JPH03249580A - Composite test device for small advancing current - Google Patents
Composite test device for small advancing currentInfo
- Publication number
- JPH03249580A JPH03249580A JP2045956A JP4595690A JPH03249580A JP H03249580 A JPH03249580 A JP H03249580A JP 2045956 A JP2045956 A JP 2045956A JP 4595690 A JP4595690 A JP 4595690A JP H03249580 A JPH03249580 A JP H03249580A
- Authority
- JP
- Japan
- Prior art keywords
- test
- voltage
- circuit
- current
- breaker
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 90
- 239000002131 composite material Substances 0.000 title claims abstract description 9
- 238000004804 winding Methods 0.000 claims abstract description 21
- 238000000034 method Methods 0.000 abstract description 2
- 230000015572 biosynthetic process Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 238000003786 synthesis reaction Methods 0.000 description 4
- 238000010998 test method Methods 0.000 description 4
- 238000009413 insulation Methods 0.000 description 2
- 238000011084 recovery Methods 0.000 description 2
- 238000012795 verification Methods 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 230000003111 delayed effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000001939 inductive effect Effects 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
Landscapes
- Tests Of Circuit Breakers, Generators, And Electric Motors (AREA)
Abstract
Description
【発明の詳細な説明】
〔発明の目的〕
（産業上の利用分野）
本発明は遮断器の周波数適用範囲を改善した進み小電流
合成試験装置に関する。DETAILED DESCRIPTION OF THE INVENTION [Object of the Invention] (Industrial Field of Application) The present invention relates to a leading small current synthesis test device that improves the frequency application range of a circuit breaker.
（従来の技術）
一般に電力用遮断器は、通常の故障時のような大電流の
遮断性能の他に、無負荷送電線路や、電カケープル等の
充電電流（数１０（Ａ）から数１０００（Ａ））に対す
る遮断性能も重要視される。(Prior Art) In general, power circuit breakers have the ability to interrupt large currents such as those at normal failures, as well as charging currents (several 10s (A) to several 1000s (A) of The blocking performance for A)) is also important.
そして、電圧より位相がπ／２進む電流が流れる容量性
回路の遮断は、誘導性回路の遮断に比べて特異性があり
、Ｊ ＥＣ−２３００（交流遮断器規格）においても、
各定格電圧に対し検証条件が定められており、また合成
試験法についても認められているように、遮断器の性能
検証の中でも重要な項目の一つである。The breaking of a capacitive circuit in which a current flows with a phase that leads the voltage by π/2 is more specific than that of an inductive circuit, and even in JEC-2300 (AC circuit breaker standard),
Verification conditions are determined for each rated voltage, and as the synthetic test method is also recognized, it is one of the important items in the performance verification of circuit breakers.
以下、第３図及び第４図を参照して従来の単一周波数の
みの進み小電流合成試験法について説明する。Hereinafter, a conventional leading small current synthesis test method using only a single frequency will be explained with reference to FIGS. 3 and 4.
供試遮断器の定格電圧が高くなり、試験電源のみの容量
を上回る場合は、合成試験法が適用されている。第３図
は進み小電流遮断の合成試験回路の一例である。If the rated voltage of the circuit breaker under test becomes high and exceeds the capacity of the test power supply alone, the composite test method is applied. FIG. 3 is an example of a composite test circuit for advanced small current interruption.
第３図は供試遮断器１に対して短絡発電機２を電源とし
て、電流を補助遮断器３を介して供給する電流源回路と
、この回路と並列に試験用変圧器５を接続し、キャパシ
タンス４を介して供試遮断器１に電圧を供給する電圧源
回路とからなり、更に供試遮断器１の片棒側は接地され
ている。この合成試験回路で供試遮断器１には電流源回
路を流れる進み電流１ｉと電圧源回路を流れる進み電流
ｉｃの合成された試験電流ｉｐが流れる。FIG. 3 shows a current source circuit that supplies current to the circuit breaker under test 1 using a short-circuit generator 2 as a power source through an auxiliary circuit breaker 3, and a test transformer 5 connected in parallel with this circuit. It consists of a voltage source circuit that supplies voltage to the test circuit breaker 1 via a capacitance 4, and one bar side of the test circuit breaker 1 is grounded. In this composite test circuit, a test current ip which is a composite of a leading current 1i flowing through the current source circuit and a leading current ic flowing through the voltage source circuit flows through the circuit breaker under test 1.
進み電流、試験電流の遮断時における電気的現象を第４
図に示す。The electrical phenomenon at the time of cutting off the lead current and test current is explained in the fourth section.
As shown in the figure.
第４図におけるＰ−Ｐ’の時点で供試遮断器１と補助遮
断器３をほぼ同時に開極すると、最初の電流零点Ｑ−Ｑ
’ において試験電流１ｐは供試遮断器１によって遮断
される。この時遅れ電流ＩＱも補助遮断器３によって遮
断されるため電流源回路は切離される。When the test circuit breaker 1 and the auxiliary circuit breaker 3 are opened almost simultaneously at the point P-P' in Fig. 4, the first current zero point Q-Q
At ', the test current 1p is interrupted by the circuit breaker 1 under test. This time-delayed current IQ is also cut off by the auxiliary circuit breaker 3, so the current source circuit is disconnected.
電圧源ｅｃは電流零の瞬時の電圧すなわち電圧波高値に
相当する電圧が残留し、 ｅｓとｅＣの合成電圧が供試
遮断器１の極間に印加され電圧は１／２サイクル後に電
源電圧波高値の２倍まで上昇する。In the voltage source ec, the instantaneous voltage when the current is zero, that is, the voltage corresponding to the voltage peak value remains, and the combined voltage of es and eC is applied between the poles of the test circuit breaker 1, and the voltage changes to the power supply voltage wave after 1/2 cycle. It will rise to twice the high price.
この試験では供試遮断器１の片側の端子には全電圧が印
加されることになり電気的に非常に苛酷な条件にある。In this test, full voltage is applied to one terminal of the circuit breaker 1 under test, which results in very severe electrical conditions.
さらに、遮断電流及び給与電圧が供給された回路構成と
なり比較的大容量の試験設備容量が必要であった。Furthermore, the circuit configuration was such that a breaking current and a supply voltage were supplied, requiring a relatively large test equipment capacity.
（発明が解決しようとする課題）
上記遮断器の進み小電流遮断の合成試験法では、電流遮
断後の回復電圧を片側から印加することになり、実使用
状態に沿った試験になっていなかった。(Problems to be Solved by the Invention) In the above-mentioned synthetic test method for advanced small current interruption of the circuit breaker, the recovery voltage after current interruption was applied from one side, and the test was not conducted in accordance with actual usage conditions. .
また、進み小電流遮断試験は遮断器が電流遮断後、接触
子間に加わる２倍の電圧に耐えられるか否かを検証する
もので、遮断器接触子の開離距離が不十分であると、接
触子間の絶縁が破壊して再び電流が流れる。この現象が
発生すると回路に異常電圧を発生するため系統の機器の
絶縁を脅かすことになってしまう。In addition, the advanced small current interruption test verifies whether the circuit breaker can withstand twice the voltage applied between the contacts after the current is interrupted. , the insulation between the contacts breaks down and current flows again. When this phenomenon occurs, abnormal voltage is generated in the circuit, which threatens the insulation of system equipment.
この進み小電流遮断試験で問題になるが、遮断器が適用
される回路の電源周波数と、試験場の試験周波数とが異
なる場合である。A problem with this advanced small current interruption test is when the power frequency of the circuit to which the circuit breaker is applied differs from the test frequency at the test site.
例えば６０）１ｚ系統で使用される遮断器を５０Ｈｚで
試験した場合、電流遮断後に遮断器接触子に加わる電圧
が波高値になるまでの時間が６０Ｈｚでは８．３ｍｓで
あるのに対して５０Ｈｚでは１０ｏ＋ｓとなり遮断器に
とって一般には楽な試験となってしまう。また、これを
カバーするために、６０Ｈｚ系統電圧の波高値までの時
間と５０［（ｚの試験電圧のものでカバーされるように
試験電圧を１．２倍にして試験が行われる場合があが、
電流遮断後６ 、８＋ｍｓを越えると６０Ｈｚ電源で試
験を行った時とほぼ同じ波形であるが６ 、８ｍｓを越
えると６０Ｈｚ電源で試験を行った時に比べて高い電圧
が印加されることになり、遮断器にとって苛酷な試験と
なってしまう。For example, when a circuit breaker used in a 60) 1z system is tested at 50Hz, the time it takes for the voltage applied to the circuit breaker contact to reach its peak value after current interruption is 8.3ms at 60Hz, but at 50Hz it is 10o+s, which is generally an easy test for circuit breakers. In addition, in order to cover this, the test voltage may be multiplied by 1.2 to cover the time to the peak value of the 60Hz system voltage and the test voltage of 50[z]. but,
If it exceeds 6.8+ms after the current is cut off, the waveform will be almost the same as when testing with a 60Hz power supply, but if it exceeds 6.8ms, a higher voltage will be applied than when testing with a 60Hz power supply. This will be a harsh test for the circuit breaker.
第５図はこの５０Ｈｚ電源と６０）１ｚ電源を使用した
時の遮断器接触子間にかかる電圧波形を比較して示した
ものである。FIG. 5 shows a comparison of the voltage waveforms applied between the circuit breaker contacts when this 50Hz power supply and the 60)1z power supply are used.
本発明は一定の試験電源周波数で、電流遮断後に遮断器
接触子間に加わる電圧の周波数を任意に変化させ、実際
に使用される周波数にすることができると共に、遮断器
の両側から定格電圧の１／２をそれぞれ逆の極性にして
印加することで接触子間には２倍の電圧を加えることが
でき、更に試験電源から電流源と電圧源を分は組合わせ
ることにより、さまざまな定格の遮断器の進み小電流遮
断性能を実使用状態に近い状態で検証できる合成試験装
置を提供することを目的とする。The present invention can arbitrarily change the frequency of the voltage applied between the circuit breaker contacts after the current is cut off at a constant test power supply frequency, making it possible to adjust the frequency to the frequency actually used. By applying 1/2 with opposite polarity, twice the voltage can be applied between the contacts, and by combining the current source and voltage source from the test power supply, various ratings can be applied. The purpose of the present invention is to provide a synthetic test device that can verify the advanced small current breaking performance of a circuit breaker under conditions close to actual usage conditions.
〔発明の構成〕
（課題を解決するための手段）
上記目的を達成するために本発明では、供試遮断器に対
して試験用電源に２台の試験用変圧器がカスケード接続
されるように接続し、その高圧巻線の接続点を接地し、
そしてこの高圧巻線の各々の端子にそれぞれ補助遮断器
を接続する。更にその補助遮断器の反対側を供試遮断器
に接続して電流現回路を構成し、この回路と並列に前記
試験用電源に別の２台の試験用変圧器もカスード接続さ
れるように構成し、この変圧器の高圧巻線も接続点を接
地し、そして低圧巻線の片側に補助遮断器を接続し、共
振回路のインダクタンスを前記補助遮断器の片端と前記
低圧巻線の中間点と低圧巻線の片端とに並列に接続し、
前記高圧巻線と並列に共振回路のキャパシタンスを接続
し、高圧巻線の各々端子にそれぞれキャパシタンスを接
続し、その反対側を供試遮断器と補助遮断器の接続点に
接続する電圧源回路を構成した。[Structure of the Invention] (Means for Solving the Problems) In order to achieve the above object, the present invention provides a method in which two test transformers are connected in cascade to the test power supply for the circuit breaker under test. and ground the connection point of its high voltage winding,
An auxiliary circuit breaker is connected to each terminal of this high voltage winding. Furthermore, the other side of the auxiliary circuit breaker is connected to the test circuit breaker to form a current current circuit, and two other test transformers are also connected in cascade to the test power supply in parallel with this circuit. The high voltage winding of this transformer also has its connection point grounded, and an auxiliary circuit breaker is connected to one side of the low voltage winding, and the inductance of the resonant circuit is connected to the midpoint between one end of the auxiliary circuit breaker and the low voltage winding. and one end of the low voltage winding in parallel,
A voltage source circuit is provided in which a capacitance of a resonant circuit is connected in parallel with the high voltage winding, a capacitance is connected to each terminal of the high voltage winding, and the opposite side is connected to a connection point between the circuit breaker under test and the auxiliary circuit breaker. Configured.
（作 用）
上記回路構成によると、供試遮断器の片極のみから電圧
を印加する必要がなくなり、供試遮断器の両極はほぼ実
系統と同等のストレスになり、電流零点で電流を遮断す
ると同時に補助遮断器によって試験電源から電流源と電
圧源の発電機側を切離してしまうことによりインダクタ
ンスとキャパシタンスの振動電圧と残留電圧の合成電圧
が印加される。このインダクタンスとキャパシタンスの
値により、電圧源電圧の周波数を任意に変化させて実際
に遮断器が使用される周波数での進みノコ１電流試験が
可能となる。(Function) According to the above circuit configuration, it is no longer necessary to apply voltage from only one pole of the test circuit breaker, and both poles of the test circuit breaker are subjected to almost the same stress as the actual system, and the current is interrupted at the current zero point. At the same time, the auxiliary circuit breaker disconnects the generator side of the current source and voltage source from the test power supply, so that a composite voltage of the oscillating voltage of the inductance and capacitance and the residual voltage is applied. These inductance and capacitance values make it possible to arbitrarily change the frequency of the voltage source voltage and perform a leading saw single current test at the frequency at which the circuit breaker is actually used.
（実施例）
以下本発明の一実施例について第１図及び第２図を用い
て説明する。(Example) An example of the present invention will be described below with reference to FIGS. 1 and 2.
第１図は本発明の回路の一例を示している。FIG. 1 shows an example of the circuit of the present invention.
供試遮断器１に対し、試験用電源となる短絡発電機２に
２台の試験用変圧器８と９がカスケードに接続されるよ
うに構成し、その高圧巻線の接続点を接地する。The test circuit breaker 1 is configured such that two test transformers 8 and 9 are connected in cascade to a short-circuit generator 2 serving as a test power source, and the connection point of the high voltage winding is grounded.
また高圧巻線の各々の端子ＣとＤにそれぞれ補助遮断器
３ａの片極を接続し、補助遮断器３ａのもう一方に極を
供試遮断器１に接続して電流源を構成する。Further, one pole of the auxiliary circuit breaker 3a is connected to each terminal C and D of the high voltage winding, and the other pole of the auxiliary circuit breaker 3a is connected to the test circuit breaker 1 to constitute a current source.
この電流源と並列に前記短絡発電機２に別の２台の試験
用変圧器１０とＩＩがカスケードになるように接続され
、その高圧巻線の接続点を接地する。Two other test transformers 10 and II are connected to the short-circuit generator 2 in parallel with this current source in a cascade manner, and the connection point of their high voltage windings is grounded.
短絡発電機２からの一端に補助遮断器３ｂを接続し、補
助遮断器３ｂのもう一方を試験用変圧器９に接続する。An auxiliary circuit breaker 3b is connected to one end from the short circuit generator 2, and the other end of the auxiliary circuit breaker 3b is connected to the test transformer 9.
共振用インダクタンス７をこの試験用変圧器の低圧側と
並列になるようＧとＨに接続する。A resonant inductance 7 is connected to G and H in parallel with the low voltage side of this test transformer.
共振用キャパシタンス６をこの高圧巻線と並列になるよ
うに各々の端子ＥとＦに接続し、その端子ＥとＦにそれ
ぞれキャパシタンス４の片側をそれぞれ接続し、キャパ
シタンス４のもう一方を供試遮断器１と補助遮断器３ａ
の接続点に接続する電圧源回路を構成する。A resonance capacitor 6 is connected to each terminal E and F in parallel with this high voltage winding, one side of the capacitance 4 is connected to each of the terminals E and F, and the other side of the capacitance 4 is connected to the test cutoff. circuit breaker 1 and auxiliary circuit breaker 3a
Configure a voltage source circuit that connects to the connection point.
次に遮断試験の現象について第２図を用いて説明する。Next, the phenomenon of the interruption test will be explained using FIG. 2.
先ず供試遮断器１と補助遮断器３ａと３ｂを閉状態にし
ておき短絡発電機２より試験用変圧器８と９及び補助遮
断器３ａを介して供試遮断器１に遅れ電流ｉＱを流す。First, the test circuit breaker 1 and the auxiliary circuit breakers 3a and 3b are closed, and a delayed current iQ is caused to flow from the short-circuit generator 2 to the test circuit breaker 1 via the test transformers 8 and 9 and the auxiliary circuit breaker 3a. .
試験電源の電圧は電流遮断後に試験用変圧器９及び１０
に発生する電圧がそれぞれ試験電圧の１／２になるよう
に、あらかじめ調整した値にしておく。The voltage of the test power supply is changed to the test transformers 9 and 10 after the current is cut off.
Adjust the voltages in advance to be 1/2 of the test voltage.
次に、Ｐ−Ｐ’時点で供試遮断器１と補助遮断器３ａ及
び３ｂをほぼ同時に開極すると最初の電流零点Ｑ−Ｑ’
で試験電流ＩＱは遮断され、電圧残留用キャパシタンス
４及び共振用キャパシタンス６とインダクタンス７は孤
立するため、Ｑ−Ｑ’時の電圧即ち波高値電圧がキャパ
シタンス４により残り、そして共振用キャパシタンス６
とインダクタンス７との共振回路に現われる電圧はキャ
パシタンス６とインダクタンス７により決まる周波数で
振動する。この電圧の合成したものが供試遮断器１の極
間に印加されることになる。Next, when the test circuit breaker 1 and the auxiliary circuit breakers 3a and 3b are opened almost simultaneously at the point P-P', the first current zero point Q-Q'
The test current IQ is cut off and the residual voltage capacitance 4, the resonance capacitance 6, and the inductance 7 are isolated, so the voltage at Q-Q', that is, the peak value voltage remains due to the capacitance 4, and the resonance capacitance 6
The voltage appearing in the resonant circuit of the capacitance 6 and the inductance 7 oscillates at a frequency determined by the capacitance 6 and the inductance 7. A combination of these voltages will be applied between the poles of the circuit breaker 1 under test.
従って回復電圧の振動分を６０Ｈｚに調整している場合
は、供試遮断器１の極間に電流遮断点のＱＱ′後の８
、３ｍｓ後に電圧波波高値が来ることになる。Therefore, when the oscillation component of the recovery voltage is adjusted to 60 Hz, the 8
, the voltage wave peak value will arrive 3ms later.
以上述べてきたように本発明の装置によれば、電流遮断
後は補助遮断器により試験電源からの電流及び電圧を全
て切離してしまい、電圧残留キャパシタンスと共振素子
のインダクタンス及びキャパシタンスによる合成電圧が
発生する回路構成であるため、単一周波数の試験電源で
あっても任意の周波数の電圧を発生させることができ、
また供試速断器の両側から定格電圧の１７２の電圧を逆
の曲製で印加させることにより定格相当のブッシングを
必要としない。また試験設備面でも電流源と電圧源を組
合わせて供給できる回路構成であるため大容量の試験設
備を必要とせず進み小電流遮断性能の検証ができる。As described above, according to the device of the present invention, after the current is cut off, the auxiliary circuit breaker disconnects all current and voltage from the test power supply, and a composite voltage is generated due to the voltage residual capacitance and the inductance and capacitance of the resonant element. Because of the circuit configuration, it is possible to generate voltage at any frequency even with a single frequency test power supply.
Further, by applying the rated voltage of 172 from both sides of the test speed breaker in a reverse curved manner, bushings corresponding to the rated voltage are not required. In terms of test equipment, the circuit configuration allows for a combination of current and voltage sources to be supplied, making it possible to verify advanced small current interrupting performance without the need for large-capacity test equipment.
しかも、複雑な試験制御を行うことなく極めて信頼性の
高い進み小電流合成試験装置を提供できる。Furthermore, it is possible to provide an extremely reliable lead small current synthesis test device without performing complicated test control.
第１図は本発明の一実施例を示す進み小電流合成試験装
置の回路構成図、第２図は第１図に示す装置における試
験現象の電圧、電流を示す波形図、第３図は従来の合成
試験による進み小電流試験回路図、第４図は第３図に示
す装置における試験現象の電圧、電流を示す波形図、第
５図は第３図に示す装置において５０Ｈｚと６０Ｈｚの
電源を使用した時の遮断器接触子間にかかる電圧を比較
した波形図である。
１・・・供試遮断器。
３ａ 、 ３ｂ・・・補助遮断器、
６・・・共振用キャパシタンス、
８．９，１０．１１・・・試験用変圧器。
２・・・短絡発電機、
４・・・キャパシタンス。
７・・・共振用インダクタンス。Fig. 1 is a circuit configuration diagram of an advanced small current synthesis test device showing an embodiment of the present invention, Fig. 2 is a waveform diagram showing the voltage and current of the test phenomenon in the device shown in Fig. 1, and Fig. 3 is a conventional 4 is a waveform diagram showing the voltage and current of the test phenomenon in the device shown in FIG. It is a waveform diagram comparing the voltage applied between the circuit breaker contacts when in use. 1... Test circuit breaker. 3a, 3b...Auxiliary circuit breaker, 6...Resonance capacitance, 8.9, 10.11...Test transformer. 2... Short circuit generator, 4... Capacitance. 7... Resonant inductance.
Claims (1)
低圧巻線をそれぞれ並列に接続し、前記変圧器の高圧巻
線を直列に接続し、その中間を接地するとともに、高圧
巻線の各々端子にそれぞれ補助遮断器の一方端子を接続
し、その反対側端子を供試遮断器の両側端子に接続して
成る電流源回路と、前記試験用電源に補助遮断器を接続
し、２台の電圧源用変圧器の低圧巻線を前記直列接続し
た回路と並列に接続し、共振回路のインダクタンスを前
記電圧源用変圧器の低圧巻線と並列に接続して閉回路を
構成し、一方前記電圧源用変圧器の高圧巻線を直列に接
続し、その接続点を接地し、直列にした高圧巻線と並列
に共振回路のキャパシタンスを接続し、その高圧巻線の
各々端子にそれぞれキャパシタンスを直列に接続し、そ
の反対側を供試遮断器と補助遮断器の各々の接続点に接
続して閉回路を構成した電圧源回路とから成ることを特
徴とする進み小電流合成試験装置。The low voltage windings of two current source transformers are connected in parallel to a test power supply using a short-circuit generator, the high voltage windings of the transformers are connected in series, the middle is grounded, and the high voltage windings of the transformers are connected in series. A current source circuit comprising one terminal of an auxiliary breaker connected to each terminal of the line and the opposite terminal connected to both terminals of the breaker under test, and an auxiliary breaker connected to the test power supply, The low voltage windings of the two voltage source transformers are connected in parallel with the series-connected circuit, and the inductance of the resonant circuit is connected in parallel with the low voltage winding of the voltage source transformer to form a closed circuit. On the other hand, the high voltage windings of the voltage source transformer are connected in series, the connection point is grounded, the capacitance of the resonant circuit is connected in parallel with the series high voltage windings, and each terminal of the high voltage windings is connected. An advanced small current composite test characterized by consisting of a voltage source circuit in which capacitances are connected in series and the opposite sides are connected to the respective connection points of the test circuit breaker and the auxiliary circuit breaker to form a closed circuit. Device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2045956A JPH03249580A (en) | 1990-02-28 | 1990-02-28 | Composite test device for small advancing current |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2045956A JPH03249580A (en) | 1990-02-28 | 1990-02-28 | Composite test device for small advancing current |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH03249580A true JPH03249580A (en) | 1991-11-07 |
Family
ID=12733723
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2045956A Pending JPH03249580A (en) | 1990-02-28 | 1990-02-28 | Composite test device for small advancing current |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH03249580A (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5025152A (en) * | 1973-07-06 | 1975-03-17 | ||
| JPH01101479A (en) * | 1987-10-15 | 1989-04-19 | Toshiba Corp | Testing device for leading small current break of breaker |
-
1990
- 1990-02-28 JP JP2045956A patent/JPH03249580A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5025152A (en) * | 1973-07-06 | 1975-03-17 | ||
| JPH01101479A (en) * | 1987-10-15 | 1989-04-19 | Toshiba Corp | Testing device for leading small current break of breaker |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Li et al. | Impact research of inductive FCL on the rate of rise of recovery voltage with circuit breakers | |
| JP2591525B2 (en) | Circuit breaker test equipment | |
| JPH03249580A (en) | Composite test device for small advancing current | |
| JP3103262B2 (en) | Circuit breaker test circuit for switchgear | |
| JPH04363677A (en) | Synthetic test circuit for breaker | |
| JP2675649B2 (en) | Switchgear test method and device | |
| JPH0145592B2 (en) | ||
| JP3185541B2 (en) | High voltage circuit breaker synthesis test equipment | |
| JPH0563748B2 (en) | ||
| JP2787050B2 (en) | Insulation recovery test circuit for switchgear | |
| JPH065652Y2 (en) | Shiya disconnector testing device | |
| JPH06186309A (en) | Interruption test circuit for switch | |
| JPS60207079A (en) | Synthesis test of breaker | |
| JP2666946B2 (en) | Capacitor switching performance test equipment | |
| JPS6157870A (en) | Three-phase equivalent testing method of breaker | |
| JPH058533Y2 (en) | ||
| JPS6030900B2 (en) | Equivalent test method for breaker | |
| Stokes et al. | Balanced synthetic circuit: new circuit for high-power testing with low-frequency transient recovery voltage | |
| JPH0519029A (en) | Composite equivalent test circuit of circuit breaker | |
| JPS59109873A (en) | Testing method of three-phase common tank-type breaker | |
| JPH10253680A (en) | Test method for short-time withstand current of switchgear | |
| JPH05288815A (en) | Composite short-circuit tester for circuit breaker with resistor | |
| JPS61225675A (en) | Method and apparatus for testing switch gear | |
| SU1486964A1 (en) | Device for synthetic disconnecting testing of ac disconnecting switches | |
| JPS6247564A (en) | Leading current cut-off testing circuit for switch |