JP6840617B2 - 研磨装置および研磨方法 - Google Patents
研磨装置および研磨方法 Download PDFInfo
- Publication number
- JP6840617B2 JP6840617B2 JP2017096604A JP2017096604A JP6840617B2 JP 6840617 B2 JP6840617 B2 JP 6840617B2 JP 2017096604 A JP2017096604 A JP 2017096604A JP 2017096604 A JP2017096604 A JP 2017096604A JP 6840617 B2 JP6840617 B2 JP 6840617B2
- Authority
- JP
- Japan
- Prior art keywords
- polishing
- substrate
- air cylinder
- connecting mechanism
- fixed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000005498 polishing Methods 0.000 title claims description 355
- 238000000034 method Methods 0.000 title claims description 8
- 230000007246 mechanism Effects 0.000 claims description 225
- 239000000758 substrate Substances 0.000 claims description 171
- 230000003014 reinforcing effect Effects 0.000 claims description 17
- 239000007789 gas Substances 0.000 description 60
- 230000002093 peripheral effect Effects 0.000 description 36
- 230000033001 locomotion Effects 0.000 description 27
- 239000013256 coordination polymer Substances 0.000 description 15
- 238000009434 installation Methods 0.000 description 14
- 238000010586 diagram Methods 0.000 description 13
- 239000007788 liquid Substances 0.000 description 9
- 238000005192 partition Methods 0.000 description 8
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 8
- 238000011084 recovery Methods 0.000 description 7
- 238000006243 chemical reaction Methods 0.000 description 6
- 238000003708 edge detection Methods 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 3
- 238000004891 communication Methods 0.000 description 3
- 229910001873 dinitrogen Inorganic materials 0.000 description 3
- 239000004696 Poly ether ether ketone Substances 0.000 description 2
- 230000003028 elevating effect Effects 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 229920002530 polyetherether ketone Polymers 0.000 description 2
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 2
- 229910010271 silicon carbide Inorganic materials 0.000 description 2
- 229910001220 stainless steel Inorganic materials 0.000 description 2
- 239000010935 stainless steel Substances 0.000 description 2
- 241000221535 Pucciniales Species 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000004886 head movement Effects 0.000 description 1
- JEIPFZHSYJVQDO-UHFFFAOYSA-N iron(III) oxide Inorganic materials O=[Fe]O[Fe]=O JEIPFZHSYJVQDO-UHFFFAOYSA-N 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 230000003449 preventive effect Effects 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 230000004044 response Effects 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B21/00—Machines or devices using grinding or polishing belts; Accessories therefor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B41/00—Component parts such as frames, beds, carriages, headstocks
- B24B41/02—Frames; Beds; Carriages
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
- B24B49/08—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation involving liquid or pneumatic means
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B55/00—Safety devices for grinding or polishing machines; Accessories fitted to grinding or polishing machines for keeping tools or parts of the machine in good working condition
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
- Grinding-Machine Dressing And Accessory Apparatuses (AREA)
- Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017096604A JP6840617B2 (ja) | 2017-05-15 | 2017-05-15 | 研磨装置および研磨方法 |
PCT/JP2018/000092 WO2018211736A1 (ja) | 2017-05-15 | 2018-01-05 | 研磨装置および研磨方法 |
TW107101488A TWI762554B (zh) | 2017-05-15 | 2018-01-16 | 研磨裝置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017096604A JP6840617B2 (ja) | 2017-05-15 | 2017-05-15 | 研磨装置および研磨方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2018192545A JP2018192545A (ja) | 2018-12-06 |
JP6840617B2 true JP6840617B2 (ja) | 2021-03-10 |
Family
ID=64273846
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2017096604A Active JP6840617B2 (ja) | 2017-05-15 | 2017-05-15 | 研磨装置および研磨方法 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP6840617B2 (zh) |
TW (1) | TWI762554B (zh) |
WO (1) | WO2018211736A1 (zh) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7111778B2 (ja) * | 2020-08-24 | 2022-08-02 | 株式会社サンシン | 研磨ロボット装置 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3650198B2 (ja) * | 1995-12-12 | 2005-05-18 | スピードファム株式会社 | 防振機構付き片面研磨装置 |
JPH11198026A (ja) * | 1998-01-16 | 1999-07-27 | Ebara Corp | ポリッシング装置 |
JP3707605B2 (ja) * | 2000-11-15 | 2005-10-19 | 株式会社平和 | 揚送研磨装置の設置構造 |
JP5886602B2 (ja) * | 2011-03-25 | 2016-03-16 | 株式会社荏原製作所 | 研磨装置および研磨方法 |
JP6130677B2 (ja) * | 2013-01-31 | 2017-05-17 | 株式会社荏原製作所 | 研磨装置および研磨方法 |
-
2017
- 2017-05-15 JP JP2017096604A patent/JP6840617B2/ja active Active
-
2018
- 2018-01-05 WO PCT/JP2018/000092 patent/WO2018211736A1/ja active Application Filing
- 2018-01-16 TW TW107101488A patent/TWI762554B/zh active
Also Published As
Publication number | Publication date |
---|---|
TW201901778A (zh) | 2019-01-01 |
TWI762554B (zh) | 2022-05-01 |
WO2018211736A1 (ja) | 2018-11-22 |
JP2018192545A (ja) | 2018-12-06 |
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