JPH0245447U - - Google Patents
Info
- Publication number
- JPH0245447U JPH0245447U JP12213188U JP12213188U JPH0245447U JP H0245447 U JPH0245447 U JP H0245447U JP 12213188 U JP12213188 U JP 12213188U JP 12213188 U JP12213188 U JP 12213188U JP H0245447 U JPH0245447 U JP H0245447U
- Authority
- JP
- Japan
- Prior art keywords
- rays
- base plate
- fluorescent
- incident
- thin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Description
第１図は本考案の作用を説明する線図、第２図
は本考案実施例の構成を示した図である。
なお図において、１は基台板、２はＸ線、３は
Ｘ線検出器、４は試料、５はスリツト、６は蛍光
Ｘ線である。
FIG. 1 is a diagram illustrating the operation of the present invention, and FIG. 2 is a diagram showing the configuration of an embodiment of the present invention. In the figure, 1 is a base plate, 2 is an X-ray, 3 is an X-ray detector, 4 is a sample, 5 is a slit, and 6 is a fluorescent X-ray.
Claims (1)
に微小の入射角をもつて細いＸ線を入射させると
共にその入射部に対設して前記試料の蛍光Ｘ線を
検出するためのＸ線検出器に入射する前記基台板
の蛍光Ｘ線が極大値より低い適当な値となるよう
に上記基台板をその表面に対して直角な方向へ移
動させる機構を設けた全反射蛍光Ｘ線分析装置。 (2) 表面に試料を薄く被着した平面状の基台板
に微小の入射角をもつて細いＸ線を入射させると
共にその入射部に対設して前記試料の蛍光Ｘ線を
検出するためのＸ線検出器に入射する前記基台板
の蛍光Ｘ線が極大値より低い適当な値となるよう
に上記細いＸ線を形成するスリツトの位置をこの
スリツトを通るＸ線と交叉する方向へ移動させる
機構を設けた全反射蛍光Ｘ線分析装置。[Claims for Utility Model Registration] (1) Thin X-rays are incident on a flat base plate with a thin sample coated on the surface at a minute angle of incidence, and the sample is placed opposite to the incident part. The base plate is moved in a direction perpendicular to its surface so that the fluorescent X-rays of the base plate incident on the X-ray detector for detecting the fluorescent X-rays of the base plate have an appropriate value lower than the maximum value. A total internal reflection fluorescent X-ray analyzer equipped with a moving mechanism. (2) To make thin X-rays incident on a flat base plate with a thin sample coated on its surface at a minute angle of incidence, and to detect fluorescent X-rays from the sample by placing it opposite to the incident part. The position of the slit that forms the thin X-rays is moved in a direction that intersects the X-rays passing through the slits so that the fluorescent X-rays of the base plate incident on the X-ray detector have an appropriate value lower than the maximum value. A total internal reflection fluorescent X-ray analyzer equipped with a moving mechanism.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1988122131U JPH0725684Y2 (en) | 1988-09-20 | 1988-09-20 | Total reflection X-ray fluorescence analyzer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1988122131U JPH0725684Y2 (en) | 1988-09-20 | 1988-09-20 | Total reflection X-ray fluorescence analyzer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0245447U true JPH0245447U (en) | 1990-03-28 |
| JPH0725684Y2 JPH0725684Y2 (en) | 1995-06-07 |
Family
ID=31369771
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1988122131U Expired - Lifetime JPH0725684Y2 (en) | 1988-09-20 | 1988-09-20 | Total reflection X-ray fluorescence analyzer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0725684Y2 (en) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62222150A (en) * | 1985-11-28 | 1987-09-30 | ゲ−・カ−・エス・エス・フオルシユングスツエントルム・ゲ−シユタハト・ゲゼルシヤフト・ミツト・ベシユレンクテル・ハフツング | Method of analyzing element composition of surface layer of sample without breaking said surface layer |
-
1988
- 1988-09-20 JP JP1988122131U patent/JPH0725684Y2/en not_active Expired - Lifetime
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62222150A (en) * | 1985-11-28 | 1987-09-30 | ゲ−・カ−・エス・エス・フオルシユングスツエントルム・ゲ−シユタハト・ゲゼルシヤフト・ミツト・ベシユレンクテル・ハフツング | Method of analyzing element composition of surface layer of sample without breaking said surface layer |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0725684Y2 (en) | 1995-06-07 |
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