JP6890114B2 - 基板処理装置及び半導体装置の製造方法 - Google Patents
基板処理装置及び半導体装置の製造方法 Download PDFInfo
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- JP6890114B2 JP6890114B2 JP2018228261A JP2018228261A JP6890114B2 JP 6890114 B2 JP6890114 B2 JP 6890114B2 JP 2018228261 A JP2018228261 A JP 2018228261A JP 2018228261 A JP2018228261 A JP 2018228261A JP 6890114 B2 JP6890114 B2 JP 6890114B2
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- 238000012545 processing Methods 0.000 title claims description 117
- 239000000758 substrate Substances 0.000 title claims description 54
- 239000004065 semiconductor Substances 0.000 title claims description 10
- 238000004519 manufacturing process Methods 0.000 title claims description 8
- 238000010926 purge Methods 0.000 claims description 49
- 238000006243 chemical reaction Methods 0.000 claims description 46
- 238000000034 method Methods 0.000 claims description 17
- 239000011810 insulating material Substances 0.000 claims description 13
- 238000007789 sealing Methods 0.000 claims description 6
- 239000003507 refrigerant Substances 0.000 claims description 5
- 238000001816 cooling Methods 0.000 claims 1
- 238000010438 heat treatment Methods 0.000 description 98
- 239000007789 gas Substances 0.000 description 86
- 235000012431 wafers Nutrition 0.000 description 45
- 239000010408 film Substances 0.000 description 17
- 239000011261 inert gas Substances 0.000 description 9
- 238000012986 modification Methods 0.000 description 9
- 230000004048 modification Effects 0.000 description 9
- 239000002994 raw material Substances 0.000 description 9
- 239000011553 magnetic fluid Substances 0.000 description 8
- 239000000463 material Substances 0.000 description 8
- 239000006227 byproduct Substances 0.000 description 7
- 239000002184 metal Substances 0.000 description 6
- 239000010453 quartz Substances 0.000 description 6
- 239000012495 reaction gas Substances 0.000 description 6
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 6
- 238000003860 storage Methods 0.000 description 6
- 230000000694 effects Effects 0.000 description 5
- 230000015572 biosynthetic process Effects 0.000 description 4
- 238000001514 detection method Methods 0.000 description 4
- 230000002093 peripheral effect Effects 0.000 description 4
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000011084 recovery Methods 0.000 description 2
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- 238000011144 upstream manufacturing Methods 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 239000000498 cooling water Substances 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
- 238000005485 electric heating Methods 0.000 description 1
- 230000003028 elevating effect Effects 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- 229920006015 heat resistant resin Polymers 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 239000000047 product Substances 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000004043 responsiveness Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 229910010271 silicon carbide Inorganic materials 0.000 description 1
- 238000002791 soaking Methods 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- LXEXBJXDGVGRAR-UHFFFAOYSA-N trichloro(trichlorosilyl)silane Chemical compound Cl[Si](Cl)(Cl)[Si](Cl)(Cl)Cl LXEXBJXDGVGRAR-UHFFFAOYSA-N 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
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- H01L21/67757—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber vertical transfer of a batch of workpieces
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- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4401—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
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- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
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- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
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- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
- C23C16/4582—Rigid and flat substrates, e.g. plates or discs
- C23C16/4583—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
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- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
- C23C16/4582—Rigid and flat substrates, e.g. plates or discs
- C23C16/4583—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
- C23C16/4586—Elements in the interior of the support, e.g. electrodes, heating or cooling devices
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- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/46—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for heating the substrate
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- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/48—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating by irradiation, e.g. photolysis, radiolysis, particle radiation
- C23C16/481—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating by irradiation, e.g. photolysis, radiolysis, particle radiation by radiant heating of the substrate
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
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Description
複数枚のウェーハWがボート17に装填(ウェーハチャージ)されると、ボート17はボートエレベータ23によって処理室5内に搬入(ボートロード)され、反応容器4の開口部は蓋部9によって気密に閉塞(シール)された状態となる。
処理室5内が所定の圧力(真空度)となる様に、真空ポンプ33によって真空排気(減圧排気)される。処理室5内の圧力は、圧力センサ31で測定され、測定された圧力情報に基づきAPCバルブ32がフィードバック制御される。又、処理室5内のウェーハWが所定の温度となる様に、ヒータ3、第1加熱部36a及び補助加熱部52によって加熱される。この際、処理室5が所定の温度分布となる様に、温度検出部6が検出した温度情報に基づき、ヒータ3、第1加熱部36a及び補助加熱部52への通電具合がフィードバック制御される。又、第2加熱部36b及び第3加熱部36cによる加熱も開始される。又、回転機構22によるボート17及びウェーハWの回転を開始する。
[原料ガス供給工程]
処理室5内の温度が予め設定された処理温度に安定すると、処理室5内のウェーハWに対してHCDSガスを供給する。HCDSガスは、MFC26aにて所望の流量となる様に制御され、ガス供給管25a及びノズル28aを介して処理室5内に供給される。
次に、HCDSガスの供給を停止し、真空ポンプ33により処理室5内を真空排気する。この時、不活性ガス供給部からN2 ガスを処理室5内に供給してもよい(不活性ガスパージ)。
次に、処理室5内のウェーハWに対してH2 Oガスを供給する。H2 Oガスは、MFC26bにて所望の流量となる様に制御され、ガス供給管25b及びノズル28bを介して処理室5内に供給される。
次に、H2 Oガスの供給を停止し、真空ポンプ33により処理室5内を真空排気する。この時、不活性ガス供給部からN2 ガスを処理室5内に供給してもよい(不活性ガスパージ)。
所定膜厚の膜を形成した後、不活性ガス供給部からN2 ガスが供給され、処理室5内がN2 ガスに置換されると共に、処理室5の圧力が常圧に復帰される。その後、ボートエレベータ23により蓋部9が降下され、ボート17が反応容器4から搬出(ボートアンロード)される。その後、処理済ウェーハWはボート17より取出される(ウェーハディスチャージ)。
処理温度(ウェーハ温度):300℃〜700℃、
処理圧力(処理室内圧力):1Pa〜4000Pa、
HCDS含有ガス:100sccm〜10000sccm、
H2 O含有ガス:100sccm〜10000sccm、
N2 ガス:100sccm〜10000sccm、
それぞれの処理条件を、それぞれの範囲内の値に設定することで、成膜処理を適正に進行させることが可能となる。
2 反応管
4 反応容器
5 処理室
9 蓋部
12 アダプター
14 キャップ
17 ボート
18a 回転軸
19 キャップカバー
21 排出口
22 回転機構
34 断熱部
35 パージガス流路
36 加熱部
57 コントローラ
Claims (12)
- 下端に開口部を有し、基板を保持する基板保持具を内部に収容する反応容器と、
前記基板保持具を回動可能に保持する軸と、
前記反応容器の内部に挿入された際に、前記反応容器の内面との間に所定の間隙を保つ様に形成された側面部と、該側面部の中心部に於いて前記軸を挿通させる筒部と、前記側面部の上端と前記筒部の上端とに接続する円環状の上板部と、前記側面部の下端に接続するフランジ部とを有し、前記フランジ部を前記開口部と直接又は間接に当接させて前記反応容器を気密に閉塞するキャップと、前記筒部の上端より上に於いて前記軸と接続し、前記キャップの上面及び側面を覆うキャップカバーとを備え、
前記軸は、前記反応容器に挿入される側の端が閉塞した管状に形成され、前記軸の内部の前記端寄りには補助ヒータが設けられる基板処理装置。 - 前記軸と前記筒部は、前記軸の下端付近において前記軸の周囲に供給されたパージガスが、最初に前記軸と前記筒部との間の空間に流れることを許容し、前記上板部、前記側面部と前記キャップカバーは、前記パージガスが前記上板部と前記キャップカバーとの間の空間に順次流れることを許容する様に構成された請求項1に記載の基板処理装置。
- 前記キャップは、前記側面部と前記筒部との間に形成される環状空間に設けられる断熱材と、前記断熱材と前記側面部との間、前記上板部との間、前記筒部との間にいずれかにそれぞれ設けられるキャップヒータとを更に有する請求項1に記載の基板処理装置。
- 前記キャップヒータは、前記断熱材と前記側面部との間、前記上板部との間、及び前記筒部との間に亘って設けられる請求項3に記載の基板処理装置。
- 前記軸の内部には補助断熱材が設けられる請求項1に記載の基板処理装置。
- 前記補助ヒータは、前記キャップヒータからの熱を吸収し、前記基板保持具の方向に向けて熱を拡散する疑似黒体である請求項3に記載の基板処理装置。
- 前記補助ヒータは、前記側面部と前記筒部との間に形成される環状空間に設けられる断熱材と前記上板部との間に設けられたキャップヒータと、実質的に同じ高さに設けられる請求項6に記載の基板処理装置。
- 前記フランジ部と前記開口部との間に設けられるシール部材と、
前記筒部と気密に接続されるアダプターと、
前記アダプターに固定され、前記軸を回動可能に保持する回転機構と、
前記フランジ部の前記反応容器と当接する側と反対側に当接してキャップを保持すると共に、前記アダプターをその中央で固定させる蓋とを更に備え、
前記側面部と前記筒部との間に形成される環状空間は、大気若しくは大気圧の周辺雰囲気と連通する請求項1に記載の基板処理装置。 - 前記回転機構は、回転可能な外軸と、外軸と同軸に配置された内軸と、を有し、
前記軸は、コネクタによって前記外軸と気密に接続される請求項8に記載の基板処理装置。 - 前記軸の内部に設けられ、前記内軸によって保持される補助断熱材を、更に備える請求項9に記載の基板処理装置。
- 前記側面部及び前記反応容器の前記側面部に面する部分は、前記軸方向に於いて一定断面形状に形成され、
前記蓋は、前記シール部材に近接する箇所に、前記シール部材を冷却する為の冷媒流路を有する請求項8に記載の基板処理装置。 - 反応容器の内面との間に所定の間隙を保つ様に形成された側面部を有するキャップを、前記反応容器の開口から挿入し、前記側面部と前記キャップの中心部に於いて軸を挿通させる筒部と前記側面部の上端と前記筒部の上端とに接続する上板部と前記側面部の下端に接続するフランジ部とによって前記反応容器の開口を閉塞する工程と、
前記反応容器に挿入される側の端が閉塞した管状に形成された前記軸の内部の前記端寄りに設けられた補助ヒータが熱を放散する工程と、
前記軸によって保持され、前記反応容器内に収容された基板保持具を回転させつつ、前記基板保持具に保持された基板を処理する工程とを有し、
前記処理する工程では、前記軸の周囲からパージガスを供給し、前記パージガスが前記軸と前記筒部との間の空間を流れた後、前記筒部の上端よりも上に於いて前記軸と接続し前記キャップの前記上板部及び前記側面部を覆うキャップカバーと、前記キャップとの間の空間を流れ、前記反応容器の開口付近から前記反応容器内へ放出される半導体装置の製造方法。
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