JPH0121585B2 - - Google Patents

Info

Publication number: JPH0121585B2
Authority: JP; Japan
Prior art keywords: charged particle; magnetic field; magnet; particle; spectrograph
Prior art date: 1979-02-03
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired

Application number

JP54010990A

Other languages

English (en)

Japanese (ja)

Other versions

JPS55104060A (en

Inventor

Hidetsugu Ikegami

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Individual

Original Assignee

Individual

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1979-02-03

Filing date

1979-02-03

Publication date

1989-04-21

1979-02-03 Application filed by Individual filed Critical Individual

1979-02-03 Priority to JP1099079A priority Critical patent/JPS55104060A/ja

1980-08-09 Publication of JPS55104060A publication Critical patent/JPS55104060A/ja

1989-04-21 Publication of JPH0121585B2 publication Critical patent/JPH0121585B2/ja

Status Granted legal-status Critical Current

Links

239000002245 particle Substances 0.000 claims description 109
239000006185 dispersion Substances 0.000 claims description 28
230000003287 optical effect Effects 0.000 claims description 14
238000009434 installation Methods 0.000 claims description 5
238000001514 detection method Methods 0.000 description 27
230000000694 effects Effects 0.000 description 9
238000003384 imaging method Methods 0.000 description 8
238000000034 method Methods 0.000 description 5
238000001228 spectrum Methods 0.000 description 5
230000000052 comparative effect Effects 0.000 description 3
239000000839 emulsion Substances 0.000 description 3
230000004075 alteration Effects 0.000 description 2
230000005684 electric field Effects 0.000 description 2
230000015572 biosynthetic process Effects 0.000 description 1
238000005259 measurement Methods 0.000 description 1
230000005405 multipole Effects 0.000 description 1
239000007787 solid Substances 0.000 description 1

Landscapes

Measurement Of Radiation (AREA)
Electron Tubes For Measurement (AREA)

JP1099079A 1979-02-03 1979-02-03 Charged particle analyzer Granted JPS55104060A (en)

Priority Applications (1)

Application Number	Priority Date	Filing Date	Title
JP1099079A JPS55104060A (en)	1979-02-03	1979-02-03	Charged particle analyzer

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
JP1099079A JPS55104060A (en)	1979-02-03	1979-02-03	Charged particle analyzer

Publications (2)

Publication Number	Publication Date
JPS55104060A JPS55104060A (en)	1980-08-09
JPH0121585B2 true JPH0121585B2 (ru)	1989-04-21

Family

ID=11765576

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
JP1099079A Granted JPS55104060A (en)	1979-02-03	1979-02-03	Charged particle analyzer

Country Status (1)

Country	Link
JP (1)	JPS55104060A (ru)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS57174843A (en) *	1981-04-20	1982-10-27	Hidetsugu Ikegami	Ion analysis device for momentum and mass with high resolusion

Citations (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS5225697A (en) *	1975-08-21	1977-02-25	Hidetsugu Ikegami	Apparatus for varying of dispersion power in corpuscular beam optical systems

1979
- 1979-02-03 JP JP1099079A patent/JPS55104060A/ja active Granted

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS5225697A (en) *	1975-08-21	1977-02-25	Hidetsugu Ikegami	Apparatus for varying of dispersion power in corpuscular beam optical systems

Also Published As

Publication number	Publication date
JPS55104060A (en)	1980-08-09

Similar Documents

Publication	Publication Date	Title
US5449914A (en)	1995-09-12	Imaging electron energy filter
US3445650A (en)	1969-05-20	Double focussing mass spectrometer including a wedge-shaped magnetic sector field
Borggreen et al.	1963	A proposed spectrograph for heavy particles
JP7029494B2 (ja)	2022-03-03	分光およびイメージングシステム、並びに、試料の特性評価の方法
JPH05205687A (ja)	1993-08-13	鏡補正器を有する、荷電素粒子ビーム用結像系
JP2015511055A (ja)	2015-04-13	粒子分光計のための分析装置
US4760261A (en)	1988-07-26	Alpha-type electron energy filter
JP3266286B2 (ja)	2002-03-18	荷電粒子エネルギー分析器
JPH05314938A (ja)	1993-11-26	電子ビーム装置
JPH0352180B2 (ru)	1991-08-09
US3622781A (en)	1971-11-23	Mass spectrograph with double focusing
US20110069862A1 (en)	2011-03-24	Electromagnetic Imaging Analyser
JPH0354831B2 (ru)	1991-08-21
US3761707A (en)	1973-09-25	Stigmatically imaging double focusing mass spectrometer
JPH0121585B2 (ru)	1989-04-21
JP3400284B2 (ja)	2003-04-28	オメガ型エネルギーフィルタ及び該フィルタを組み込んだ電子顕微鏡
WO2019216348A1 (ja)	2019-11-14	減速比可変球面収差補正静電レンズ、広角エネルギーアナライザ、及び、二次元電子分光装置
US3084249A (en)	1963-04-02	Magnetic spectrometer with a focusing lens system prior to the energy separation means
JPH11260312A (ja)	1999-09-24	オメガ型エネルギーフィルタ
JP6104756B2 (ja)	2017-03-29	電子分光装置
US3213276A (en)	1965-10-19	Magnetic analyzing system for a mass spectrometer having bi-directional focusing
US4942298A (en)	1990-07-17	Electron spectrometer
JPH0812773B2 (ja)	1996-02-07	同時検出型質量分析装置
JP5815826B2 (ja)	2015-11-17	粒子分光計のための分析装置
JP2956706B2 (ja)	1999-10-04	質量分析装置