JP7319205B2 - 緻密質複合材料、その製法、接合体及び半導体製造装置用部材 - Google Patents
緻密質複合材料、その製法、接合体及び半導体製造装置用部材 Download PDFInfo
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- JP7319205B2 JP7319205B2 JP2020012343A JP2020012343A JP7319205B2 JP 7319205 B2 JP7319205 B2 JP 7319205B2 JP 2020012343 A JP2020012343 A JP 2020012343A JP 2020012343 A JP2020012343 A JP 2020012343A JP 7319205 B2 JP7319205 B2 JP 7319205B2
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- C04B2237/30—Composition of layers of ceramic laminates or of ceramic or metallic articles to be joined by heating, e.g. Si substrates
- C04B2237/32—Ceramic
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Description
1.製造手順
・調合
各原料成分を表1に示す質量%となるように秤量し、イソプロピルアルコールを溶媒とし、ナイロン製のポット、直径10mmの鉄芯入りナイロンボールを用いて4時間湿式混合した。混合後スラリーを取り出し、窒素気流中110℃で乾燥した。その後、30メッシュの篩に通し、調合粉末とした。尚、秤量した原料約500gを高速流動混合機(粉体投入部の容量1.8L)に投入し、攪拌羽根の回転数1500rpmで混合した場合にも湿式混合と同様の材料特性が得られることを確認した。
・成形
調合粉末を、200kgf/cm2の圧力で一軸加圧成形し、直径50mm、厚さ17mm程度の円盤状成形体を作製し、焼成用黒鉛モールドに収納した。
・焼成
円盤状成形体をホットプレス焼成することにより緻密質焼結材料を得た。ホットプレス焼成では、プレス圧力を200kgf/cm2とし、表1に示す焼成温度(最高温度)で焼成し、焼成終了まで真空雰囲気とした。焼成温度での保持時間は4時間とした。
表1には、a:各実験例の出発原料組成(調合比)、b:原料中、SiCを除いた成分(Si,Ti,TiSi2,TiC)に由来する、Si,Tiの総量に対するSiの質量比(Si/(Si+Ti))、c:焼成条件(ホットプレス焼成温度及びプレス荷重)、d:リートベルト解析から求めた複合材料の構成相とその質量比、e:複合材料の基本特性(嵩密度、開気孔率、4点曲げ強度、線熱膨張係数、熱伝導率、炭化珪素の粒子間距離に関するパラメータ)を示した。なお、実験例1~11のうち、実験例1~9が本発明の実施例に相当し、残りの実験例が比較例に相当する。
緻密質複合材料を乳鉢で粉砕して粉末とし、この粉末のXRD測定を2θ=5°~70°の範囲で行い、得られたXRD回折パターンを対象にリートベルト解析を行った。解析ソフトとしてはBruker AXS製のTOPASを用いた。
(1)原料の平均粒径
堀場製作所製、LA950V2を使用し、純水を分散媒として測定した。
(2)開気孔率及び嵩密度
純水を媒体としたアルキメデス法により測定した。
(3)4点曲げ強度
JIS-R1601に従って求めた。
(4)線熱膨張係数(40~570℃の平均線熱膨張係数)
JIS-R1618に従って求めた。具体的には、リガク製、Thermo plus EVO(縦型示差膨張測定方式)を使用し、アルゴン雰囲気中、昇温速度10℃/分の条件で600℃まで2回昇温し、2回目の測定データから40~570℃の平均線熱膨張係数を算出した。標準試料には装置付属のアルミナ標準試料(純度99.7%、嵩密度3.9g/cm3、長さ20mm)を使用した。このアルミナ標準試料をもう1本用意し、同一条件で線熱膨張係数を測定した値は7.7ppm/Kであった。
(5)熱伝導率
JIS-R1611に従ってレーザーフラッシュ法により測定した。
(6)SEM観察
緻密質複合材料のSEM観察を行った。SEM観察では、緻密質複合材料の断面を鏡面研磨し、電子顕微鏡(SEM;日本電子製JSM-IT500LA)により反射電子像で観察した。反射電子像の観察は、加速電圧10~15kV、PC30~45の条件で行った。各実験例のSEM画像(倍率500倍)を図1に示す。
(7)炭化珪素の粒子間距離の平均値、標準偏差及び最大値
図1に示したSEM像を、株式会社日本ローパー製の画像解析ソフト「Image-Pro ver.9.3.2」を用いて画像解析することにより炭化珪素の粒子間距離を求めた。具体的には、SEM画像において、平行に延びる5本の直線を配列した。各直線の幅は、0.2μmとした。また、当該SEM画像の1画素は、0.2μm×0.2μmに対応する。次に、直線上において明部分(すなわち、Ti-Siマトリックス)と重複する領域(以下、「明領域」と呼ぶ。)の面積を自動算出した。この時、各直線は画素列の境界線上に配置されるため、明領域の面積算出では、直線により幅0.4μmの領域(すなわち、2画素分の幅を有する領域)が抽出される。幅0.2μmの直線は、幅方向にて隣接する2列の画素列(すなわち、幅方向に垂直な方向に配列される複数の画素の列)の境界線上に配置され、直線と重なりを有する全画素が、面積算出の対象となる。明領域の面積算出では、1画素(すなわち0.04μm2)以下の領域はカウントされないため、0.05μm2未満の領域はノイズとして無視した。そして、明領域の面積を、炭化珪素粒子間のマトリックス面積として求めた。マトリックス面積は、炭化珪素の粒子間距離と明領域として抽出される直線幅(すなわち、0.4μm)とを積算したものである。したがって、上述の明領域の面積を0.4μmで除算することにより、炭化珪素の粒子間距離が算出される。算出したすべての粒子間距離を用いて、その平均値、標準偏差及び最大値を求めた。
実験例1~9の緻密質複合材料は、炭化珪素の粒子間距離の最大値が40μm以下(具体的には20~40μm)、標準偏差が10以下(具体的には4~8)であった。また、炭化珪素の粒子間距離の平均値は4~10μm(具体的には4~9μm)であった。これらの緻密質複合材料は、開気孔率が1%以下で十分に緻密化しており、4点曲げ強度が250MPa以上で十分に強度が高く、熱伝導率が70W/mK以上で良好な熱伝導性を有し、線熱膨張係数が7.2~8.2ppm/Kでアルミナとほぼ同等(アルミナとの線熱膨張係数の差の絶対値が0.5ppm/K以下)であった。
実験例1で得られた緻密質複合材料サンプル(直径50mm、厚み8mm)に、アルミニウムが主構成材料である厚み200μmの金属箔(縦、横は前出のサンプルと同じ)と、厚み5mmの緻密質アルミナ焼結体とをこの順に積層し、焼成用黒鉛モールドに収納し、100kgf/cm2の圧力、600℃真空下でホットプレス焼成した。そうしたところ、界面に剥離やボイドのない接合体(金属接合体)が得られた。また、実験例1で得られた緻密質複合材料サンプルの代わりに実験例2及び実験例9で得られた緻密質複合材料サンプルを用いて同様にして接合体を作製したところ、いずれも界面に剥離やボイドはみられなかった。
Claims (12)
- 珪化チタンを43~63質量%含有すると共に、炭化珪素及び炭化チタンをそれぞれ珪化チタンの質量%よりも少量含有し、炭化珪素の粒子間距離の最大値が40μm以下で標準偏差が10以下であり、開気孔率が1%以下である、
緻密質複合材料。 - 炭化珪素が29~46質量%であり、炭化チタンが5~15質量%である、
請求項1に記載の緻密質複合材料。 - 炭化珪素の粒子間距離の平均値が4~10μmである、
請求項1又は2に記載の緻密質複合材料。 - アルミナとの40~570℃の平均線熱膨張係数の差の絶対値が0.5ppm/K以下である、
請求項1~3のいずれか1項に記載の緻密質複合材料。 - 熱伝導率が70W/mK以上である、
請求項1~4のいずれか1項に記載の緻密質複合材料。 - 4点曲げ強度が250MPa以上である、
請求項1~5のいずれか1項に記載の緻密質複合材料。 - チタンシリコンカーバイドを含有する、
請求項1~6のいずれか1項に記載の緻密質複合材料。 - 請求項1~7のいずれか1項に記載の緻密質複合材料からなる第1材と、アルミナからなる第2材とを接合したものである、
接合体。 - 前記第1材と前記第2材とは金属接合されている、
請求項8に記載の接合体。 - 請求項8又は9に記載の接合体からなる、
半導体製造装置用部材。 - (a)平均粒径が10~25μmの炭化珪素を24~45質量%、平均粒径が10μm未満の珪化チタンを42~67質量%含有すると共に、平均粒径が20μm未満の金属チタン又は平均粒径が10μm未満の炭化チタンを含有する粉体混合物を調製する工程と、
(b)前記粉体混合物を不活性雰囲気下でホットプレスにより1350~1430℃で焼結させる工程と、
を含む緻密質複合材料の製法。 - 工程(a)で、前記粉体混合物の炭化珪素を除く原料に由来するSi及びTiについて、Si/(Si+Ti)の質量比が0.40~0.50である、
請求項11に記載の緻密質複合材料の製法。
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