JPH01165907A - Method for measuring distortion of reflected image - Google Patents
Method for measuring distortion of reflected imageInfo
- Publication number
- JPH01165907A JPH01165907A JP32271087A JP32271087A JPH01165907A JP H01165907 A JPH01165907 A JP H01165907A JP 32271087 A JP32271087 A JP 32271087A JP 32271087 A JP32271087 A JP 32271087A JP H01165907 A JPH01165907 A JP H01165907A
- Authority
- JP
- Japan
- Prior art keywords
- reflected image
- image
- distortion
- pattern
- reflected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims description 12
- 238000012545 processing Methods 0.000 claims abstract description 7
- 238000005259 measurement Methods 0.000 claims abstract description 5
- 239000011521 glass Substances 0.000 claims description 4
- 230000008602 contraction Effects 0.000 abstract 1
- 241000270281 Coluber constrictor Species 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- OQZCSNDVOWYALR-UHFFFAOYSA-N flurochloridone Chemical compound FC(F)(F)C1=CC=CC(N2C(C(Cl)C(CCl)C2)=O)=C1 OQZCSNDVOWYALR-UHFFFAOYSA-N 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 238000003908 quality control method Methods 0.000 description 1
- 238000013441 quality evaluation Methods 0.000 description 1
- 238000011002 quantification Methods 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
- 238000011179 visual inspection Methods 0.000 description 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
Abstract
Description
【発明の詳細な説明】 ［産業上の利用分野コ 本発明は反射像歪測定方法に関するものである。[Detailed description of the invention] [Industrial application fields] The present invention relates to a method for measuring reflection image distortion.
［従来の技術］
従来、ガラス反射像歪の評価には、景色・屋内照明灯・
格子パターンボート等に対し、適当な距離・角度にガラ
スを位置し、目視あるいは写真撮影により歪量の大小・
分布等を定性的に判定していた。しかし、この方法ては
反射像歪の大小が距離・角度て変化したり、判定の着目
点が、判定者によって異なる等、定量的判定かてきなか
った。[Conventional technology] Traditionally, glass reflection image distortion has been evaluated using scenery, indoor lighting,
Position the glass at an appropriate distance and angle to a grid pattern boat, etc., and check the amount of distortion by visual inspection or by taking a photograph.
The distribution etc. were determined qualitatively. However, this method does not allow for quantitative determination, as the magnitude of reflected image distortion changes with distance and angle, and the point of focus for determination differs depending on the judge.
［発明が解決しようとする問題点］
本発明は前述の目視による定性的判定を定量化し、自動
測定する事を目的とするものである。[Problems to be Solved by the Invention] The present invention aims to quantify and automatically measure the above-mentioned visual qualitative judgment.
［問題点を解決するだめの手段む
本発明は前述の問題を解決すべくなされたものてあり、
カラス等の鏡面を有する物体表面における周囲、景色の
反射像歪の測定方法において、景色に代えて直線格子パ
ターンを使用し、鏡面物体・格子パターン・観測点の相
互位置を一定に保った状態てその表面反射格子像の曲率
を求め、反射像歪の有無・大小・分布を測定することを
特徴とする反射像歪測定方法を提供するものである。[Means for Solving the Problems The present invention has been made to solve the above-mentioned problems,
In a method for measuring the distortion of the reflected image of the surroundings and scenery on the surface of a mirrored object such as a crow, a linear grid pattern is used instead of the scenery, and the mutual positions of the mirrored object, grid pattern, and observation point are kept constant. A method for measuring reflection image distortion is provided, which is characterized by determining the curvature of the surface reflection grating image and measuring the presence/absence, magnitude, and distribution of reflection image distortion.
以下、本発明を実施例に従って説明する。第１図は本発
明の基本構成であり、ｌは鏡面を有する例えばガラスの
ような物体、２はスクリーン、３はレーザースキャナー
、４はビデオカメラ、５は画像処理装置、６はホストコ
ンピュータ、７はデイスプレィ、８はプリンター、９は
キーボード、１０は鏡面物体支持台を示している。Hereinafter, the present invention will be explained according to examples. FIG. 1 shows the basic configuration of the present invention, where l is an object such as glass having a mirror surface, 2 is a screen, 3 is a laser scanner, 4 is a video camera, 5 is an image processing device, 6 is a host computer, and 7 8 is a display, 8 is a printer, 9 is a keyboard, and 10 is a mirror object support stand.
第２図は鏡面物体ｌ、スクリーン２、レーサースキャナ
３、カメラ４の位置関係を示している。鏡面物体１の中
心部分の面法線１１とスクリーン２をほぼ直交させ、か
つ、スクリーン２の中心付近の開口部に置かれたカメラ
４の光軸と面法線１１をほぼ一致させる。鏡面物体１と
スクリーン２・カメラ４との距離を所定の距離例えば２
ｍとする。レーザースキャナ３はスクリーン２に格子パ
ターンを歪なく投影てきる位置に置く。FIG. 2 shows the positional relationship among the mirror object 1, the screen 2, the racer scanner 3, and the camera 4. A surface normal 11 at the center of a mirror object 1 and a screen 2 are made substantially orthogonal, and an optical axis of a camera 4 placed in an opening near the center of the screen 2 is made to substantially coincide with the surface normal 11. Set the distance between the mirror object 1 and the screen 2/camera 4 to a predetermined distance, for example 2.
Let it be m. The laser scanner 3 is placed at a position where it can project the grid pattern onto the screen 2 without distortion.
次に測定方法について説明する。スキャナー３によりス
クリーン２上へ直線格子パターン１１を投影する。投影
パターンは鏡面物体１により反射され、反射像かビデオ
カメラ４によって撮像される。撮像された反射像は、画
像処理装置５てＳ／Ｎ比の改善、線巾の縮小等の画像処
理か行われた後、線の中心部の位置データかホストコン
ピュータ６へ送られ反射像各部の曲率が計算される。計
算された曲率は、デイスプレィ７、プリンター８に出力
される。キーボード９は、これら一連の測定の開始や測
定条件の入力等を行う為に用いられる。Next, the measurement method will be explained. A linear grating pattern 11 is projected onto a screen 2 by a scanner 3. The projected pattern is reflected by the specular object 1, and the reflected image is captured by the video camera 4. The captured reflection image undergoes image processing such as improving the S/N ratio and reducing the line width in the image processing device 5, and then the position data of the center of the line is sent to the host computer 6 and each part of the reflection image is processed. The curvature of is calculated. The calculated curvature is output to the display 7 and printer 8. The keyboard 9 is used to start a series of measurements, input measurement conditions, and the like.
本発明において格子パターン１１の発生方法は、上記実
施例の他にスクリーン２とレーザースキャナ３に代えて
パターンを直接、ボード上に描いたものを用いても良い
。あるいはボード」−に発光素子、光ファイバーを配列
させたもの又はＣＲ７表示管でも良い。また、レーザー
スキャナ３に代えて、スライドプロジェクタ−１ＯＨＰ
等によりパターンを順次投影しても良く、パターンを描
くものとして、スライド、フィルムの他に液晶素子を用
いることも可能である。In the present invention, the grid pattern 11 may be generated by directly drawing the pattern on a board instead of using the screen 2 and the laser scanner 3, in addition to the above embodiments. Alternatively, it may be a board in which light emitting elements and optical fibers are arranged, or a CR7 display tube. Also, in place of the laser scanner 3, a slide projector-1 OHP
The pattern may be sequentially projected using a method such as a slide or film, and a liquid crystal element may be used in addition to a slide or film to draw the pattern.
更に、また、用いるパターンは直線に限らず、画像処理
上都合のよいものであれば、パターンの一部を塗りつぶ
した市松模様やドツト等でも良い。画像の入力方法につ
いてはビデオカメラ４に代えて写真機を用い、フィルム
又は印画紙上の像について、ドラムスキャナー等により
像をデジタイズして画像データを作成するようにしても
良い。Furthermore, the pattern to be used is not limited to straight lines, but may be a checkerboard pattern, dots, etc. in which part of the pattern is filled in, as long as it is convenient for image processing. As for the image input method, a camera may be used instead of the video camera 4, and image data may be created by digitizing the image on film or photographic paper using a drum scanner or the like.
さらに、レーサースキャナ３をスクリーン２に投影せず
、鏡面物体ｌへ投影し、その反射光をスクリーン２へ受
けて、スクリーン２上の像を撮像する方法を用いても良
い。Furthermore, a method may be used in which the racer scanner 3 is not projected onto the screen 2, but is projected onto a mirror surface object l, the reflected light is received by the screen 2, and the image on the screen 2 is captured.
なお、鏡面物体１の鏡面か予め所定の形状を持っており
、反射像がこの鏡面物体の形状により生ずる固有の歪と
格子パターンの反射像歪とか重複しているときは、計測
された曲率から前記の固有の歪に起因する曲率を差し引
くことにより、鏡面物体の反射像歪を測定することかで
きる。In addition, if the mirror surface of the mirror object 1 has a predetermined shape and the reflected image overlaps with the inherent distortion caused by the shape of the mirror object and the reflected image distortion of the lattice pattern, the measured curvature By subtracting the curvature due to the above-mentioned inherent distortion, the reflected image distortion of the specular object can be measured.
［発明の効果］
本発明は前述の様に、従来定性的に行われていた反射像
歪判定において、反射像歪の有る部位、大きさを定量的
に測定するととかてきる様になり、製造工程上の品質管
理、製法改善の評価の定量化を可能とする。あるいは取
り付は応力による鏡面物体の形状歪か反射歪として現わ
れる事を利用する事により取付は状況の評価かできると
いう効果を有する。[Effects of the Invention] As described above, the present invention enables the determination of reflected image distortion, which was conventionally performed qualitatively, to quantitatively measure the location and size of reflected image distortion, and improves manufacturing efficiency. It enables the quantification of process quality control and evaluation of manufacturing method improvements. Alternatively, the attachment has the effect of being able to evaluate the situation by utilizing the stress that appears as shape distortion or reflection distortion of the mirror object.
第１図は本発明装置の一実施例を示す斜視図、第２図は
この装置の部分側面図を示す。
図において、１は鏡面物体、２はスクリーン、３はレー
ザースキャナー、４はビデオカメラ、５は画像処理装置
。
１１廚ノ（°クーン
第２ 図FIG. 1 is a perspective view showing an embodiment of the device of the present invention, and FIG. 2 is a partial side view of this device. In the figure, 1 is a mirror object, 2 is a screen, 3 is a laser scanner, 4 is a video camera, and 5 is an image processing device. 11 degrees (°Kuhn Fig. 2
Claims (1)
の測定方法において、鏡面物体に相対して所定の格子パ
ターンを配置し、該格子パターンの鏡面における表面反
射格子像の曲率を計測することにより、反射像歪を測定
することを特徴とする反射像歪の測定方法。 ２、平面スクリーン格子にパターンを投影し、鏡面にお
けるその反射像をビデオカメラで入力して格子線の曲率
を画像処理により計測することを特徴とする特許請求の
範囲第１項記載の反射像歪の測定方法。 ３、反射像が鏡面物体の本来の表面形状により固有の歪
を有しており、格子パターンの反射像歪がこの固有の歪
と重複して生じるとき は、計測された曲率から鏡面物体の固有の曲率を差し引
いた曲率により測定することを特徴とする特許請求の範
囲第１項記載の反射像歪の測定方法。 ４、スクリーンへ投影する格子パターンが単一又は複数
の水平・垂直・斜めな直線であり、それぞれを同時又は
分割して投影できる様光源としてレーザースキャナを用
いた特許請求の範囲第２項記載の反射像歪の測定方法。[Claims] 1. In a method for measuring reflection image distortion on the surface of an object having a mirror surface such as glass, a predetermined grating pattern is arranged opposite to the mirror surface, and a surface reflection grating image on the mirror surface of the grating pattern is measured. A method for measuring reflected image distortion, characterized by measuring reflected image distortion by measuring curvature. 2. Reflection image distortion according to claim 1, characterized in that a pattern is projected onto a plane screen grid, the reflected image on a mirror surface is inputted with a video camera, and the curvature of the grid lines is measured by image processing. How to measure. 3. If the reflected image has an inherent distortion due to the original surface shape of the specular object, and the reflected image distortion of the grating pattern overlaps with this inherent distortion, the measured curvature may be used to determine the inherent distortion of the specular object. 2. The method for measuring reflected image distortion according to claim 1, wherein the measurement is performed using a curvature obtained by subtracting a curvature of . 4. The lattice pattern projected onto the screen is a single or multiple horizontal, vertical, and diagonal straight lines, and a laser scanner is used as a light source so that each can be projected simultaneously or separately. How to measure reflected image distortion.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62322710A JPH0797024B2 (en) | 1987-12-22 | 1987-12-22 | Reflection image distortion measurement method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62322710A JPH0797024B2 (en) | 1987-12-22 | 1987-12-22 | Reflection image distortion measurement method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01165907A true JPH01165907A (en) | 1989-06-29 |
| JPH0797024B2 JPH0797024B2 (en) | 1995-10-18 |
Family
ID=18146755
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62322710A Expired - Fee Related JPH0797024B2 (en) | 1987-12-22 | 1987-12-22 | Reflection image distortion measurement method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0797024B2 (en) |
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2007034848A1 (en) * | 2005-09-15 | 2007-03-29 | Jfe Steel Corporation | Plane distortion measuring device and method |
| EP1821064A1 (en) * | 2006-02-15 | 2007-08-22 | Deutsches Zentrum für Luft- und Raumfahrt e.V. | Method and device for determining the contour of a reflecting surface |
| EP1837623A1 (en) * | 2006-03-17 | 2007-09-26 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Method and device for recording the surface form of a partially reflective surface |
| JP2008039767A (en) * | 2006-08-01 | 2008-02-21 | Mitsubishi Electric Research Laboratories Inc | Method and system for sensing surface shape of reflective object |
| JP2008089566A (en) * | 2006-09-08 | 2008-04-17 | Jfe Steel Kk | Device and method for measuring surface distortion |
| JP2008224341A (en) * | 2007-03-12 | 2008-09-25 | Jfe Steel Kk | Face distortion measuring instrument and method |
| EP1717568A3 (en) * | 2005-04-26 | 2009-07-29 | Deutsches Zentrum für Luft- und Raumfahrt e.V. | Method for measuring a solar thermal concentrator |
| JP2013015324A (en) * | 2011-06-30 | 2013-01-24 | Toshiba Corp | Image display device, image display method and program |
| JP2013076667A (en) * | 2011-09-30 | 2013-04-25 | Toshiba Corp | Calibration method and image display device |
| JP2016218025A (en) * | 2015-05-26 | 2016-12-22 | 富士フイルム株式会社 | Inspection method and device |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5875531A (en) * | 1981-10-28 | 1983-05-07 | 株式会社トプコン | Apparatus for measuring curvature |
| JPS59231403A (en) * | 1983-06-14 | 1984-12-26 | Sanwa Seiki Kk | Non-contact type three-dimensional measuring device |
-
1987
- 1987-12-22 JP JP62322710A patent/JPH0797024B2/en not_active Expired - Fee Related
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5875531A (en) * | 1981-10-28 | 1983-05-07 | 株式会社トプコン | Apparatus for measuring curvature |
| JPS59231403A (en) * | 1983-06-14 | 1984-12-26 | Sanwa Seiki Kk | Non-contact type three-dimensional measuring device |
Cited By (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1717568A3 (en) * | 2005-04-26 | 2009-07-29 | Deutsches Zentrum für Luft- und Raumfahrt e.V. | Method for measuring a solar thermal concentrator |
| JP2007147587A (en) * | 2005-09-15 | 2007-06-14 | Jfe Steel Kk | Surface distortion measuring device and method |
| WO2007034848A1 (en) * | 2005-09-15 | 2007-03-29 | Jfe Steel Corporation | Plane distortion measuring device and method |
| JP4730836B2 (en) * | 2005-09-15 | 2011-07-20 | Ｊｆｅスチール株式会社 | Apparatus and method for measuring surface distortion |
| US7869061B2 (en) | 2005-09-15 | 2011-01-11 | Jfe Steel Corporation | Surface-distortion measuring device and method |
| EP1821064A1 (en) * | 2006-02-15 | 2007-08-22 | Deutsches Zentrum für Luft- und Raumfahrt e.V. | Method and device for determining the contour of a reflecting surface |
| EP1837623A1 (en) * | 2006-03-17 | 2007-09-26 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Method and device for recording the surface form of a partially reflective surface |
| JP2008039767A (en) * | 2006-08-01 | 2008-02-21 | Mitsubishi Electric Research Laboratories Inc | Method and system for sensing surface shape of reflective object |
| JP2008089566A (en) * | 2006-09-08 | 2008-04-17 | Jfe Steel Kk | Device and method for measuring surface distortion |
| JP2008224341A (en) * | 2007-03-12 | 2008-09-25 | Jfe Steel Kk | Face distortion measuring instrument and method |
| JP2013015324A (en) * | 2011-06-30 | 2013-01-24 | Toshiba Corp | Image display device, image display method and program |
| JP2013076667A (en) * | 2011-09-30 | 2013-04-25 | Toshiba Corp | Calibration method and image display device |
| JP2016218025A (en) * | 2015-05-26 | 2016-12-22 | 富士フイルム株式会社 | Inspection method and device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0797024B2 (en) | 1995-10-18 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |