JPH01320296A - Production of bi12sio20 single crystal - Google Patents

Production of bi12sio20 single crystal

Info

Publication number
JPH01320296A
JPH01320296A JP15399988A JP15399988A JPH01320296A JP H01320296 A JPH01320296 A JP H01320296A JP 15399988 A JP15399988 A JP 15399988A JP 15399988 A JP15399988 A JP 15399988A JP H01320296 A JPH01320296 A JP H01320296A
Authority
JP
Japan
Prior art keywords
melt
single crystal
crystal
bi12sio20
growing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15399988A
Other languages
Japanese (ja)
Other versions
JPH0521878B2 (en
Inventor
Kenji Kitamura
健二 北村
Shigeyuki Kimura
木村 茂行
Tsutomu Sawada
勉 沢田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute for Research in Inorganic Material
Original Assignee
National Institute for Research in Inorganic Material
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by National Institute for Research in Inorganic Material filed Critical National Institute for Research in Inorganic Material
Priority to JP15399988A priority Critical patent/JPH01320296A/en
Publication of JPH01320296A publication Critical patent/JPH01320296A/en
Publication of JPH0521878B2 publication Critical patent/JPH0521878B2/ja
Granted legal-status Critical Current

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  • Crystals, And After-Treatments Of Crystals (AREA)

Abstract

PURPOSE:To easily obtain a single crystal having light transmittance close to the ideal characteristics of pure Bi12SiO20, also having uniform optical properties, and free from crystal strain by adopting a melt composition in a specific range increased in silicon content to a greater extent than heretofore at the time of growing a Bi12SiO20 single crystal from a melt. CONSTITUTION:In a method of growing a Bi12SiO20 single crystal from a melt, the crystal is grown from a melt having a melt composition held in a range in which silicon content is excess and the ratio of SiO2 to (Bi2O3+SiO2) is regulated to 0.18-0.28 (molar fraction). As to the method for growing the single crystal from the melt, any of chokralsky method, Bridgman process, zone melting method, and floating zone melting method can be adopted.

Description

【発明の詳細な説明】 産業上の利用分野 本発明はBj+zSiO1゜(以下BSOと記載する)
単結晶の製造法に関する。 BSO単結晶は大きな電気
光学効果を有し、電圧センサー素子や画像記憶素子とし
て有用なものである。
[Detailed description of the invention] Industrial application field The present invention is directed to Bj+zSiO1° (hereinafter referred to as BSO)
Concerning a method for producing single crystals. BSO single crystals have a large electro-optical effect and are useful as voltage sensor elements and image storage elements.

従来技術 従来、BSO単結晶は結晶組成に近いBigOi  :
5iOz= 6 : 1組成融液から回転引上げ法で育
成することにより製造されてきた。
Conventional technology Conventionally, BSO single crystal has a crystal composition similar to BigOi:
It has been produced by growing a 5iOz=6:1 composition melt using a rotary pulling method.

しかし、この方法で育成されたBSO単結晶は、ビスマ
ス成分が過剰に結晶中に取り込まれ、380〜500n
−の波長領域で純粋な化学量論比組成を持ったBSO単
結晶の理論特性よりもはるかに大きな光吸収を示す、し
かも、光吸収の度合は育成条件を敏感に反映するので、
育成条件が結晶育成時に変動すると、特性値(光透過率
)のバラツキが生ずる。また、結晶中のコア(あるいは
ファセット)と呼ばれる領域とそれ以外の領域では、光
吸収の度合が異なったり、両頭域の境界で歪が生したり
する。このような光学特性の不均一や結晶内歪の存在は
、素子の信頼性や素子製作の歩留まりを悪くする原因と
なっていた。
However, in the BSO single crystal grown by this method, the bismuth component is excessively incorporated into the crystal, and
In the wavelength region of
If the growth conditions change during crystal growth, variations in characteristic values (light transmittance) will occur. Furthermore, the degree of light absorption differs between a region called the core (or facet) and other regions in the crystal, and distortion occurs at the boundary between the two head regions. Such non-uniform optical properties and the presence of intracrystalline strain have been a cause of deteriorating device reliability and device manufacturing yield.

発明の目的 本発明は従来法におけるBSO単結晶の欠点をなくそう
とするもので、その目的は光透過率が純粋なりSO結晶
の理想特性に近く、しかも光学特性が均一で結晶内歪の
ないBSO単結晶を容易に製造することか可能な方法を
提供しようとするものである。
Purpose of the Invention The present invention aims to eliminate the drawbacks of the BSO single crystal in the conventional method.The purpose of the present invention is to provide a material with pure light transmittance close to the ideal characteristics of an SO crystal, with uniform optical characteristics and no intracrystalline strain. The purpose of this invention is to provide a method that allows easy production of BSO single crystals.

発明の構成 本発明者らは前記目的を達成すべ(鋭意研究の結果、融
液から結晶を育成する方法において、その融e組成を、
従来の結晶組成に近い一致溶融組成ではなく、それより
ビスマス成分の少ない(珪素成分の多い)特定範囲の組
成とすると、結晶中に取り込まれる過剰なビスマス成分
が少なくなり、また光学特性が均一で、結晶内量のない
優れたBSO単結晶を容易に製造し得られることを知見
し得た。この知見に基づいて本発明を完成した。
Structure of the Invention The present inventors have achieved the above object (as a result of intensive research, in a method for growing crystals from a melt, the melt e composition is
Rather than a consistent melt composition close to the conventional crystal composition, if the composition is in a specific range with less bismuth (more silicon), the excess bismuth incorporated into the crystal will be reduced, and the optical properties will be more uniform. It has been found that an excellent BSO single crystal with no intracrystalline content can be easily produced and obtained. The present invention was completed based on this knowledge.

本発明の要旨は、融液からBl+gSiO□。単結晶を
育成する方法において、融液組成を珪素成分過剰なSi
OJ(Bigot +Siりのモル分率=0.18〜0
.28の範囲に保った融液から育成することを特徴とす
るB111SiOt*単結晶の製造法にある。
The gist of the present invention is to obtain Bl+gSiO□ from the melt. In the method of growing single crystals, the melt composition is changed to Si with excessive silicon content.
OJ (Bigot + Si mole fraction = 0.18~0
.. A method for producing a B111SiOt* single crystal is characterized in that it is grown from a melt maintained within a range of 28%.

前記モル分率が0.18より小さいと、珪素成分を過剰
にした効果がなく、過剰ビスマス成分が結晶中に取り込
まれる。また、0.28を趨えると珪素をより含んだ他
の固相が結晶中に析出しやすくなる。
When the molar fraction is smaller than 0.18, there is no effect of excess silicon component, and the excess bismuth component is incorporated into the crystal. Further, when the value exceeds 0.28, other solid phases containing more silicon tend to precipitate in the crystal.

従って0.18〜0.28の範囲であることが必要であ
る。
Therefore, it is necessary that it is in the range of 0.18 to 0.28.

本発明における融液から単結晶を育成する方法としては
、引上げ法2ブリンジマン法、帯溶融法。
Methods for growing single crystals from melt in the present invention include pulling method 2Bringeman method and zone melting method.

フローティングゾーン法などいずれの方法でもよい、し
かし、育成結晶の高品質化が達成し易い点から引上げ法
、帯溶融法、フローティングゾーン法が好ましい。
Any method such as the floating zone method may be used, but the pulling method, zone melting method, and floating zone method are preferable because it is easy to achieve high quality grown crystals.

本発明に用いる出発原料としては市販の99.99%純
度のBiJs 、SiO□でも良いができるだけ純度の
高い原料を使用するのが好ましい、フローティングゾー
ン法の場合には、それら出発原料粉末をBigOs  
:5iOt=6 : 1 (化学量論比組成)に混合し
、棒状に成形・焼結して原料棒とする。また、溶融帯の
融液組成を珪素成分過剰にするために、珪素成分過剰(
SiOz/ (Big03 + 5ift )モル分率
−〇、18〜0.28好ましくは0.25程度)のペレ
ント状の焼結体(好ましくは溶融帯と同程度の容積を持
つ)を用意し、あらかじめ種結晶上に置き、加熱して融
解させ溶融帯を形成してから育成を始める。
Commercially available 99.99% pure BiJs or SiO□ may be used as the starting raw material used in the present invention, but it is preferable to use a raw material with as high purity as possible.In the case of the floating zone method, these starting raw material powders are
:5iOt=6:1 (stoichiometric composition), formed into a rod shape and sintered to obtain a raw material rod. In addition, in order to make the melt composition in the molten zone excessive in silicon content,
A pellet-like sintered body (preferably having a volume comparable to that of the molten zone) of SiOz/ (Big03 + 5ift) molar fraction -〇, 18 to 0.28, preferably about 0.25) is prepared, and It is placed on a seed crystal, heated and melted to form a molten zone, and then growth begins.

本発明における結晶の成長速度は、0.1−15M/時
、好ましくは0.5〜4.0m/時である。育成雰囲気
は、酸素、窒素、空気のいずれでも可能である。
The crystal growth rate in the present invention is 0.1-15 m/hr, preferably 0.5-4.0 m/hr. The growth atmosphere can be oxygen, nitrogen, or air.

フローティングゾーン法では、アフターヒーターなどを
利用して、成長した結晶の象、冷による割れなどを防ぐ
事が好ましい。さらに、育成した結晶は約780〜82
0°Cで焼鈍する事が好ましい。
In the floating zone method, it is preferable to use an after-heater or the like to prevent crystal growth and cracking due to cold. Furthermore, the grown crystals were approximately 780 to 82
It is preferable to anneal at 0°C.

実施例 市販の高純度(99,9999%)BiJs とsto
w (純度99.99%)原料粉末を6:1のモル比で
混合し、1 ton/cm”の静水圧で棒状にラバープ
レス成形し、810°Cの酸素中で焼結し原料棒を作成
した。また、溶融帯の組成を珪素成分過剰にするために
、同様のプロセスで5ift/ (BizOt +Si
ng)モル分率0,26の組成をもった焼結ペレットを
用意した。次に、原料棒を回転楕円面鏡を用いた集光式
フローティングゾーン法単結晶製造装置に装填し、別に
準備した850種結晶を装填し、その種結晶上に焼結ペ
レットを置いた。雰囲気ガスとして窒素ガスを毎分2リ
ツトルの割合で流しながらランプ出力を上げて加熱し、
焼結ペレットを融解したところで原料棒と接合させ、安
定した溶融帯を形成した後、フローティングゾーン法の
常法に従って、結晶育成操作を行った。育成条件は、原
料棒及び種結晶の回転速度が逆方向にそれぞれ40回/
分、結晶成長速度は3mm/時であった。得られたBS
O単結晶を20時間約800 ’Cで焼鈍し、わずかに
黄色味を帯びた透明な結晶体を得た。
Example Commercially available high purity (99,9999%) BiJs and sto
w (Purity 99.99%) Raw material powders were mixed at a molar ratio of 6:1, rubber press molded into a rod shape under a hydrostatic pressure of 1 ton/cm'', and sintered in oxygen at 810°C to form a raw material rod. In addition, in order to make the composition of the molten zone excessive in silicon content, 5ift/(BizOt +Si
ng) Sintered pellets having a composition with a mole fraction of 0.26 were prepared. Next, the raw material rod was loaded into a condensing floating zone method single crystal manufacturing apparatus using a spheroidal mirror, 850 seed crystals prepared separately were loaded, and sintered pellets were placed on the seed crystals. Heat the lamp by increasing the lamp output while flowing nitrogen gas as an atmospheric gas at a rate of 2 liters per minute.
After the sintered pellets were melted and joined to the raw material rod to form a stable molten zone, a crystal growth operation was performed according to the conventional floating zone method. The growth conditions are such that the rotation speed of the raw material rod and the seed crystal is reversed 40 times each.
The crystal growth rate was 3 mm/hour. Obtained BS
The O single crystal was annealed at about 800'C for 20 hours to obtain a transparent crystal with a slight yellow tinge.

得られたBSO単結晶を光学的に評価したところ、従来
の引上げ法で育成したものよりも、390〜〜500 
nmの波長領域で著しく透過率が高くなっている事が判
明した。さらにコア領域とそれ以外の領域での光学特性
の差も、従来のBSO結晶よりもはるかに減少している
事が認められた。
When the obtained BSO single crystal was optically evaluated, it was found that the BSO single crystal had a crystallinity of 390 to 500
It was found that the transmittance was significantly higher in the nm wavelength region. Furthermore, the difference in optical properties between the core region and other regions was also found to be much smaller than in conventional BSO crystals.

発明の効果 本発明の方法によると、高い光透過率を有し、しかも光
学特性の均質で結晶内量のないBSO単結晶を容易に製
造することができる。
Effects of the Invention According to the method of the present invention, a BSO single crystal having high light transmittance, homogeneous optical properties, and no internal crystal content can be easily produced.

BSO単結晶の電気光学効果を利用したセンサーや画像
記憶素子を製作する場合に、従来の方法で育成した単結
晶では光学特性不均一や結晶内歪の存在で、信鯨性に問
題があった。しかし、本発明により、より高品位なりS
O単結晶育成が可能となり、優れた特性を有する素子が
容易に得られる。
When manufacturing sensors and image storage devices that utilize the electro-optic effect of BSO single crystals, single crystals grown using conventional methods have problems with reliability due to non-uniform optical properties and strain within the crystal. . However, with the present invention, higher quality and S
It becomes possible to grow an O single crystal, and a device with excellent characteristics can be easily obtained.

Claims (1)

【特許請求の範囲】 1)Bi_1_2SiO_2_0単結晶を融液から育成
する方法において、融液組成を珪素成分過剰なSiO_
2/(Bi_2O_3+SiO_2)のモル分率=0.
18〜0.28の範囲に保った融液から育成することを
特徴とするBi_1_2SiO_2_0単結晶の製造方
法。 2)融液から単結晶を育成する方法が、引上げ法、ブリ
ッジマン法、帯溶融法、フローティングゾーン法である
前記1)の製造方法。
[Claims] 1) In a method of growing a Bi_1_2SiO_2_0 single crystal from a melt, the composition of the melt is changed to SiO_2_0 with an excessive silicon content.
Molar fraction of 2/(Bi_2O_3+SiO_2)=0.
1. A method for producing a Bi_1_2SiO_2_0 single crystal, characterized in that it is grown from a melt kept in the range of 18 to 0.28. 2) The manufacturing method of 1) above, wherein the method for growing a single crystal from the melt is a pulling method, a Bridgman method, a zone melting method, or a floating zone method.
JP15399988A 1988-06-22 1988-06-22 Production of bi12sio20 single crystal Granted JPH01320296A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15399988A JPH01320296A (en) 1988-06-22 1988-06-22 Production of bi12sio20 single crystal

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15399988A JPH01320296A (en) 1988-06-22 1988-06-22 Production of bi12sio20 single crystal

Publications (2)

Publication Number Publication Date
JPH01320296A true JPH01320296A (en) 1989-12-26
JPH0521878B2 JPH0521878B2 (en) 1993-03-25

Family

ID=15574702

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15399988A Granted JPH01320296A (en) 1988-06-22 1988-06-22 Production of bi12sio20 single crystal

Country Status (1)

Country Link
JP (1) JPH01320296A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102351202A (en) * 2011-07-06 2012-02-15 陕西科技大学 Preparation method of bismuth silicate powder
CN104562205A (en) * 2015-01-28 2015-04-29 中国科学院上海硅酸盐研究所 Anion-cation co-doped bismuth silicate scintillation crystal and preparation method thereof
CN112342622A (en) * 2020-09-24 2021-02-09 彩虹集团(邵阳)特种玻璃有限公司 High-purity single-phase Bi12SiO20Method for producing polycrystal

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51120693A (en) * 1975-04-16 1976-10-22 Sumitomo Electric Ind Ltd Fablication method for photoconductive single-crystal
JPS5315299A (en) * 1976-07-28 1978-02-10 Sumitomo Electric Ind Ltd Liquid-phase epitaxial growth method of electrooptical crystals

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51120693A (en) * 1975-04-16 1976-10-22 Sumitomo Electric Ind Ltd Fablication method for photoconductive single-crystal
JPS5315299A (en) * 1976-07-28 1978-02-10 Sumitomo Electric Ind Ltd Liquid-phase epitaxial growth method of electrooptical crystals

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102351202A (en) * 2011-07-06 2012-02-15 陕西科技大学 Preparation method of bismuth silicate powder
CN104562205A (en) * 2015-01-28 2015-04-29 中国科学院上海硅酸盐研究所 Anion-cation co-doped bismuth silicate scintillation crystal and preparation method thereof
CN112342622A (en) * 2020-09-24 2021-02-09 彩虹集团(邵阳)特种玻璃有限公司 High-purity single-phase Bi12SiO20Method for producing polycrystal
CN112342622B (en) * 2020-09-24 2022-05-17 彩虹集团(邵阳)特种玻璃有限公司 High-purity single-phase Bi12SiO20Method for producing polycrystal

Also Published As

Publication number Publication date
JPH0521878B2 (en) 1993-03-25

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