JP6767045B2 - 計測用x線ct装置と座標測定機の座標合せ治具 - Google Patents
計測用x線ct装置と座標測定機の座標合せ治具 Download PDFInfo
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- JP6767045B2 JP6767045B2 JP2016215672A JP2016215672A JP6767045B2 JP 6767045 B2 JP6767045 B2 JP 6767045B2 JP 2016215672 A JP2016215672 A JP 2016215672A JP 2016215672 A JP2016215672 A JP 2016215672A JP 6767045 B2 JP6767045 B2 JP 6767045B2
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- measurement
- ray
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- measuring machine
- posture
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- 238000005259 measurement Methods 0.000 title claims description 92
- 239000000853 adhesive Substances 0.000 claims description 3
- 230000001070 adhesive effect Effects 0.000 claims description 3
- 239000002390 adhesive tape Substances 0.000 claims description 3
- 230000005540 biological transmission Effects 0.000 claims description 3
- 238000000034 method Methods 0.000 description 12
- 230000008569 process Effects 0.000 description 6
- 239000000523 sample Substances 0.000 description 5
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 3
- 239000000470 constituent Substances 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 230000007246 mechanism Effects 0.000 description 2
- 230000008901 benefit Effects 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 238000013170 computed tomography imaging Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000001066 destructive effect Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/042—Calibration or calibration artifacts
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/0002—Arrangements for supporting, fixing or guiding the measuring instrument or the object to be measured
- G01B5/0004—Supports
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T11/00—2D [Two Dimensional] image generation
- G06T11/003—Reconstruction from projections, e.g. tomography
- G06T11/008—Specific post-processing after tomographic reconstruction, e.g. voxelisation, metal artifact correction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/303—Accessories, mechanical or electrical features calibrating, standardising
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/419—Imaging computed tomograph
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Theoretical Computer Science (AREA)
- Engineering & Computer Science (AREA)
- Electromagnetism (AREA)
- Pulmonology (AREA)
- Radiology & Medical Imaging (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- A Measuring Device Byusing Mechanical Method (AREA)
- Apparatus For Radiation Diagnosis (AREA)
Description
52…ベース
52A、52B、52C、52D…接地面
54…チャック
55…台座
55A…ワーク搭載面
56A、56B、56C…ポール
58A、58B、58C…マスターボール
60…三次元(座標)測定機
W…ワーク(測定対象)
Claims (5)
- 座標測定機による測定に適した姿勢と計測用X線CT装置による測定に適した姿勢とを保てる、少なくとも2つの接地面を有するベースと、
該ベースに測定対象を固定するための固定手段と、
を備えたことを特徴とする計測用X線CT装置と座標測定機の座標合せ治具。 - 前記座標測定機による測定に適した姿勢が、座標測定機の基準面と測定対象の基準面を一致させる姿勢であることを特徴とする請求項1に記載の計測用X線CT装置と座標測定機の座標合せ治具。
- 前記計測用X線CT装置による測定に適した姿勢が、X線透過像を得やすい斜め姿勢であることを特徴とする請求項1に記載の計測用X線CT装置と座標測定機の座標合せ治具。
- 前記ベースに配設された、少なくとも3つのマスターボールを更に備えたことを特徴とする請求項1乃至3のいずれかに記載の計測用X線CT装置と座標測定機の座標合せ治具。
- 前記固定手段が、チャック、接着剤、又は両面接着テープであることを特徴とする請求項1に記載の計測用X線CT装置と座標測定機の座標合せ治具。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016215672A JP6767045B2 (ja) | 2016-11-02 | 2016-11-02 | 計測用x線ct装置と座標測定機の座標合せ治具 |
US15/800,408 US10545102B2 (en) | 2016-11-02 | 2017-11-01 | Coordinate alignment tool for coordinate measuring device and measuring X-ray CT apparatus |
CN201711062976.1A CN108007400B (zh) | 2016-11-02 | 2017-11-02 | 用于坐标测量装置和测量x射线ct设备的坐标对准工具 |
DE102017010200.7A DE102017010200A1 (de) | 2016-11-02 | 2017-11-02 | Koordinatenabgleichwerkzeug für Koordinatenmessvorrichtung und Mess-Röntgen-CT-Vorrichtung sowie Messverfahren |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016215672A JP6767045B2 (ja) | 2016-11-02 | 2016-11-02 | 計測用x線ct装置と座標測定機の座標合せ治具 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2018072274A JP2018072274A (ja) | 2018-05-10 |
JP6767045B2 true JP6767045B2 (ja) | 2020-10-14 |
Family
ID=61912347
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2016215672A Expired - Fee Related JP6767045B2 (ja) | 2016-11-02 | 2016-11-02 | 計測用x線ct装置と座標測定機の座標合せ治具 |
Country Status (4)
Country | Link |
---|---|
US (1) | US10545102B2 (ja) |
JP (1) | JP6767045B2 (ja) |
CN (1) | CN108007400B (ja) |
DE (1) | DE102017010200A1 (ja) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6767045B2 (ja) * | 2016-11-02 | 2020-10-14 | 株式会社ミツトヨ | 計測用x線ct装置と座標測定機の座標合せ治具 |
JP7082492B2 (ja) | 2018-01-19 | 2022-06-08 | 株式会社ミツトヨ | 計測用x線ct装置、及び、その干渉防止方法 |
JP2019158534A (ja) * | 2018-03-12 | 2019-09-19 | 株式会社ミツトヨ | 計測用x線ct装置、及び、その断層画像生成方法 |
JP2019158541A (ja) | 2018-03-12 | 2019-09-19 | 株式会社ミツトヨ | 計測用x線ct装置、及び、その量産ワーク測定方法 |
JP7211722B2 (ja) * | 2018-06-25 | 2023-01-24 | 株式会社ミツトヨ | 計測用x線ct装置 |
JP7154535B2 (ja) * | 2018-07-04 | 2022-10-18 | 国立大学法人 東京大学 | X線ct装置により得られる投影像を用いた寸法測定方法 |
JP7143567B2 (ja) * | 2018-09-14 | 2022-09-29 | 株式会社島津テクノリサーチ | 材料試験機および放射線ct装置 |
US11733181B1 (en) | 2019-06-04 | 2023-08-22 | Saec/Kinetic Vision, Inc. | Imaging environment testing fixture and methods thereof |
DE102019125916A1 (de) * | 2019-09-26 | 2021-04-01 | Bayerische Motoren Werke Aktiengesellschaft | Rotationsvorrichtung zur Untersuchung von Bauteilen für ein Computertomographiesystem mit einer Spanneinrichtung zum Halten des Bauteils, sowie Computertomographiesystem |
DE102021115391B3 (de) | 2021-06-15 | 2022-01-27 | Dr. Ing. H.C. F. Porsche Aktiengesellschaft | Verfahren zur Prüfung des Stators sowie Prüfanordnung zur Durchführung des Verfahrens |
EP4332587A1 (en) * | 2022-08-30 | 2024-03-06 | Aptiv Technologies Limited | Sensor mounting device for radar testing |
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JPH11344330A (ja) * | 1998-05-29 | 1999-12-14 | Canon Inc | 三次元形状測定装置 |
JP2000258150A (ja) * | 1999-03-05 | 2000-09-22 | Canon Inc | 三次元形状測定装置 |
JP2000298106A (ja) * | 1999-04-14 | 2000-10-24 | Hitachi Ltd | X線ct利用システム |
DE19936364A1 (de) * | 1999-08-03 | 2001-02-15 | Siemens Ag | Verfahren zur Identifizierung und Lokalisierung von Marken in einem 3D-Volumendatensatz |
JP4374753B2 (ja) | 2000-08-11 | 2009-12-02 | 株式会社島津製作所 | X線ct装置 |
JP3427046B2 (ja) | 2000-08-29 | 2003-07-14 | 株式会社日立製作所 | 3次元寸法計測装置及びその計測方法 |
JP2004012407A (ja) | 2002-06-11 | 2004-01-15 | Hitachi Ltd | 透過画像提供システムおよびx線ct・dr撮影サービスシステム |
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JP6767045B2 (ja) * | 2016-11-02 | 2020-10-14 | 株式会社ミツトヨ | 計測用x線ct装置と座標測定機の座標合せ治具 |
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-
2016
- 2016-11-02 JP JP2016215672A patent/JP6767045B2/ja not_active Expired - Fee Related
-
2017
- 2017-11-01 US US15/800,408 patent/US10545102B2/en active Active
- 2017-11-02 CN CN201711062976.1A patent/CN108007400B/zh active Active
- 2017-11-02 DE DE102017010200.7A patent/DE102017010200A1/de active Pending
Also Published As
Publication number | Publication date |
---|---|
DE102017010200A1 (de) | 2018-05-03 |
US10545102B2 (en) | 2020-01-28 |
CN108007400A (zh) | 2018-05-08 |
JP2018072274A (ja) | 2018-05-10 |
US20180120242A1 (en) | 2018-05-03 |
CN108007400B (zh) | 2021-09-24 |
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