JP5547548B2 - 電子増倍率の測定方法 - Google Patents
電子増倍率の測定方法 Download PDFInfo
- Publication number
- JP5547548B2 JP5547548B2 JP2010112209A JP2010112209A JP5547548B2 JP 5547548 B2 JP5547548 B2 JP 5547548B2 JP 2010112209 A JP2010112209 A JP 2010112209A JP 2010112209 A JP2010112209 A JP 2010112209A JP 5547548 B2 JP5547548 B2 JP 5547548B2
- Authority
- JP
- Japan
- Prior art keywords
- image
- electron multiplication
- multiplication factor
- average value
- luminance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000000034 method Methods 0.000 title claims description 36
- 238000003384 imaging method Methods 0.000 claims description 51
- 239000006185 dispersion Substances 0.000 claims description 35
- 238000006243 chemical reaction Methods 0.000 claims description 27
- 235000019557 luminance Nutrition 0.000 description 86
- 238000012545 processing Methods 0.000 description 11
- 238000000691 measurement method Methods 0.000 description 6
- 238000001444 catalytic combustion detection Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 5
- 238000012546 transfer Methods 0.000 description 4
- 238000004364 calculation method Methods 0.000 description 3
- 238000012937 correction Methods 0.000 description 2
- 238000009825 accumulation Methods 0.000 description 1
- 230000002238 attenuated effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000012886 linear function Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/148—Charge coupled imagers
- H01L27/14831—Area CCD imagers
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/63—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to dark current
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
- H04N25/713—Transfer or readout registers; Split readout registers or multiple readout registers
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
- H04N25/72—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors using frame transfer [FT]
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Studio Devices (AREA)
Description
Claims (3)
- 電子増倍型撮像素子を備える撮像装置における電子増倍率の測定方法であって、
予め設定された所定の電子増倍率において、第1光量の入射光による第1増倍画像と、前記第1光量と異なる第2光量の入射光による第2増倍画像と、を取得する第1工程と、
前記第1増倍画像に含まれる画素の輝度平均値及び輝度分散平均値を算出する第2工程と、
前記第2増倍画像に含まれる画素の輝度平均値及び輝度分散平均値を算出する第3工程と、
前記第2及び前記第3工程で算出した前記輝度平均値及び前記輝度分散平均値を用いて、前記第1及び前記第2増倍画像の変換係数を算出する第4工程と、
前記第4工程で算出した前記変換係数と基準電子増倍率における変換係数との比から、前記第1及び前記第2増倍画像の電子増倍率を求める第5工程と、
を備えることを特徴とする電子増倍率の測定方法。 - 前記第5工程で求めた前記電子増倍率を、該電子増倍率に応じた過剰雑音指数を用いて補正する工程をさらに備えることを特徴とする請求項1記載の電子増倍率の測定方法。
- 前記第1工程では、互いに異なる時刻に撮像された第3及び第4増倍画像を前記第1増倍画像として取得すると共に、互いに異なる時刻に撮像された第5及び第6増倍画像を第2増倍画像として取得し、
前記第2工程では、前記第3増倍画像と前記第4増倍画像との加算画像に基づいて、前記第1増倍画像に含まれる画素の輝度平均値を算出すると共に、前記第3増倍画像と前記第4増倍画像との減算画像に基づいて、前記第1増倍画像に含まれる画素の輝度分散平均値を算出し、
前記第3工程では、前記第5増倍画像と前記第6増倍画像との加算画像に基づいて、前記第2増倍画像に含まれる画素の輝度平均値を算出すると共に、前記第5増倍画像と前記第6増倍画像との減算画像に基づいて、前記第2増倍画像に含まれる画素の輝度分散平均値を算出する、
ことを特徴とする請求項1又は2記載の電子増倍率の測定方法。
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2010112209A JP5547548B2 (ja) | 2010-05-14 | 2010-05-14 | 電子増倍率の測定方法 |
EP11780425.2A EP2571254A4 (en) | 2010-05-14 | 2011-03-07 | METHOD FOR MEASURING ELECTRON MULTIPLICATION FACTORS |
US13/696,886 US9142591B2 (en) | 2010-05-14 | 2011-03-07 | Method for measuring electronic multiplication factor |
PCT/JP2011/055258 WO2011142168A1 (ja) | 2010-05-14 | 2011-03-07 | 電子増倍率の測定方法 |
TW100109450A TWI540898B (zh) | 2010-05-14 | 2011-03-18 | Method of determination of electron multiplication rate |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2010112209A JP5547548B2 (ja) | 2010-05-14 | 2010-05-14 | 電子増倍率の測定方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2011243641A JP2011243641A (ja) | 2011-12-01 |
JP5547548B2 true JP5547548B2 (ja) | 2014-07-16 |
Family
ID=44914226
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2010112209A Expired - Fee Related JP5547548B2 (ja) | 2010-05-14 | 2010-05-14 | 電子増倍率の測定方法 |
Country Status (5)
Country | Link |
---|---|
US (1) | US9142591B2 (ja) |
EP (1) | EP2571254A4 (ja) |
JP (1) | JP5547548B2 (ja) |
TW (1) | TWI540898B (ja) |
WO (1) | WO2011142168A1 (ja) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB201516701D0 (en) * | 2015-09-21 | 2015-11-04 | Innovation & Business Dev Solutions Ltd | Time of flight distance sensor |
US9400916B1 (en) * | 2015-10-02 | 2016-07-26 | Silk Id Systems, Inc. | System and method for detecting an organic body for authentication |
GB201704452D0 (en) | 2017-03-21 | 2017-05-03 | Photonic Vision Ltd | Time of flight sensor |
JP2022090239A (ja) * | 2020-12-07 | 2022-06-17 | 浜松ホトニクス株式会社 | 光電変換装置 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003009000A (ja) * | 2001-06-21 | 2003-01-10 | Fuji Photo Film Co Ltd | 撮像装置 |
JP2003158679A (ja) * | 2001-08-20 | 2003-05-30 | Fuji Photo Film Co Ltd | 電荷増倍型固体電子撮像装置およびその制御方法 |
GB0501149D0 (en) * | 2005-01-20 | 2005-02-23 | Andor Technology Plc | Automatic calibration of electron multiplying CCds |
JP2006324614A (ja) * | 2005-05-16 | 2006-11-30 | Koji Eto | 高ダイナミックレンジ画素周辺記録型撮像素子 |
GB2431538B (en) * | 2005-10-24 | 2010-12-22 | E2V Tech | CCD device |
GB2435126A (en) * | 2006-02-14 | 2007-08-15 | E2V Tech | EMCCD device with multiplication register gain measurement allowing realtime calibration of a camera in use. |
JP2008271049A (ja) * | 2007-04-18 | 2008-11-06 | Hamamatsu Photonics Kk | 撮像装置及びそのゲイン調整方法 |
-
2010
- 2010-05-14 JP JP2010112209A patent/JP5547548B2/ja not_active Expired - Fee Related
-
2011
- 2011-03-07 EP EP11780425.2A patent/EP2571254A4/en not_active Withdrawn
- 2011-03-07 US US13/696,886 patent/US9142591B2/en not_active Expired - Fee Related
- 2011-03-07 WO PCT/JP2011/055258 patent/WO2011142168A1/ja active Application Filing
- 2011-03-18 TW TW100109450A patent/TWI540898B/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
US9142591B2 (en) | 2015-09-22 |
EP2571254A1 (en) | 2013-03-20 |
EP2571254A4 (en) | 2014-06-25 |
WO2011142168A1 (ja) | 2011-11-17 |
JP2011243641A (ja) | 2011-12-01 |
TW201143406A (en) | 2011-12-01 |
US20130070088A1 (en) | 2013-03-21 |
TWI540898B (zh) | 2016-07-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
WO2014065056A1 (ja) | 撮像装置、および画像処理方法、並びにプログラム | |
US7907194B2 (en) | Imaging apparatus and gain adjusting method for the same | |
US20100039539A1 (en) | Image processing apparatus and image processing method | |
WO2010001811A1 (ja) | 画像信号補正装置、撮像装置、画像信号補正方法、およびプログラム | |
TWI520606B (zh) | 影像處理設備及影像處理設備之控制方法 | |
JP2009284424A (ja) | 撮像装置、撮像方法及びプログラム | |
JP5656613B2 (ja) | 撮像装置及びその制御方法 | |
JPH08331463A (ja) | アクティブ画素を用いたccd撮像装置のスミア修正 | |
JP5547548B2 (ja) | 電子増倍率の測定方法 | |
JP5520833B2 (ja) | 撮像方法および撮像装置 | |
JP5207926B2 (ja) | 撮像装置及びその制御方法 | |
JP5013718B2 (ja) | 放射線画像取得装置及び方法 | |
JP6478774B2 (ja) | 撮像装置、撮像方法及びプログラム | |
JP2013150144A (ja) | 撮像方法および撮像装置 | |
JP6270400B2 (ja) | 画像処理装置、画像処理方法及び画像処理プログラム | |
JP5551510B2 (ja) | 電子増倍率の測定方法及び撮像装置 | |
JP5588729B2 (ja) | 画像信号処理装置 | |
JP5355726B2 (ja) | 撮影装置、画像処理装置、撮影システム、放射線撮影装置および画像処理方法 | |
TW200525745A (en) | Signal processing method and image acquiring device | |
JP2012120076A (ja) | 撮像装置 | |
JP5421703B2 (ja) | 画像信号処理装置および撮像装置 | |
JP2013115547A (ja) | 撮像装置及びその制御方法 | |
JP2013118598A (ja) | 撮像装置のシェーディング補正方法、及び撮像装置 | |
JP2011055336A (ja) | 撮像装置及び信号処理方法 | |
JP2007228259A (ja) | 信号処理装置及び撮像装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20130221 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20140311 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20140423 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20140513 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20140515 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 5547548 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
LAPS | Cancellation because of no payment of annual fees |