JP4765099B2 - 半導体装置およびその製造方法 - Google Patents
半導体装置およびその製造方法 Download PDFInfo
- Publication number
- JP4765099B2 JP4765099B2 JP2005313883A JP2005313883A JP4765099B2 JP 4765099 B2 JP4765099 B2 JP 4765099B2 JP 2005313883 A JP2005313883 A JP 2005313883A JP 2005313883 A JP2005313883 A JP 2005313883A JP 4765099 B2 JP4765099 B2 JP 4765099B2
- Authority
- JP
- Japan
- Prior art keywords
- layer
- solder
- substrate
- semiconductor device
- metal part
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000004065 semiconductor Substances 0.000 title claims description 75
- 238000004519 manufacturing process Methods 0.000 title claims description 21
- 229910000679 solder Inorganic materials 0.000 claims description 89
- 229910052751 metal Inorganic materials 0.000 claims description 56
- 239000002184 metal Substances 0.000 claims description 56
- 239000000758 substrate Substances 0.000 claims description 43
- 229910052802 copper Inorganic materials 0.000 claims description 29
- 239000000463 material Substances 0.000 claims description 26
- 238000010438 heat treatment Methods 0.000 claims description 22
- 239000004020 conductor Substances 0.000 claims description 16
- 229910052782 aluminium Inorganic materials 0.000 claims description 9
- 229910052787 antimony Inorganic materials 0.000 claims description 7
- 229910052738 indium Inorganic materials 0.000 claims description 7
- 229910052737 gold Inorganic materials 0.000 claims description 6
- 238000000034 method Methods 0.000 claims description 6
- 238000005476 soldering Methods 0.000 claims description 5
- 229910052718 tin Inorganic materials 0.000 claims description 5
- 229910001128 Sn alloy Inorganic materials 0.000 claims description 3
- 239000010410 layer Substances 0.000 description 119
- PXHVJJICTQNCMI-UHFFFAOYSA-N nickel Substances [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 83
- 239000010949 copper Substances 0.000 description 79
- 238000007747 plating Methods 0.000 description 33
- 239000010408 film Substances 0.000 description 27
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 23
- 239000010931 gold Substances 0.000 description 17
- 229910045601 alloy Inorganic materials 0.000 description 13
- 239000000956 alloy Substances 0.000 description 13
- 229910052759 nickel Inorganic materials 0.000 description 10
- 238000005304 joining Methods 0.000 description 9
- 238000006243 chemical reaction Methods 0.000 description 8
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 7
- 229910008433 SnCU Inorganic materials 0.000 description 6
- 238000009792 diffusion process Methods 0.000 description 6
- 230000000694 effects Effects 0.000 description 5
- 229910000881 Cu alloy Inorganic materials 0.000 description 4
- 229910005887 NiSn Inorganic materials 0.000 description 4
- -1 SnAgCu Inorganic materials 0.000 description 4
- 239000013078 crystal Substances 0.000 description 4
- 230000007797 corrosion Effects 0.000 description 3
- 238000005260 corrosion Methods 0.000 description 3
- KDLHZDBZIXYQEI-UHFFFAOYSA-N palladium Substances [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 3
- 229910000990 Ni alloy Inorganic materials 0.000 description 2
- 229910006913 SnSb Inorganic materials 0.000 description 2
- 229910005728 SnZn Inorganic materials 0.000 description 2
- 230000004888 barrier function Effects 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 229910052804 chromium Inorganic materials 0.000 description 2
- 239000011651 chromium Substances 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 239000002131 composite material Substances 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 2
- 238000009713 electroplating Methods 0.000 description 2
- 239000007791 liquid phase Substances 0.000 description 2
- 239000002244 precipitate Substances 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- 229910018125 Al-Si Inorganic materials 0.000 description 1
- 229910018520 Al—Si Inorganic materials 0.000 description 1
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 1
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- 229910018104 Ni-P Inorganic materials 0.000 description 1
- 229910018536 Ni—P Inorganic materials 0.000 description 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- 229910007637 SnAg Inorganic materials 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 230000032683 aging Effects 0.000 description 1
- 238000005275 alloying Methods 0.000 description 1
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical compound [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 description 1
- 239000003963 antioxidant agent Substances 0.000 description 1
- 230000003078 antioxidant effect Effects 0.000 description 1
- 229910052797 bismuth Inorganic materials 0.000 description 1
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 description 1
- 229910052796 boron Inorganic materials 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000007772 electroless plating Methods 0.000 description 1
- 238000010828 elution Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 230000003628 erosive effect Effects 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- 238000010406 interfacial reaction Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 239000012071 phase Substances 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 238000001953 recrystallisation Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 230000035882 stress Effects 0.000 description 1
- 239000002344 surface layer Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
- 239000011701 zinc Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L24/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29099—Material
- H01L2224/291—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/29101—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of less than 400°C
- H01L2224/29111—Tin [Sn] as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/325—Material
- H01L2224/32505—Material outside the bonding interface, e.g. in the bulk of the layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45117—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 400°C and less than 950°C
- H01L2224/45124—Aluminium (Al) as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/838—Bonding techniques
- H01L2224/83801—Soldering or alloying
- H01L2224/8381—Soldering or alloying involving forming an intermetallic compound at the bonding interface
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Die Bonding (AREA)
Description
また、前述のはんだ接合時に形成される前記SnCu合金層については、適度な厚みを持っていることがはんだ接合層の密着性の観点からは必要な要件であるが、他方では銅より硬度が高いものの脆性傾向の高い機械的性質をも有している。加えて前記SnCu合金層は合金形成時の体積変化のため接合部に応力ひずみが発生するので、前述のように実使用中における高温履歴により合金層が過大に成長すると、はんだ接合層に初期クラックを導入した場合と同様の理由により、所定の期間経過後にはんだ接合層が破壊されるという結果をもたらし、半導体モジュールの信頼性を損なう要因となることが判明した。従って、はんだの濡れ性などの接合安定性と接合後のSnCu合金化反応の進行抑制を目的として、Niめっき等で被接合材(銅基板または銅層)を被覆するのが一般的になりつつある。
本発明は以上述べた点に鑑みて成されたものであり、本発明の目的は、半導体チップが良伝導体上にはんだ接合された半導体装置について、初期だけでなく、実使用中における高温動作履歴後においても、Snを主成分とする鉛フリーはんだを用いたはんだ接合部の信頼性を高くできる半導体装置およびその製造方法を提供することである。
特許請求の範囲の請求項2記載の本発明によれば、前記金属部がCu、Alを含む良伝導体材料から選ばれる少なくともいずれか一種類の材料である請求項1記載の半導体装置とすることが好ましい。
特許請求の範囲の請求項3記載の本発明によれば、前記金属部を有する基板が、絶縁基板の表面に形成される金属配線パターンを含む金属部を有する基板である請求項1または2記載の半導体装置とすることが好適である。
特許請求の範囲の請求項5記載の本発明によれば、半導体チップをはんだを用いた接合により、基板の金属部上に搭載する半導体装置の製造方法において、表面側からNi層とCu層とをこの順に有する金属部を備える基板に所定の加熱処理を加えることにより、Cu/Ni層とCu層とをこの順に有する金属部を備える基板に変えてから、Snを主成分とするPbフリーはんだ材を用いて半導体チップを前記金属部のCu/Ni層の上にはんだ接合し、はんだ層側から、順次はんだ層、Ni/Sn層およびCu/Ni/Sn層で構成される接合層構造を形成する半導体装置の製造方法とすることにより、前記本発明の目的は達成される。
特許請求の範囲の請求項6記載の本発明によれば、前記金属部を備える基板に所定の加熱処理を加えた後、前記金属部の最表面にAu、In、Sbから選ばれる少なくとも一種類を用いた金属層を形成し、前記半導体チップをはんだ接合する請求項5記載の半導体装置の製造方法とすることが好ましい。
2、… Ni皮膜、
2−1、… Cu/Ni層
3、… はんだ層、
4、… Cu/Ni/Sn層
5、… Au膜、
6、… Al層
7、… Ni層
8、… Cu層
9、… はんだめっき層
10、… Ni/Sn層。
Claims (7)
- 半導体チップが金属部を有する基板上にはんだを用いた接合により搭載される半導体装置において、前記はんだがPbフリーのSn系はんだであり、前記半導体チップと前記金属部の間のSn系はんだ層と前記金属部の表面とが前記Sn系はんだ層側から、順次Sn系はんだ層とNi/Sn層とCu/Ni/Sn層とCu/Ni層とCu層とで構成される接合層構造を有することを特徴とする半導体装置。
- 前記金属部がCu、Alを含む良伝導体材料から選ばれる少なくともいずれか一種類の材料であることを特徴とする請求項1記載の半導体装置。
- 前記金属部を有する基板が、絶縁基板の表面に形成される金属配線パターンを含む金属部を有する基板であることを特徴とする請求項1または2記載の半導体装置。
- 前記金属部を有する基板が金属基板からなることを特徴とする請求項1または2記載の半導体装置。
- 半導体チップをはんだ材を用いた接合により、基板の金属部上に搭載する半導体装置の製造方法において、表面側からNi層とCu層とをこの順に有する金属部を備える基板に所定の加熱処理を加えることにより、Cu/Ni層とCu層とをこの順に有する金属部を備える基板に変えてから、Snを主成分とするPbフリーはんだ材を用いて半導体チップを前記金属部のCu/Ni層の上にはんだ接合し、はんだ層側から、順次はんだ層、Ni/Sn層およびCu/Ni/Sn層で構成される接合層構造を形成することを特徴とする半導体装置の製造方法。
- 前記金属部を備える基板に所定の加熱処理を加えた後、前記金属部の最表面にAu、In、Sbから選ばれる少なくとも一種類を用いた金属層を形成し、前記半導体チップをはんだ接合することを特徴とする請求項5記載の半導体装置の製造方法。
- 前記金属部の最表面にAu、In、Sbから選ばれる少なくとも一種類を用いた金属層を形成した後、前記半導体チップをはんだ接合する前に、前記金属層上にSnまたはSn合金層を形成することを特徴とする請求項6記載の半導体装置の製造方法。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005313883A JP4765099B2 (ja) | 2005-10-28 | 2005-10-28 | 半導体装置およびその製造方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005313883A JP4765099B2 (ja) | 2005-10-28 | 2005-10-28 | 半導体装置およびその製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2007123566A JP2007123566A (ja) | 2007-05-17 |
JP4765099B2 true JP4765099B2 (ja) | 2011-09-07 |
Family
ID=38147079
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2005313883A Expired - Fee Related JP4765099B2 (ja) | 2005-10-28 | 2005-10-28 | 半導体装置およびその製造方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP4765099B2 (ja) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011014705A (ja) * | 2009-07-01 | 2011-01-20 | Hitachi Ltd | 半導体装置および半導体装置の製造方法 |
JP5677346B2 (ja) * | 2012-03-22 | 2015-02-25 | 株式会社日立製作所 | 半導体素子、半導体装置、半導体装置の製造方法及び接続材料 |
JP2014060341A (ja) | 2012-09-19 | 2014-04-03 | Toshiba Corp | 半導体装置および半導体装置の製造方法 |
JP6477517B2 (ja) * | 2016-01-20 | 2019-03-06 | トヨタ自動車株式会社 | 半導体装置の製造方法 |
US20220139852A1 (en) * | 2020-10-30 | 2022-05-05 | Cree, Inc. | Transistor packages with improved die attach |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3092603B2 (ja) * | 1998-11-02 | 2000-09-25 | 日本電気株式会社 | 半導体素子実装基板又は放熱板とその製造方法及び該基板又は放熱板と半導体素子との接合体 |
JP2001011612A (ja) * | 1999-06-28 | 2001-01-16 | Sumitomo Metal Mining Co Ltd | ターゲット材料、電極材料、及び実装部品 |
JP3880877B2 (ja) * | 2002-03-29 | 2007-02-14 | Dowaホールディングス株式会社 | めっきを施した銅または銅合金およびその製造方法 |
JP2005026612A (ja) * | 2003-07-02 | 2005-01-27 | Denso Corp | 半導体装置 |
JP4663975B2 (ja) * | 2003-11-28 | 2011-04-06 | 日本特殊陶業株式会社 | 電子部品用パッケージ |
-
2005
- 2005-10-28 JP JP2005313883A patent/JP4765099B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JP2007123566A (ja) | 2007-05-17 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US10930614B2 (en) | Chip arrangements | |
KR101704030B1 (ko) | 구리 첨가에 의한 솔더 인터커넥트의 개선 | |
US8092621B2 (en) | Method for inhibiting growth of nickel-copper-tin intermetallic layer in solder joints | |
US20110042815A1 (en) | Semiconductor device and on-vehicle ac generator | |
TW201323131A (zh) | 抑制柯肯達爾孔洞形成於銲料與銅銲墊之間的方法 | |
JPH10511226A (ja) | フリップチップ実装用はんだバンプおよびその製造方法 | |
WO2011081213A1 (ja) | 面実装部品のはんだ付け方法および面実装部品 | |
US10328533B2 (en) | Hybrid lead-free solder wire | |
JP6287759B2 (ja) | 半導体装置とその製造方法 | |
WO2012053178A1 (ja) | 半導体接合構造体および半導体接合構造体の製造方法 | |
JP4765099B2 (ja) | 半導体装置およびその製造方法 | |
JP3796181B2 (ja) | 無鉛ハンダ合金、ハンダボール及びハンダバンプを有する電子部材 | |
JP5614507B2 (ja) | Sn−Cu系鉛フリーはんだ合金 | |
JP2005032834A (ja) | 半導体チップと基板との接合方法 | |
CN115881673A (zh) | 层结构、芯片封装体以及它们的形成方法和焊料材料 | |
JP2015205345A (ja) | 面実装部品のはんだ付け方法および面実装部品 | |
JP2007031740A (ja) | 電子部品及びその製造方法 | |
US20230126663A1 (en) | Layer structure and chip package that includes the layer structure | |
JP2003223945A (ja) | Au−Ge系ろう材付リードピン | |
US12023762B2 (en) | Layer structure with an intermetallic phase layer and a chip package that includes the layer structure | |
JP6543890B2 (ja) | 高温はんだ合金 | |
WO2001076335A1 (en) | Mounting structure of electronic device and method of mounting electronic device | |
JP2012204476A (ja) | 配線基板およびその製造方法 | |
JP4779710B2 (ja) | 接合方法およびこれを用いたインバータ | |
JP3466498B2 (ja) | 配線基板及びその製造方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A711 | Notification of change in applicant |
Free format text: JAPANESE INTERMEDIATE CODE: A711 Effective date: 20080204 |
|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20080916 |
|
RD02 | Notification of acceptance of power of attorney |
Free format text: JAPANESE INTERMEDIATE CODE: A7422 Effective date: 20081216 |
|
RD04 | Notification of resignation of power of attorney |
Free format text: JAPANESE INTERMEDIATE CODE: A7424 Effective date: 20090219 |
|
A711 | Notification of change in applicant |
Free format text: JAPANESE INTERMEDIATE CODE: A712 Effective date: 20091112 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20110204 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20110215 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20110408 |
|
A711 | Notification of change in applicant |
Free format text: JAPANESE INTERMEDIATE CODE: A712 Effective date: 20110422 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20110510 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20110523 |
|
R150 | Certificate of patent or registration of utility model |
Free format text: JAPANESE INTERMEDIATE CODE: R150 Ref document number: 4765099 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20140624 Year of fee payment: 3 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
LAPS | Cancellation because of no payment of annual fees |