JP5442052B2 - 粒子分析装置 - Google Patents
粒子分析装置 Download PDFInfo
- Publication number
- JP5442052B2 JP5442052B2 JP2012032161A JP2012032161A JP5442052B2 JP 5442052 B2 JP5442052 B2 JP 5442052B2 JP 2012032161 A JP2012032161 A JP 2012032161A JP 2012032161 A JP2012032161 A JP 2012032161A JP 5442052 B2 JP5442052 B2 JP 5442052B2
- Authority
- JP
- Japan
- Prior art keywords
- light receiving
- receiving unit
- time
- overcurrent
- series data
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000002245 particle Substances 0.000 title claims description 93
- 238000001514 detection method Methods 0.000 claims description 28
- 238000004458 analytical method Methods 0.000 claims description 12
- 238000004364 calculation method Methods 0.000 claims description 9
- 230000000717 retained effect Effects 0.000 claims description 6
- 239000002612 dispersion medium Substances 0.000 claims description 4
- 238000005259 measurement Methods 0.000 description 22
- 230000010365 information processing Effects 0.000 description 15
- 239000000523 sample Substances 0.000 description 14
- 238000000034 method Methods 0.000 description 9
- 238000007493 shaping process Methods 0.000 description 5
- 230000015556 catabolic process Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 230000003287 optical effect Effects 0.000 description 4
- 239000002105 nanoparticle Substances 0.000 description 3
- 230000007423 decrease Effects 0.000 description 2
- 239000010419 fine particle Substances 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000000704 physical effect Effects 0.000 description 2
- 230000000630 rising effect Effects 0.000 description 2
- 239000012488 sample solution Substances 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 230000005653 Brownian motion process Effects 0.000 description 1
- 238000012951 Remeasurement Methods 0.000 description 1
- 238000005537 brownian motion Methods 0.000 description 1
- 230000008602 contraction Effects 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 238000007561 laser diffraction method Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 230000033001 locomotion Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 238000004062 sedimentation Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
- G01B11/10—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving
- G01B11/105—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving using photoelectric detection means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means
- G01N15/0211—Investigating a scatter or diffraction pattern
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N2015/0038—Investigating nanoparticles
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means
- G01N15/0211—Investigating a scatter or diffraction pattern
- G01N2015/0222—Investigating a scatter or diffraction pattern from dynamic light scattering, e.g. photon correlation spectroscopy
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Dispersion Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Or Analysing Biological Materials (AREA)
Description
4 ・・・光射出部
5 ・・・受光部
6 ・・・カウンタ
8 ・・・コリレータ
9 ・・・算出部
104・・・過電流検知部
105・・・PMT制御部
Claims (4)
- 分散媒中を運動する粒子群に向かって光を射出する光射出部と、
光射出部からの光が照射された粒子群から発される散乱光を受光して電流信号を出力する受光部と、
受光部が出力する電流信号から得られるパルスの数の時系列データに基づいて粒子分析に係るデータ処理を行うデータ処理部と、
受光部が出力する電流信号に基づいて受光部に過電流が流れたことを検知する過電流検知部と、
過電流検知部が過電流を検知した場合に、受光部の動作を停止させ、且つ受光部の動作の停止から所定時間後に受光部の動作を再開させる制御部とを備えてなり、
データ処理部が、受光部の動作の停止の際にその停止の前までの時系列データを保持し、受光部の動作の再開後は保持された時系列データと再開後に得た時系列データとでデータ処理を行う粒子分析装置。 - 制御部は、過電流検知部が過電流を所定回以上検知した場合に、受光部の動作を中止させて粒子の分析を中止する請求項1記載の粒子分析装置。
- データ処理部が、ゲートを開いている状態において受け付けた、電流信号から得られるパルスの数をカウントする並列配置した複数のマルチビットカウンタと、
受光部の動作の停止の際にその停止の前までのパルス数の時系列データを保持し、受光部の動作の再開後は保持されたパルス数の時系列データと再開後のパルス数の時系列データとから自己相関データの作成を再開するコリレータと、
コリレータから得られる自己相関データに基づいて粒子群の粒径分布を算出する算出部とを備えている請求項1又は2記載の粒子分析装置。 - 請求項1乃至3に記載の粒子分析装置を利用した粒子分析方法であって、
光が照射された粒子群から発される散乱光を受光する受光部が出力する電流信号から得られるパルスの数の時系列データに基づいて粒子分析に係るデータ処理を行う間に、受光部が出力する電流信号に基づいて受光部に過電流が流れたことを検知した場合に、受光部の動作を停止させ、
受光部の動作の停止の際にその停止の前までの時系列データを保持し、
受光部の動作の停止から所定時間後に受光部の動作を再開させ、
受光部の動作の再開後は保持された時系列データと再開後に得た時系列データとでデータ処理を行う粒子分析方法。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012032161A JP5442052B2 (ja) | 2012-02-16 | 2012-02-16 | 粒子分析装置 |
CN2013100474836A CN103257097A (zh) | 2012-02-16 | 2013-02-06 | 颗粒分析装置和颗粒分析方法 |
GB1302604.2A GB2499521B (en) | 2012-02-16 | 2013-02-14 | Particle analytical device |
US13/767,980 US9243892B2 (en) | 2012-02-16 | 2013-02-15 | Particle analytical device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012032161A JP5442052B2 (ja) | 2012-02-16 | 2012-02-16 | 粒子分析装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2013167588A JP2013167588A (ja) | 2013-08-29 |
JP5442052B2 true JP5442052B2 (ja) | 2014-03-12 |
Family
ID=48048394
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2012032161A Expired - Fee Related JP5442052B2 (ja) | 2012-02-16 | 2012-02-16 | 粒子分析装置 |
Country Status (4)
Country | Link |
---|---|
US (1) | US9243892B2 (ja) |
JP (1) | JP5442052B2 (ja) |
CN (1) | CN103257097A (ja) |
GB (1) | GB2499521B (ja) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103760073B (zh) * | 2014-01-08 | 2015-10-28 | 大连理工大学 | 一种模拟室内灰尘飞散沉降特性的装置的测试方法 |
DE102014010185A1 (de) * | 2014-07-09 | 2016-01-14 | Carl Zeiss Microscopy Gmbh | Verfahren zum Betrieb eines Laser-Scanning-Mikroskops |
EP3023770B1 (en) * | 2014-11-21 | 2017-12-27 | Anton Paar GmbH | Determination of a refractive index of a sample and of a particle size of particles in said sample by means of an apparatus for measuring light scattering |
CN105987868B (zh) * | 2015-02-09 | 2019-11-12 | 上海北分科技股份有限公司 | 一种低浓度烟气颗粒物检测*** |
CN105203439B (zh) * | 2015-09-11 | 2018-01-05 | 珠海格力电器股份有限公司 | 空气净化控制方法及装置 |
EP3353527B1 (en) * | 2015-09-23 | 2022-12-28 | Malvern Panalytical Limited | Particle characterisation |
US11002655B2 (en) | 2015-09-23 | 2021-05-11 | Malvern Panalytical Limited | Cuvette carrier |
JP6602211B2 (ja) * | 2016-01-22 | 2019-11-06 | 株式会社堀場製作所 | 粒子分析装置、粒子分析方法及び粒子分析プログラム |
GB201604460D0 (en) | 2016-03-16 | 2016-04-27 | Malvern Instr Ltd | Dynamic light scattering |
JP6749011B2 (ja) * | 2016-06-13 | 2020-09-02 | 学校法人 東洋大学 | 粒径測定システムおよび粒径測定方法 |
EP3379232A1 (en) | 2017-03-23 | 2018-09-26 | Malvern Panalytical Limited | Particle characterisation |
US11957447B2 (en) | 2019-06-18 | 2024-04-16 | University Of Georgia Research Foundation, Inc. | Systems and methods of use thereof for determining aerosol particle characteristics |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1802269C3 (de) * | 1968-10-10 | 1979-09-27 | Kernforschungszentrum Karlsruhe Gmbh, 7500 Karlsruhe | Verfahren zum Messen der Konzentration und/oder Größe von Schwebstoffteilchen |
DE2440376C3 (de) * | 1974-08-23 | 1979-11-29 | Bayer Ag, 5090 Leverkusen | Teilchengrößen-Analyse von polydispersen Systemen mit Hilfe der Laserlichtstreuung |
JPS6035882U (ja) | 1983-08-17 | 1985-03-12 | 株式会社大井製作所 | 往復回走する索条の緩み吸収装置 |
US4676640A (en) * | 1984-09-12 | 1987-06-30 | Syntex (U.S.A.) Inc. | Fluctuation analysis for enhanced particle detection |
JPH063413B2 (ja) * | 1986-06-06 | 1994-01-12 | 興和株式会社 | 流体中の粒子計測装置 |
US4830494A (en) * | 1986-07-10 | 1989-05-16 | Kowa Company Ltd. | Method and apparatus for measuring particles in a fluid |
JP2899360B2 (ja) * | 1990-05-21 | 1999-06-02 | 興和株式会社 | 流体中の粒子計測方法及びその装置 |
JPH0548359U (ja) | 1991-11-28 | 1993-06-25 | 三洋電機株式会社 | 半導体装置 |
JP3231134B2 (ja) * | 1993-05-11 | 2001-11-19 | 住友化学工業株式会社 | 微粒子計測方法およびそのための装置 |
JP3579174B2 (ja) * | 1996-02-29 | 2004-10-20 | 勇蔵 森 | 微粒子径測定装置 |
JP2000009644A (ja) * | 1998-06-19 | 2000-01-14 | Hitachi Ltd | 蛍光光度計 |
DE10202999B4 (de) * | 2002-01-26 | 2004-04-15 | Palas Gmbh Partikel- Und Lasermesstechnik | Verfahren und Vorrichtung zum Messen der Größenverteilung und Konzentration von Partikeln in einem Fluid |
JP4346476B2 (ja) * | 2004-03-08 | 2009-10-21 | 株式会社堀場製作所 | 粒径分布測定装置 |
JP5057922B2 (ja) * | 2006-12-28 | 2012-10-24 | 株式会社堀場製作所 | コリレータ |
-
2012
- 2012-02-16 JP JP2012032161A patent/JP5442052B2/ja not_active Expired - Fee Related
-
2013
- 2013-02-06 CN CN2013100474836A patent/CN103257097A/zh active Pending
- 2013-02-14 GB GB1302604.2A patent/GB2499521B/en not_active Expired - Fee Related
- 2013-02-15 US US13/767,980 patent/US9243892B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
GB201302604D0 (en) | 2013-04-03 |
CN103257097A (zh) | 2013-08-21 |
GB2499521A (en) | 2013-08-21 |
JP2013167588A (ja) | 2013-08-29 |
GB2499521B (en) | 2017-07-19 |
US20130218519A1 (en) | 2013-08-22 |
US9243892B2 (en) | 2016-01-26 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP5442052B2 (ja) | 粒子分析装置 | |
JP5518110B2 (ja) | 粒径分布測定装置 | |
JP4971451B2 (ja) | 流動式サイトメトリのパルスの区別と応用 | |
US11047786B2 (en) | Apparatus and method for measuring particle size distribution, and program for particle size distribution measuring apparatus | |
JP2017526914A (ja) | フローサイトメーターを用いた多重ピークイベントの評価 | |
US20180284007A1 (en) | Automated drop delay calculation | |
CN110140032B (zh) | 测量设备 | |
US7724369B2 (en) | Correlator | |
JP4346476B2 (ja) | 粒径分布測定装置 | |
JP4928502B2 (ja) | 液体シンチレーションカウンタ | |
US10024779B2 (en) | Sample measuring apparatus and sample measuring method | |
JP2018163163A (ja) | 気泡検出器 | |
CN109030299B (zh) | 高浓度样品的后向散射纳米颗粒粒度测量装置的测量方法 | |
JP4284031B2 (ja) | フローサイトメータ | |
US9869626B2 (en) | Particle size distribution measuring apparatus and particle size distribution measuring method | |
US10458976B2 (en) | Early warning of changes in health and robustness using narrowly forward scattered light to track ease of morphological changes of blood cells | |
JP3963942B1 (ja) | 液中粒子計数方法 | |
CN109030298B (zh) | 一种利用后向散射纳米颗粒粒度测量装置实现的测量方法 | |
KR20180082233A (ko) | 유동 유체 내의 나노입자 거동 예측 방법 및 장치 | |
JP2022070861A (ja) | 気泡検出器 | |
JP2020091299A (ja) | 気泡検出器 | |
JPH04109141A (ja) | 粒子計数方法及び装置 | |
RU2003122736A (ru) | Способ измерения декремента рентгеновского показателя преломления | |
JP2017032310A (ja) | 光源の駆動条件調整方法 | |
JPH0572107A (ja) | 媒体中の微粒子物質の検出方法および装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20131206 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20131212 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20131217 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 5442052 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
LAPS | Cancellation because of no payment of annual fees |