JPH01218201A - Arbitrary waveform generator - Google Patents
Arbitrary waveform generatorInfo
- Publication number
- JPH01218201A JPH01218201A JP4367588A JP4367588A JPH01218201A JP H01218201 A JPH01218201 A JP H01218201A JP 4367588 A JP4367588 A JP 4367588A JP 4367588 A JP4367588 A JP 4367588A JP H01218201 A JPH01218201 A JP H01218201A
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- JP
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- Prior art keywords
- waveform
- data
- signal
- load
- memory
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- 230000005540 biological transmission Effects 0.000 claims description 30
- 238000004364 calculation method Methods 0.000 claims description 13
- 230000006870 function Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- CQZISUJEDPJJNF-UHFFFAOYSA-N ethonafide Chemical compound O=C1N(CCN(C)C)C(=O)C2=CC=CC3=C2C1=C1C=CC=CC1=C3OCC CQZISUJEDPJJNF-UHFFFAOYSA-N 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 230000006641 stabilisation Effects 0.000 description 2
- 238000011105 stabilization Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 1
- 239000000284 extract Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000001915 proofreading effect Effects 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
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Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は任意波形発生装置における出力波形の品位の改
善に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to improving the quality of an output waveform in an arbitrary waveform generator.
第３図に従来の任意波形発生器の構成例を示す。 FIG. 3 shows an example of the configuration of a conventional arbitrary waveform generator.
任意波形発生装置はオペレータが所望の波形データを予
め装置に入力し、その波形を装置から出力させ、シミュ
レーション等に使用するような装置である。An arbitrary waveform generator is a device in which an operator inputs desired waveform data into the device in advance, and outputs the waveform from the device for use in simulations and the like.
同図において波形メモリ５１には、所望の出力波形を形
成する振幅値が各アドレスに書込まれている。この波形
データはオペレータが図示していないコンピュータの助
けを借りて入力することができる。波形メモリ５１の内
容はコンピュータの制御により順次読みだされ、ＤＡ変
換器５２にてアナログ信号へ変換され、増幅器（以下Ａ
ＭＰと記す）５３で増幅される。そして、ＡＭＰ５３の
出力は可変減衰器（以下ＡＴＴと記す）５４にて所望の
出力レベルに合わされ、フィルタ５５を介して出力波形
が負荷５へ加えられる。In the figure, in the waveform memory 51, amplitude values forming a desired output waveform are written at each address. This waveform data can be input by an operator with the aid of a computer (not shown). The contents of the waveform memory 51 are sequentially read out under the control of the computer, converted into analog signals by the DA converter 52, and then sent to the amplifier (hereinafter referred to as A).
MP) 53. Then, the output of the AMP 53 is adjusted to a desired output level by a variable attenuator (hereinafter referred to as ATT) 54, and the output waveform is applied to the load 5 via a filter 55.
一般に、伝送系を介して信号を負荷へ加えた場合、出力
装置側（この場合、任意波形発生装置）の信号波形と、
負荷の受電端の波形とは異なってくる。伝送経路での信
号の歪みがあるからである。Generally, when a signal is applied to a load via a transmission system, the signal waveform on the output device side (in this case, the arbitrary waveform generator)
The waveform will be different from the waveform at the receiving end of the load. This is because there is signal distortion in the transmission path.
また、第３図の装置では、波形メモリ５１以降の梢成要
素、即ちＤＡ変換器５２とＡＭＰ５３とＡＴＴ５４とフ
ィルタ５５においても信号の歪みが発生している。従っ
て、負荷５へ出力したい所望の波形データを波形メモリ
５１へ格納しても、実際に負荷５へ加えられる波形は、
所望の波形と異なったものになる。Further, in the device shown in FIG. 3, signal distortion also occurs in the upper components after the waveform memory 51, that is, the DA converter 52, the AMP 53, the ATT 54, and the filter 55. Therefore, even if desired waveform data to be output to the load 5 is stored in the waveform memory 51, the waveform actually applied to the load 5 is
The waveform will be different from the desired one.
しかし第３図に示す従来の任意波形発生装置は、上述し
た伝送系や波形メモリ５１以降の回路素子（ＤＡ変換器
５２やＡ Ｍ Ｐ ５３等）によって生じる信号の歪み
を考慮しない構成であるため実際に負荷５へ加えられる
波形は、所望の波形と異なるという課題があった。However, the conventional arbitrary waveform generator shown in FIG. 3 has a configuration that does not take into account signal distortion caused by the above-mentioned transmission system and circuit elements after the waveform memory 51 (DA converter 52, AMP 53, etc.). There was a problem that the waveform actually applied to the load 5 was different from the desired waveform.
本発明の目的は、伝送系や波形メモリ５１以降の回路素
子による信号の歪みを校正し、所望の波形を負荷へ加え
ることができる任意波形発生装置を提供することである
。An object of the present invention is to provide an arbitrary waveform generator that can calibrate signal distortion caused by the transmission system and circuit elements after the waveform memory 51 and apply a desired waveform to a load.
本発明は、上記課題を解決するために
波形を形成する振幅データが書込まれる第１の波形メモ
リ（２）と、
この第１の波形メモリの内容を読み出しこれをアナログ
信号へ変換し、第１の伝送系（４）を介して負荷へアナ
ログ波形を加える発生部（３）と、伝達特性が既知であ
る第２の伝送系（６）を介して前記負荷の受電端のアナ
ログ波形を検出しこれをデジタル信号へ変換して出力す
る検出器と、この検出器の出力信号と後述する第２の波
形メモリからの信号を導入し、これの差を演算する比較
器と、
前記負荷の受電端へ、負荷へ加えたい所望の波形を加え
た場合に、第２の伝送系（６）を介して検出器（７）、
から比較器（８）へ出力される波形のデータを演算する
データ校正部（１１）と、このデータ校正部からの波形
データが書込まれる第２の波形メモリ（９）と、
比較器の出力が０となるように前記第１の波形メモリ（
２）の内容を書換える校正用データ演算部（１０）と、
を備えるようにしたものである。In order to solve the above problems, the present invention provides a first waveform memory (2) into which amplitude data forming a waveform is written, a first waveform memory (2) that reads the contents of the first waveform memory, converts it into an analog signal, A generator (3) that applies an analog waveform to the load via the first transmission system (4), and detects the analog waveform at the receiving end of the load via a second transmission system (6) whose transfer characteristics are known. and a detector that converts this into a digital signal and outputs it, a comparator that introduces the output signal of this detector and a signal from a second waveform memory described later and calculates the difference between them, and a power receiving unit for the load. When the desired waveform to be applied to the load is applied to the end, the detector (7) is transmitted via the second transmission system (6),
A data calibration unit (11) that calculates waveform data output from the data calibration unit to the comparator (8), a second waveform memory (9) into which the waveform data from this data calibration unit is written, and the output of the comparator. The first waveform memory (
2); and a calibration data calculation unit (10) for rewriting the contents of 2).
本願の装置は、負荷の受電端の波形を検出し、この検出
波形と“校正波形”との差をとり、この差がＯとなるよ
うに制御している。一般に負荷の受電端の波形と検出波
形とは異なる。それは第２の伝送系や検出器で検出波形
は歪みを受けるからである０本発明は、伝達特性が既知
である第２の伝送系や検出器における歪みをも考慮して
前記“校正波形”を予め演算し、この“校正波形”と検
出波形との差が０となるように制御しているので目的の
波形と非常に一致度の高い波形を負荷へ加えることがで
きる。The device of the present invention detects the waveform at the power receiving end of the load, calculates the difference between this detected waveform and a "calibration waveform," and performs control so that this difference becomes O. Generally, the waveform at the receiving end of the load and the detected waveform are different. This is because the detected waveform is subject to distortion in the second transmission system and detector.0 The present invention takes into account the distortion in the second transmission system and detector whose transfer characteristics are known, and calculates the "calibration waveform". is calculated in advance and controlled so that the difference between this "calibration waveform" and the detected waveform becomes 0, so a waveform that closely matches the target waveform can be applied to the load.
以下、図面を用いて本発明の詳細な説明する。 Hereinafter, the present invention will be explained in detail using the drawings.
第１図は本発明に係る任意波形発生装置の一実施例を示
す図、第２図は第１図装置の各部の信号のタイムチャー
トである。FIG. 1 is a diagram showing an embodiment of an arbitrary waveform generator according to the present invention, and FIG. 2 is a time chart of signals of various parts of the device shown in FIG.
第１図において、１はコンピュータであり、第１図装置
の全体を制御するとともに、本発明の特徴とする動作も
制御する。なお、後述するデータ校正部１１及び校正用
データ演算部１０は、このコンピュータ１における演算
機能で置換えることができる。In FIG. 1, reference numeral 1 denotes a computer, which controls the entire apparatus of FIG. 1 and also controls the operations characteristic of the present invention. Note that the data proofing section 11 and the proofreading data calculation section 10, which will be described later, can be replaced with the calculation functions of this computer 1.
２は第１の波形メモリであり、波形を形成する振幅デー
タが書込まれている。この振幅データはコンピュータ１
の助けを借りてオペレータが入力するが、この第１の波
形メモリ２の内容は後述する校正用データ演算ｇｉｏの
面きにより修正される。2 is a first waveform memory in which amplitude data forming a waveform is written. This amplitude data is
The contents of the first waveform memory 2 are inputted by the operator with the help of the following, and the contents of the first waveform memory 2 are corrected by the calibration data calculation process described later.
３は発生部であり、第１の波形メモリ２の内容を読み出
しこれをアナログ信号へ変換し、第１の伝送系４を介し
て負荷５ヘアナログ波形を加えるものである。この発生
部３の校正は特に限定しないが、第１図では波形メモリ
２からの信号をアナログへ変換するＤＡ変換器３１と、
このＤＡ変換器３１の出力を増幅する増幅器３２と、こ
の増幅器３２の出力レベルを調整するＡ Ｔ Ｔ ３３
と、このＡ Ｔ Ｔ ３３の出力の不要な成分を除去す
るフィルタとから構成した例で示した。Reference numeral 3 denotes a generation section which reads the contents of the first waveform memory 2, converts it into an analog signal, and applies the analog waveform to the load 5 via the first transmission system 4. Although the calibration of this generator 3 is not particularly limited, in FIG.
An amplifier 32 that amplifies the output of this DA converter 31, and an AT T 33 that adjusts the output level of this amplifier 32.
and a filter for removing unnecessary components of the output of this AT T 33.
４は第１の伝送系であり、この伝送系を介して本願発明
の出力波形が負荷５に加えられる。4 is a first transmission system, and the output waveform of the present invention is applied to the load 5 via this transmission system.
６は第２の伝送系であり、負荷５の受電端の信号を取出
し、次段の検出器７へ伝達するものである。この第２の
伝送系６は例えば同軸ライン等で構成でき、本発明にお
いては第２の伝送系６として予め伝達特性が既知のもの
を使用することが条件である。Reference numeral 6 denotes a second transmission system, which extracts a signal from the power receiving end of the load 5 and transmits it to the detector 7 at the next stage. This second transmission system 6 can be constructed of, for example, a coaxial line, and in the present invention, it is a condition that the second transmission system 6 is used as the second transmission system 6 whose transfer characteristics are known in advance.
７は検出器であり、第２の伝送系６を介して負荷５の受
電端のアナログ波形を検出しこれをデジタル信号へ変換
するものである。なお、コンピュータ１はこの検出器７
の伝達特性を予め知ることができ、この検出器７の伝達
特性データと第２の伝達系６の伝達特性データとを用い
て後述する“校正波形”を作成することができる。A detector 7 detects an analog waveform at the receiving end of the load 5 via the second transmission system 6 and converts it into a digital signal. Note that the computer 1 uses this detector 7
The transfer characteristic of the detector 7 can be known in advance, and a "calibration waveform" to be described later can be created using the transfer characteristic data of the detector 7 and the transfer characteristic data of the second transfer system 6.
８は比較器であり、検出器７の出力信号と後述する第２
の波形メモリからの信号を導入し、これの差を演算する
ものである。8 is a comparator, which compares the output signal of the detector 7 with a second
The signal from the waveform memory is introduced and the difference between these signals is calculated.
９は第２の波形メモリであり、次に説明するような”校
正波形”のデータが各アドレスに書込まれている。負荷
５へ所望の波形（任意波形発生装置から負荷５へ実際に
加えたい波形）が加わったと仮定すると、受電端Ｐ１と
第２の伝送系６を介して検出器７へ前記所望の波形が伝
達される。しかし、検出器７へ伝達された波形は既に第
２の伝送系６により歪みを受け、所望の波形と異なって
いる。更に、検出器７でデジタル変換された波形データ
は、この検出器７でも歪みを受は受電端Ｐ１における所
望の波形と大部具なってしまう、このように受電端Ｐ１
へ所望の波形を加えた場合に、第２の伝送系６を介して
検出器７から比較器８へ出力される波形のことを本明細
書では“校正波形”という。Reference numeral 9 denotes a second waveform memory, in which "calibration waveform" data as described below is written at each address. Assuming that a desired waveform (a waveform that is actually desired to be applied to the load 5 from the arbitrary waveform generator) is applied to the load 5, the desired waveform is transmitted to the detector 7 via the power receiving end P1 and the second transmission system 6. be done. However, the waveform transmitted to the detector 7 has already been distorted by the second transmission system 6 and is different from the desired waveform. Furthermore, the waveform data digitally converted by the detector 7 is also distorted by the detector 7, and the desired waveform at the power receiving end P1 is almost identical to the desired waveform at the power receiving end P1.
In this specification, the waveform that is output from the detector 7 to the comparator 8 via the second transmission system 6 when a desired waveform is added to is referred to as a "calibration waveform".
この“校正波形”データは、データ校正部１１で演算す
ることができる。このデータ校正部１１は独立した演算
装置でも良いし、又はコンピュータ１内における演算機
能で置換えても良い、ここではコンピュータ１の演算機
能として説明する０本発明では、第２の伝送系６と検出
器７に伝達特性が既知のものを使用しており、負荷５へ
与える所望の波形データも既知であるから、受電端Ｐ１
へこの所望の波形を加えたときの検出器７の出力データ
、即ち、“校正波形”のデータはコンピュータｌのデー
タ校正部１１を用いて算出できる。This "calibration waveform" data can be calculated by the data calibration section 11. This data proofing section 11 may be an independent arithmetic device, or may be replaced with an arithmetic function within the computer 1.Here, it will be explained as an arithmetic function of the computer 1.In the present invention, the second transmission system 6 and the detection Since the transfer characteristic of the device 7 is known and the desired waveform data to be applied to the load 5 is also known, the receiving end P1
The output data of the detector 7 when the desired waveform is added thereto, that is, the "calibration waveform" data can be calculated using the data calibration section 11 of the computer 1.
１０は校正用データ演算部であり、この部分は独立した
演算機能素子で構成して良いし、又はコンピュータ１に
おける演算機能で兼用しても良い。Reference numeral 10 denotes a data calculation section for calibration, and this section may be constituted by an independent calculation function element, or may also be used as a calculation function in the computer 1.
この校正用データ演算部１０は、第１の波形メモリ２か
らデータを読み出し、比較器８の出力信号がＯとなるよ
うに（“校正波形”と検出波形が等しくなるように）、
第１の波形メモリ２から読みだした波形データに校正演
算を加え、その校正した波形データを第１の波形メモリ
２の元のアドレスへ書込むものである。This calibration data calculation unit 10 reads data from the first waveform memory 2, so that the output signal of the comparator 8 becomes O (so that the "calibration waveform" and the detected waveform are equal).
A calibration operation is added to the waveform data read from the first waveform memory 2, and the calibrated waveform data is written to the original address of the first waveform memory 2.
以上のように構成された第１図装置の動作を第２図を参
照しながら説明する。第２図の各波形図で横軸は時間（
ただしく４）図はアドレス）、縦軸は振幅を表わす。The operation of the apparatus shown in FIG. 1 constructed as above will be explained with reference to FIG. 2. In each waveform diagram in Figure 2, the horizontal axis is time (
4) The figure shows the address), and the vertical axis shows the amplitude.
発明を分り易くするため、ここでは発生部３での波形歪
みはないものと仮定して説明する。また本発明の装置は
、検出器７と比較器８と校正用データ演算部１０等から
の帰還ループが設けられており、負荷へ加えられる波形
が安定する前と、安定後に分けて説明する方が分り易い
ので、第２図では（Ａ）として安定前、（Ｂ）として安
定後に分けて記載した。In order to make the invention easier to understand, the explanation will be given here assuming that there is no waveform distortion in the generator 3. Furthermore, the device of the present invention is provided with a feedback loop from the detector 7, the comparator 8, the calibration data calculation unit 10, etc., and will be explained separately before and after the waveform applied to the load is stabilized. To make it easier to understand, in FIG. 2, (A) is shown before stabilization, and (B) is shown after stabilization.
オペレータは、第２図（１）のような波形を負荷５に加
えたいため、第２図（１）の波形データを第１の波形メ
モリ２に入力し、その結果、第２図（υの波形が発生部
３から出力される。この第２図（１）の波形は、第１の
伝送系４にて歪み（第２図の例では高周波領域の成分が
減衰）、負荷５の受電端Ｐ１では第２図（２）のように
変形し、所望の波形（第２図（１））とは異なってしま
う、なお、この■の波形は時間漏れもともなっている。The operator wants to add the waveform shown in Fig. 2 (1) to the load 5, so he inputs the waveform data shown in Fig. 2 (1) into the first waveform memory 2, and as a result, the waveform data shown in Fig. 2 (υ A waveform is output from the generator 3.The waveform shown in FIG. 2(1) is distorted in the first transmission system 4 (in the example of FIG. At P1, the waveform is deformed as shown in FIG. 2 (2) and differs from the desired waveform (FIG. 2 (1)). Note that this waveform (■) also has a time leak.
この受電端Ｐ１の波形（第２図（１））は、第２の伝送
系６を介してコンピュータ２で制御されるサンプリング
周期で検出器７に取込まれる。そしてここでデジタル値
へ変換され第２図（３）のようなデータとなる。The waveform of this power receiving end P1 (FIG. 2 (1)) is taken into the detector 7 via the second transmission system 6 at a sampling period controlled by the computer 2. Then, it is converted into a digital value and becomes data as shown in FIG. 2 (3).
なお、第２図（３）は検出器７のデジタルデータ出力を
アナログ的に表現したものである。Note that FIG. 2(3) is an analog representation of the digital data output of the detector 7.
一方、第２の波形メモリ９には、上述した“校正波形”
が予め格納されている。この“校正波形”は、負荷５の
受電端Ｐ１へ所望の波形〈第２図では（１）の波形）を
加えた時の検出器７の出力波形であるから、第２図（４
）のような波形である。“校正波形”のデータは第２の
伝送系６と検出器７の既知の伝達特性を用い、データ校
正部１１（又はコンピュータ１自身）で演算することが
できる。On the other hand, the second waveform memory 9 stores the above-mentioned "calibration waveform".
is stored in advance. This "calibration waveform" is the output waveform of the detector 7 when a desired waveform (waveform (1) in FIG. 2) is applied to the power receiving end P1 of the load 5, so it is
) is the waveform. The "calibration waveform" data can be calculated by the data calibration unit 11 (or the computer 1 itself) using the known transfer characteristics of the second transmission system 6 and the detector 7.
この第２図（４）の校正波形データは、コンピュータ１
の制御により読みだされ比較器８に加えられる。なお、
コンピュータ１は第２の伝送系６と検出器７の伝達特性
を把握しているので第２図（３）の波形の位相タイミン
グを知ることができる。従って、第２図（３）の波形の
位相に応じた第２図（４）の校正波形の位相、即ち、第
２図（３）と（４）の２つの波形の比較すべき位相を一
致させるように第２の波形メモリ９から適切なタイミン
グで校正波形データを読み出し比較器８へ加えることが
できる。The calibration waveform data in FIG. 2 (4) is
is read out and added to the comparator 8 under the control of. In addition,
Since the computer 1 knows the transfer characteristics of the second transmission system 6 and the detector 7, it can know the phase timing of the waveform shown in FIG. 2(3). Therefore, the phase of the calibration waveform in FIG. 2 (4) corresponding to the phase of the waveform in FIG. 2 (3), that is, the phase to be compared between the two waveforms in FIG. The calibration waveform data can be read out from the second waveform memory 9 at appropriate timing and applied to the comparator 8 so as to make the adjustment.
動作が安定する前は、比較器８からは大きな誤差信号が
校正用データ演算部１０へ出力される。そして誤差信号
が０となるように校正用データ演算部１０は、第１の波
形メモリ２の内容を修正し、成る動作時間後において発
生部３の出力波形は第２図（５）のようになり、比較器
８から出力される誤差信号はＯとなる。このとき負荷５
の受電端波形は第２図（６）のように、所望の波形と一
致する。Before the operation becomes stable, the comparator 8 outputs a large error signal to the calibration data calculation section 10. Then, the calibration data calculation section 10 modifies the contents of the first waveform memory 2 so that the error signal becomes 0, and after the corresponding operating time, the output waveform of the generation section 3 becomes as shown in FIG. 2 (5). Therefore, the error signal output from the comparator 8 becomes O. At this time, load 5
The receiving end waveform matches the desired waveform as shown in FIG. 2 (6).
上述では発生部３での歪みを０として説明したが、発生
部３にて歪みがあっても、これらは第１図の制御ループ
内に含まれるので、この発生部３の歪みも本発明では消
去される。In the above explanation, the distortion in the generator 3 is assumed to be 0, but even if there is distortion in the generator 3, it is included in the control loop of FIG. 1, so the distortion in the generator 3 is also included in the present invention. will be deleted.
以上述べたように本発明によれば所望の波形と一致した
実波形を負荷に加えることができる。As described above, according to the present invention, an actual waveform that matches a desired waveform can be applied to the load.
第１図は本発明に係る任意波形発生装置の一実施例を示
す図、第２図は第１図装置の各部の信号のタイムチャー
ト、第３図は従来例を示す図である。
１・・・コンピュータ、２・・・第１の波形メモリ、３
・・・発生部、４・・・第１の伝送系、６・・・第２の
伝送系、７・・・検出器、８・・・比較器、９・・・第
２の波形メモリ、１０・・・校正用データ演算部、１１
・・・データ校正部、ズリＪ 図FIG. 1 is a diagram showing an embodiment of an arbitrary waveform generator according to the present invention, FIG. 2 is a time chart of signals of various parts of the device shown in FIG. 1, and FIG. 3 is a diagram showing a conventional example. 1... Computer, 2... First waveform memory, 3
... Generator, 4... First transmission system, 6... Second transmission system, 7... Detector, 8... Comparator, 9... Second waveform memory, 10... Calibration data calculation section, 11
・・・Data calibration department, misalignment J figure
Claims (1)
リ（２）と、 この第１の波形メモリの内容を読み出しこれをアナログ
信号へ変換し、第１の伝送系（４）を介して負荷へアナ
ログ波形を加える発生部（３）と、伝達特性が既知であ
る第２の伝送系（６）を介して前記負荷の受電端のアナ
ログ波形を検出しこれをデジタル信号へ変換して出力す
る検出器と、この検出器の出力信号と後述する第２の波
形メモリからの信号を導入し、これの差を演算する比較
器と、 前記負荷の受電端へ、負荷へ加えたい所望の波形を加え
た場合に、第２の伝送系（６）を介して検出器（７）か
ら比較器（８）へ出力される波形のデータを演算するデ
ータ校正部（１１）と、このデータ校正部からの波形デ
ータが書込まれる第２の波形メモリ（９）と、 比較器の出力が０となるように前記第１の波形メモリ（
２）の内容を書換える校正用データ演算部（１０）と、 を備えたことを特徴とする任意波形発生装置。[Claims] A first waveform memory (2) in which amplitude data forming a waveform is written, and a first transmission system (2) that reads the contents of the first waveform memory and converts it into an analog signal. A generator (3) that applies an analog waveform to the load via a generator (3) and a second transmission system (6) whose transfer characteristics are known detects the analog waveform at the receiving end of the load and converts it into a digital signal. a detector that converts and outputs the output signal, a comparator that introduces the output signal of this detector and a signal from a second waveform memory (described later) and calculates the difference between them; a data calibration unit (11) that calculates waveform data output from the detector (7) to the comparator (8) via the second transmission system (6) when a desired waveform is added; , a second waveform memory (9) into which the waveform data from this data calibration section is written, and a second waveform memory (9) in which the output of the comparator is 0.
An arbitrary waveform generator comprising: a calibration data calculation unit (10) for rewriting the contents of 2);
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4367588A JPH01218201A (en) | 1988-02-26 | 1988-02-26 | Arbitrary waveform generator |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4367588A JPH01218201A (en) | 1988-02-26 | 1988-02-26 | Arbitrary waveform generator |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH01218201A true JPH01218201A (en) | 1989-08-31 |
Family
ID=12670415
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4367588A Pending JPH01218201A (en) | 1988-02-26 | 1988-02-26 | Arbitrary waveform generator |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH01218201A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0451831A2 (en) * | 1990-04-13 | 1991-10-16 | Advantest Corporation | Low-distorted waveform generating method and waveform generator using the same |
| WO2008149675A1 (en) * | 2007-06-05 | 2008-12-11 | Advantest Corporation | Waveform generation device, waveform generation method, and program |
-
1988
- 1988-02-26 JP JP4367588A patent/JPH01218201A/en active Pending
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0451831A2 (en) * | 1990-04-13 | 1991-10-16 | Advantest Corporation | Low-distorted waveform generating method and waveform generator using the same |
| EP0451831A3 (en) * | 1990-04-13 | 1992-11-19 | Advantest Corporation | Low-distorted waveform generating method and waveform generator using the same |
| WO2008149675A1 (en) * | 2007-06-05 | 2008-12-11 | Advantest Corporation | Waveform generation device, waveform generation method, and program |
| US7999578B2 (en) | 2007-06-05 | 2011-08-16 | Advantest Corporation | Waveform generation device, waveform generation method, and computer readable medium |
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