JP6285987B2 - 異物検査装置 - Google Patents
異物検査装置 Download PDFInfo
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- JP6285987B2 JP6285987B2 JP2016120850A JP2016120850A JP6285987B2 JP 6285987 B2 JP6285987 B2 JP 6285987B2 JP 2016120850 A JP2016120850 A JP 2016120850A JP 2016120850 A JP2016120850 A JP 2016120850A JP 6285987 B2 JP6285987 B2 JP 6285987B2
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- 238000007689 inspection Methods 0.000 title claims description 146
- 239000002184 metal Substances 0.000 claims description 121
- 229910052751 metal Inorganic materials 0.000 claims description 121
- 238000001514 detection method Methods 0.000 claims description 90
- 239000000463 material Substances 0.000 claims description 20
- 239000012811 non-conductive material Substances 0.000 claims description 9
- 239000000126 substance Substances 0.000 claims description 7
- 238000012546 transfer Methods 0.000 claims description 7
- 238000011144 upstream manufacturing Methods 0.000 claims description 6
- 230000003993 interaction Effects 0.000 claims description 4
- 239000000696 magnetic material Substances 0.000 claims description 2
- 230000032258 transport Effects 0.000 description 44
- 230000005540 biological transmission Effects 0.000 description 20
- 230000001629 suppression Effects 0.000 description 8
- 239000000758 substrate Substances 0.000 description 7
- 229910001220 stainless steel Inorganic materials 0.000 description 6
- 239000010935 stainless steel Substances 0.000 description 6
- 210000000078 claw Anatomy 0.000 description 4
- 230000004907 flux Effects 0.000 description 4
- 238000003825 pressing Methods 0.000 description 4
- 238000012545 processing Methods 0.000 description 4
- 239000000470 constituent Substances 0.000 description 3
- 230000006870 function Effects 0.000 description 3
- 230000007246 mechanism Effects 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 229920005989 resin Polymers 0.000 description 3
- 239000011347 resin Substances 0.000 description 3
- 238000004891 communication Methods 0.000 description 2
- 230000005674 electromagnetic induction Effects 0.000 description 2
- 230000035699 permeability Effects 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 238000002834 transmittance Methods 0.000 description 2
- 229920001342 Bakelite® Polymers 0.000 description 1
- 239000004637 bakelite Substances 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 238000012905 input function Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
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- 238000012423 maintenance Methods 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 239000002023 wood Substances 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/18—Investigating the presence of flaws defects or foreign matter
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
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- Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Toxicology (AREA)
- Electrochemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Description
Claims (5)
- 被検査物を搬送する搬送部と、
X線の透過性を利用して、前記搬送部で搬送されている前記被検査物に含まれる異物を検出するX線検査部と、
磁界と金属との相互作用を利用して、前記搬送部で搬送されている前記被検査物に含まれる金属を異物として検出する金属検出部と、
前記搬送部の少なくとも一部、前記X線検査部、及び前記金属検出部を内部に収容し、前記搬送部による前記被検査物の搬入口、及び前記搬送部による前記被検査物の搬出口を有する筐体と、を備え、
前記搬送部は、
前記搬送部による前記被検査物の搬送領域の上流端に配置された第1送りローラと、
前記搬送領域の下流端に配置された第2送りローラと、
前記第1送りローラ及び前記第2送りローラに架けられた無端ベルトと、
非磁性の材料で形成され、前記搬送領域において前記無端ベルトを支持する支持プレートと、
前記搬入口及び前記搬出口のうち前記X線検査部に近い前記搬入口又は前記搬出口において前記X線を遮蔽するX線遮蔽プレートと、を有する、異物検査装置。 - 前記X線遮蔽プレートは、前記支持プレートに取り付けられている、請求項1に記載の異物検査装置。
- 前記X線遮蔽プレートは、金属で形成されており、
前記X線遮蔽プレートは、金属で形成された前記筐体と電気的に絶縁されている、請求項1又は2に記載の異物検査装置。 - 前記第1送りローラ及び前記第2送りローラは、金属で形成されており、
前記第1送りローラ及び前記第2送りローラは、金属で形成された前記筐体と電気的に絶縁されている、請求項1〜3のいずれか一項に記載の異物検査装置。 - 前記支持プレートを形成する前記材料は、非導電性の材料である、請求項1〜4のいずれか一項に記載の異物検査装置。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016120850A JP6285987B2 (ja) | 2016-06-17 | 2016-06-17 | 異物検査装置 |
PCT/JP2017/022168 WO2017217499A1 (ja) | 2016-06-17 | 2017-06-15 | 異物検査装置 |
Applications Claiming Priority (1)
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---|---|---|---|
JP2016120850A JP6285987B2 (ja) | 2016-06-17 | 2016-06-17 | 異物検査装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2017223615A JP2017223615A (ja) | 2017-12-21 |
JP6285987B2 true JP6285987B2 (ja) | 2018-02-28 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2016120850A Active JP6285987B2 (ja) | 2016-06-17 | 2016-06-17 | 異物検査装置 |
Country Status (2)
Country | Link |
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JP (1) | JP6285987B2 (ja) |
WO (1) | WO2017217499A1 (ja) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108802072A (zh) * | 2018-06-15 | 2018-11-13 | 珠海格力电器股份有限公司 | 检测装置 |
JP6497725B1 (ja) * | 2018-11-09 | 2019-04-10 | 株式会社エー・アンド・デイ | 金属検出機 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8451974B2 (en) * | 2003-04-25 | 2013-05-28 | Rapiscan Systems, Inc. | X-ray tomographic inspection system for the identification of specific target items |
JPWO2005043149A1 (ja) * | 2003-10-30 | 2007-11-29 | トック・エンジニアリング株式会社 | ハイブリッド型異物検知装置とそのトレサビリティ用システム |
JP2008268035A (ja) * | 2007-04-20 | 2008-11-06 | Ishida Co Ltd | 異物検査装置 |
JP6346764B2 (ja) * | 2013-06-25 | 2018-06-20 | 日新電子工業株式会社 | 異物検査装置 |
-
2016
- 2016-06-17 JP JP2016120850A patent/JP6285987B2/ja active Active
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2017
- 2017-06-15 WO PCT/JP2017/022168 patent/WO2017217499A1/ja active Application Filing
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Publication number | Publication date |
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JP2017223615A (ja) | 2017-12-21 |
WO2017217499A1 (ja) | 2017-12-21 |
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