JP4930713B2 - Thermal cycle test apparatus and thermal cycle test method - Google Patents

Thermal cycle test apparatus and thermal cycle test method Download PDF

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JP4930713B2
JP4930713B2 JP2007154853A JP2007154853A JP4930713B2 JP 4930713 B2 JP4930713 B2 JP 4930713B2 JP 2007154853 A JP2007154853 A JP 2007154853A JP 2007154853 A JP2007154853 A JP 2007154853A JP 4930713 B2 JP4930713 B2 JP 4930713B2
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JP2008309504A (en
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浩一 藤田
稔智 太田
和夫 上松
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IHI Corp
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Description

本発明は熱サイクル試験装置及び熱サイクル試験方法に関するものである。   The present invention relates to a thermal cycle test apparatus and a thermal cycle test method.

塗膜や表面処理層などの耐久性を評価する熱サイクル試験では、金属基材の所定部位を塗膜や処理層で覆った試料に対して熱負荷を繰り返し与え、塗膜、もしくは処理層と金属基材の熱膨張差に起因した剥離が発生したか否かを確かめる。   In a thermal cycle test that evaluates the durability of a coating film or surface treatment layer, a thermal load is repeatedly applied to a sample in which a predetermined portion of a metal substrate is covered with the coating film or treatment layer. Whether or not peeling due to the difference in thermal expansion of the metal substrate has occurred is confirmed.

熱サイクル試験としては、評価対象部位である試料の塗膜や処理層などに向けてバーナからの燃焼ガスにより断続的に加熱しながら、同じ試料の評価対象部位とは反対側の部位に冷却空気を連続的に吹き付ける手法（例えば、特許文献１参照）、あるいは試料を搬送手段によって加熱炉と冷却室に交互に入れる手法などがある。
特開２００４−１２５５７５号公報 In the thermal cycle test, while cooling intermittently with the combustion gas from the burner toward the coating film or treatment layer of the sample that is the evaluation target part, cooling air is applied to the part opposite to the evaluation target part of the same sample. There is a method of continuously spraying (see, for example, Patent Document 1) or a method of alternately putting a sample into a heating furnace and a cooling chamber by a conveying means.
JP 2004-125575 A

ところが、特許文献１の手法にあっては、燃焼ガスで加熱される試料の評価対象部位の温度を周期的に変動させることは考慮されていない。   However, in the method of Patent Document 1, it is not considered to periodically change the temperature of the evaluation target portion of the sample heated by the combustion gas.

また加熱炉と冷却室に試料を交互に入れる手法にあっては、試料に温度勾配を持たせることができない。   Further, in the method of alternately putting the sample in the heating furnace and the cooling chamber, the sample cannot have a temperature gradient.

本発明は、試料に温度勾配を持たせられ、しかも試料の評価対象部位の温度を周期的に変動可能な熱サイクル試験装置及び熱サイクル試験方法を提供することを目的としている。   An object of the present invention is to provide a thermal cycle test apparatus and a thermal cycle test method in which a temperature gradient is given to a sample and the temperature of an evaluation target portion of the sample can be periodically changed.

上記目的を達成するため、請求項１に記載の発明は、加熱部からの輻射により試料を加熱し得る加熱部と、冷却台と、当該冷却台に試料を取り付ける熱抵抗体と、試料の温度を測定するセンサと、加熱部からの輻射行為と輻射の遮へい行為の繰り返しによる試料への加熱と冷却を繰り返す手段とを備えている。   In order to achieve the above object, the invention described in claim 1 includes a heating unit that can heat the sample by radiation from the heating unit, a cooling table, a thermal resistor that attaches the sample to the cooling table, and the temperature of the sample. And a means for repeatedly heating and cooling the sample by repeating the radiation action from the heating section and the shielding action of the radiation.

請求項２に記載の発明は、加熱部からの輻射により試料を加熱し得るヒータと、液冷構造の冷却台と、当該冷却台に試料を取り付ける熱抵抗体と、試料の温度を測定するセンサと、前記ヒータを加熱部が試料に向く姿勢、あるいは加熱部が試料から外れた姿勢に設定し得る駆動手段とを備えている。   The invention described in claim 2 is a heater capable of heating a sample by radiation from a heating unit, a cooling table having a liquid cooling structure, a thermal resistor for attaching the sample to the cooling table, and a sensor for measuring the temperature of the sample. And a driving means capable of setting the heater in a posture in which the heating unit faces the sample or a posture in which the heating unit is detached from the sample.

請求項３に記載の発明は、加熱部、冷却台、及び熱抵抗体を真空容器に内装している。   In a third aspect of the present invention, the heating unit, the cooling stand, and the thermal resistor are provided in the vacuum vessel.

請求項４に記載の発明は、冷却台に熱抵抗体を介した試料を複数固定している。   In the invention according to claim 4, a plurality of samples are fixed to the cooling table via the thermal resistor.

請求項５に記載の発明は、熱抵抗体を介して冷却台に固定された試料の温度を測定し、ヒータの加熱部を試料に向けて試料を加熱し、当該試料の温度が予め定めてある上限値に達したならば、ヒータによる試料の加熱を止めたうえ、試料の温度が予め定めてある下限値に達したならば、ヒータによる試料の加熱をする行程を持ち、これらの操作を繰り返して試料の温度を下限値と上限値との間で変動させる。   The invention according to claim 5 measures the temperature of the sample fixed to the cooling table via the thermal resistor, heats the sample with the heating part of the heater facing the sample, and the temperature of the sample is predetermined. If a certain upper limit is reached, the sample is heated by the heater, and if the sample temperature reaches a predetermined lower limit, the sample is heated by the heater. The temperature of the sample is repeatedly varied between the lower limit value and the upper limit value.

請求項６に記載の発明は、熱抵抗体を介して冷却台に固定された試料の温度を測定し、ヒータの加熱部を試料に向けて試料を加熱し、当該試料の温度が予め定めてある上限値に達したならば、ヒータによる試料の加熱を止めたうえ、ヒータと試料の間に試料に面するように冷却盤を挿入して輻射熱が試料へ届かない構成にする行程と、当該試料の温度が予め定めてある下限値に達したならば、冷却盤をヒータと試料の間から引き抜き、ヒータ加熱部が試料に面する構成にし、ヒータによる試料の加熱をする行程を持ち、これらの操作を繰り返して試料の温度を下限値と上限値との間で変動させる。   The invention according to claim 6 measures the temperature of the sample fixed to the cooling table via the thermal resistor, heats the sample with the heating portion of the heater facing the sample, and the temperature of the sample is predetermined. When a certain upper limit is reached, the heating of the sample with the heater is stopped, and a cooling plate is inserted between the heater and the sample so as to face the sample so that the radiant heat does not reach the sample. When the temperature of the sample reaches a predetermined lower limit, the cooling board is pulled out from between the heater and the sample, the heater heating part faces the sample, and the sample is heated by the heater. The above procedure is repeated to change the temperature of the sample between the lower limit value and the upper limit value.

請求項７に記載の発明は、熱抵抗体を介して冷却台に固定された試料の温度を測定し、ヒータの加熱部を試料に向けて試料を加熱し、当該試料の温度が予め定めてある上限値に達したならば、ヒータによる試料の加熱を止めたうえ、ヒータの姿勢を加熱部が試料から外れる姿勢にする行程と、当該試料の温度が予め定めてある下限値に達したならば、ヒータの姿勢を加熱部が試料を向く姿勢にし、ヒータによる試料の加熱する行程を持ち、これらの操作を繰り返して試料の温度を下限値と上限値との間で変動させる。   The invention according to claim 7 measures the temperature of the sample fixed to the cooling table via the thermal resistor, heats the sample with the heating part of the heater facing the sample, and the temperature of the sample is predetermined. If a certain upper limit value is reached, the heating of the sample by the heater is stopped, and the heater is moved to a posture in which the heating part is removed from the sample, and the temperature of the sample reaches a predetermined lower limit value. For example, the posture of the heater is set so that the heating unit faces the sample, and the sample is heated by the heater, and these operations are repeated to change the temperature of the sample between the lower limit value and the upper limit value.

すなわち、試料の評価対象部位の反対側の温度を、熱抵抗体及び冷却台による熱伝導で冷却し、試料の評価対象部位の温度を、ヒータによる輻射で周期的に加熱する。   That is, the temperature on the opposite side of the evaluation target portion of the sample is cooled by heat conduction by the thermal resistor and the cooling table, and the temperature of the evaluation target portion of the sample is periodically heated by radiation from the heater.

本発明の熱サイクル試験装置及び熱サイクル試験方法によれば、下記のような優れた効果を奏し得る。   According to the thermal cycle test apparatus and the thermal cycle test method of the present invention, the following excellent effects can be obtained.

（１）ヒータの動作とその停止、及び輻射熱が試料へ輻射するか否かの切り換えによって、試料の評価対象部位の温度を周期的に変動させることができる。   (1) The temperature of the evaluation target portion of the sample can be periodically changed by switching the operation of the heater, stopping it, and whether or not the radiant heat is radiated to the sample.

（２）ヒータの作動とその停止、及び加熱部が試料を向くか否かの切り換えによって、試料の評価対象部位の温度を周期的に変動させることができる。   (2) The temperature of the evaluation target portion of the sample can be periodically changed by operating and stopping the heater and switching whether or not the heating unit faces the sample.

（３）試料の評価対象部位をヒータによる輻射で加熱し、試料の評価対象部位の反対側を熱抵抗体及び冷却台による熱伝導で冷却するので、当該試料に温度勾配を持たせることができ、評価対象部位とその反対側との温度差を変化させることもできる。   (3) Since the evaluation target part of the sample is heated by radiation from the heater, and the opposite side of the evaluation target part of the sample is cooled by heat conduction using a thermal resistor and a cooling table, the sample can have a temperature gradient. The temperature difference between the evaluation target site and the opposite side can also be changed.

（４）熱抵抗体の断面積及び長さなどの寸法や材質を変更することで、当該試料に任意に温度勾配を持たせることができ、評価対象部材とその反対側との温度差を変化させることもできる。   (4) By changing dimensions and materials such as the cross-sectional area and length of the thermal resistor, the sample can be given a temperature gradient arbitrarily, and the temperature difference between the evaluation target member and the opposite side can be changed. It can also be made.

以下、本発明の実施の形態を図面に基づき説明する。   Hereinafter, embodiments of the present invention will be described with reference to the drawings.

図１〜図３は本発明の熱サイクル試験装置の第１の例であり、試料１を加熱部２からの輻射によって加熱し得るヒータ３と、液冷構造の冷却台４と、試料１を冷却台４に取り付ける軸状の熱抵抗体５と、ヒータ３を加熱部２が試料１に向く姿勢から１８０°の範囲で回動させる駆動手段６と、これらヒータ３、冷却台４、及び熱抵抗体５を内装する液冷構造の真空容器７とを備えている。   1 to 3 show a first example of a thermal cycle test apparatus according to the present invention. A heater 3 capable of heating a sample 1 by radiation from a heating unit 2, a cooling table 4 having a liquid cooling structure, and a sample 1 are shown. A shaft-shaped thermal resistor 5 attached to the cooling table 4, a driving means 6 for rotating the heater 3 within a range of 180 ° from a posture in which the heating unit 2 faces the sample 1, the heater 3, the cooling table 4, and the heat A liquid-cooled vacuum container 7 in which the resistor 5 is housed is provided.

試料１は、アルミニウム合金基材の所定部位を、受熱特性向上用の塗膜で覆ったもので、評価対象となる部位の反対側には、ねじ穴が形作ってある。   Sample 1 was obtained by covering a predetermined part of an aluminum alloy substrate with a coating film for improving heat receiving characteristics, and a screw hole was formed on the opposite side of the part to be evaluated.

試料１の塗膜は、クロム、銅、アルミニウムなどを含有し、珪酸ナトリウムをバインダとしている。   The coating film of Sample 1 contains chromium, copper, aluminum, and the like, and uses sodium silicate as a binder.

ヒータ３には、熱エネルギーの放出される方向に向けて内径が漸減する筒状の反射部材８が装着され、この反射部材８は、加熱部２から試料１に与えられるべき熱エネルギーの拡散を抑え、真空容器７の昇温を防ぐ役割を担う。   The heater 3 is provided with a cylindrical reflecting member 8 whose inner diameter gradually decreases in the direction in which the heat energy is released, and this reflecting member 8 diffuses the heat energy to be given to the sample 1 from the heating unit 2. It plays a role of suppressing and preventing the temperature rise of the vacuum vessel 7.

熱抵抗体５の基端部分には、冷却台４の上面に設けてある固定板９のねじ穴に螺合する雄ねじが形作られ、また、熱抵抗体５の先端部分には、試料１のねじ穴に螺合する雄ねじが形作られており、この熱抵抗体５は、冷却台４による吸熱効果が試料１に働き過ぎないようにする役割を担う（熱抵抗体５の素材としては、アルミニウム合金、あるいは銅など熱伝導率の異なる材料が選択でき、断面積も選択できる）。   The base end portion of the thermal resistor 5 is formed with a male screw that is screwed into the screw hole of the fixing plate 9 provided on the upper surface of the cooling table 4. A male screw that is screwed into the screw hole is formed, and this thermal resistor 5 plays a role of preventing the endothermic effect of the cooling table 4 from acting too much on the sample 1 (a material of the thermal resistor 5 is aluminum. Materials with different thermal conductivities such as alloys or copper can be selected, and the cross-sectional area can also be selected).

駆動手段６は、先端にヒータ３が取り付けられたアーム１０と、当該アーム１０にモータ１１の回転を伝達する減速機１２とを主な要素とするものであり、モータ１１の回転方向に応じて、ヒータ３を前述した１８０°の範囲で回動させる。図示しないが、ヒータ３の放熱部分以外から、輻射熱の放出が少なくなるように反射板を保持する。   The driving means 6 mainly includes an arm 10 having a heater 3 attached to the tip and a speed reducer 12 that transmits the rotation of the motor 11 to the arm 10, and depends on the rotation direction of the motor 11. The heater 3 is rotated in the range of 180 ° described above. Although not shown in the drawings, the reflector is held so that radiation heat is released from the portion other than the heat radiating portion of the heater 3.

受熱特性向上用の塗膜の耐久性を調べる際には、複数の試料１のそれぞれを熱抵抗体５により冷却台４の固定板９に取り付け、試料１のひとつをモニタ用にして、ヒータ３側と熱抵抗体５側とに温度センサを実装しておく。   When examining the durability of the coating film for improving the heat receiving characteristics, each of the plurality of samples 1 is attached to the fixing plate 9 of the cooling table 4 by the thermal resistor 5, and one of the samples 1 is used for monitoring, and the heater 3 The temperature sensor is mounted on the side and the thermal resistor 5 side.

更に、ガス対流の影響を除くため、真空容器７の内部を減圧したうえ、冷却台４に取り付けてある試料１に加熱部２が向くようにヒータ３の姿勢を設定する（図１、図２参照）。   Further, in order to eliminate the influence of gas convection, the inside of the vacuum vessel 7 is decompressed, and the posture of the heater 3 is set so that the heating unit 2 faces the sample 1 attached to the cooling table 4 (FIGS. 1 and 2). reference).

冷却台４と真空容器７に冷却水を流通させるとともにヒータ３を作動させて、冷却台４によって試料１の熱抵抗体５側の部位の温度を予め定めてある下限値（例えば、１００℃）に保ちながら、ヒータ３によって試料１を加熱する。   Cooling water is circulated through the cooling table 4 and the vacuum vessel 7 and the heater 3 is operated, so that the temperature of the portion of the sample 1 on the side of the thermal resistor 5 is predetermined by the cooling table 4 (for example, 100 ° C.). The sample 1 is heated by the heater 3 while being maintained at the same temperature.

試料１と冷却台４との間には熱抵抗体５が介在させてあるので、冷却台４による試料１からの吸熱が過大にならず、試料１に温度差が付く。   Since the thermal resistor 5 is interposed between the sample 1 and the cooling table 4, the heat absorption from the sample 1 by the cooling table 4 is not excessive, and the sample 1 has a temperature difference.

試料１のヒータ３側の部位の温度が予め定めてある上限値（例えば、３８０℃）に達したならば、ヒータ３の作動を停止させる。   When the temperature of the portion of the sample 1 on the heater 3 side reaches a predetermined upper limit value (for example, 380 ° C.), the operation of the heater 3 is stopped.

このとき、駆動手段６によりヒータ３の姿勢を１８０°反転させて、加熱部２が試料１から外れるようにし、輻射熱が試料１にできるだけ伝わらないようにする（図３参照）。   At this time, the posture of the heater 3 is reversed by 180 ° by the driving means 6 so that the heating unit 2 is detached from the sample 1 so that radiant heat is not transmitted to the sample 1 as much as possible (see FIG. 3).

試料１のヒータ３側の部位の温度が下限値に達したならば、駆動手段６によりヒータ３の姿勢を加熱部２が試料１を向くようにしたうえ、ヒータ３によって試料１を再び加熱し、この操作を繰り返して試料１のヒータ３側の部位の温度を下限値と上限値との間で変動させる。   When the temperature of the portion of the sample 1 on the heater 3 side reaches the lower limit value, the heater 3 is set so that the heating unit 2 faces the sample 1 by the driving means 6, and the sample 1 is heated again by the heater 3. By repeating this operation, the temperature of the portion of the sample 1 on the heater 3 side is varied between the lower limit value and the upper limit value.

塗膜が健全であれば、試料１のヒータ３側の部位の温度は、１００℃と３８０℃との間を規則的に変動する（図４参照）。   If the coating film is healthy, the temperature of the portion of the sample 1 on the heater 3 side regularly varies between 100 ° C. and 380 ° C. (see FIG. 4).

塗膜が剥離すると、その個所の受熱特性が低下してしまうため、ヒータ３への給電量が同じでも、試料１の温度は３８０℃まで上がらなくなる。   When the coating film is peeled off, the heat receiving characteristics at that point are deteriorated. Therefore, even if the amount of power supplied to the heater 3 is the same, the temperature of the sample 1 cannot be increased to 380 ° C.

このように、図１〜図３に示す熱サイクル試験装置では、ヒータ３の作動とその停止、及び加熱部２が試料１を向くか否かの切り換えによって、試料１の評価対象部位の温度を図４に示すように周期的に変動させることができる。   As described above, in the thermal cycle test apparatus shown in FIGS. 1 to 3, the temperature of the evaluation target portion of the sample 1 is set by switching the operation of the heater 3, the stop thereof, and whether the heating unit 2 faces the sample 1. As shown in FIG. 4, it can be changed periodically.

複数の試料１を設置する場合は、あるひとつの試料１に付けたヒータ制御用温度センサにより、ヒータ３及び駆動手段６を周期的に変動させるように制御する。残りの試料１には、温度センサによる温度差や温度変化の測定を行い、到達温度、温度変化量、温度差、温度変化速度により評価を行うことができる。   When a plurality of samples 1 are installed, the heater 3 and the driving means 6 are controlled to be periodically changed by a heater control temperature sensor attached to one sample 1. The remaining sample 1 can be measured by measuring a temperature difference or a temperature change with a temperature sensor, and can be evaluated based on the reached temperature, the amount of temperature change, the temperature difference, and the temperature change rate.

また、試料１の評価対象部位をヒータ３による輻射で加熱し、試料１の評価対象部位の反対側を熱抵抗体５及び冷却台４による熱伝導で冷却するので、当該試料１に温度勾配を持たせることができ、評価対象部位とその反対側との温度差を変化させることもできる。   In addition, the evaluation target part of the sample 1 is heated by radiation from the heater 3, and the opposite side of the evaluation target part of the sample 1 is cooled by heat conduction by the thermal resistor 5 and the cooling table 4, so that a temperature gradient is applied to the sample 1. The temperature difference between the evaluation target part and the opposite side can be changed.

温度差の変化量は、試料１の大きさ（熱容量）やヒータ３の出力、冷却台４の冷却能力、冷却台４と試料１の間の熱抵抗体５により設定できる。   The amount of change in the temperature difference can be set by the size (heat capacity) of the sample 1, the output of the heater 3, the cooling capacity of the cooling table 4, and the thermal resistor 5 between the cooling table 4 and the sample 1.

図５は本発明の熱サイクル試験装置の第２の例であり、試料１を加熱部２からの輻射によって加熱し得るヒータ３と、液冷構造の冷却台４と、試料１を冷却台４に取り付ける軸状の熱抵抗体５と、冷却盤１３と、ヒータ３と試料１の間に冷却盤１３を出し入れする駆動手段（図示せず）と、これらヒータ３、冷却台４、及び熱抵抗体５を内装する液冷構造の真空容器７とを備え、その他、図１と同じ符号を付したものは同一物を表している。   FIG. 5 shows a second example of the thermal cycle test apparatus according to the present invention. The heater 3 can heat the sample 1 by radiation from the heating unit 2, the cooling table 4 with a liquid cooling structure, and the sample 1 with the cooling table 4. A shaft-shaped thermal resistor 5 attached to the heater 3, a cooling plate 13, a driving means (not shown) for inserting and removing the cooling plate 13 between the heater 3 and the sample 1, the heater 3, the cooling table 4, and the thermal resistance. A liquid-cooled vacuum vessel 7 having a body 5 is provided, and the other components having the same reference numerals as those in FIG.

駆動手段は、先端に冷却盤１３が取り付けられたアームと、当該アームにモータの回転を往復運動に変換して伝達するクランクとを主な要素とするものであり、モータの回転に応じて冷却盤１３を、ヒータ３と試料１の間に出し入れする。   The driving means mainly includes an arm having a cooling plate 13 attached to the tip and a crank that converts the rotation of the motor into a reciprocating motion and transmits the arm to the arm, and cools in accordance with the rotation of the motor. The board 13 is put in and out between the heater 3 and the sample 1.

受熱特性向上用の塗膜の耐久性を調べる際には、複数の試料１のそれぞれを熱抵抗体５により冷却台４の固定板９に取り付け、試料１のひとつをモニタ用にして、ヒータ３側と熱抵抗体５側とに温度センサを実装しておく。   When examining the durability of the coating film for improving the heat receiving characteristics, each of the plurality of samples 1 is attached to the fixing plate 9 of the cooling table 4 by the thermal resistor 5, and one of the samples 1 is used for monitoring, and the heater 3 The temperature sensor is mounted on the side and the thermal resistor 5 side.

冷却台４と真空容器７に冷却水を流通させるとともにヒータ３を作動させて、冷却台４によって試料１の熱抵抗体５側の部位の温度を予め定めてある下限値（例えば、１００℃）に保ちながら、ヒータ３によって試料１を加熱する。   Cooling water is circulated through the cooling table 4 and the vacuum vessel 7 and the heater 3 is operated, so that the temperature of the portion of the sample 1 on the side of the thermal resistor 5 is predetermined by the cooling table 4 (for example, 100 ° C.). The sample 1 is heated by the heater 3 while being maintained at the same temperature.

試料１と冷却台４との間には熱抵抗体５が介在させてあるので、冷却台４による試料１からの吸熱が過大にならず、試料１に温度差が付く。   Since the thermal resistor 5 is interposed between the sample 1 and the cooling table 4, the heat absorption from the sample 1 by the cooling table 4 is not excessive, and the sample 1 has a temperature difference.

試料１のヒータ３側の部位の温度が予め定めてある上限値（例えば、３８０℃）に達したならば、ヒータ３の作動を停止させる。   When the temperature of the portion of the sample 1 on the heater 3 side reaches a predetermined upper limit value (for example, 380 ° C.), the operation of the heater 3 is stopped.

このとき、駆動手段により試料１とヒータ３の間に冷却盤１３を差し込み、輻射熱が試料１に入らないようにする。   At this time, the cooling plate 13 is inserted between the sample 1 and the heater 3 by the driving means so that radiant heat does not enter the sample 1.

試料１のヒータ３側の部位の温度が下限値に達したならば、駆動手段により試料１とヒータ３の間から冷却盤１３を引き抜きく。この操作を繰り返して試料１の温度を下限値と上限値との間で変動させる。   When the temperature of the part on the heater 3 side of the sample 1 reaches the lower limit value, the cooling board 13 is pulled out between the sample 1 and the heater 3 by the driving means. This operation is repeated to change the temperature of the sample 1 between the lower limit value and the upper limit value.

塗膜が健全であれば、試料１のヒータ３側の部位の温度は、１００℃と３８０℃との間を規則的に変動する。   If the coating film is healthy, the temperature of the portion of the sample 1 on the heater 3 side regularly varies between 100 ° C. and 380 ° C.

塗膜が剥離すると、その個所の受熱特性が低下してしまうため、ヒータ３への給電量が同じでも、試料１の温度は３８０℃まで上がらなくなる。   When the coating film is peeled off, the heat receiving characteristics at that point are deteriorated. Therefore, even if the amount of power supplied to the heater 3 is the same, the temperature of the sample 1 cannot be increased to 380 ° C.

このように、図５に示す熱サイクル試験装置では、ヒータ３の作動とその停止、及び冷却盤１３の出し入れによって、試料１の評価対象部位の温度を周期的に変動させることができる。   As described above, in the thermal cycle test apparatus shown in FIG. 5, the temperature of the evaluation target portion of the sample 1 can be periodically changed by the operation of the heater 3 and its stop and the insertion and removal of the cooling board 13.

図６は本発明の熱サイクル試験装置の第３の例であり、冷却水Ｗが連続的に流通し得る冷却盤１４と、ヒータ３と試料１の間に冷却盤１４を出し入れする駆動手段（図示せず）とを備え、その他、図５と同じ符号を付したものは同一物を表している。   FIG. 6 shows a third example of the thermal cycle test apparatus according to the present invention, in which a cooling plate 14 through which the cooling water W can continuously flow, and a driving means for inserting and removing the cooling plate 14 between the heater 3 and the sample 1 ( Other components denoted by the same reference numerals as those in FIG. 5 represent the same items.

駆動手段は、先端に冷却盤１４が取り付けられたアームと、当該アームにモータの回転を往復運動に変換して伝達するクランクとを主な要素とするものであり、モータの回転に応じて冷却盤１４を、ヒータ３と試料１の間に出し入れする。   The driving means mainly includes an arm having a cooling plate 14 attached to the tip and a crank that converts the rotation of the motor into a reciprocating motion and transmits the arm to the arm, and cools in accordance with the rotation of the motor. The board 14 is put in and out between the heater 3 and the sample 1.

よって、図６に示す熱サイクル試験装置でも、ヒータ３の作動とその停止、及び冷却盤１４の出し入れによって、試料１の評価対象部位の温度を周期的に変動させることができる。   Therefore, also in the thermal cycle test apparatus shown in FIG. 6, the temperature of the evaluation target portion of the sample 1 can be periodically changed by operating and stopping the heater 3 and taking in and out the cooling board 14.

図７は本発明の熱サイクル試験装置の第４の例であり、試料１を加熱部２からの輻射によって加熱し得るヒータ３と、液冷構造の冷却台４と、試料１を冷却台４に取り付ける軸状の熱抵抗体５と、冷却台４を試料１がヒータ３の加熱部２に向く姿勢から１８０°の範囲で回動させる駆動手段（図示せず）とを備え、その他、図１と同じ符号を付したものは同一物を表している。   FIG. 7 shows a fourth example of the thermal cycle test apparatus according to the present invention. The heater 3 can heat the sample 1 by radiation from the heating unit 2, the cooling table 4 with a liquid cooling structure, and the sample 1 with the cooling table 4. And a driving means (not shown) for rotating the cooling table 4 within a range of 180 ° from the posture in which the sample 1 faces the heating unit 2 of the heater 3. Those given the same reference numerals as 1 represent the same thing.

駆動手段は、先端に冷却台４が取り付けられたアームと、当該アームにモータの回転を伝達する減速機とを主な要素とするものであり、モータの回転方向に応じて、冷却台４を前述した１８０°の範囲で回動させる   The driving means mainly includes an arm having a cooling base 4 attached to the tip and a speed reducer that transmits the rotation of the motor to the arm. Rotate within the range of 180 ° mentioned above

よって、図７に示す熱サイクル試験装置でも、ヒータ３の作動とその停止、及び試料１が加熱部２を向くか否かの切り換えによって、試料１の評価対象部位の温度を周期的に変動させることができる。   Therefore, also in the thermal cycle test apparatus shown in FIG. 7, the temperature of the evaluation target portion of the sample 1 is periodically changed by the operation and stop of the heater 3 and the switching of whether or not the sample 1 faces the heating unit 2. be able to.

なお、本発明は、上述した実施の形態のみに限定されるものではなく、本発明の要旨を逸脱しない範囲において変更を加え得ることは勿論である。   It should be noted that the present invention is not limited to the above-described embodiment, and it goes without saying that modifications can be made without departing from the scope of the present invention.

本発明の熱サイクル試験装置及び熱サイクル試験方法は、様々な材料の評価に適用することができる。特に、塗膜やその剥離性、材料の輻射能力の経時変化の評価や加速評価試験に適用することができる。   The thermal cycle test apparatus and thermal cycle test method of the present invention can be applied to the evaluation of various materials. In particular, the present invention can be applied to evaluation of changes with time in coating films, their peelability, and radiation ability of materials, and accelerated evaluation tests.

本発明の熱サイクル試験装置の第１の例を示す概念図である。It is a conceptual diagram which shows the 1st example of the thermal cycle test apparatus of this invention. 図１のＩＩ−ＩＩ矢視図である。It is an II-II arrow line view of FIG. 図２におけるヒータが１８０°反転した状態を示す図である。It is a figure which shows the state which the heater in FIG. 2 reversed 180 degrees. 試料の評価対象部位の温度線図である。It is a temperature line figure of the evaluation object part of a sample. 本発明の熱サイクル試験装置の第２の例を示す概念図である。It is a conceptual diagram which shows the 2nd example of the thermal cycle test apparatus of this invention. 本発明の熱サイクル試験装置の第３の例を示す概念図である。It is a conceptual diagram which shows the 3rd example of the thermal cycle test apparatus of this invention. 本発明の熱サイクル試験装置の第４の例を示す概念図である。It is a conceptual diagram which shows the 4th example of the thermal cycle test apparatus of this invention.

符号の説明Explanation of symbols

１ 試料
２ 加熱部
３ ヒータ
４ 冷却台
５ 熱抵抗体
６ 駆動手段
７ 真空容器 DESCRIPTION OF SYMBOLS 1 Sample 2 Heating part 3 Heater 4 Cooling stand 5 Thermal resistor 6 Driving means 7 Vacuum container

Claims (7)

加熱部からの輻射により試料を加熱し得る加熱部と、冷却台と、当該冷却台に試料を取り付ける熱抵抗体と、試料の温度を測定するセンサと、加熱部からの輻射行為と輻射の遮へい行為の繰り返しによる試料への加熱と冷却を繰り返す手段とを備えてなることを特徴とする熱サイクル試験装置。   A heating unit that can heat the sample by radiation from the heating unit, a cooling table, a thermal resistor that attaches the sample to the cooling table, a sensor that measures the temperature of the sample, and a radiation action and radiation shielding from the heating unit A thermal cycle test apparatus comprising: means for repeating heating and cooling of a sample by repetition of actions. 加熱部からの輻射により試料を加熱し得るヒータと、液冷構造の冷却台と、当該冷却台に試料を取り付ける熱抵抗体と、試料の温度を測定するセンサと、前記ヒータを加熱部が試料に向く姿勢、あるいは加熱部が試料から外れた姿勢に設定し得る駆動手段とを備えてなることを特徴とする熱サイクル試験装置。   A heater that can heat the sample by radiation from the heating unit, a cooling table having a liquid cooling structure, a thermal resistor that attaches the sample to the cooling table, a sensor that measures the temperature of the sample, and the heating unit that samples the heater And a driving means that can be set to a posture in which the heating unit is detached from the sample. 加熱部、冷却台、及び熱抵抗体を真空容器に内装した請求項１または２に記載の熱サイクル試験装置。   The thermal cycle test apparatus according to claim 1 or 2, wherein the heating unit, the cooling stand, and the thermal resistor are housed in a vacuum vessel. 冷却台に熱抵抗体を介した試料を複数固定した請求項１から３に記載の熱サイクル試験装置。   The thermal cycle test apparatus according to claim 1, wherein a plurality of samples are fixed to the cooling table via thermal resistors. 熱抵抗体を介して冷却台に固定された試料の温度を測定し、ヒータの加熱部を試料に向けて試料を加熱し、当該試料の温度が予め定めてある上限値に達したならば、ヒータによる試料の加熱を止めたうえ、試料の温度が予め定めてある下限値に達したならば、ヒータによる試料の加熱をする行程を持ち、これらの操作を繰り返して試料の温度を下限値と上限値との間で変動させる熱サイクル試験方法。   If the temperature of the sample fixed to the cooling table is measured via the thermal resistor, the sample is heated with the heating part of the heater facing the sample, and the temperature of the sample reaches a predetermined upper limit value, After stopping the heating of the sample by the heater, if the temperature of the sample reaches a predetermined lower limit value, there is a process of heating the sample by the heater, and repeating these operations, the temperature of the sample becomes the lower limit value. Thermal cycle test method that varies between upper limit values. 熱抵抗体を介して冷却台に固定された試料の温度を測定し、ヒータの加熱部を試料に向けて試料を加熱し、当該試料の温度が予め定めてある上限値に達したならば、ヒータによる試料の加熱を止めたうえ、ヒータと試料の間に試料に面するように冷却盤を挿入して輻射熱が試料へ届かない構成にする行程と、当該試料の温度が予め定めてある下限値に達したならば、冷却盤をヒータと試料の間から引き抜き、ヒータ加熱部が試料に面する構成にし、ヒータによる試料の加熱をする行程を持ち、これらの操作を繰り返して試料の温度を下限値と上限値との間で変動させる熱サイクル試験方法。   If the temperature of the sample fixed to the cooling table is measured via the thermal resistor, the sample is heated with the heating part of the heater facing the sample, and the temperature of the sample reaches a predetermined upper limit value, The process of stopping the heating of the sample by the heater and inserting a cooling plate between the heater and the sample so as to face the sample so that the radiant heat does not reach the sample, and the lower limit of the temperature of the sample. When the value is reached, the cooling board is pulled out from between the heater and the sample, the heater heating part faces the sample, and the sample is heated by the heater. These operations are repeated to increase the sample temperature. A thermal cycle test method that varies between a lower limit value and an upper limit value. 熱抵抗体を介して冷却台に固定された試料の温度を測定し、ヒータの加熱部を試料に向けて試料を加熱し、当該試料の温度が予め定めてある上限値に達したならば、ヒータによる試料の加熱を止めたうえ、ヒータの姿勢を加熱部が試料から外れる姿勢にする行程と、当該試料の温度が予め定めてある下限値に達したならば、ヒータの姿勢を加熱部が試料を向く姿勢にし、ヒータによる試料の加熱する行程を持ち、これらの操作を繰り返して試料の温度を下限値と上限値との間で変動させる熱サイクル試験方法。
If the temperature of the sample fixed to the cooling table is measured via the thermal resistor, the sample is heated with the heating part of the heater facing the sample, and the temperature of the sample reaches a predetermined upper limit value, After the heating of the sample by the heater is stopped, the heating unit changes the posture of the heater to a posture in which the heating unit is removed from the sample and the temperature of the sample reaches a predetermined lower limit value. A thermal cycle test method in which the sample is placed in a posture, the sample is heated by a heater, and these operations are repeated to change the sample temperature between a lower limit value and an upper limit value.
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