JP5145291B2 - レーザービジョンモジュール及びこれを用いた非接触計測装置 - Google Patents
レーザービジョンモジュール及びこれを用いた非接触計測装置 Download PDFInfo
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- JP5145291B2 JP5145291B2 JP2009144002A JP2009144002A JP5145291B2 JP 5145291 B2 JP5145291 B2 JP 5145291B2 JP 2009144002 A JP2009144002 A JP 2009144002A JP 2009144002 A JP2009144002 A JP 2009144002A JP 5145291 B2 JP5145291 B2 JP 5145291B2
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- laser
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- cameras
- laser generator
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- 238000005259 measurement Methods 0.000 claims description 39
- 238000001914 filtration Methods 0.000 claims description 22
- 239000000284 extract Substances 0.000 claims 1
- 230000001678 irradiating effect Effects 0.000 claims 1
- 238000000034 method Methods 0.000 description 5
- 238000012545 processing Methods 0.000 description 5
- 229910000831 Steel Inorganic materials 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 238000000691 measurement method Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 239000010959 steel Substances 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000010297 mechanical methods and process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/50—Depth or shape recovery
- G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Optics & Photonics (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Theoretical Computer Science (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Image Input (AREA)
Description
110 レーザー発生器
120,130 カメラ
140 固定体
150 ケース
210 画像フィルタリング部
220 計測データ生成部
230 制御部
Claims (2)
- 十字状のレーザービームを被計測部材に照射するレーザー発生器、前記被計測部材に照射された前記十字状のレーザービームによるレーザービーム画像を撮像する一対のカメラ、及び前記レーザー発生器と前記一対のカメラが一体に設けられている単一の固定体を含むレーザービジョンモジュールと、
前記一対のカメラにより得られた画像データに対してフィルタリングを行って垂直画像成分を除去する画像フィルタリング部と、
前記画像フィルタリング部によりフィルタリング処理された画像データから計測点データを抽出し、計測点データのモデリングにより曲面に表現されて3次元形状計測データを生成する計測データ生成部と、
前記レーザー発生器、前記一対のカメラ、前記画像フィルタリング部、及び前記計測データ生成部の動作を管理する制御部と、を含み、
前記一対のカメラのうち、一つのカメラの中心を前記レーザー発生器の中心に連結する第1仮想線と、他の一つのカメラの中心を前記レーザー発生器の中心に連結する第2仮想線とが相互直交することを特徴とする非接触計測装置。 - 前記レーザー発生器は、前記固定体に一体に結合されているケースの内部で、前記十字状のレーザービームの交差軸を中心に回転可能に設けられることを特徴とする請求項1に記載の非接触計測装置。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020080099239A KR101052514B1 (ko) | 2008-10-09 | 2008-10-09 | 비접촉 계측 장치 |
KR10-2008-0099239 | 2008-10-09 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2010091549A JP2010091549A (ja) | 2010-04-22 |
JP5145291B2 true JP5145291B2 (ja) | 2013-02-13 |
Family
ID=42216340
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2009144002A Active JP5145291B2 (ja) | 2008-10-09 | 2009-06-17 | レーザービジョンモジュール及びこれを用いた非接触計測装置 |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP5145291B2 (ja) |
KR (1) | KR101052514B1 (ja) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101282213B1 (ko) | 2011-08-09 | 2013-07-09 | 주식회사화신 | 크로스빔 레이저를 이용한 부품 측정장치 |
CN104062840A (zh) * | 2014-06-19 | 2014-09-24 | 广东中烟工业有限责任公司 | 一种3d成像相机与结构光光源的固定装置 |
KR101682518B1 (ko) * | 2015-07-21 | 2016-12-07 | (주)인천측기 | 격자 표시 가능한 레이저 레벨조사장치 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2535561B2 (ja) * | 1987-09-19 | 1996-09-18 | 株式会社豊田中央研究所 | 三次元座標測定装置 |
JPH0567198A (ja) * | 1991-09-05 | 1993-03-19 | Matsushita Electric Ind Co Ltd | 三次元形状計測装置 |
JPH0712534A (ja) * | 1993-04-26 | 1995-01-17 | Koyo Seiko Co Ltd | 3次元形状測定装置 |
JP3162983B2 (ja) * | 1995-12-01 | 2001-05-08 | 日本鋼管株式会社 | 船体外板の自動加熱曲げ加工方法 |
KR100292610B1 (ko) * | 1998-06-01 | 2002-01-12 | 추호석 | 카메라와레이저변위센서를혼합한비접촉식선박용곡판부재계측장치 |
US7009717B2 (en) * | 2002-08-14 | 2006-03-07 | Metris N.V. | Optical probe for scanning the features of an object and methods therefor |
US7428061B2 (en) * | 2002-08-14 | 2008-09-23 | Metris Ipr N.V. | Optical probe for scanning the features of an object and methods thereof |
JP4218283B2 (ja) * | 2002-08-22 | 2009-02-04 | 株式会社Ihi | ターゲット投影式3次元形状計測方法および装置 |
EP1877726B1 (en) * | 2005-03-11 | 2011-07-27 | Creaform Inc. | Auto-referenced system and apparatus for three-dimensional scanning |
-
2008
- 2008-10-09 KR KR1020080099239A patent/KR101052514B1/ko active IP Right Grant
-
2009
- 2009-06-17 JP JP2009144002A patent/JP5145291B2/ja active Active
Also Published As
Publication number | Publication date |
---|---|
KR20100040145A (ko) | 2010-04-19 |
KR101052514B1 (ko) | 2011-07-29 |
JP2010091549A (ja) | 2010-04-22 |
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