JP5239716B2 - LED testing equipment - Google Patents

LED testing equipment Download PDF

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JP5239716B2
JP5239716B2 JP2008259986A JP2008259986A JP5239716B2 JP 5239716 B2 JP5239716 B2 JP 5239716B2 JP 2008259986 A JP2008259986 A JP 2008259986A JP 2008259986 A JP2008259986 A JP 2008259986A JP 5239716 B2 JP5239716 B2 JP 5239716B2
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light
led
light path
shutter
support
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JP2010091341A5 (en
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賢一 鷲尾
昌志 長谷川
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Micronics Japan Co Ltd
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Description

本発明は、複数のＬＥＤ（発光ダイオード）を試験する装置に関し、特にＬＥＤウエーハのような基板に備えられた複数のＬＥＤの検査、すなわち試験をする装置に関する。 The present invention relates to an apparatus for testing a plurality of LEDs (light emitting diodes), and more particularly to an apparatus for inspecting, that is, testing a plurality of LEDs provided on a substrate such as an LED wafer.

ＬＥＤが正しい光を発生するか否かの試験をする装置は、種々提案されている（特許文献１，２，３を参照） Various devices have been proposed for testing whether an LED generates correct light (see Patent Documents 1, 2, and 3 ).

しかし、上記いずれの従来技術も、一つのＬＥＤで発光された光を光学系により受光器に導く構造を有する光学機器に構成されているにすぎないから、ＬＥＤを１つずつ試験することができるにすぎない。このため、ＬＥＤウエーハや配線基板のようなＬＥＤ基板に備えられた複数のＬＥＤを試験する場合、ＬＥＤ毎に試験しなければならず、試験に時間と労力を要する。   However, any of the above prior arts is merely an optical device having a structure that guides light emitted from one LED to a light receiver by an optical system, so that the LEDs can be tested one by one. Only. For this reason, when testing a plurality of LEDs provided on an LED substrate such as an LED wafer or a wiring substrate, the test must be performed for each LED, and the test requires time and labor.

上記課題を解決するために、上記のような光学機器を複数用いて、ＬＥＤ基板に備えられた多数のＬＥＤを同時に又は複数回に分けて試験することが考えられる。しかし、そのような装置では、一回で試験可能のＬＥＤの数と同数の光学系及び受光器を必要とするから、装置が複雑化し、高価になる。   In order to solve the above-mentioned problem, it is conceivable to test a plurality of LEDs provided on the LED substrate simultaneously or divided into a plurality of times using a plurality of optical devices as described above. However, such devices require the same number of optical systems and light receivers as the number of LEDs that can be tested at one time, which complicates the device and makes it expensive.

また、平面的に見たときの光学系及び受光器の大きさがＬＥＤのそれに比べてきわめて大きいから、光学系を複雑な形状にしなければならず、したがって装置が複雑化し、高価になる。
特開２００６−２３４４９７号公報 特開２００６−３０１５３号公報 特許第３１００８６４６号公報 Further, since the size of the optical system and the light receiver when viewed in a plan view is very large compared to that of the LED, the optical system must be made in a complicated shape, so that the apparatus becomes complicated and expensive.
JP 2006-234497 A JP 2006-30153 A Japanese Patent No. 31008646

本発明は、装置の複雑化及び高価化を招くことなく、多数のＬＥＤを複数回に分けて試験することを可能にして、試験に要する時間及び労力を低減することを目的とする。 The present invention, without complicating and expensive of the device, making it possible to test separately a number of LED into a plurality of times, and an object thereof is to reduce the time and labor required for the test.

本発明に係る試験装置は、左右方向に整列して配置された、上下方向に伸びる複数の第１の光通路であって、それぞれが、その上端部及び下端部をそれぞれ上方及び下方に向けられて、ＬＥＤで発光された光が下方側から入射して、上方へ通過することを許す複数の第１の光通路を備える、支持体と、該支持体の上側に配置されたカバーであって、前記第１の光通路の上方を左右方向へ伸びる第２の光通路を有するカバーと、前記第１の光通路を経る光が前記第２の光通路に達することを解除可能に遮断するように、前記支持体と前記カバーとの間に左右方向へ移動可能に配置されたシャッタであって、左右方向への当該シャッタの移動にともなって前記第１の光通路の上端に順次対向される開口を有するシャッタと、前記第２の光通路内に左右方向へ移動可能に配置された反射鏡であって、前記第１の光通路を経た光を前記第２の光通路内において左右方向へ指向させる反射鏡と、前記シャッタ及び前記反射鏡を左右方向へ移動させるアクチュエータと、前記反射鏡により反射されて前記第２の光通路内を進む光を受光する受光器とを含む。 The test apparatus according to the present invention includes a plurality of first light paths extending in the up-down direction and arranged in alignment in the left-right direction, each having an upper end portion and a lower end portion thereof directed upward and downward, respectively. A support provided with a plurality of first light paths that allow light emitted from the LED to enter from below and pass upward, and a cover disposed on the upper side of the support. A cover having a second light path extending in the left-right direction above the first light path, and releasably blocking light passing through the first light path from reaching the second light path. Further, the shutter is disposed between the support and the cover so as to be movable in the left-right direction, and sequentially faces the upper end of the first light path as the shutter moves in the left-right direction. A shutter having an opening, and the second light path. A reflecting mirror which is movably arranged to the right, a reflecting mirror for directing the horizontal direction the first light that has passed through the optical path in the second light passage, said shutter and said reflecting mirror right and left An actuator that moves in a direction, and a light receiver that receives light reflected by the reflecting mirror and traveling in the second optical path.

さらに、各第１の光通路の下端に配置された弾性変形可能の筒状の遮光部を含むことができる。該遮光部は、対応する第１の光通路に連通されて、外部の光が対応する第１の光通路に入ることを防止する。   Furthermore, the cylindrical light-shielding part which can be elastically deformed arrange | positioned at the lower end of each 1st optical path can be included. The light shielding portion communicates with the corresponding first light path to prevent external light from entering the corresponding first light path.

本発明に係る試験装置は、さらに、前記第１の光通路毎に備えられた接触子であって、当該接触子の針先が対応する第１の光通路の下端部に刺し通された接触子を含むことができる。 The test apparatus according to the present invention further includes a contact provided for each of the first optical paths, wherein the contact point of the contact is pierced by the lower end of the corresponding first optical path. Can contain children.

本発明に係る試験装置は、さらに、前記支持体の下側に配置された配線基板を含むことができる。この場合、前記接触子は、前記ＬＥＤの電極に接触可能に前記配線基板に配置されていてもよい。   The test apparatus according to the present invention can further include a wiring board disposed below the support. In this case, the contact may be arranged on the wiring board so as to be in contact with the electrode of the LED.

各第１の光通路は、前記支持体を上下方向に貫通して前記第２の光通路及び下方に開放する内部空間を有する筒状の光ガイドにより形成されていてもよい。また、光ガイドの下端部の前記内部空間の部分は、前記光ガイドの軸線に直角な断面積が下端側ほど小さい截頭円錐形又は截頭角錐形の形状を有していてもよい。   Each first light path may be formed by a cylindrical light guide having an interior space that penetrates the support body in the vertical direction and opens to the second light path and downward. The portion of the inner space at the lower end of the light guide may have a truncated cone shape or truncated pyramid shape in which the cross-sectional area perpendicular to the axis of the light guide is smaller toward the lower end side.

前記支持体は、支持ベースと、該支持ベースの上に配置された支持ブロックとを備えることができ、また前記カバーは前記支持ブロックに配置されていてもよく、さらに前記シャッタは前記支持ベースと前記カバーとの間に配置されていてもよい。   The support may include a support base and a support block disposed on the support base, the cover may be disposed on the support block, and the shutter may be disposed on the support base. You may arrange | position between the said covers.

前記シャッタは、前記開口を有する板状部材を含むことができ、また前記第２の光通路は、前記一列に配置された複数の前記第１の光通路の側に開放する溝を含むことができる。さらに、前記反射鏡は前記シャッタに取り付けられていてもよい。   The shutter may include a plate-like member having the opening, and the second light path includes a groove that opens to the side of the plurality of first light paths arranged in the row. it can. Further, the reflecting mirror may be attached to the shutter.

例えば、複数のＬＥＤがＬＥＤ基板に一列に配置されている場合、試験装置とＬＥＤ基板とは、シャッタ及び反射鏡の移動方向（左右方向）とＬＥＤの配列方向とが一致するように、維持される。   For example, when a plurality of LEDs are arranged in a row on the LED substrate, the test apparatus and the LED substrate are maintained so that the moving direction (left-right direction) of the shutter and reflecting mirror matches the LED arrangement direction. The

上記の状態で、ＬＥＤが点灯され、シャッタ及び反射鏡が左右方向に移動されると、シャッタは、第１の光通路を第２の光通路に順次連通させて、ＬＥＤからの光を反射鏡に順次入射させるように、第１の光通路を第２の光通路に順次切り替える。これにより、反射鏡が第２の光通路内を指向させる光を順次切り換えるから、受光器に入射する光の順番がＬＥＤの配列の順に順次切り換えられる。   In the above state, when the LED is turned on and the shutter and the reflecting mirror are moved in the left-right direction, the shutter sequentially connects the first light path to the second light path to reflect the light from the LED to the reflecting mirror. The first light path is sequentially switched to the second light path so as to sequentially enter the light. Thereby, since the reflecting mirror sequentially switches the light directed in the second light path, the order of the light incident on the light receiver is sequentially switched in the order of the LED arrangement.

平面的に見て、第１の光通路及び受光器の大きさがＬＥＤのそれに比べて大きいときは、シャッタ及び反射鏡が一回の移動で複数おきのＬＥＤからの光を受光器に順次導き、シャッタ及び反射鏡が一回移動されるたびに、第１の光通路とＬＥＤとの相対的位置が変位するように、第１の光通路に対向するＬＥＤが切り換えられる。   In plan view, when the size of the first light path and the light receiver is larger than that of the LED, the shutter and the reflecting mirror sequentially move the light from every other LED to the light receiver in one movement. Each time the shutter and the reflecting mirror are moved once, the LED facing the first light path is switched so that the relative position between the first light path and the LED is displaced.

上記のように、本発明によれば、シャッタを左右方向へ移動させることにより受光器に導く光をシャッタにより順次切り替えるようにしたから、多数のＬＥＤを複数回に分けて試験することができ、しかも一回で試験可能のＬＥＤの数と同数の光通路及び受光器を必要としない。   As described above, according to the present invention, since the light guided to the light receiver is sequentially switched by the shutter by moving the shutter in the left-right direction, a large number of LEDs can be tested in multiple times, Moreover, the same number of light paths and light receivers as the number of LEDs that can be tested at one time are not required.

上記の結果、本発明によれば、装置が簡略化し、廉価になると共に、試験に要する時間及び労力が著しく低減する。   As a result, according to the present invention, the apparatus is simplified and inexpensive, and the time and labor required for the test are significantly reduced.

［用語の説明］   [Explanation of terms]

本発明においては、図２において、上下方向（Ｚ方向）を上下方向といい、左右方向を左右方向（Ｘ方向）といい、紙面に垂直な方向（Ｙ方向）を前後方向という。しかし、これらの方向は、ＬＥＤ基板を試験装置に配置する姿勢に応じて異なる。   In the present invention, in FIG. 2, the vertical direction (Z direction) is referred to as the vertical direction, the horizontal direction is referred to as the horizontal direction (X direction), and the direction perpendicular to the paper surface (Y direction) is referred to as the front-rear direction. However, these directions differ depending on the posture in which the LED substrate is arranged in the test apparatus.

したがって、上記の方向は、試験装置による試験時のＬＥＤ基板の姿勢に応じて、左右方向（Ｘ方向）及び前後方向（Ｙ方向）を含む面（ＸＹ面）が、水平面、水平面に対し傾斜する傾斜面、及び水平面に垂直の垂直面のいずれかの面内となるように決定される。   Therefore, in the above direction, the plane (XY plane) including the left and right direction (X direction) and the front and rear direction (Y direction) is inclined with respect to the horizontal plane and the horizontal plane in accordance with the posture of the LED substrate at the time of the test by the test apparatus. It is determined to be in any one of the inclined plane and the vertical plane perpendicular to the horizontal plane.

［試験装置の実施例］   [Example of test apparatus]

図１から図５を参照するに、試験装置１０は、多数のＬＥＤ１２をＬＥＤウエーハのようなＬＥＤ基板１４にマトリクス状に配置した基板を被検査体１６とし、それらＬＥＤ１２を列毎に複数回に分けて試験する装置に適用されている。   Referring to FIGS. 1 to 5, the test apparatus 10 uses a substrate in which a large number of LEDs 12 are arranged in a matrix on an LED substrate 14 such as an LED wafer as an inspected object 16, and the LEDs 12 are arranged multiple times for each column. It is applied to the equipment to test separately.

ＬＥＤ基板１４は、多数のＬＥＤ１２を図６に斜線で示すＬＥＤ領域１８に図７に示すようにマトリクス状に配置している。図７は、３列×６個のＬＥＤアレイを示すにすぎないが、実際にはそれよりさらに多いＬＥＤ１２がＬＥＤ基板１４に配置されている。   The LED board 14 has a large number of LEDs 12 arranged in a matrix as shown in FIG. 7 in an LED region 18 indicated by hatching in FIG. FIG. 7 only shows a 3 × 6 LED array, but actually more LEDs 12 are arranged on the LED substrate 14.

図５，７及び８に示すように、各ＬＥＤ１２は、発光部２０と、正側の電極２２と、負側の電極２４とを、電極２２及び２４が発光部２０の両側に位置する状態に、ベース部２６の上面に有しており、またベース部２６の下面においてＬＥＤ基板１４に配置されている。   As shown in FIGS. 5, 7, and 8, each LED 12 has the light emitting unit 20, the positive electrode 22, and the negative electrode 24 in a state where the electrodes 22 and 24 are located on both sides of the light emitting unit 20. , And is disposed on the LED substrate 14 on the lower surface of the base portion 26.

再度図１から図５を参照するに、試験装置１０は、支持体３０と、支持体３０の上側に配置されたカバー３２と、支持体３０及びカバー３２の間に左右方向へ移動可能に配置された板状のシャッタ３４と、ＬＥＤ１２からの光を左右方向における一方側（図１及び２において、右方側）に指向させる反射鏡３６と、シャッタ３４及び反射鏡３６を左右方向へ移動させるアクチュエータ３８と、反射鏡３６により反射された光を受光する受光器４０と、支持体３０の下側に配置された配線基板４２と、ＬＥＤ１２の電極２２及び２４に接触可能に配線基板４２の下面に配置された複数対の接触子４４とを含む。 Referring to FIGS. 1 to 5 again, the test apparatus 10 is disposed so as to be movable in the left-right direction between the support 30, the cover 32 disposed above the support 30, and the support 30 and the cover 32. The plate-shaped shutter 34, the reflecting mirror 36 that directs the light from the LED 12 to one side in the left-right direction (the right side in FIGS. 1 and 2), and the shutter 34 and the reflecting mirror 36 are moved in the left-right direction. The actuator 38, the light receiver 40 that receives the light reflected by the reflecting mirror 36, the wiring board 42 disposed below the support 30, and the lower surface of the wiring board 42 so as to be in contact with the electrodes 22 and 24 of the LED 12 And a plurality of pairs of contacts 44 disposed on the surface.

配線基板４２、支持ベース４６及び支持ブロック４８は、ボルトのような複数のねじ部材により、分離可能に結合されている。また、上記の、支持体３０、カバー３２、シャッタ３４、反射鏡３６、アクチュエータ３８、受光器４０、配線基板４２、接触子４４等は、試験用ヘッドを構成している。   The wiring board 42, the support base 46, and the support block 48 are detachably coupled by a plurality of screw members such as bolts. Further, the support 30, cover 32, shutter 34, reflecting mirror 36, actuator 38, light receiver 40, wiring board 42, contact 44 and the like constitute a test head.

支持体３０は、配線基板４２の上に配置された板状又は枠状の支持ベース４６と、支持ベース４６の上に配置された支持ブロック４８とを備えており、また支持ベース４６においてプローバ（ハンドリング装置）のフレーム（図示せず）にボルトのような適宜な手段により取り外し可能に取り付けられる。 The support 30 includes a plate-like or frame-like support base 46 disposed on the wiring substrate 42 and a support block 48 disposed on the support base 46 , and a prober ( It is removably attached to a frame (not shown) of the handling device by appropriate means such as a bolt.

支持体３０は、上下方向に伸びる複数の第１の光通路５０を備える。第１の光通路５０は、左右方向に整列した１列に配置されている。カバー３２は、第１の光通路５０の上方を左右方向へ伸びる第２の光通路５２を有する。両光通路５０及び５２は、シャッタ３４を介して連通される。   The support 30 includes a plurality of first light paths 50 extending in the vertical direction. The first light paths 50 are arranged in one row aligned in the left-right direction. The cover 32 has a second light path 52 extending in the left-right direction above the first light path 50. Both light paths 50 and 52 are communicated with each other via the shutter 34.

左右方向における第１の光通路５０の配置ピッチは、図６に示す領域１８のＬＥＤ１２を列毎に複数回に分けて試験することができる値、すなわち列方向におけるＬＥＤ１２の配置ピッチの整数倍の値とされている。図示の例では、４つの第１の光通路５０が設けられているように示しているにすぎないが、実際には、より多くのＬＥＤ１２が一列に設けられている。   The arrangement pitch of the first light paths 50 in the left-right direction is a value that allows the LEDs 12 in the region 18 shown in FIG. 6 to be tested in a plurality of times for each column, that is, an integral multiple of the arrangement pitch of the LEDs 12 in the column direction. Value. In the illustrated example, only four first light paths 50 are shown, but actually, more LEDs 12 are provided in a row.

各第１の光通路５０は、支持ベース４６及び支持ブロック４８並びに配線基板４２を上下方向に貫通して第２の光通路５２の側（上方）及び被検査体１６の側（下方）に開放する内部空間を有する筒状の光ガイドにより形成されている。   Each first optical path 50 passes through the support base 46, the support block 48, and the wiring board 42 in the vertical direction, and opens to the second optical path 52 side (upper side) and the inspection object 16 side (lower side). It is formed by a cylindrical light guide having an internal space.

各第１の光通路５０、すなわち光ガイドは、その上端部及び下端部をそれぞれ上方及び下方に向けられて、ＬＥＤ１２で発光された光が下方側から入射して、上方へ通過することを許すが、外部の光が内部空間内に入ることを防止する。   Each first light path 50, that is, the light guide, has its upper end and lower end directed upward and downward, respectively, and allows light emitted from the LED 12 to enter from below and pass upward. However, it prevents external light from entering the internal space.

各第１の光通路５０（光ガイド）の下端部の、内部空間の部分５０ａ（図５参照）は、各第１の光通路５０の軸線に直角な断面の面積（縦断面積）が下端側ほど小さくなる截頭円錐形又は截頭角錐形の形状を有しており、また配線基板４２より下方に突出されている。   The inner space portion 50a (see FIG. 5) of the lower end portion of each first light path 50 (light guide) has a cross-sectional area (vertical cross-sectional area) perpendicular to the axis of each first light path 50 at the lower end side. It has a truncated cone shape or truncated pyramid shape that becomes smaller, and protrudes downward from the wiring board 42.

各第１の光通路５０の下端には、蛇腹状の遮光部５４（図５参照）が設けられている。遮光部５４は、対応する接触子４４が対応する電極２２又は２４に押圧されたとき、他のＬＥＤ１２に押圧されて、外部の光が第１の光通路５０に入ることを防止する。   A bellows-shaped light shielding portion 54 (see FIG. 5) is provided at the lower end of each first light path 50. When the corresponding contactor 44 is pressed against the corresponding electrode 22 or 24, the light shielding unit 54 is pressed by another LED 12 to prevent external light from entering the first light path 50.

カバー３２は、下方に開放しかつ左右方向へ伸びる逆コ字状の溝となる第２の通路５２を形成するように、逆コ字状の縦断面形状を有しており、またボルト、溶接等の適宜な手段により支持ブロック４８に取り付けられている。カバー３２は、これの下端部内側を前後方向に間隔をおいて左右方向に伸びる一対の段部５６を有する。各段部５６は、内方及び下方に向けられている。   The cover 32 has an inverted U-shaped longitudinal section so as to form a second passage 52 that is an inverted U-shaped groove that opens downward and extends in the left-right direction. It attaches to the support block 48 by suitable means, such as. The cover 32 has a pair of step portions 56 extending in the left-right direction with an interval in the front-rear direction inside the lower end portion thereof. Each step 56 is directed inward and downward.

第２の通路５２の左方側の端部は閉塞されている。これに対し、第２の通路５２の右方側の端部は、各ＬＥＤ１２からの光が受光器４０に入射するように、受光器４０に連通されて、受光器４０により閉鎖されている。   The left end of the second passage 52 is closed. On the other hand, the right end of the second passage 52 is communicated with the light receiver 40 and closed by the light receiver 40 so that the light from each LED 12 enters the light receiver 40.

図示の例では、カバー３２は、前後方向に間隔をおいて左右方向へ平行に伸びるように支持ブロック４８に取り付けられた一対の板部材３２ａと、両板部材３２ａの間の空間の上部を閉塞するように板部材３２ａの上部に取り付けられた他の板部材３２ｂとにより、逆コ字状の第２の通路５２を形成しており、また閉塞ブロック３２ｃにより第２の通路５２の左方側の端部は閉塞している。   In the illustrated example, the cover 32 closes the upper part of the space between the pair of plate members 32a attached to the support block 48 so as to extend in parallel in the left-right direction with an interval in the front-rear direction, and the plate members 32a. Thus, the other plate member 32b attached to the upper part of the plate member 32a forms an inverted U-shaped second passage 52, and the closing block 32c is on the left side of the second passage 52. The end of is closed.

シャッタ３４は、幅の狭い長板状の形状を有しており、また幅方向の各縁部をカバー３２の段部５６に受け入れられて、左右方向へ移動可能に支持ベース４８とカバー３２との間に位置されている。 The shutter 34 has a narrow long plate-like shape having a width, also accepted the respective edge portions in the width direction to the step portion 56 of the cover 32, and movably supporting base 48 and the cover 32 in the lateral direction Is located between.

シャッタ３４は、左右方向への移動にともなって、第１の光通路５０の上端に順次対向される開口５８を有する。このため、シャッタ３４は、左右方向への移動にともなって、第１の光通路５０を経る光が第２の光通路５２に達することを解除可能に遮断する。   The shutter 34 has an opening 58 that sequentially faces the upper end of the first light path 50 as the shutter 34 moves in the left-right direction. Therefore, the shutter 34 releasably blocks the light passing through the first optical path 50 from reaching the second optical path 52 as it moves in the left-right direction.

反射鏡３６は、左右方向へ移動可能に第２の光通路５２内に配置されており、また第１の光通路５０及びシャッタ３４の開口５８を経た光を第２の光通路５２内において左右方向受光器４０の側へ指向させるように、及びシャッタ３４と一体的に移動可能に、ホルダ６０によりシャッタ３４に取り付けられている。 The reflecting mirror 36 is disposed in the second light path 52 so as to be movable in the left-right direction, and the light that has passed through the first light path 50 and the opening 58 of the shutter 34 is left and right in the second light path 52. to direct to the side of the direction the light receiver 40, and movably shutter 34 integrally with, and is attached to the shutter 34 by the holder 60.

アクチュエータ３８は、図示の例では、可動子６２と、可動子６２を支持する固定子６４とを用いるリニアモータである。可動子６２は、ホルダ６０を介してシャッタ３４及び反射鏡３６を左右方向へ移動させるように、結合具６６でホルダ６０に結合されている。固定子６４は、左右方向へ伸びる状態に、支持ブロック４８の上に取り付けられている。しかし、リニアモータ以外の移動機構を用いてもよい。 In the illustrated example, the actuator 38 is a linear motor that uses a mover 62 and a stator 64 that supports the mover 62. The movable element 62 is coupled to the holder 60 with a coupling tool 66 so as to move the shutter 34 and the reflecting mirror 36 in the left-right direction via the holder 60. The stator 64 is mounted on the support block 48 so as to extend in the left-right direction. However, a moving mechanism other than a linear motor may be used.

図示してはいないが、カバー３２は、結合具６６が左右方向への可動子６２の移動にともなって左右方向へ移動することを許す、左右方向に長い長穴を一方の板部材３２ａに有する。その長穴は、外部の光が第１の光通路５２に入ることを防止するように、ゴムシートのような適宜な覆いにより覆われている。   Although not shown, the cover 32 has a long slot in one plate member 32a that allows the coupler 66 to move in the left-right direction as the mover 62 moves in the left-right direction. . The long hole is covered with a suitable cover such as a rubber sheet so as to prevent external light from entering the first light path 52.

受光器４０は、受光した光の少なくとも色相（波長、周期等）及び強度（明度）を検出する高度計のような既知の光検出装置であり、第２の光通路５２を経る光を受光するように、カバー３２の端部に取り外し可能に取り付けられている。   The light receiver 40 is a known light detection device such as an altimeter that detects at least the hue (wavelength, period, etc.) and intensity (lightness) of the received light, and receives light passing through the second light path 52. The cover 32 is detachably attached to the end of the cover 32.

配線基板４２は、それぞれが配線パターンの一部である複数の配線（図示せず）を有すると共に、各配線に電気的に接続された取り付けランド（図示せず）を下面に有し、各取り付けランドに接触子４４を片持ち梁状に取り付けた一般的なプローブ基板である。   The wiring board 42 has a plurality of wirings (not shown), each of which is a part of a wiring pattern, and has an attachment land (not shown) electrically connected to each wiring on the lower surface. This is a general probe substrate in which a contact 44 is attached to a land in a cantilever shape.

配線基板４２には、コネクタ６８が上面に取り付けられている。コネクタ６８は、配線基板４２の配線に電気的に接続された複数の端子を備えており、また支持ベース４６及び支持ブロック４８を上下方向に貫通して、端子を上方に露出させている。コネクタ６８は、試験装置１０をテスターの電気回路（図示せず）に接続するために用いられる。   A connector 68 is attached to the upper surface of the wiring board 42. The connector 68 includes a plurality of terminals that are electrically connected to the wiring of the wiring board 42, and penetrates the support base 46 and the support block 48 in the vertical direction to expose the terminals upward. The connector 68 is used to connect the test apparatus 10 to a tester electrical circuit (not shown).

接触子４４は、図示の例では、金属細線から製作されたニードルタイプのプローブであり、また２つずつ１組とされて第１の光通路５０毎に備えられている。各第１の光通路５０の接触子４４は、先端部を対応する遮光部５４を対応する側から内側に刺し通されて、針先をＬＥＤ１２の電極２２又は２４に当接可能とされている。   In the illustrated example, the contactors 44 are needle-type probes made of fine metal wires, and are provided in pairs for each of the first optical paths 50. The contact 44 of each first light path 50 is pierced inward from the corresponding side with the corresponding light-shielding portion 54 at the tip, so that the needle tip can contact the electrode 22 or 24 of the LED 12. .

［試験装置による試験方法］   [Test method using test equipment]

被検査体１６は、ＬＥＤ１２の配列方向がシャッタ３４及び反射鏡３６の移動方向となり、かつシャッタ３４の最左端に位置する第１の光通路５０に対応する接触子４４の針先が１つの列の最左端に位置するＬＥＤ１２の電極２２及び２４が接触子４４の針先に押圧可能の状態に、試験装置１０に配置される。   In the inspected object 16, the array direction of the LEDs 12 is the moving direction of the shutter 34 and the reflecting mirror 36, and the needle tip of the contact 44 corresponding to the first optical path 50 located at the leftmost end of the shutter 34 is one row. The electrodes 22 and 24 of the LED 12 located at the leftmost end of the LED are arranged in the test apparatus 10 in a state where the electrodes 22 and 24 can be pressed against the needle tip of the contactor 44.

上記状態において、各第１の光通路５０の下端が所定のＬＥＤ１２に対向されて、各第１の光通路５０に対応する接触子４４の針先が所定のＬＥＤ１２の電極２２及び２４に相対的に押圧される。 In the above state, the lower end of each first light path 50 is opposed to the predetermined LED 12, and the tip of the contact 44 corresponding to each first light path 50 is relative to the electrodes 22 and 24 of the predetermined LED 12. Pressed.

また、上記状態において、シャッタ３４は、図４に実線で示すように、開口５８を最左端に位置する第１の光通路５０の上端に位置させて、その第１の光通路５０を第２の光通路５２に連通させているが、他の第１の光通路５０をその上端部において閉鎖している。そのような状態において最左端に位置するＬＥＤ１２に通電されて、そのＬＥＤ１２が発光する。   In the above state, as shown by the solid line in FIG. 4, the shutter 34 positions the opening 58 at the upper end of the first optical path 50 positioned at the leftmost end, and the first optical path 50 is moved to the second position. The other first light path 50 is closed at the upper end thereof. In such a state, the LED 12 located at the leftmost end is energized, and the LED 12 emits light.

最左端に位置するＬＥＤ１２からの光は、遮光部５４、第１の光通路５０及び開口５８を経て第２の光通路５２に達し、反射鏡３６により第２の光通路５２を受光器４０に指向されて、最終的に受光器４０に入射する。   The light from the LED 12 located at the leftmost end reaches the second optical path 52 through the light shielding portion 54, the first optical path 50 and the opening 58, and the second optical path 52 is transferred to the light receiver 40 by the reflecting mirror 36. It is directed and finally enters the light receiver 40.

受光器４０は、受けた光の色相及び強度にそれぞれ対応する信号を発生し、それらの信号を前記した電気回路に出力する。受光器４０からの電気信号は、電気回路において、入力した電気信号を基に、対応するＬＥＤ１２が正しい色相及び強度を有する光を発生しているか否かの判定に用いられる。 The light receiver 40 generates signals corresponding to the hue and intensity of the received light and outputs the signals to the above-described electric circuit. Electrical signals from the light receiver 40, in the electric circuit, based on an electrical signal input, used to determine whether the corresponding LED12 is generating light with the correct hue and intensity.

最左端に位置するＬＥＤ１２の試験が終了すると、シャッタ３４が第１の光通路５０の配置ピッチ分だけ右方に移動される。これにより、左方から２番目に位置する第１の光通路５０が開口４８を介して第２の光通路５２に連通されるから、その第１の光通路５０に対向されているＬＥＤ１２に通電されて、そのＬＥＤ１２からの光が受光器４０に受光される。   When the test on the leftmost LED 12 is completed, the shutter 34 is moved to the right by the arrangement pitch of the first light path 50. As a result, the first light path 50 located second from the left is communicated with the second light path 52 through the opening 48, so that the LED 12 facing the first light path 50 is energized. Then, the light from the LED 12 is received by the light receiver 40.

その後は、次の第１の光通路５０が開口５８を介して第２の光通路５２に連通されるように、シャッタ３４が第１の光通路５０の配置ピッチ分だけ右方に移動されて、次の第１の光通路５０に対向されたＬＥＤ１２に通電され、そのＬＥＤ１２からの光が受光器４０に受光され、そのＬＥＤ１２の正否の試験が行われる工程が繰り返される。シャッタ３４がＬＥＤ１２の配置ピッチ分ずつ右方に移動されたときの、シャッタ３４の位置を図４に破線で示す。   Thereafter, the shutter 34 is moved to the right by the arrangement pitch of the first light path 50 so that the next first light path 50 communicates with the second light path 52 through the opening 58. The LED 12 facing the next first light path 50 is energized, the light from the LED 12 is received by the light receiver 40, and the test of whether the LED 12 is correct or not is repeated. The position of the shutter 34 when the shutter 34 is moved to the right by the arrangement pitch of the LEDs 12 is indicated by a broken line in FIG.

全ての第１の光通路５０を経る光が受光器４０に受光された後、１列に整列されたＬＥＤ１２に未判定のＬＥＤが存在すると、最左端に位置する第１の光通路５０が最左端に位置する未判定のＬＥＤ１２の光の通過を許すように、ＬＥＤ１２の電極２２及び２４と接触子４４の針先とが離間された状態で、被検査体１６が第１の光通路５０に対して右方に移動され、次いでＬＥＤ１２の電極２２及び２４と接触子４４の針先とが相対的に押圧される。   After the light passing through all the first light paths 50 is received by the light receiver 40, if there is an undetermined LED in the LEDs 12 aligned in a row, the first light path 50 located at the leftmost position is the most. The test object 16 enters the first light path 50 in a state where the electrodes 22 and 24 of the LED 12 and the needle tip of the contactor 44 are separated from each other so as to allow the light of the undetermined LED 12 located at the left end to pass. In contrast, the electrodes 22 and 24 of the LED 12 and the needle tip of the contact 44 are pressed relatively.

上記の位置において、未判定の最左端に位置するＬＥＤ１２に通電され、そのＬＥＤ１２からの光が受光器４０に導かれてそのＬＥＤ１２の試験が行われる試験工程と、シャッタ３４を第１の光通路５０の配置ピッチ分だけ移動させて試験を行う工程とが繰り返される。   In the above-described position, the LED 12 located at the leftmost end of the unjudged state is energized, the light from the LED 12 is guided to the light receiver 40, and the test of the LED 12 is performed, and the shutter 34 passes through the first light path. The process of moving the test by 50 arrangement pitches is repeated.

１列中の全てのＬＥＤ１２の試験が終了すると、次の列のＬＥＤ１２の試験のために、ＬＥＤ１２の電極２２及び２４と接触子４４の針先とが離間された状態で、被検査体１６が第１の光通路５０に対して前後方向に移動されて、上記各工程が実行される。   When the test of all the LEDs 12 in one row is completed, the test object 16 is in a state where the electrodes 22 and 24 of the LED 12 and the needle tip of the contact 44 are separated from each other for the test of the LED 12 in the next row. It moves to the front-back direction with respect to the 1st optical path 50, and said each process is performed.

各ＬＥＤ１２の正否の判定は、全てのＬＥＤ１２からの光の色相及び強度に対応する信号を電気回路に取り込んだ後に行ってもよい。また、ＬＥＤ１２への通電は、そのＬＥＤの光を受光器４０に導くとき間だけに行ってもよいし、接触子４４の針先が電極２２及び２４に押圧されている全てのＬＥＤ１２の光を受光器に導いている間中行ってもよい。   The determination of whether each LED 12 is correct or not may be performed after signals corresponding to the hue and intensity of light from all the LEDs 12 are taken into the electric circuit. In addition, the LED 12 may be energized only when the LED light is guided to the light receiver 40, or the light of all the LEDs 12 in which the needle tips of the contacts 44 are pressed against the electrodes 22 and 24 may be used. You may do it all the way to the light receiver.

シャッタ３４を左右方向へ一回移動させることにより、列方向におけるＬＥＤ１２の配置ピッチの整数分の１のＬＥＤ１２からの光を順次切り換えて受光器４０に導くことができる数の第１の光通路５０を設けてもよい。   By moving the shutter 34 once in the left-right direction, the number of first light paths 50 that can sequentially switch the light from the LEDs 12 of an integral number of the arrangement pitch of the LEDs 12 in the column direction to the light receiver 40. May be provided.

また、シャッタ３４を左右方向へ一回移動させるのみで、一列に配置された全てのＬＥＤ１２からの光を順次切り換えて受光器４０に導くことができる数の第１の光通路５０を設けてもよい。   Alternatively, the first light paths 50 may be provided in such a number that the light from all the LEDs 12 arranged in a row can be sequentially switched and guided to the light receiver 40 only by moving the shutter 34 once in the left-right direction. Good.

さらに、図６及び図７に示すように、ＬＥＤ１２がＬＥＤ基板１４と平行の面内を前後方向に複数列に配置されているときは、前後方向にも、上記のように複数の第１の光通路１２の列を複数列に設けてもよい。   Furthermore, as shown in FIGS. 6 and 7, when the LEDs 12 are arranged in a plurality of rows in the front-rear direction in a plane parallel to the LED substrate 14, a plurality of the first first as described above is also provided in the front-rear direction. You may provide the row | line | column of the optical path 12 in multiple rows.

［試験装置の他の実施例］   [Other Examples of Test Apparatus]

図９に示す試験装置８０は、図１０に示すように、発光部２０と、正（又は負）の電極２２（又は２４）とをベース部２６の上面に有し、負（又は正）の電極２４（又は２２）をベース部２６の下面に有するＬＥＤ８２の試験に適用される。 As shown in FIG. 10, the test apparatus 80 shown in FIG. 9 has the light emitting part 20 and the positive (or negative) electrode 22 (or 24) on the upper surface of the base part 26, and is negative (or positive). This is applied to the test of the LED 82 having the electrode 24 (or 22) on the lower surface of the base portion 26.

試験装置８０は、各第１の光通路部５０毎に１つの接触子４４を用いる点を除いて、図１から図５に示す試験装置１０と同様に構成されている。このため、各ＬＣＤ８２は、接触子４４とＬＥＤ基板１４とにより通電されることを除いて、図８に示すＬＥＤ１２と同様に試験される。   The test apparatus 80 is configured in the same manner as the test apparatus 10 shown in FIGS. 1 to 5 except that one contact 44 is used for each first light path portion 50. For this reason, each LCD 82 is tested in the same manner as the LED 12 shown in FIG. 8 except that the current is passed through the contact 44 and the LED substrate 14.

本発明は、上記した形状を有するＬＥＤ１２及び８２のみならず、両電極２２及び２４をベース部２６の同じ又は異なる側面や、下面等にソナアエラＬＥＤ等、他の形状を有するＬＥＤにも適用することができる。 The present invention is applicable not only to the LEDs 12 and 82 having the above-described shape, but also to the LEDs having other shapes such as the Sona Aera LED on the same or different side surfaces or the lower surface of the base portion 26. Can do.

本発明は、上記実施例に限定されず、特許請求の範囲に記載された趣旨を逸脱しない限り、種々に変更することができる。   The present invention is not limited to the above-described embodiments, and various modifications can be made without departing from the spirit described in the claims.

本発明に係る試験装置の一実施例を示す平面図である。It is a top view which shows one Example of the testing apparatus concerning this invention. 図１に示す試験装置の正面図である。It is a front view of the test apparatus shown in FIG. 図１に示す試験装置の右側面図である。It is a right view of the test apparatus shown in FIG. 図１における４−４線に沿って得た断面図である。FIG. 4 is a cross-sectional view taken along line 4-4 in FIG. 第１の光通路の下端部とＬＥＤとの関係を示す拡大断面図である。It is an expanded sectional view which shows the relationship between the lower end part of a 1st light path, and LED. 図１に示す試験装置により試験するＬＥＤ基板の一実施例を示す斜視図である。It is a perspective view which shows one Example of the LED board tested with the test apparatus shown in FIG. 図６に示すＬＥＤ基板に配置されたＬＥＤアレイの一部を示す斜視図である。It is a perspective view which shows a part of LED array arrange | positioned at the LED board shown in FIG. 図６に示すＬＥＤアレイ中の１つのＬＥＤの一実施例を示す平面図である。It is a top view which shows one Example of one LED in the LED array shown in FIG. 本発明に係る試験装置の一実施例を示す、図５と同種の断面図である。It is sectional drawing of the same kind as FIG. 5 which shows one Example of the testing apparatus which concerns on this invention. 図９に示す試験装置により試験するＬＥＤの一実施例を示す平面図である。It is a top view which shows one Example of LED tested by the testing apparatus shown in FIG.

１０，８０ 試験装置
１２，８２ ＬＥＤ
１４ ＬＥＤ基板
１６ 被検査体
１８ ＬＥＤ領域
２０ 発光部
２２，２４ 電極
２６ ベース部
３０ 支持体
３２ カバー
３４ シャッタ
３６ 反射鏡
３８ アクチュエータ
４０ 受光器
４２ 配線基板
４４ 接触子
４６ 支持ベース
４８ 支持ブロック
５０，５２ 第１及び第２の光通路
５０ａ 光ガイドの下端部
５４ 遮光部
５６ 段部
５８ シャッタの開口
６０ ホルダ
６２ 可動子
６４ 固定子
６６ 結合具
６８ コネクタ 10,80 Test device 12,82 LED
DESCRIPTION OF SYMBOLS 14 LED board 16 Test object 18 LED area 20 Light emission part 22,24 Electrode 26 Base part 30 Support body 32 Cover 34 Shutter 36 Reflector 38 Actuator 40 Light receiver 42 Wiring board 44 Contact 46 Support base 48 Support block 50, 52 First and second light paths 50a Light guide lower end portion 54 Light shielding portion 56 Step portion 58 Shutter opening 60 Holder 62 Movable element 64 Stator 66 Coupler 68 Connector

Claims (9)

左右方向に整列して配置された、上下方向に伸びる複数の第１の光通路であって、それぞれが、その上端部及び下端部をそれぞれ上方及び下方に向けられて、ＬＥＤで発光された光が下方側から入射して、上方へ通過することを許す複数の第１の光通路を備える支持体と、
該支持体の上側に配置されたカバーであって、前記第１の光通路の上方を左右方向へ伸びる第２の光通路を有するカバーと、
前記第１の光通路を経る光が前記第２の光通路に達することを解除可能に遮断するように、前記支持体と前記カバーとの間に左右方向へ移動可能に配置されたシャッタであって、左右方向への当該シャッタの移動にともなって前記第１の光通路の上端に順次対向される開口を有するシャッタと、
前記第２の光通路内に左右方向へ移動可能に配置された反射鏡であって、前記第１の光通路を経た光を前記第２の光通路内において左右方向へ指向させる反射鏡と、
前記シャッタ及び前記反射鏡を左右方向へ移動させるアクチュエータと、
前記反射鏡により反射されて前記第２の光通路内を進む光を受光する受光器とを含む、ＬＥＤの試験装置。 A plurality of first light paths arranged in the left-right direction and extending in the up-down direction, each having its upper end and lower end directed upward and downward, respectively, and light emitted by the LED A support having a plurality of first light paths that allow the light to enter from below and pass upward;
A cover disposed on the upper side of the support, the cover having a second light path extending in the left-right direction above the first light path;
The shutter is disposed between the support and the cover so as to be movable in the left-right direction so as to releasably block light passing through the first light path from reaching the second light path. A shutter having an opening that sequentially faces the upper end of the first optical path as the shutter moves in the left-right direction;
A reflecting mirror disposed in the second light path so as to be movable in the left-right direction, the reflecting mirror for directing light passing through the first light path in the left-right direction in the second light path;
An actuator for moving the shutter and the reflecting mirror in the left-right direction;
And a light receiver that receives light reflected by the reflecting mirror and traveling in the second light path. さらに、各第１の光通路の下端に配置された弾性変形可能の筒状の遮光部を含み、該遮光部は、対応する第１の光通路に連通されて、外部の光が対応する第１の光通路に入ることを防止する、請求項１に記載のＬＥＤの試験装置。   Furthermore, it includes an elastically deformable cylindrical light-shielding portion disposed at the lower end of each first light path, and the light-shielding part communicates with the corresponding first light path so that external light corresponds to the first light path. The LED test apparatus according to claim 1, wherein the LED test apparatus prevents entry into one light path. さらに、前記第１の光通路毎に備えられた接触子であって、当該接触子の針先が対応する第1の光通路の下端部に刺し通された接触子を含む、請求項１及び２のいずれか１項に記載のＬＥＤの試験装置。   Furthermore, it is a contact provided for every said 1st optical path, Comprising: The contact point by which the needle point of the said contact was pierced by the lower end part of the corresponding 1st optical path, and 1 3. The LED testing apparatus according to any one of 2 above. さらに、前記支持体の下側に配置された配線基板を含み、前記接触子は、前記ＬＥＤの電極に接触可能に前記配線基板に配置されている、請求項３に記載のＬＥＤの試験装置。   The LED testing apparatus according to claim 3, further comprising a wiring board disposed below the support, wherein the contact is disposed on the wiring board so as to be in contact with an electrode of the LED. 各第１の光通路は、前記支持体を上下方向に貫通して前記第２の光通路及び下方に開放する内部空間を有する筒状の光ガイドにより形成されており、該第１の光通路の下端部の前記内部空間の部分は、前記光ガイドの軸線に直角な断面積が下端側ほど小さい截頭円錐形又は截頭角錐形の形状を有する、請求項１から４のいずれか１項に記載のＬＥＤの試験装置。   Each first light path is formed by a cylindrical light guide having an inner space that penetrates the support body in the vertical direction and opens to the second light path and downward. 5. The portion of the inner space at the lower end of the light guide has a truncated cone shape or a truncated pyramid shape in which a cross-sectional area perpendicular to the axis of the light guide is smaller toward the lower end side. The LED test apparatus according to 1. 前記支持体は、支持ベースと、該支持ベースの上に配置された支持ブロックとを備え、前記カバーは前記支持ブロックに配置されており、前記シャッタは前記支持ベースと前記カバーとの間に配置されている、請求項１から５のいずれか１項に記載のＬＥＤの試験装置。   The support includes a support base and a support block disposed on the support base, the cover is disposed on the support block, and the shutter is disposed between the support base and the cover. The LED testing device according to claim 1, wherein the LED testing device is used. 前記シャッタは、前記開口を有する板状部材を含む、請求項１から６のいずれか１項に記載のＬＥＤの試験装置。   The LED testing apparatus according to claim 1, wherein the shutter includes a plate-like member having the opening. 前記第２の光通路は、前記一列に配置された複数の第１の光通路の側に開放する溝を含む、請求項１から７のいずれか１項に記載のＬＥＤの試験装置。   The LED test apparatus according to claim 1, wherein the second light path includes a groove that opens to a side of the plurality of first light paths arranged in the row. 前記反射鏡は前記シャッタに取り付けられている、請求項１から７のいずれか１項に記載のＬＥＤの試験装置。   The LED test apparatus according to claim 1, wherein the reflecting mirror is attached to the shutter.
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US9371400B2 (en) 2010-04-16 2016-06-21 Outlast Technologies, LLC Thermal regulating building materials and other construction components containing phase change materials
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Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5665324B2 (en) * 2010-01-27 2015-02-04 パナソニック株式会社 Total light measurement system, total light measurement device, and total light measurement method
JP5307080B2 (en) * 2010-06-30 2013-10-02 パナソニック株式会社 Total light measurement system, total light measurement device, total light measurement method
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Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61239680A (en) * 1985-04-16 1986-10-24 Hitachi Cable Ltd Testing method for light-emitting diode array
JPS62119644U (en) * 1986-01-23 1987-07-29
JPS63177033A (en) * 1987-01-19 1988-07-21 Alps Electric Co Ltd Method and apparatus for measuring light emitting diode head
JP2520387B2 (en) * 1990-08-06 1996-07-31 富士通株式会社 Optical beam diameter measuring device for LED array
JPH0560651A (en) * 1991-09-03 1993-03-12 Nikko Kyodo Co Ltd Device for evaluating optical element
JP3375752B2 (en) * 1994-09-07 2003-02-10 星和電機株式会社 LED chip optical characteristics measurement sensor
JP2004287368A (en) * 2003-01-27 2004-10-14 Tokyo Electron Ltd Inspecting device
JP2006250656A (en) * 2005-03-10 2006-09-21 Fuji Photo Film Co Ltd Method and apparatus for measuring illuminance unevenness of light emitting device array

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US9797087B2 (en) 2006-01-26 2017-10-24 Outlast Technologies, LLC Coated articles with microcapsules and other containment structures incorporating functional polymeric phase change materials
WO2010008910A1 (en) 2008-07-16 2010-01-21 Outlast Technologies, Inc. Heat regulating article with moisture enhanced temperature control
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