JP5151073B2 - 光度計 - Google Patents
光度計 Download PDFInfo
- Publication number
- JP5151073B2 JP5151073B2 JP2006154685A JP2006154685A JP5151073B2 JP 5151073 B2 JP5151073 B2 JP 5151073B2 JP 2006154685 A JP2006154685 A JP 2006154685A JP 2006154685 A JP2006154685 A JP 2006154685A JP 5151073 B2 JP5151073 B2 JP 5151073B2
- Authority
- JP
- Japan
- Prior art keywords
- measurement
- light source
- window plate
- gas
- light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000005259 measurement Methods 0.000 claims description 40
- 230000003287 optical effect Effects 0.000 claims description 15
- 230000007717 exclusion Effects 0.000 claims description 5
- 239000007789 gas Substances 0.000 description 26
- CBENFWSGALASAD-UHFFFAOYSA-N Ozone Chemical compound [O-][O+]=O CBENFWSGALASAD-UHFFFAOYSA-N 0.000 description 21
- 238000005192 partition Methods 0.000 description 12
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 9
- 229910001873 dinitrogen Inorganic materials 0.000 description 9
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 7
- 239000001301 oxygen Substances 0.000 description 7
- 229910052760 oxygen Inorganic materials 0.000 description 7
- 230000003628 erosive effect Effects 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 230000007246 mechanism Effects 0.000 description 4
- 238000000034 method Methods 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- YZCKVEUIGOORGS-OUBTZVSYSA-N Deuterium Chemical compound [2H] YZCKVEUIGOORGS-OUBTZVSYSA-N 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 2
- 230000002411 adverse Effects 0.000 description 2
- 229910052805 deuterium Inorganic materials 0.000 description 2
- 238000007599 discharging Methods 0.000 description 2
- 239000006185 dispersion Substances 0.000 description 2
- 238000002955 isolation Methods 0.000 description 2
- 238000004451 qualitative analysis Methods 0.000 description 2
- 238000004445 quantitative analysis Methods 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 230000003595 spectral effect Effects 0.000 description 2
- 229910052786 argon Inorganic materials 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000007865 diluting Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 229920001971 elastomer Polymers 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000001737 promoting effect Effects 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 229920002379 silicone rubber Polymers 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/33—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using ultraviolet light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/0252—Constructional arrangements for compensating for fluctuations caused by, e.g. temperature, or using cooling or temperature stabilization of parts of the device; Controlling the atmosphere inside a photometer; Purge systems, cleaning devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/429—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to measurement of ultraviolet light
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Biochemistry (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Electromagnetism (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Spectrometry And Color Measurement (AREA)
Description
11…カバー
11a、11b、11c、11d…ガス導入口
11e、11f…ガス排出口
20…光源室
21…紫外光源
22…隔壁
23…ピン
30…分光器
31、35、36、51…ミラー
32、34…スリット
33…回折格子
40…試料室
41…試料
50…検出器室
52…光検出器
60…A/D変換部
70…パーソナルコンピュータ
80…窓板ユニット
81…窓板
82…窓板ホルダ
83…ガイド穴
84…Oリング
Claims (1)
- 紫外領域の測定光を発生する光源と、試料と相互作用した後の測定光を検出する光検出器を有し、前記光源から前記光検出器に至る光路全体を密閉する構造体と、前記構造体内部から空気を排除する空気排除手段とを備えた光度計において、
前記空気排除手段を稼働させずに測定を行う場合に光源を格納する空間とそれ以外の空間の間の気体の流通を遮断すると共に、前記空気排除手段を稼働させた状態で測定を行う場合に前記気体の流通の遮断を解除するための着脱式又は可動式の空間隔離部材を有し、
前記空間隔離部材が、測定光を透過させることができ、且つオペレータが工具を用いることなく着脱又は移動させることのできるものであることを特徴とする光度計。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006154685A JP5151073B2 (ja) | 2006-06-02 | 2006-06-02 | 光度計 |
US11/723,290 US7576841B2 (en) | 2006-06-02 | 2007-03-19 | Photometric apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006154685A JP5151073B2 (ja) | 2006-06-02 | 2006-06-02 | 光度計 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2012174627A Division JP5609932B2 (ja) | 2012-08-07 | 2012-08-07 | 光度計を用いた試料測定方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2007322321A JP2007322321A (ja) | 2007-12-13 |
JP5151073B2 true JP5151073B2 (ja) | 2013-02-27 |
Family
ID=38789675
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2006154685A Active JP5151073B2 (ja) | 2006-06-02 | 2006-06-02 | 光度計 |
Country Status (2)
Country | Link |
---|---|
US (1) | US7576841B2 (ja) |
JP (1) | JP5151073B2 (ja) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5678408B2 (ja) | 2009-03-10 | 2015-03-04 | ウシオ電機株式会社 | エキシマランプ用照度測定装置 |
DE102011018986A1 (de) * | 2011-04-28 | 2012-10-31 | Heraeus Noblelight Gmbh | Lampenmodul, insbesondere für Spektralanalysevorrichtungen |
DE102014000210B3 (de) * | 2014-01-14 | 2015-05-13 | Dräger Safety AG & Co. KGaA | Modifizierte Messküvette |
CN104316181B (zh) * | 2014-11-05 | 2017-01-11 | 中国科学院长春光学精密机械与物理研究所 | 真空紫外平面光栅色散光谱仪的装调方法 |
JP6385299B2 (ja) * | 2015-03-03 | 2018-09-05 | 株式会社日立ハイテクノロジーズ | 液体クロマトグラフ用遠紫外吸光度検出装置 |
CN105388137A (zh) * | 2015-12-15 | 2016-03-09 | 北京雪迪龙科技股份有限公司 | 一种用于气态汞检测的荧光池组件 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06123697A (ja) * | 1992-10-09 | 1994-05-06 | Kita Denshi:Kk | ランプ装置 |
JP3360097B2 (ja) * | 1994-07-06 | 2002-12-24 | 株式会社ニコン | 真空紫外域の光学装置 |
JPH11211566A (ja) * | 1998-01-29 | 1999-08-06 | Nikon Corp | 分光光度計 |
JP2001194234A (ja) * | 2000-01-14 | 2001-07-19 | Shimadzu Corp | 分光光度計 |
GB2405924B (en) * | 2003-09-09 | 2006-07-26 | Thermo Electron Corp | Ultraviolet spectroscopy |
-
2006
- 2006-06-02 JP JP2006154685A patent/JP5151073B2/ja active Active
-
2007
- 2007-03-19 US US11/723,290 patent/US7576841B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JP2007322321A (ja) | 2007-12-13 |
US20070279616A1 (en) | 2007-12-06 |
US7576841B2 (en) | 2009-08-18 |
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