JP4921348B2 - 導通検査具の導通ピン保護構造 - Google Patents
導通検査具の導通ピン保護構造 Download PDFInfo
- Publication number
- JP4921348B2 JP4921348B2 JP2007341197A JP2007341197A JP4921348B2 JP 4921348 B2 JP4921348 B2 JP 4921348B2 JP 2007341197 A JP2007341197 A JP 2007341197A JP 2007341197 A JP2007341197 A JP 2007341197A JP 4921348 B2 JP4921348 B2 JP 4921348B2
- Authority
- JP
- Japan
- Prior art keywords
- end surface
- plate
- inspection
- connector
- conduction
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000007689 inspection Methods 0.000 claims description 68
- 230000001681 protective effect Effects 0.000 claims description 35
- 230000006835 compression Effects 0.000 description 10
- 238000007906 compression Methods 0.000 description 10
- 238000005452 bending Methods 0.000 description 7
- 239000002184 metal Substances 0.000 description 6
- 238000006073 displacement reaction Methods 0.000 description 4
- 229920005989 resin Polymers 0.000 description 4
- 239000011347 resin Substances 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 230000013011 mating Effects 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 229920003002 synthetic resin Polymers 0.000 description 1
- 239000000057 synthetic resin Substances 0.000 description 1
- 230000002618 waking effect Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R43/00—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors
- H01R43/26—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors for engaging or disengaging the two parts of a coupling device
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/68—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board
- G01R31/69—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board of terminals at the end of a cable or a wire harness; of plugs; of sockets, e.g. wall sockets or power sockets in appliances
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R2201/00—Connectors or connections adapted for particular applications
- H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Details Of Connecting Devices For Male And Female Coupling (AREA)
- Manufacturing Of Electrical Connectors (AREA)
- Measuring Leads Or Probes (AREA)
Description
3 コネクタセット部
4 検査部
5 レバー
6 導通ピン保護板
6a 前端面
7 コイルばね
8 ガイドピン
9,10 側壁
9a,10a 後端面
12’ リンク
21 導通ピン
23a 前端面
28 孔部
41 分割リンク
42 コイルばね
43 ばね保持カバー
44 固定ピン
45 長孔
Claims (2)
- 左右一対の側壁を有するコネクタセット部と、該コネクタセット部に向けて進退自在な検査部とを備え、該検査部に複数の導通ピンが配設された導通検査具において、前記検査部の前端にガイドピンが突設され、前記各導通ピンを挿通させる各孔部を有する導通ピン保護板が該ガイドピンに沿ってばね付勢のもとで進退自在に設けられ、導通検査時に該導通ピン保護板の前端面が前記コネクタセット部の左右一対の側壁の後端面に当接し、且つ該側壁の後端面と該検査部の前端面との間に挟まれることを特徴とする導通検査具の導通ピン保護構造。
- 前記検査部がリンクを介して進退駆動用のレバーに連結され、該リンクが、一対の分割リンクと、該一対の分割リンクを離間方向に付勢するばねと、該一対の分割リンクの長孔に係合する固定ピンを有するばね保持カバーとで構成され、前記導通ピン保護板の前端面が前記コネクタセット部の左右一対の側壁の後端面に当接した際に、該リンクが該ばねの付勢に抗して短縮されることを特徴とする請求項1記載の導通検査具の導通ピン保護構造。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007341197A JP4921348B2 (ja) | 2007-12-28 | 2007-12-28 | 導通検査具の導通ピン保護構造 |
PCT/JP2008/073973 WO2009084735A1 (en) | 2007-12-28 | 2008-12-26 | Inspection pin protection structure of conduction check apparatus |
US12/810,534 US8581599B2 (en) | 2007-12-28 | 2008-12-26 | Inspection pin protection structure of conduction check apparatus |
CN2008801276806A CN101960679B (zh) | 2007-12-28 | 2008-12-26 | 导通检查装置的检测针保护结构 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007341197A JP4921348B2 (ja) | 2007-12-28 | 2007-12-28 | 導通検査具の導通ピン保護構造 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2009163953A JP2009163953A (ja) | 2009-07-23 |
JP4921348B2 true JP4921348B2 (ja) | 2012-04-25 |
Family
ID=40824439
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2007341197A Active JP4921348B2 (ja) | 2007-12-28 | 2007-12-28 | 導通検査具の導通ピン保護構造 |
Country Status (4)
Country | Link |
---|---|
US (1) | US8581599B2 (ja) |
JP (1) | JP4921348B2 (ja) |
CN (1) | CN101960679B (ja) |
WO (1) | WO2009084735A1 (ja) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9482695B2 (en) * | 2012-12-21 | 2016-11-01 | Tektronix, Inc. | High bandwidth differential lead with device connection |
CN105527465B (zh) * | 2014-09-30 | 2020-03-20 | 泰科电子(上海)有限公司 | 连接器测试插座及连接器测试装置 |
US9455521B2 (en) | 2014-12-03 | 2016-09-27 | Hyundai Motor Company | Lever type connector |
US10809023B2 (en) * | 2017-03-20 | 2020-10-20 | Stoneage, Inc. | Flexible tube cleaning lance positioner apparatus |
JP6757369B2 (ja) | 2018-07-06 | 2020-09-16 | 矢崎総業株式会社 | 導通検査治具および導通ピンの検査方法 |
US20200116755A1 (en) * | 2018-10-15 | 2020-04-16 | AIS Technology, Inc. | Test interface system and method of manufacture thereof |
CN112652918A (zh) * | 2019-10-11 | 2021-04-13 | 青岛职业技术学院 | 一种可自动吸合脱离的直流电气自动对接装置 |
KR20220153830A (ko) * | 2021-05-12 | 2022-11-21 | 주식회사 엘지에너지솔루션 | 핀 밀림 검사 커넥터 |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4862313A (en) * | 1987-12-11 | 1989-08-29 | Hitachi, Ltd. | Driving apparatus for DC circuit breakers |
DE4428797C2 (de) * | 1994-08-13 | 1997-04-17 | Kommunikations Elektronik | Vorrichtung zum Prüfen von Leiterkarten und/oder Flachbaugruppen |
JPH0935844A (ja) * | 1995-07-20 | 1997-02-07 | Sumitomo Wiring Syst Ltd | ボールロックコネクタの嵌合検知用治具 |
US5663655A (en) * | 1995-09-22 | 1997-09-02 | Everett Charles Technologies, Inc. | ESD protection for universal grid type test fixtures |
JP3518091B2 (ja) * | 1995-09-25 | 2004-04-12 | 株式会社エンプラス | Icソケット |
US5945838A (en) * | 1997-06-26 | 1999-08-31 | Star Technology Group, Inc. | Apparatus for testing circuit boards |
JP2000150102A (ja) * | 1998-11-11 | 2000-05-30 | Sumitomo Wiring Syst Ltd | 導通検査装置 |
JP2001135441A (ja) * | 1999-11-02 | 2001-05-18 | Sony Corp | ソケット装置 |
JP3743305B2 (ja) * | 2001-05-14 | 2006-02-08 | 住友電装株式会社 | コネクタ検査装置 |
JP3566691B2 (ja) * | 2001-12-17 | 2004-09-15 | 日本テキサス・インスツルメンツ株式会社 | 半導体装置用ソケットおよび半導体装置のソケットへの取付け方法 |
US6960923B2 (en) * | 2001-12-19 | 2005-11-01 | Formfactor, Inc. | Probe card covering system and method |
JP2003255013A (ja) * | 2002-02-28 | 2003-09-10 | Sumitomo Wiring Syst Ltd | コネクタの導通検査ユニット |
JP2004037164A (ja) * | 2002-07-01 | 2004-02-05 | Sumitomo Wiring Syst Ltd | コネクタ検査装置 |
JP4490972B2 (ja) * | 2003-05-22 | 2010-06-30 | クニペックス−ウエルク・ツエ・グスタフ・プッチュ・カーゲー | 片手で操作できるペンチ |
JP3625470B1 (ja) * | 2003-09-30 | 2005-03-02 | キヤノン株式会社 | プロセスカートリッジ、及び、電子写真画像形成装置 |
DE602004007870T2 (de) * | 2004-01-16 | 2008-04-17 | Ming-Jeng Lin | Scharniervorrichtung |
TWI276812B (en) * | 2005-06-24 | 2007-03-21 | Innolux Display Corp | Automatic connecting device used in high voltage testing |
TWI323503B (en) * | 2005-12-12 | 2010-04-11 | Optopac Co Ltd | Apparatus, unit and method for testing image sensor packages |
US7172450B1 (en) * | 2006-01-11 | 2007-02-06 | Qualitau, Inc. | High temperature open ended zero insertion force (ZIF) test socket |
-
2007
- 2007-12-28 JP JP2007341197A patent/JP4921348B2/ja active Active
-
2008
- 2008-12-26 WO PCT/JP2008/073973 patent/WO2009084735A1/en active Application Filing
- 2008-12-26 CN CN2008801276806A patent/CN101960679B/zh active Active
- 2008-12-26 US US12/810,534 patent/US8581599B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
CN101960679B (zh) | 2013-05-22 |
JP2009163953A (ja) | 2009-07-23 |
WO2009084735A1 (en) | 2009-07-09 |
US8581599B2 (en) | 2013-11-12 |
CN101960679A (zh) | 2011-01-26 |
US20100271043A1 (en) | 2010-10-28 |
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