JP7510215B2 - コンタクトレンズの欠陥分析及び追跡システム - Google Patents
コンタクトレンズの欠陥分析及び追跡システム Download PDFInfo
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- JP7510215B2 JP7510215B2 JP2023105994A JP2023105994A JP7510215B2 JP 7510215 B2 JP7510215 B2 JP 7510215B2 JP 2023105994 A JP2023105994 A JP 2023105994A JP 2023105994 A JP2023105994 A JP 2023105994A JP 7510215 B2 JP7510215 B2 JP 7510215B2
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- 230000007547 defect Effects 0.000 title claims description 63
- 238000007689 inspection Methods 0.000 claims description 27
- 238000005286 illumination Methods 0.000 claims description 26
- 238000000034 method Methods 0.000 claims description 26
- 230000003287 optical effect Effects 0.000 claims description 15
- 238000004519 manufacturing process Methods 0.000 claims description 11
- 238000000275 quality assurance Methods 0.000 claims description 2
- 238000013507 mapping Methods 0.000 claims 1
- 238000005259 measurement Methods 0.000 description 22
- 210000003128 head Anatomy 0.000 description 5
- 239000011521 glass Substances 0.000 description 4
- 230000004075 alteration Effects 0.000 description 2
- 238000012937 correction Methods 0.000 description 2
- 229920000642 polymer Polymers 0.000 description 2
- 238000003908 quality control method Methods 0.000 description 2
- 241000282412 Homo Species 0.000 description 1
- 206010020675 Hypermetropia Diseases 0.000 description 1
- 206010047513 Vision blurred Diseases 0.000 description 1
- 230000004931 aggregating effect Effects 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 230000032798 delamination Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000004438 eyesight Effects 0.000 description 1
- 230000004305 hyperopia Effects 0.000 description 1
- 201000006318 hyperopia Diseases 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000004379 myopia Effects 0.000 description 1
- 208000001491 myopia Diseases 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
- G01M11/0278—Detecting defects of the object to be tested, e.g. scratches or dust
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
- G01M11/0257—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
- G01M11/0257—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
- G01M11/0264—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested by using targets or reference patterns
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F18/00—Pattern recognition
- G06F18/20—Analysing
- G06F18/24—Classification techniques
- G06F18/241—Classification techniques relating to the classification model, e.g. parametric or non-parametric approaches
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/10—Image acquisition
- G06V10/12—Details of acquisition arrangements; Constructional details thereof
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8822—Dark field detection
- G01N2021/8825—Separate detection of dark field and bright field
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
- G01N2021/9583—Lenses
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/10—Scanning
- G01N2201/104—Mechano-optical scan, i.e. object and beam moving
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10024—Color image
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10052—Images from lightfield camera
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10056—Microscopic image
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V2201/00—Indexing scheme relating to image or video recognition or understanding
- G06V2201/06—Recognition of objects for industrial automation
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- Computer Vision & Pattern Recognition (AREA)
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- Quality & Reliability (AREA)
- Data Mining & Analysis (AREA)
- Signal Processing (AREA)
- Evolutionary Biology (AREA)
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- Bioinformatics & Computational Biology (AREA)
- Bioinformatics & Cheminformatics (AREA)
- Artificial Intelligence (AREA)
- General Engineering & Computer Science (AREA)
- Evolutionary Computation (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Eyeglasses (AREA)
Description
Claims (4)
- リアプロジェクションを用いたコンタクトレンズの欠陥分析及び追跡方法であって、
バックライト照明及びフロントライト照明を用いた検査中の前記コンタクトレンズの画像のキャプチャすることと、
気泡、裂け目、傷、ロット情報を含むパターンなどの欠陥を強調するために、照明モジュールを異なる時間領域で動的にパルス化することと、
第1のカメラからの画像を取り込んで欠陥を識別し、追跡のためにロット情報にタグ付け処理することと、
欠陥の特定とロット情報への欠陥のマッピングによるデータベースを作成することと、
観察用スクリーン上の識別された欠陥の近くに第2のカメラを手動で位置決めすることによって、第1のカメラからの画像を処理するときに決定された欠陥の拡大画像をキャプチャするように第2のカメラをトリガすることと、
拡大された画像を指定されたロットに統合し、タグ付けし、拡大された領域と共に重要な欠陥のリストを用いてデータベースの有効性を向上させることと、
作表された実績とデータベースを外部インターフェースに伝達すること、又は品質保証担当チームが製造工程の微調整を目的として使用するためにそれらを印刷することと、を含み、
拡大された画像が較正ゲージの画像と重ね合わせられる、コンタクトレンズの欠陥分析及び追跡方法。 - 欠陥の測定が、欠陥の種類に適合するように較正ゲージを変更することを含む、請求項1に記載の方法。
- 欠陥の測定が、特定の欠陥の種類についての複数の倍率設定の下での第2のカメラによって欠陥の拡大された画像をキャプチャすることを含む、請求項1に記載の方法。
- 欠陥の測定がコンタクトレンズ上の異なる種類の欠陥を見るために、回転ホイール上に取り付けられた異なる光学フィルタを利用することを含む、請求項1に記載の方法。
Applications Claiming Priority (3)
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SG10202010191P | 2020-10-14 | ||
SG10202010191P | 2020-10-14 | ||
JP2021169140A JP7309225B2 (ja) | 2020-10-14 | 2021-10-14 | コンタクトレンズの欠陥分析及び追跡システム |
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JP2021169140A Division JP7309225B2 (ja) | 2020-10-14 | 2021-10-14 | コンタクトレンズの欠陥分析及び追跡システム |
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JP2023131173A JP2023131173A (ja) | 2023-09-21 |
JP7510215B2 true JP7510215B2 (ja) | 2024-07-03 |
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JP2021169140A Active JP7309225B2 (ja) | 2020-10-14 | 2021-10-14 | コンタクトレンズの欠陥分析及び追跡システム |
JP2023105994A Active JP7510215B2 (ja) | 2020-10-14 | 2023-06-28 | コンタクトレンズの欠陥分析及び追跡システム |
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Country Status (6)
Country | Link |
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US (1) | US11796418B2 (ja) |
JP (2) | JP7309225B2 (ja) |
KR (1) | KR20220049481A (ja) |
CN (1) | CN114429444A (ja) |
DE (1) | DE102021211596A1 (ja) |
TW (1) | TW202235860A (ja) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
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CN116990450B (zh) * | 2023-07-18 | 2024-04-26 | 欧几里德(苏州)医疗科技有限公司 | 一种角膜塑形镜的缺陷检测方法及*** |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008180722A (ja) | 1994-06-14 | 2008-08-07 | Visionix Ltd | 光要素をマッピングするための装置 |
JP7190885B2 (ja) | 2018-11-30 | 2022-12-16 | 株式会社マキタ | 電力供給システム |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0644411B1 (fr) * | 1993-09-17 | 1997-03-26 | ESSILOR INTERNATIONAL (Compagnie Générale d'Optique) | Procédé de mesure absolue de la structure géométrique ou optique d'un composant optique et dispositif pour sa mise en oeuvre |
WO1997025647A1 (fr) * | 1996-01-10 | 1997-07-17 | Kabushiki Kaisha Topcon | Appareil et systeme d'evaluation d'une representation |
JPH10274591A (ja) * | 1997-01-29 | 1998-10-13 | Naitsu:Kk | 透明物体の拡大観察装置 |
US8143600B2 (en) * | 2008-02-18 | 2012-03-27 | Visiongate, Inc. | 3D imaging of live cells with ultraviolet radiation |
EP2489467A1 (de) * | 2011-02-15 | 2012-08-22 | Schneider GmbH & Co. KG | Vorrichtung und Verfahren zum Bearbeiten einer optischen Linse mit einer Vorrichtung zur optischen Erfassung des Übergangs des Linsenmaterials zum Block- oder Folienmaterial zur Bestimmung des Randkantenverlaufs der Linse |
KR102166189B1 (ko) * | 2013-10-08 | 2020-10-15 | 이미지 비전 피티이. 리미티드 | 습식 안과 렌즈 검사 시스템 및 방법 |
KR102226634B1 (ko) * | 2014-05-15 | 2021-03-10 | 이미지 비전 피티이. 리미티드 | 안과 렌즈 검사 시스템 및 방법 |
SG10201501672PA (en) * | 2015-03-05 | 2016-10-28 | Emage Vision Pte Ltd | Inspection of sealing quality in blister packages |
SG10201509497VA (en) * | 2015-11-18 | 2017-06-29 | Emage Vision Pte Ltd | Contact lens defect inspection using uv illumination |
US9961253B2 (en) * | 2016-05-03 | 2018-05-01 | Mitutoyo Corporation | Autofocus system for a high speed periodically modulated variable focal length lens |
SG10201701099XA (en) * | 2017-02-10 | 2018-09-27 | Emage Vision Pte Ltd | Contact lens inspection in a plastic shell |
US9970884B1 (en) * | 2017-04-28 | 2018-05-15 | Hong Kong Applied Science and Technology Research Institute Company Limited | Apparatus and a method for inspecting a light transmissive optical component |
SG10201803290VA (en) * | 2018-04-19 | 2019-11-28 | Emage Vision Pte Ltd | System and method for inspecting optical power and thickness of ophthalmic lenses immersed in a solution |
-
2021
- 2021-10-14 KR KR1020210136953A patent/KR20220049481A/ko active Search and Examination
- 2021-10-14 CN CN202111200256.3A patent/CN114429444A/zh active Pending
- 2021-10-14 JP JP2021169140A patent/JP7309225B2/ja active Active
- 2021-10-14 US US17/501,368 patent/US11796418B2/en active Active
- 2021-10-14 DE DE102021211596.9A patent/DE102021211596A1/de active Pending
- 2021-10-14 TW TW110138202A patent/TW202235860A/zh unknown
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2023
- 2023-06-28 JP JP2023105994A patent/JP7510215B2/ja active Active
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008180722A (ja) | 1994-06-14 | 2008-08-07 | Visionix Ltd | 光要素をマッピングするための装置 |
JP7190885B2 (ja) | 2018-11-30 | 2022-12-16 | 株式会社マキタ | 電力供給システム |
Also Published As
Publication number | Publication date |
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KR20220049481A (ko) | 2022-04-21 |
TW202235860A (zh) | 2022-09-16 |
JP2022064881A (ja) | 2022-04-26 |
JP7309225B2 (ja) | 2023-07-18 |
DE102021211596A1 (de) | 2022-04-14 |
US11796418B2 (en) | 2023-10-24 |
US20220178787A1 (en) | 2022-06-09 |
JP2023131173A (ja) | 2023-09-21 |
CN114429444A (zh) | 2022-05-03 |
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