投光Ｌ３と反射光である受信光Ｌ
４とが平行になる幾何光学的に回帰性を有するように光
の方向を規制するコーナキューブプリズム３０ｃとを組
合わせて構成されている。この蛍光物質ｆｉ３０ｂは、
同図（ｂ）の断面図に示すように、第１のＡＪＩＧ ａ
Ａｓ層３０ｂｌとＧａＡｓ層３０ｂ２層と第２のＡ交Ｇ
ａＡｓ層３０ｂ３とが積層れて構成されており、投光Ｌ
３の吸収により効率良く受信光Ｌ４としてルミネセンス
光を発生させる機能を有している。また、コーナキュー
ブプリズム３０ｃは、同図（Ｃ）にＩｓ視図で示すよう
にキューブのコーナを形成するように互いに交差する３
つの反射面３０ｃｌ 、３０ｃ２．３０ｃ３を有し、
キューブの対角線に対して垂直な入射面を膚して構成さ
れており、投光Ｌ３の入射角度にかかわらず１反射光は
全て入射方向に反射されるという機能を有している０以
上、センサ３１について説明したが、他のセンサ３２，
３３．３４も全く同じ構造である。The second FM (a) is a side sectional view of the sensor 31, which shows a transparent glass substrate 30a, another light (luminescence light) excited by the stimulation of the incident light when the incident projected light L3 is absorbed, That is, the fluorescent substance W layer 3 emits the received light L4.
0b, the projected light L3 which is the incident light, and the received light L which is the reflected light.
It is configured in combination with a corner cube prism 30c that regulates the direction of light so that it has geometrical optical recurrence so that 4 and 4 are parallel to each other. This fluorescent material fi30b is
As shown in the cross-sectional view of the same figure (b), the first AJIG a
As layer 30bl, GaAs layer 30b2 layer and second A-cross G
The aAs layer 30b3 is laminated, and the light emitting L
It has a function of efficiently generating luminescence light as the received light L4 by absorbing the light L4. Furthermore, as shown in the Is view in FIG.
It has two reflective surfaces 30cl, 30c2.30c3,
The sensor is configured with an incident surface perpendicular to the diagonal of the cube, and has the function that all reflected light is reflected in the incident direction regardless of the incident angle of the projected light L3. 31, but other sensors 32,
33 and 34 have exactly the same structure.
なお、第１図において、４１は光学系２０の投光レンズ
２３から出射された参照光Ｌ２を測定器１０内の光電変
換部１３に導光する光ファイバ、４２は同様にレンズ２
５により集光された受信光Ｌ４を光電変換部１４に導光
する光ファイバである。In FIG. 1, 41 is an optical fiber that guides the reference light L2 emitted from the projection lens 23 of the optical system 20 to the photoelectric converter 13 in the measuring instrument 10, and 42 is the lens 2.
This is an optical fiber that guides the received light L4 focused by 5 to the photoelectric conversion unit 14.
このように構成された空間温度計測システムにおいて、
測定器ｌＯ内の光源Ｉｔから投光レンズ１２を介して出
射された光源光Ｌｌは、光学系２０内のミラー２１によ
り反射され、ビームスプリッタ２２に入射されて参照光
Ｌ２と投光Ｌ３とに分割される。そして、参照光Ｌ２は
投光レンズ２３および光ファイバ４１を透過して測定器
２０内の光電変換部１３に入射され電気信号に変換され
る。また、投光Ｌ３は、ミラ一部２４で反射された後、
さらにスキャンミラー２６に反射され室内空間に設置さ
れたセンナ３１〜３４を走査する。In the space temperature measurement system configured in this way,
The light source light Ll emitted from the light source It in the measuring instrument IO via the projection lens 12 is reflected by the mirror 21 in the optical system 20, enters the beam splitter 22, and is divided into the reference light L2 and the projection light L3. be divided. Then, the reference light L2 passes through the projection lens 23 and the optical fiber 41, enters the photoelectric conversion section 13 in the measuring instrument 20, and is converted into an electrical signal. Moreover, after the projected light L3 is reflected by the mirror part 24,
Furthermore, it is reflected by the scan mirror 26 and scans the sensors 31 to 34 installed in the indoor space.
そして、センサ部３０では、各センサ３１〜３４の蛍光
物質ｆｉ３０ｂが投光Ｌ３を受けて光ルミネセンスによ
り別の波長のルミネセンス光に変換され、受信光Ｌ４と
してスキャンミラー２６に入射される。この受信光Ｌ４
は集光レンズ２５により集光され、光フィルタＦ３を経
て光フアイバ４２内を伝達して測定器ｌＯ内の光電変換
部１４に入射されて電気信号に変換される。変換された
電気信号は、演算器１５で光電変換部１３から入力され
る参照光の電気信号と比較演算され、その演算結果が各
点の計測温度として表示部１６に表示される。In the sensor section 30, the fluorescent substance fi30b of each of the sensors 31 to 34 receives the projected light L3, is converted into luminescent light of a different wavelength by photoluminescence, and enters the scan mirror 26 as received light L4. This received light L4
is condensed by the condensing lens 25, transmitted through the optical filter F3 through the optical fiber 42, and incident on the photoelectric converter 14 in the measuring instrument 10, where it is converted into an electrical signal. The converted electrical signal is compared with the electrical signal of the reference light input from the photoelectric converter 13 in the calculator 15, and the result of the calculation is displayed on the display 16 as the measured temperature at each point.
ここで、各センサ３１〜３４の蛍光物質層３０ｂから発
光されるルミネセンス光は、第３図に示すように、波長
（周波数）と強度（明るさ）が温度ＴＩ、Ｔ２．Ｔ３
（ＴＩ （Ｔ２ ＜Ｔ３ ）に応じて比例変化するこ
とから、温度変化情報を含んだ受信光Ｌ４を光源光であ
る参照光Ｌ２と比較演算することによって、各センサ３
１〜３４が配置された場所の空間温度を正確に測定する
ことができる。Here, as shown in FIG. 3, the luminescence light emitted from the fluorescent substance layer 30b of each sensor 31 to 34 has a wavelength (frequency) and intensity (brightness) at a temperature of TI, T2. T3
(TI (T2 < T3), so each sensor 3
It is possible to accurately measure the temperature of the space where the devices Nos. 1 to 34 are placed.
一方、第３図（ｂ）に示すように励起された光の強さｓ
ｌのピーク値がエクスポネンシャルにｓｌ／ｅまで減衰
降下（３７％）してくる時定数τ時間は、計測温度ｔ１
となる。このことから、前記と同様に空間部位の温度を
知ることができる。On the other hand, as shown in Fig. 3(b), the intensity of the excited light s
The time constant τ time at which the peak value of l decays exponentially (37%) to sl/e is determined by the measured temperature t1.
becomes. From this, it is possible to know the temperature of the spatial region in the same way as above.
以上の実施例においては、センサは第２図に示したよう
に、コーナキューブプリズムを使用した構造のものを用
いたが、本発明はこれに限定されるものではなく、第４
図に断面図で示したような構造のものを用いることもで
きる。第４図において、このセンサは、ガラス基板３０
ａ上に蛍光物質層３０ｂを形威し、この蛍光物質層３０
ｂ Ｊ：の投光受光面に多数の透光性のプラスチック
又はガラスからなるポール３０ｃｉを並設し、ガラス基
板３０ａ’で押え、このポール３０ｄとほぼ同じ屈折率
を有する接着剤３０ｅで固定したものである。３０ｆは
反射板である。この構造はルーネベルグレンズと同じよ
うな機能を有し、第２図のセンサと同様に、投光と受信
光とが平行になり良好な回帰性が得られる。投光がどの
ような方向から入射しても、受信光はこれと平行方向に
反射される。In the above embodiments, the sensor used has a structure using a corner cube prism as shown in FIG. 2, but the present invention is not limited to this.
It is also possible to use a structure as shown in the cross-sectional view in the figure. In FIG. 4, this sensor includes a glass substrate 30
A fluorescent material layer 30b is formed on the fluorescent material layer 30b.
b A large number of poles 30ci made of transparent plastic or glass were arranged in parallel on the light emitting and receiving surface of J:, held down with a glass substrate 30a', and fixed with an adhesive 30e having approximately the same refractive index as the pole 30d. It is something. 30f is a reflection plate. This structure has a function similar to that of a Luneberg lens, and like the sensor shown in FIG. 2, the emitted light and the received light are parallel to each other, resulting in good regression performance. No matter what direction the projected light enters, the received light is reflected in a direction parallel to it.
また、投光と受信光を透過するミラ一部と集光レンズの
光学系としては、１ｓ５ｒｇＪに示したような実施例も
考えられる。第５図（ａ）において、投光Ｌ３は光ファ
イバ６１から出射光プリズム５１を経て！’！、１図の
ミラ一部２４に相当する中心レンズ部２４ａに入射され
、ここでビーム状に集光されてスキャンミラーに出射さ
れる。受信光Ｌ４は集光レンズ２５で集光され受光レン
ズ５２を経て光ファイバ４２に供給される。＄５図（ｂ
）において、集光レンズ２５の外面中心部に設けられた
出射光プリズム５１により、投光Ｌ３は直接にスキャン
ミラーに出射される。Further, as an optical system including a portion of the mirror that transmits the projected light and the received light and a condensing lens, an embodiment as shown in 1s5rgJ can also be considered. In FIG. 5(a), the projected light L3 is transmitted from the optical fiber 61 through the output light prism 51! '! , is incident on a central lens portion 24a corresponding to the mirror portion 24 in FIG. The received light L4 is condensed by the condenser lens 25 and supplied to the optical fiber 42 via the light receiving lens 52. Figure $5 (b
), the projected light L3 is directly emitted to the scan mirror by the emitted light prism 51 provided at the center of the outer surface of the condenser lens 25.
また１以上の実施例ではセンサは複数設けたが１つでも
よく、また、スタジオ内の空間温度を計測する場合、天
井から下げたバー軸の先端にミラーポール状に各方向に
向けて複数のセンサを設け、いずれか任意の位置から投
光をこのセンサに向けて放射させることもできる。この
ような場合にはセンサの設置場所が１箇所になるので、
投光を走査する必要はなくなり光学系統が簡単になる。In addition, in one or more embodiments, a plurality of sensors are provided, but only one sensor may be used.Also, when measuring the space temperature in a studio, a plurality of sensors are installed in the shape of a mirror pole in each direction at the tip of a bar shaft hung from the ceiling. It is also possible to provide a sensor and emit light toward the sensor from any arbitrary position. In this case, the sensor only needs to be installed in one location, so
There is no need to scan the projected light, which simplifies the optical system.
以上説明したように、本発明に係る空間温度計測システ
ムによれば、センサのみを温度測定したい空間の任意の
個所に設置しておくだけで、遠島位置から光によりセン
サの温度を検出できるため、面および立体空間における
温度分布を無接触で正確に計測できるという極めて優れ
た効果が得られる。As explained above, according to the space temperature measurement system according to the present invention, the temperature of the sensor can be detected by light from a remote island location by simply installing the sensor at any location in the space where the temperature is to be measured. The extremely excellent effect of being able to accurately measure temperature distribution in a surface and three-dimensional space without contact can be obtained.
第１図は本発明に係る空間温度計測システムの一実施例
による構成を示すブロック図、＄２図（ａ） 、 （ｂ
） 、 （ｃ）はＭ１図のセンサの構成を説明する図、
第３図（ａ）、（ｂ）は参照光および受信光の励起波長
とその強度の関係を示す図、第４図はセンサの他の実施
例による構成を示す断面図、第５図（ａ）、（ｂ）は投
光と受信光を透過するミラ一部と集光レンズの光学系の
他の実施例による構成を示す平面図である。
１０−−−測定器、１１−−−光１１．１２−−・投光
レンズ、１３，１４・・・光電変換部、１５・・・演算
部、１６・・・表示部、２０・・・光学系、２１・・・
ミラー、２２・・・ビームスプリッタ、２３・・・投光
レンズ、２４・・・ミラ一部 ２５・・・集光レンズ、
２６・・・スキャンミラー、３０・−・センサ部、３１
〜３４・・・センサ、３０ａ・・・ガラス基板、３０ｂ
・・・蛍光物質層、３０ｃ・・・コーナキューブプリズ
ム、４１，４２◆・・光ファイバ、Ｆｌ、Ｆ２゜Ｆ３
◆・・光フィルタ。FIG. 1 is a block diagram showing the configuration of an embodiment of the space temperature measurement system according to the present invention.
), (c) is a diagram explaining the configuration of the sensor in diagram M1,
3(a) and 3(b) are diagrams showing the relationship between the excitation wavelengths of the reference light and the received light and their intensities, FIG. 4 is a sectional view showing the configuration of another embodiment of the sensor, and FIG. 5(a) ) and (b) are plan views showing configurations of other embodiments of the optical system including a part of the mirror and a condensing lens that transmit the projected light and the received light. 10---Measuring device, 11---Light 11.12---・Light projection lens, 13, 14... Photoelectric conversion section, 15... Calculation section, 16... Display section, 20... Optical system, 21...
Mirror, 22...Beam splitter, 23...Light projection lens, 24...Mirror part 25...Condenser lens,
26...Scan mirror, 30...Sensor section, 31
~34...Sensor, 30a...Glass substrate, 30b
...Fluorescent material layer, 30c...Corner cube prism, 41,42◆...Optical fiber, Fl, F2°F3
◆・・・Light filter.
Claims (2)
を空間に出射する光学系と、 空間内に配置され、前記投光を受光して温度に応じて変
化した投光とは異なる波長強度の受信光を前記光学系に
出射する光励起センサと、 前記光学系からの参照光と受信光を受光して電気信号に
変換し、演算処理を行なつて前記受信光の波長強度から
前記センサの温度を測定する温度計測手段と を備えたことを特徴とする空間温度計測システム。(1) a light emitting means for emitting light; an optical system for dividing the emitted light into a reference light and a projected light and emitting the projected light into space; and an optical system disposed in the space for receiving the projected light; a light excitation sensor that emits received light with a wavelength intensity different from that of the emitted light that changes depending on the temperature to the optical system; and temperature measuring means for measuring the temperature of the sensor from the wavelength intensity of the received light.
るように走査する光走査受光手段を設けた ことを特徴とする空間温度計測システム。(2) In claim 1, a plurality of the sensors are provided at different positions, and the optical system is provided with a light scanning light receiving means for scanning so that the projected light is emitted to all of the sensors. Space temperature measurement system.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2071974A JPH0769218B2 (en) | 1990-03-23 | 1990-03-23 | Space temperature measurement system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2071974A JPH0769218B2 (en) | 1990-03-23 | 1990-03-23 | Space temperature measurement system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH03273123A true JPH03273123A (en) | 1991-12-04 |
| JPH0769218B2 JPH0769218B2 (en) | 1995-07-26 |
Family
ID=13475948
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2071974A Expired - Fee Related JPH0769218B2 (en) | 1990-03-23 | 1990-03-23 | Space temperature measurement system |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0769218B2 (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11173918A (en) * | 1997-12-12 | 1999-07-02 | Mitsubishi Heavy Ind Ltd | Temperature distribution measuring instrument for inside of combustor |
| JP2004525583A (en) * | 2001-05-07 | 2004-08-19 | フリル システムズ アクチボラゲット | Infrared camera sensitive to infrared |
| GB2545340A (en) * | 2015-12-09 | 2017-06-14 | Bae Systems Plc | Improvements in and relating to remote sensing |
| US10852201B2 (en) | 2015-12-09 | 2020-12-01 | Bae Systems Plc | Remote sensing |
| US10955345B2 (en) | 2015-12-09 | 2021-03-23 | Bae Systems Plc | Relating to remote sensing |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60181623A (en) * | 1984-02-28 | 1985-09-17 | Omron Tateisi Electronics Co | Temperature measuring apparatus |
| JPS6469925A (en) * | 1987-09-11 | 1989-03-15 | Hitachi Cable | Optical fiber type temperature distribution measuring apparatus |
-
1990
- 1990-03-23 JP JP2071974A patent/JPH0769218B2/en not_active Expired - Fee Related
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60181623A (en) * | 1984-02-28 | 1985-09-17 | Omron Tateisi Electronics Co | Temperature measuring apparatus |
| JPS6469925A (en) * | 1987-09-11 | 1989-03-15 | Hitachi Cable | Optical fiber type temperature distribution measuring apparatus |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11173918A (en) * | 1997-12-12 | 1999-07-02 | Mitsubishi Heavy Ind Ltd | Temperature distribution measuring instrument for inside of combustor |
| JP2004525583A (en) * | 2001-05-07 | 2004-08-19 | フリル システムズ アクチボラゲット | Infrared camera sensitive to infrared |
| JP4889913B2 (en) * | 2001-05-07 | 2012-03-07 | フリル システムズ アクチボラゲット | Infrared camera sensitive to infrared rays |
| GB2545340A (en) * | 2015-12-09 | 2017-06-14 | Bae Systems Plc | Improvements in and relating to remote sensing |
| GB2545340B (en) * | 2015-12-09 | 2019-07-24 | Bae Systems Plc | Improvements in and relating to remote sensing |
| US10852201B2 (en) | 2015-12-09 | 2020-12-01 | Bae Systems Plc | Remote sensing |
| US10955345B2 (en) | 2015-12-09 | 2021-03-23 | Bae Systems Plc | Relating to remote sensing |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0769218B2 (en) | 1995-07-26 |
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