JP6857259B2 - 測定装置および測定方法 - Google Patents

測定装置および測定方法 Download PDF

Info

Publication number
JP6857259B2
JP6857259B2 JP2019562146A JP2019562146A JP6857259B2 JP 6857259 B2 JP6857259 B2 JP 6857259B2 JP 2019562146 A JP2019562146 A JP 2019562146A JP 2019562146 A JP2019562146 A JP 2019562146A JP 6857259 B2 JP6857259 B2 JP 6857259B2
Authority
JP
Japan
Prior art keywords
measurement target
measuring device
distance
deviation angle
electromagnetic wave
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2019562146A
Other languages
English (en)
Japanese (ja)
Other versions
JPWO2019131840A1 (ja
Inventor
瑞穂 本間
瑞穂 本間
健志 西
健志 西
裕寿 川端
裕寿 川端
正樹 角一
正樹 角一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Chugoku Marine Paints Ltd
Original Assignee
Chugoku Marine Paints Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chugoku Marine Paints Ltd filed Critical Chugoku Marine Paints Ltd
Publication of JPWO2019131840A1 publication Critical patent/JPWO2019131840A1/ja
Application granted granted Critical
Publication of JP6857259B2 publication Critical patent/JP6857259B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection
    • G01B11/0633—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection using one or more discrete wavelengths
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/024—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2019562146A 2017-12-27 2018-12-27 測定装置および測定方法 Active JP6857259B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2017250427 2017-12-27
JP2017250427 2017-12-27
PCT/JP2018/048055 WO2019131840A1 (ja) 2017-12-27 2018-12-27 測定装置および測定方法

Publications (2)

Publication Number Publication Date
JPWO2019131840A1 JPWO2019131840A1 (ja) 2020-11-19
JP6857259B2 true JP6857259B2 (ja) 2021-04-14

Family

ID=67067463

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2019562146A Active JP6857259B2 (ja) 2017-12-27 2018-12-27 測定装置および測定方法

Country Status (5)

Country Link
JP (1) JP6857259B2 (zh)
KR (1) KR102683487B1 (zh)
CN (1) CN111417834B (zh)
DE (1) DE112018006697T5 (zh)
WO (1) WO2019131840A1 (zh)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3742191A1 (en) * 2019-05-24 2020-11-25 Helmut Fischer GmbH Terahertz measuring device and method of operating a terahertz measuring device

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07114999B2 (ja) 1987-03-30 1995-12-13 住友金属工業株式会社 塗膜厚測定方法
EP0320139A3 (en) * 1987-12-08 1990-08-08 Emhart Industries, Inc. Optical measurement of wall thickness of transparent articles
JPH04172207A (ja) * 1990-11-05 1992-06-19 Nec Corp 光干渉式膜厚測定装置
JP3241991B2 (ja) * 1996-02-09 2001-12-25 株式会社東芝 距離計
CA2255105C (en) * 1997-12-05 2006-01-31 Grove U.S. L.L.C. Luffing angle measurement system
JP4255586B2 (ja) * 1999-10-25 2009-04-15 株式会社ニデック 試料検査装置
JP3995579B2 (ja) * 2002-10-18 2007-10-24 大日本スクリーン製造株式会社 膜厚測定装置および反射率測定装置
KR102197197B1 (ko) 2014-07-31 2021-01-04 현대엠엔소프트 주식회사 교통 정보 생성 방법
JP2016142672A (ja) * 2015-02-04 2016-08-08 株式会社東芝 光学式距離検出器を用いた厚さ測定装置
FR3038044B1 (fr) * 2015-06-23 2020-05-15 Lisi Aerospace Bague de controle
WO2017090426A1 (ja) * 2015-11-27 2017-06-01 富士フイルム株式会社 物体測定装置及び物体測定方法
JP2017187386A (ja) * 2016-04-06 2017-10-12 株式会社インザライフ レーザ測距計
CN108427116A (zh) * 2017-02-12 2018-08-21 钱浙滨 一种位置基准网节点工作方法及装置
CN109765532A (zh) * 2018-12-04 2019-05-17 中国科学院遥感与数字地球研究所 基于无人机的遥感卫星接收***的远程标校装置及方法

Also Published As

Publication number Publication date
KR102683487B1 (ko) 2024-07-10
WO2019131840A1 (ja) 2019-07-04
JPWO2019131840A1 (ja) 2020-11-19
CN111417834A (zh) 2020-07-14
DE112018006697T5 (de) 2020-09-10
KR20200099512A (ko) 2020-08-24
CN111417834B (zh) 2022-07-12

Similar Documents

Publication Publication Date Title
US8786858B2 (en) Gas detector
US9423339B2 (en) Spectrum measuring device and spectrum measuring method
JP2012523567A5 (zh)
US20140091219A1 (en) Optical gas sensor device and method for determining the concentration of a gas
CN103471820A (zh) 便携式多光谱光电设备实时标校测试仪
JP2014517287A (ja) ガラスユニット内の気体成分濃度を測定するための方法およびデバイス
WO2007075639A2 (en) Microwave datum tool
JP6857259B2 (ja) 測定装置および測定方法
JP2006349625A (ja) 紫外線量測定装置および携帯電話機および紫外線量測定方法
US10895447B2 (en) Apparatus for smart material analysis
KR20190053747A (ko) 원거리 계측기
KR102526101B1 (ko) 복합물들의 열 열화를 측정하기 위한 시스템 및 방법
Basistyy et al. Backscattering properties of topographic targets in the visible, shortwave infrared, and mid-infrared spectral ranges for hard-target lidars
US4381151A (en) Hand-holdable contamination tester
Germer et al. Angle-resolved diffuse reflectance and transmittance
KR101623490B1 (ko) 독성가스의 광범위 측정용 반사형 적외선 검출기를 이용한 가스 측정 장치 및 방법, 그리고 이를 실행하기 위한 프로그램을 기록한 컴퓨터로 읽을 수 있는 기록매체
JP2013250197A (ja) 角度計測装置
Georgiev et al. SWIR calibration of spectralon reflectance factor
Hallberg et al. Round robin comparison of BRDF measurements
JP2004251875A (ja) 部屋の寸法測定装置および方法
Murrill et al. Advanced terahertz imaging system performance model for concealed weapon identification
Tiranov et al. Laser goniophotometer–polarimeter for investigating the reflective characteristics of structural materials
Birkebak et al. Radiometry 101 Calibrating with diffuse reflecting targets
Tonvall Study of reflective and polarization properties of objects found in automotive LiDAR applications
Riley et al. Controlling light scatter in advanced ligo

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20200508

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A821

Effective date: 20200508

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20201110

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20201228

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20210302

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20210319

R150 Certificate of patent or registration of utility model

Ref document number: 6857259

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250