JP5257007B2 - 磁気センサー - Google Patents
磁気センサー Download PDFInfo
- Publication number
- JP5257007B2 JP5257007B2 JP2008287996A JP2008287996A JP5257007B2 JP 5257007 B2 JP5257007 B2 JP 5257007B2 JP 2008287996 A JP2008287996 A JP 2008287996A JP 2008287996 A JP2008287996 A JP 2008287996A JP 5257007 B2 JP5257007 B2 JP 5257007B2
- Authority
- JP
- Japan
- Prior art keywords
- layer
- magnetization
- magnetic sensor
- channel
- channel layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/09—Magnetoresistive devices
- G01R33/093—Magnetoresistive devices using multilayer structures, e.g. giant magnetoresistance sensors
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y25/00—Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
- G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
- G11B5/3903—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects using magnetic thin film layers or their effects, the films being part of integrated structures
- G11B5/3906—Details related to the use of magnetic thin film layers or to their effects
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
- G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
- G11B2005/3996—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects large or giant magnetoresistive effects [GMR], e.g. as generated in spin-valve [SV] devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/32—Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
- H01F10/324—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
- H01F10/3254—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer the spacer being semiconducting or insulating, e.g. for spin tunnel junction [STJ]
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/11—Magnetic recording head
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/11—Magnetic recording head
- Y10T428/115—Magnetic layer composition
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Physics & Mathematics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Hall/Mr Elements (AREA)
- Magnetic Heads (AREA)
Description
(第1実施形態)
(第2実施形態)
Claims (13)
- チャンネル層と、
前記チャンネル層の第一の部分上に設けられ、外部磁界を検出する磁化自由層と、
前記チャンネル層の前記第一の部分とは異なる第二の部分上に設けられた磁化固定層と、を備え、
前記チャンネル層と対向する面における前記磁化固定層の断面積が、前記チャンネル層と対向する面における前記磁化自由層の断面積よりも大きく、
前記チャンネル層の厚み方向から見て、前記磁化自由層の幾何学的重心と、前記磁化固定層の幾何学的重心と、を結ぶ直線と直交する方向における前記チャンネル層の幅が、前記磁化固定層から前記磁化自由層に向かって狭くなる磁気センサー。 - 前記チャンネル層の厚み方向から見て、前記磁化自由層の幾何学的重心と、前記磁化固定層の幾何学的重心と、を結ぶ直線と直交する方向における前記磁化固定層の幅は、前記方向における前記磁化自由層の幅よりも大きい請求項1に記載の磁気センサー。
- 前記チャンネル層の厚み方向から見て、前記直線に沿う方向の前記磁化固定層の長さは、前記磁化固定層の前記幅よりも小さい請求項2に記載の磁気センサー。
- 前記チャンネル層の厚み方向から見て、前記磁化固定層は、前記磁化自由層の幾何学的重心を中心とする円環の一部を構成する円弧形状をなす請求項2または3に記載の磁気センサー。
- 前記チャンネル層の厚み方向から見て、前記直線に対して線対称である請求項4に記載の磁気センサー。
- 前記磁化自由層にバイアス磁界を印加する永久磁石を更に備える請求項1〜5のいずれか1項に記載の磁気センサー。
- 前記磁化固定層の磁化方向が、反強磁性層、形状異方性、及び成膜時における外部磁場のうち少なくとも一つによって固定されている請求項1〜6のいずれか1項に記載の磁気センサー。
- 前記磁化固定層の保磁力は、前記磁化自由層の保磁力よりも大きい請求項1〜7のいずれか1項に記載の磁気センサー。
- 前記磁化自由層は、前記チャンネル層の検出対象となる磁束が進入する側に配置され、前記磁化固定層は、前記チャンネル層の検出対象となる磁束が進入する側の反対側に配置されている請求項1〜8のいずれか1項に記載の磁気センサー。
- 前記磁化自由層の材料は、Cr、Mn、Co、Fe及びNiからなる群から選択される金属、前記群の元素を1以上含む合金、又は、前記群から選択される1以上の元素及びB、C、及びNからなる群から選択される1以上の元素を含む合金である請求項1〜9のいずれか1項に記載の磁気センサー。
- 前記磁化固定層の材料は、Cr、Mn、Co、Fe及びNiからなる群から選択される金属、前記群の元素を1以上含む合金、又は、前記群から選択される1以上の元素及びB、C、及びNからなる群から選択される1以上の元素を含む合金である請求項1〜10のいずれか1項に記載の磁気センサー。
- 前記チャンネル層の材料は、B、C、Mg、Al、Cu、及びZnからなる群から選択される一つ以上の元素を含む材料である請求項1〜11のいずれか1項に記載の磁気センサー。
- 前記チャンネル層の材料は、Si、ZnO、及びGaAsのうちのいずれか一つを含む半導体化合物である請求項1〜11のいずれか1項に記載の磁気センサー。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008287996A JP5257007B2 (ja) | 2008-11-10 | 2008-11-10 | 磁気センサー |
US12/608,583 US8085513B2 (en) | 2008-11-10 | 2009-10-29 | Magnetic sensor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008287996A JP5257007B2 (ja) | 2008-11-10 | 2008-11-10 | 磁気センサー |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2010113788A JP2010113788A (ja) | 2010-05-20 |
JP5257007B2 true JP5257007B2 (ja) | 2013-08-07 |
Family
ID=42165471
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2008287996A Expired - Fee Related JP5257007B2 (ja) | 2008-11-10 | 2008-11-10 | 磁気センサー |
Country Status (2)
Country | Link |
---|---|
US (1) | US8085513B2 (ja) |
JP (1) | JP5257007B2 (ja) |
Families Citing this family (28)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4731393B2 (ja) * | 2006-04-28 | 2011-07-20 | 株式会社日立製作所 | 磁気再生ヘッド |
JP5251281B2 (ja) * | 2008-06-11 | 2013-07-31 | Tdk株式会社 | 磁気センサー |
JP5157676B2 (ja) * | 2008-06-25 | 2013-03-06 | Tdk株式会社 | 磁気センサー |
JP2010020826A (ja) | 2008-07-09 | 2010-01-28 | Tdk Corp | 磁気センサー |
JP2012039010A (ja) * | 2010-08-10 | 2012-02-23 | Tdk Corp | 磁気センサー及び磁気検出装置 |
JP5736836B2 (ja) * | 2011-02-23 | 2015-06-17 | Tdk株式会社 | スピン伝導型磁気センサ |
US8619393B2 (en) * | 2011-08-16 | 2013-12-31 | Seagate Technology Llc | Devices and methods using recessed electron spin analyzers |
JP5754326B2 (ja) * | 2011-09-27 | 2015-07-29 | Tdk株式会社 | スピン伝導素子 |
JP5935444B2 (ja) * | 2012-03-29 | 2016-06-15 | Tdk株式会社 | スピン伝導素子、及びスピン伝導を用いた磁気センサ及び磁気ヘッド |
KR101699780B1 (ko) | 2012-11-08 | 2017-01-25 | 고쿠리츠켄큐카이하츠호진 카가쿠기쥬츠신코키코 | 스핀 밸브 소자 |
US8717715B1 (en) | 2012-12-13 | 2014-05-06 | HGST Netherlands B.V. | Spin accumulation magnetic read sensor |
US9142229B2 (en) | 2013-03-15 | 2015-09-22 | Seagate Technology Llc | Heat assisted magnetic recording head having thermal sensor with high-TCR transparent conducting oxide |
JP6163038B2 (ja) * | 2013-07-26 | 2017-07-12 | 株式会社東芝 | 磁気抵抗効果素子、磁気ヘッドおよび磁気記録再生装置 |
JP6413428B2 (ja) | 2013-08-02 | 2018-10-31 | Tdk株式会社 | 磁気センサ、磁気ヘッド及び生体磁気センサ |
JP6121311B2 (ja) * | 2013-11-14 | 2017-04-26 | アルプス電気株式会社 | 磁気検知装置 |
US8953284B1 (en) * | 2013-11-20 | 2015-02-10 | HGST Netherlands B.V. | Multi-read sensor having a narrow read gap structure |
JP6397712B2 (ja) | 2014-10-01 | 2018-09-26 | 株式会社東芝 | 磁気抵抗効果素子、磁気抵抗効果素子の製造方法、磁気ヘッド、および磁気記録再生装置 |
JP6439413B6 (ja) | 2014-12-01 | 2019-01-30 | Tdk株式会社 | 磁気センサ、磁気ヘッド及び生体磁気センサ |
US9478240B1 (en) | 2015-05-21 | 2016-10-25 | Seagate Technology Llc | Spin-signal enhancement in a lateral spin valve reader |
US9685178B1 (en) | 2015-06-15 | 2017-06-20 | Seagate Technology Llc | Lateral spin valve reader with large-area tunneling spin-injector |
US9704515B2 (en) | 2015-09-29 | 2017-07-11 | Seagate Technology Llc | Lateral spin valve reader with in-plane detector |
US9978412B1 (en) | 2015-11-06 | 2018-05-22 | Seagate Technology Llc | Transparent thermocouple for heat-assisted magnetic recording device |
US9812157B1 (en) | 2016-03-07 | 2017-11-07 | Seagate Technology Llc | Lateral spin valve reader and fabrication method thereof |
US10141501B2 (en) | 2016-03-30 | 2018-11-27 | Tdk Corporation | Magnetoresistive element |
JP2017188182A (ja) | 2016-03-30 | 2017-10-12 | Tdk株式会社 | 磁気抵抗効果素子および磁気センサ |
US9934798B1 (en) | 2016-09-28 | 2018-04-03 | Seagate Technology Llc | Lateral spin valve reader with vertically-integrated two-dimensional semiconducting channel |
JP6973679B2 (ja) * | 2019-04-08 | 2021-12-01 | Tdk株式会社 | 磁性素子、磁気メモリ、リザボア素子、認識機及び磁性素子の製造方法 |
US11282538B1 (en) | 2021-01-11 | 2022-03-22 | Seagate Technology Llc | Non-local spin valve sensor for high linear density |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
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US20050111138A1 (en) * | 2002-06-27 | 2005-05-26 | Kiyoshi Yamakawa | Thin-film magnetic head and its manufacturing method |
JP4714918B2 (ja) * | 2002-11-29 | 2011-07-06 | 独立行政法人科学技術振興機構 | スピン注入素子及びスピン注入素子を用いた磁気装置 |
JP4029772B2 (ja) | 2003-05-16 | 2008-01-09 | 株式会社日立製作所 | 磁気ヘッドおよびそれを用いた磁気記録再生装置 |
JP4082274B2 (ja) * | 2003-05-22 | 2008-04-30 | 株式会社日立製作所 | 磁気センサ及びそれを備える磁気ヘッド |
JP4128938B2 (ja) * | 2003-10-28 | 2008-07-30 | 株式会社日立製作所 | 磁気ヘッド及び磁気記録再生装置 |
JP2005209248A (ja) * | 2004-01-20 | 2005-08-04 | Hitachi Ltd | 磁気ヘッド及び磁気記録再生装置 |
JP4291751B2 (ja) * | 2004-07-23 | 2009-07-08 | 富士通マイクロエレクトロニクス株式会社 | 半導体記憶装置 |
US7298597B2 (en) * | 2005-03-29 | 2007-11-20 | Hitachi Global Storage Technologies Netherlands B.V. | Magnetoresistive sensor based on spin accumulation effect with free layer stabilized by in-stack orthogonal magnetic coupling |
US7522392B2 (en) * | 2005-05-17 | 2009-04-21 | Hitachi Global Storage Technologies Netherlands B.V. | Magnetoresistive sensor based on spin accumulation effect with terminal connection at back end of sensor |
JP4758812B2 (ja) * | 2006-04-26 | 2011-08-31 | 株式会社日立製作所 | スピン流狭窄層を備えたスピン蓄積素子及びその作製方法 |
JP4731393B2 (ja) * | 2006-04-28 | 2011-07-20 | 株式会社日立製作所 | 磁気再生ヘッド |
US7678475B2 (en) * | 2006-05-05 | 2010-03-16 | Slavin Andrei N | Spin-torque devices |
US7492631B1 (en) * | 2008-05-09 | 2009-02-17 | International Business Machines Corporation | Methods involving resetting spin-torque magnetic random access memory |
-
2008
- 2008-11-10 JP JP2008287996A patent/JP5257007B2/ja not_active Expired - Fee Related
-
2009
- 2009-10-29 US US12/608,583 patent/US8085513B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US20100119875A1 (en) | 2010-05-13 |
JP2010113788A (ja) | 2010-05-20 |
US8085513B2 (en) | 2011-12-27 |
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