JP6857259B2 - 測定装置および測定方法 - Google Patents
測定装置および測定方法 Download PDFInfo
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- JP6857259B2 JP6857259B2 JP2019562146A JP2019562146A JP6857259B2 JP 6857259 B2 JP6857259 B2 JP 6857259B2 JP 2019562146 A JP2019562146 A JP 2019562146A JP 2019562146 A JP2019562146 A JP 2019562146A JP 6857259 B2 JP6857259 B2 JP 6857259B2
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Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
- G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection
- G01B11/0633—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection using one or more discrete wavelengths
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/024—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Analytical Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017250427 | 2017-12-27 | ||
JP2017250427 | 2017-12-27 | ||
PCT/JP2018/048055 WO2019131840A1 (ja) | 2017-12-27 | 2018-12-27 | 測定装置および測定方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPWO2019131840A1 JPWO2019131840A1 (ja) | 2020-11-19 |
JP6857259B2 true JP6857259B2 (ja) | 2021-04-14 |
Family
ID=67067463
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2019562146A Active JP6857259B2 (ja) | 2017-12-27 | 2018-12-27 | 測定装置および測定方法 |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP6857259B2 (zh) |
KR (1) | KR102683487B1 (zh) |
CN (1) | CN111417834B (zh) |
DE (1) | DE112018006697T5 (zh) |
WO (1) | WO2019131840A1 (zh) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP3742191A1 (en) * | 2019-05-24 | 2020-11-25 | Helmut Fischer GmbH | Terahertz measuring device and method of operating a terahertz measuring device |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07114999B2 (ja) | 1987-03-30 | 1995-12-13 | 住友金属工業株式会社 | 塗膜厚測定方法 |
EP0320139A3 (en) * | 1987-12-08 | 1990-08-08 | Emhart Industries, Inc. | Optical measurement of wall thickness of transparent articles |
JPH04172207A (ja) * | 1990-11-05 | 1992-06-19 | Nec Corp | 光干渉式膜厚測定装置 |
JP3241991B2 (ja) * | 1996-02-09 | 2001-12-25 | 株式会社東芝 | 距離計 |
CA2255105C (en) * | 1997-12-05 | 2006-01-31 | Grove U.S. L.L.C. | Luffing angle measurement system |
JP4255586B2 (ja) * | 1999-10-25 | 2009-04-15 | 株式会社ニデック | 試料検査装置 |
JP3995579B2 (ja) * | 2002-10-18 | 2007-10-24 | 大日本スクリーン製造株式会社 | 膜厚測定装置および反射率測定装置 |
KR102197197B1 (ko) | 2014-07-31 | 2021-01-04 | 현대엠엔소프트 주식회사 | 교통 정보 생성 방법 |
JP2016142672A (ja) * | 2015-02-04 | 2016-08-08 | 株式会社東芝 | 光学式距離検出器を用いた厚さ測定装置 |
FR3038044B1 (fr) * | 2015-06-23 | 2020-05-15 | Lisi Aerospace | Bague de controle |
WO2017090426A1 (ja) * | 2015-11-27 | 2017-06-01 | 富士フイルム株式会社 | 物体測定装置及び物体測定方法 |
JP2017187386A (ja) * | 2016-04-06 | 2017-10-12 | 株式会社インザライフ | レーザ測距計 |
CN108427116A (zh) * | 2017-02-12 | 2018-08-21 | 钱浙滨 | 一种位置基准网节点工作方法及装置 |
CN109765532A (zh) * | 2018-12-04 | 2019-05-17 | 中国科学院遥感与数字地球研究所 | 基于无人机的遥感卫星接收***的远程标校装置及方法 |
-
2018
- 2018-12-27 WO PCT/JP2018/048055 patent/WO2019131840A1/ja active Application Filing
- 2018-12-27 CN CN201880076721.7A patent/CN111417834B/zh active Active
- 2018-12-27 KR KR1020207010607A patent/KR102683487B1/ko active IP Right Grant
- 2018-12-27 DE DE112018006697.5T patent/DE112018006697T5/de active Pending
- 2018-12-27 JP JP2019562146A patent/JP6857259B2/ja active Active
Also Published As
Publication number | Publication date |
---|---|
KR102683487B1 (ko) | 2024-07-10 |
WO2019131840A1 (ja) | 2019-07-04 |
JPWO2019131840A1 (ja) | 2020-11-19 |
CN111417834A (zh) | 2020-07-14 |
DE112018006697T5 (de) | 2020-09-10 |
KR20200099512A (ko) | 2020-08-24 |
CN111417834B (zh) | 2022-07-12 |
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