JPH02198186A - Method of inspecting printed circuit board shielding layer and inspecting means thereof - Google Patents

Method of inspecting printed circuit board shielding layer and inspecting means thereof

Info

Publication number
JPH02198186A
JPH02198186A JP1832989A JP1832989A JPH02198186A JP H02198186 A JPH02198186 A JP H02198186A JP 1832989 A JP1832989 A JP 1832989A JP 1832989 A JP1832989 A JP 1832989A JP H02198186 A JPH02198186 A JP H02198186A
Authority
JP
Japan
Prior art keywords
printed wiring
wiring board
shield layer
shielding layer
layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1832989A
Other languages
Japanese (ja)
Inventor
Shin Kawakami
川上 伸
Satoru Haruyama
春山 哲
Hirotaka Okonogi
弘孝 小此木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon CMK Corp
CMK Corp
Original Assignee
Nippon CMK Corp
CMK Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon CMK Corp, CMK Corp filed Critical Nippon CMK Corp
Priority to JP1832989A priority Critical patent/JPH02198186A/en
Publication of JPH02198186A publication Critical patent/JPH02198186A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0213Electrical arrangements not otherwise provided for
    • H05K1/0216Reduction of cross-talk, noise or electromagnetic interference
    • H05K1/0218Reduction of cross-talk, noise or electromagnetic interference by printed shielding conductors, ground planes or power plane
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0266Marks, test patterns or identification means
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/11Printed elements for providing electric connections to or between printed circuits
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/0097Processing two or more printed circuits simultaneously, e.g. made from a common substrate, or temporarily stacked circuit boards

Landscapes

  • Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
  • Structure Of Printed Boards (AREA)

Abstract

PURPOSE:To inspect the characteristics of a shielding layer without influence of a printed circuit board itself by simultaneously forming an independent check land and a shielding layer circuit communicating therewith in the printed circuit board simultaneously with the shielding layer. CONSTITUTION:Independent check lands 14, 15 and a shielding layer circuit 17 communicating therewith are formed in a printed circuit board 10 simultaneously with a shielding layer 5. Here, the shielding layer 5 is impossible to be measured for its characteristics by the formation of an overcoating layer 7. However, a shielding circuit 17 of the thickness under the same forming conditions in the same step as those of the formation of the shielding layer 5 is formed. Thus, the electric resistance value of the shielding circuit 17 can be measured through the lands 14, 15.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明はプリント配線板に関し、特にシールド層を有す
るプリント配線板のシールド層の検査に関する。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] The present invention relates to printed wiring boards, and more particularly to inspection of a shield layer of a printed wiring board having a shield layer.

〔従来の技術〕[Conventional technology]

従来はプリント配線板の所定の回路パターン上のソルダ
ーレジスト層上に導電性インキを塗膜形成してシールド
層とする。
Conventionally, a conductive ink film is formed on a solder resist layer on a predetermined circuit pattern of a printed wiring board to form a shield layer.

すなわち、第3図および第4図に示す如(、絶縁基板1
の片面に形成された回路パターン2のうちの接続ランド
3を残して回路パターン2の上側にソルダーレジスト層
4をシルク印刷により形成するとともに当該ソルダーレ
ジスト層4上偏にシールド層5を導電性インキをシルク
印刷により塗布することにより前記回路パターン2の所
要の範囲にわたってシールド層5を形成する。
That is, as shown in FIGS. 3 and 4, the insulating substrate 1
A solder resist layer 4 is formed on the upper side of the circuit pattern 2 by silk printing, leaving the connection lands 3 of the circuit pattern 2 formed on one side of the circuit pattern 2, and a shield layer 5 is coated with conductive ink on the upper part of the solder resist layer 4. A shield layer 5 is formed over a required range of the circuit pattern 2 by applying the above by silk printing.

尚、図中、6は回路パターン2の接続ランド3に形成し
たスルホール、7はオーバーコート層をそれぞれ示すも
のである。
In the figure, 6 indicates a through hole formed in the connection land 3 of the circuit pattern 2, and 7 indicates an overcoat layer.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

上述のシールド層5のシールド効果を判定するにはシー
ルド層5の厚さと導電性とを知る必要を生ずる。しかし
、シールド層5は導電性インキのシルク印刷技法による
塗布であるため各プリント配線板においてシールド特性
のばらつきが多いが、現在では特性検査の方法がない0
通常はシールド層5の上の全面にオーバーコート層7を
印刷塗布するため検査は不可能である。
In order to judge the shielding effect of the above-mentioned shield layer 5, it is necessary to know the thickness and conductivity of the shield layer 5. However, since the shield layer 5 is coated with conductive ink using a silk printing technique, there are many variations in the shielding characteristics of each printed wiring board, but there is currently no method for testing the characteristics.
Normally, the overcoat layer 7 is printed and coated on the entire surface of the shield layer 5, so inspection is impossible.

本発明の目的はプリント配線板のシールド層の検査方法
を提供し、個々のプリント配線板のシールド層の特性を
プリント配線板自体に影響させずに検査可能とするにあ
る。
An object of the present invention is to provide a method for inspecting the shield layer of a printed wiring board, and to enable inspection of the characteristics of the shield layer of each printed wiring board without affecting the printed wiring board itself.

〔課題を解決するための手段] 上述の目的を達するための本発明によるプリント配線板
のシールド層検査方法は、プリント配線板の回路パター
ン上にシールド層を施す場合に、プリント配線板内に独
立したチェックランドとこれに連通したシールド層回路
を上記シールド層と同時に形成し、プリント配線板の基
板完成後にシールド層の性能を検査する。
[Means for Solving the Problems] A method for inspecting a shield layer of a printed wiring board according to the present invention in order to achieve the above-mentioned object, when a shield layer is applied on a circuit pattern of a printed wiring board, A check land and a shield layer circuit connected thereto are formed at the same time as the shield layer, and the performance of the shield layer is inspected after the printed wiring board is completed.

本発明によるシールド屓検査手段を有するプリント配線
板は、プリント配線板の回路パターン上に施したシール
ド層を有する場合に、プリント配線板内に独立した2個
のランドと、ランド間に形成した所定寸法のシールド層
回路とを形成し、シールド層検査を可能とする。
When a printed wiring board having a shield layer inspection means according to the present invention has a shield layer formed on a circuit pattern of the printed wiring board, two independent lands in the printed wiring board and a predetermined area formed between the lands are provided. This enables shield layer inspection by forming a shield layer circuit with the following dimensions.

〔作用〕[Effect]

本発明の上述の構成によって、プリント配線板の基板完
成後にプリント配線板自体に悪影響を生ずることなく、
シールド層の特性の適確な検査を行い得る。
With the above-described configuration of the present invention, the printed wiring board itself is not adversely affected after the printed wiring board board is completed.
It is possible to accurately test the characteristics of the shield layer.

〔実施例] 以下本発明の実施例を図面とともに説明する。〔Example] Embodiments of the present invention will be described below with reference to the drawings.

第1図および第2図は本発明プリント配線板の部分的な
平面図および第1図B−B拡大断面図である。
1 and 2 are a partial plan view and an enlarged sectional view taken along the line BB in FIG. 1 of the printed wiring board of the present invention.

しかして、第1図のプリント配線板10は前述した第3
図および第4図示のプリント配線板と同様に絶縁基板1
の片面に回路パターン2を形成するとともにこの回路パ
ターン2の上側にソルダーレジスト層4を介してシール
ド層5を形成することにより構成されている。
Therefore, the printed wiring board 10 of FIG.
An insulating substrate 1 similar to the printed wiring board shown in the figure and the fourth figure.
A circuit pattern 2 is formed on one side of the circuit pattern 2, and a shield layer 5 is formed above the circuit pattern 2 via a solder resist layer 4.

また、かかるプリント配線板10の形成に当たり、予め
、プリント配線板10の所要位置に、切取孔11を配孔
した切取部12を介してテストピース部13を設け、こ
のテストピース部13上側にも前記回路パターン2の形
成と同時にテスト用のランド14.15を形成するとと
もにソルダーレジスト層4の形成と同時にテストピース
部13上側のテスト用のランド14.15を残してソル
ダーレジスト層16を形成し、さらに前記シールド層5
の形成に関連してテスト用のランド14゜15間を接続
するシールド回路17を形成し、かつプリント配線板1
0のオーバーコート層7の形成に関連してオーバーコー
ト層18を施すものである。
Further, in forming such a printed wiring board 10, a test piece part 13 is provided in advance at a required position of the printed wiring board 10 through a cutout part 12 in which a cutout hole 11 is provided, and the test piece part 13 is also provided on the upper side of this test piece part 13. Test lands 14.15 are formed simultaneously with the formation of the circuit pattern 2, and at the same time as the solder resist layer 4 is formed, a solder resist layer 16 is formed leaving the test lands 14.15 above the test piece portion 13. , and further the shield layer 5
In connection with the formation of the printed wiring board 1, a shield circuit 17 is formed to connect between the lands 14 and 15 for testing.
The overcoat layer 18 is applied in conjunction with the formation of the overcoat layer 7 of No. 0.

すなわち、テストピース部13におけるランド14.1
5、ソルダーレジスト層16、シールド回路17および
オーバーコート層18は、それぞれプリント配線板lO
の回路パターン2、ソルダーレジスト層4、シールド層
5およびオーバーコート層7の製造工程と同一工程にて
形成する。
That is, the land 14.1 in the test piece portion 13
5, the solder resist layer 16, the shield circuit 17 and the overcoat layer 18 are each printed wiring board lO
It is formed in the same process as the circuit pattern 2, solder resist layer 4, shield layer 5, and overcoat layer 7.

特に、シールド回路17の長さおよび幅については、予
めシールド回路17の形成に使用される導電性インキ、
すなわち前記プリント配線板10のシールド層5の形成
に使用される導電性インキの組成における抵抗値に対応
する基準設定値と比較し得る長さおよび幅(体積)例え
ば長さ10m、幅5am等のものとなるように設計して
形成するものである。
In particular, regarding the length and width of the shield circuit 17, the conductive ink used to form the shield circuit 17,
That is, the length and width (volume) can be compared with the reference setting value corresponding to the resistance value in the composition of the conductive ink used to form the shield layer 5 of the printed wiring board 10, for example, a length of 10 m, a width of 5 am, etc. It is designed and formed to become something.

尚、ランド14.15の一部は測定を可能とする為にオ
ーバーコート層18の形成時に一部をn出せしめて形成
する。
Incidentally, in order to enable measurement, some of the lands 14 and 15 are formed so as to be exposed during the formation of the overcoat layer 18.

図中、3は回路パターン2における接続ランド、6はス
ルーホールである。
In the figure, 3 is a connection land in the circuit pattern 2, and 6 is a through hole.

以上の構成から成るプリント配線板10におけるシール
ド層5はオーバーコートN7の形成により、その特性を
測定することが不可能であるが、かかるシールド層5の
形成と同一工程、すなわち、同一形成条件(同一の組成
から成る導電性インキによる同一の条件によるシルク印
刷等)による膜厚のシールド回路17が形成されるので
、かかるシールド回路17の電気的な抵抗値をランド1
4゜15を介して測定することが可能である。
Although it is impossible to measure the characteristics of the shield layer 5 in the printed wiring board 10 having the above structure due to the formation of the overcoat N7, the shield layer 5 is formed in the same process as the formation of the shield layer 5, that is, under the same formation conditions ( A shield circuit 17 with a film thickness is formed using conductive ink of the same composition under the same conditions (silk printing, etc.), so the electrical resistance of the shield circuit 17 is determined by the land 1.
It is possible to measure through 4°15.

従って、この測定値を予め同一組成の導電性インキによ
り形成された所定の膜厚、長さ(体積)における基準設
定値と比較することにより、プリント配線板10におい
て形成されたシールド層5の特性を間接的に検知するこ
とができる。
Therefore, by comparing this measured value with a standard set value at a predetermined film thickness and length (volume) formed using conductive ink of the same composition, the characteristics of the shield layer 5 formed on the printed wiring board 10 can be determined. can be detected indirectly.

尚、テストピース部13は必要に応じて切取部12によ
りプリント配線板10より切り離すことが可能である。
Incidentally, the test piece portion 13 can be separated from the printed wiring board 10 using the cutout portion 12 if necessary.

〔発明の効果] 従来はプリント配線板のシールド層の特性の測定は不可
能であったが本発明によって初めて可能となった。
[Effects of the Invention] Conventionally, it was impossible to measure the characteristics of the shield layer of a printed wiring board, but the present invention has made it possible for the first time.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図および第2図は本発明の実施例を示すプリント配
線板の部分的な平面図、第1図B−B拡大断面図、第3
図および第4図は従来のプリント配線板の部分的な平面
図および第3図A−A断面図である。 1・・・絶縁基板      2・・・回路パターン3
・・・接続ランド 4.16ソルダ一レジスト層 5.17・・・シールド層  6・・・スルホール7.
18・・・オーバーコート層 10・・・プリント配線板  11・・・切取孔12・
・・切取部      13・・・テストピース部特許
出廓人  日本シイエムケイ株式会社第1図 2・・・回路パターン 3・・・接続ランド 5.17・・・シールド層 6・・・スルホール 7・・・オーバーコート層 10・・・プリント配線板 11・・・切取孔 12・・・切取部 13・・・テストピース部
1 and 2 are a partial plan view of a printed wiring board showing an embodiment of the present invention, FIG. 1 is an enlarged sectional view taken along line B-B, and FIG.
The figure and FIG. 4 are a partial plan view and a sectional view taken along the line AA in FIG. 3 of a conventional printed wiring board. 1... Insulating board 2... Circuit pattern 3
...Connection land 4.16 Solder-resist layer 5.17...Shield layer 6...Through hole 7.
18... Overcoat layer 10... Printed wiring board 11... Cutout hole 12.
...Cut-out part 13...Test piece part patent distributor Japan CMK Co., Ltd. Figure 1 2...Circuit pattern 3...Connection land 5.17...Shield layer 6...Through hole 7...・Overcoat layer 10...Printed wiring board 11...Cutout hole 12...Cutout part 13...Test piece part

Claims (2)

【特許請求の範囲】[Claims] (1)プリント配線板の回路パターン上にシールド層を
施す場合に、 プリント配線板内に独立したチェックランドとこれに連
通したシールド層回路を上記シールド層と同時に形成し
、プリント配線板の基板完成後にシールド層の性能を検
査することを特徴とするプリント配線板のシールド層検
査方法。
(1) When applying a shield layer on the circuit pattern of a printed wiring board, an independent check land and a shield layer circuit connected to this are formed on the printed wiring board at the same time as the above shield layer, and the board of the printed wiring board is completed. A method for inspecting a shield layer of a printed wiring board, characterized in that the performance of the shield layer is subsequently inspected.
(2)プリント配線板の回路パターン上に施したシール
ド層を有する場合に、 プリント配線板内に独立した2個のランドと、ランド間
に形成した所定寸法のシールド層回路とを形成し、シー
ルド層検査を可能とすることを特徴とするシールド層検
査手段を有するプリント配線板。
(2) When the printed wiring board has a shield layer applied on the circuit pattern, two independent lands and a shield layer circuit of a predetermined size formed between the lands are formed in the printed wiring board, and the shield layer is formed on the printed wiring board. A printed wiring board having a shield layer inspection means that enables layer inspection.
JP1832989A 1989-01-27 1989-01-27 Method of inspecting printed circuit board shielding layer and inspecting means thereof Pending JPH02198186A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1832989A JPH02198186A (en) 1989-01-27 1989-01-27 Method of inspecting printed circuit board shielding layer and inspecting means thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1832989A JPH02198186A (en) 1989-01-27 1989-01-27 Method of inspecting printed circuit board shielding layer and inspecting means thereof

Publications (1)

Publication Number Publication Date
JPH02198186A true JPH02198186A (en) 1990-08-06

Family

ID=11968588

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1832989A Pending JPH02198186A (en) 1989-01-27 1989-01-27 Method of inspecting printed circuit board shielding layer and inspecting means thereof

Country Status (1)

Country Link
JP (1) JPH02198186A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05283822A (en) * 1992-03-30 1993-10-29 Toppan Printing Co Ltd Printed circuit board equipped with electromagnetic wave shield layer
JP2008085051A (en) * 2006-09-27 2008-04-10 Nitto Denko Corp Wired circuit board and its manufacturing method
JP2013162055A (en) * 2012-02-08 2013-08-19 Panasonic Corp Electronic device manufacturing method and hot press device

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05283822A (en) * 1992-03-30 1993-10-29 Toppan Printing Co Ltd Printed circuit board equipped with electromagnetic wave shield layer
JP2008085051A (en) * 2006-09-27 2008-04-10 Nitto Denko Corp Wired circuit board and its manufacturing method
US8063312B2 (en) 2006-09-27 2011-11-22 Nitto Denko Corporation Wired circuit board and producing method thereof
US8327535B2 (en) 2006-09-27 2012-12-11 Nitto Denko Corporation Wired circuit board and producing method thereof
JP2013162055A (en) * 2012-02-08 2013-08-19 Panasonic Corp Electronic device manufacturing method and hot press device

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