JP3109325B2 - Method for inspecting continuity of circuit board having light emitting diode and continuity inspection apparatus used for the method - Google Patents
Method for inspecting continuity of circuit board having light emitting diode and continuity inspection apparatus used for the methodInfo
- Publication number
- JP3109325B2 JP3109325B2 JP05119177A JP11917793A JP3109325B2 JP 3109325 B2 JP3109325 B2 JP 3109325B2 JP 05119177 A JP05119177 A JP 05119177A JP 11917793 A JP11917793 A JP 11917793A JP 3109325 B2 JP3109325 B2 JP 3109325B2
- Authority
- JP
- Japan
- Prior art keywords
- circuit board
- circuit
- continuity
- inspected
- light emitting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Description
【０００１】[0001]
【産業上の利用分野】本発明は、例えば、パーソナルコ
ンピューターの動作表示として用いられる発光ダイオー
ドを有する回路基板の導通検査方法と、それに用いる導
通検査装置に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for inspecting the continuity of a circuit board having a light emitting diode used as an operation display of a personal computer, for example, and a continuity inspection apparatus used for the method.
【０００２】[0002]
【従来の技術】発光ダイオードを有する回路基板は、基
板に設けた回路に、単色発光または２色発光の発光ダイ
オードが組込まれており、その基板のコネクタを、パー
ソナルコンピューター等の装置本体に接続して装着され
る。そして、そのパーソナルコンピューター等が所定の
動作をなすと、その回路基板の発光ダイオードが所定色
に発光して、その動作が正常かどうかを表示する構造を
有している。2. Description of the Related Art A circuit board having a light emitting diode has a light emitting diode of monochromatic light emission or two color light emission incorporated in a circuit provided on the circuit board, and a connector of the substrate is connected to an apparatus body such as a personal computer. Is attached. When the personal computer or the like performs a predetermined operation, a light emitting diode on the circuit board emits light of a predetermined color to indicate whether the operation is normal.
【０００３】そして、その発光ダイオードを有する回路
基板は、製作後に、予め正常な回路であることを確認し
たサンプル回路基板を装着した導通検査装置に取り付
け、製作後の製品回路基板と、そのサンプル回路基板の
回路に、共通のスイッチをオンさせることによって、共
通の検査電源から同時に検査電流を回路毎に順次流し、
そのサンプル回路基板と製品回路基板の発光ダイオード
の点灯・不点灯によって、その製品回路基板の導通性の
良否が確認され、そのサンプル回路基板と製品回路基板
の両方の発光ダイオードが同一色に点灯したものが良
品、不点灯のものが不良品となす導通検査方法と導通検
査装置が用いられている。After the circuit board having the light emitting diode is manufactured, the circuit board is mounted on a continuity inspecting apparatus equipped with a sample circuit board which has been confirmed to be a normal circuit in advance. By turning on a common switch in the circuit of the board, a test current is simultaneously passed from a common test power supply to each circuit sequentially for each circuit,
Lighting / non-lighting of the light emitting diodes of the sample circuit board and the product circuit board confirmed the conductivity of the product circuit board, and the light emitting diodes of both the sample circuit board and the product circuit board were lit in the same color. A continuity inspection method and a continuity inspection device are used in which a non-defective product is regarded as a good product and an unlit product is regarded as a defective product.
【０００４】[0004]
【発明が解決しようとする課題】以上の従来技術の導通
検査方法は、製品回路基板とサンプル回路基板の検査対
称回路に、共通の検査電源から検査電流を同時に流すの
で、製品側の検査回路に不備が存在して、その検査回路
が不導通になると、サンプル回路基板の回路も検査電流
が不導通となり、両者の発光ダイオードが不点灯となっ
て不良品と判断される。しかし、その両者不点灯は、検
査電流のスイッチの操作不備等の製品回路基板以外の不
備原因の場合でも生ずるので、正常な製品回路基板が不
良品と誤認される場合がある。さらに、製品回路基板の
隣接回路間の短絡不良の場合も、その両者不点灯を生ず
るので、不良判定された製品回路基板の不良原因が、回
路自体の導通不良か回路間短絡不良かを層別できない不
具合があり、前記の従来の導通検査手段は、検査品質上
の難点がある。In the continuity inspection method of the prior art described above, an inspection current is simultaneously supplied from a common inspection power supply to an inspection symmetrical circuit of a product circuit board and a sample circuit board. If there is a defect and the test circuit becomes non-conductive, the test current of the circuit of the sample circuit board also becomes non-conductive, and both light emitting diodes are turned off, and it is determined to be defective. However, the non-lighting of the both occurs even in the case of a defect other than the product circuit board, such as a defective operation of the switch of the inspection current, so that the normal product circuit board may be mistaken as a defective product. Further, in the case of a short circuit between adjacent circuits of a product circuit board, both of them are not lit. Therefore, the fault of the product circuit board determined to be defective is classified into a circuit failure or a short circuit between the circuits. However, the conventional continuity inspection means has a problem in inspection quality.
【０００５】本発明は、以上の従来技術の難点を解消す
る導通検査方法と、それに用いる導通検査装置を提供す
るものである。[0005] The present invention provides a continuity inspection method and a continuity inspection device used for solving the above-mentioned drawbacks of the prior art.
【０００６】[0006]
【課題を解決するための手段】以上の技術課題を解決す
る本発明は、「発光ダイオードを回路に組み入れた回路
基板を導通検査するにおいて、被検査回路基板と同一の
回路構成を有して、予め正常であることを確認したサン
プル回路基板と被検査回路基板に、個別の検査電流を共
通のスイッチによって流すと共に、前記検査電流による
前記被検査回路基板の回路間短絡電流を、アラーム回路
によって検知し、前記サンプル回路基板と前記被検査回
路基板の発光ダイオードの発光色対比と、前記被検査回
路基板の発光ダイオードの不点灯によって、前記被検査
回路基板の導通不良を検出すると同時に、前記アラーム
回路の作動によって、前記被検査回路基板の回路間短絡
を層別検出することを特徴とする発光ダイオードを有す
る回路基板の導通検査方法」と、SUMMARY OF THE INVENTION The present invention for solving the above-mentioned technical problem is based on the fact that "in conducting a continuity test on a circuit board incorporating a light emitting diode in a circuit, the circuit has the same circuit configuration as the circuit board to be inspected. An individual inspection current is applied to the sample circuit board and the circuit board to be inspected which have been confirmed to be normal in advance by a common switch, and a short circuit current between the circuits of the circuit board to be inspected by the inspection current is detected by an alarm circuit. Detecting the conduction failure of the circuit board to be inspected by comparing the emission color contrast of the light emitting diodes of the sample circuit board and the circuit board to be inspected with the non-lighting of the light emitting diode of the circuit board to be inspected; The circuit board having a light emitting diode is detected by the operation of the circuit board. And 査方 method ",
【０００７】「サンプル回路基板の取付部と該サンプル
回路基板のサンプルコネクタ接続部と、被検査回路基板
の取付部と該被検査回路基板の被検査コネクタ接続部を
配設し、さらに、前記サンプルコネクタ接続部と前記被
検査コネクタ接続部に個別の検査電源を接続し、かつ、
共通のスイッチによって該検査電源から前記サンプルコ
ネクタ接続部と前記被検査コネクタ接続部に個別の検査
電流を流すと共に、前記被検査回路基板の回路間の短絡
電流のアラーム回路を組み入れた検査回路を設けた構造
を特徴とする前記の発光ダイオードを有する回路基板の
導通検査方法に用いる導通検査装置」によって構成され
ている。[0007] A mounting portion of a sample circuit board, a sample connector connecting portion of the sample circuit board, a mounting portion of a circuit board to be tested, and a connector connecting portion of the circuit board to be tested are provided. An individual inspection power supply is connected to the connector connection part and the connector connection part to be inspected, and
An inspection circuit is provided, in which an individual inspection current flows from the inspection power supply to the sample connector connection portion and the connector connection portion to be inspected by a common switch, and an alarm circuit for a short-circuit current between the circuits of the circuit substrate to be inspected is provided. Continuity inspection apparatus for use in the continuity inspection method for a circuit board having the light emitting diode having the above-mentioned structure.
【０００８】[0008]
【作用】以上の構成を有する本発明の導通検査方法と導
通検査装置は、個別の検査電源による個別の検査電源
を、サンプル回路基板と被検査回路基板に、同時に流す
ので、被検査回路基板の回路に不備があると、その被検
査回路基板の発光ダイオードが不点灯となり、サンプル
回路基板の発光ダイオードは点灯するので、被検査回路
基板の導通不良を正確に検知することができる。そし
て、そのサンプル回路基板と被検査回路基板の発光ダイ
オードのいずれもが不点灯のときは、スイッチの操作不
良等の被検査回路基板以外の不良原因として処理するこ
とができる。従って、正常な被検査回路基板が導通不良
として誤認されることがない。さらに、被検査回路基板
の回路間短絡の不良があると、前記のアラーム回路が作
動するので、短絡不良として的確に層別検出して、適切
な処理を講ずることができる。According to the continuity inspection method and continuity inspection apparatus of the present invention having the above-described configurations, the individual inspection power supplies by the individual inspection power supplies are simultaneously supplied to the sample circuit board and the circuit board to be inspected. If the circuit is defective, the light emitting diode of the circuit board to be inspected is turned off and the light emitting diode of the sample circuit board is illuminated, so that the conduction failure of the circuit board to be inspected can be accurately detected. When neither the sample circuit board nor the light emitting diode of the circuit board to be inspected is turned on, it can be processed as a cause of a failure other than the circuit board to be inspected such as an operation failure of a switch. Therefore, a normal circuit board to be inspected is not erroneously recognized as a conduction failure. Further, if there is a short circuit between the circuits of the circuit board to be inspected, the above-mentioned alarm circuit is activated. Therefore, it is possible to accurately detect the short circuit as a short circuit defect and perform appropriate processing.
【０００９】[0009]
【実施例】以下、実施例に基づいて詳しく説明する。ま
ず、本発明一実施例の導通検査装置を示す図１を参照し
て、この実施例の被検査回路基板の製品回路基板１は、
２脚の単色発光ダイオード３と、３脚の２色発光ダイオ
ード４を、それぞれ１個配設し、単色発光ダイオード３
を組み入れる２条の回路５と、２色発光ダイオード４の
３脚を組み入れる３条の回路６を有している。そして、
その製品回路基板１の導通検査装置は、図１の（Ｂ）参
照、導通検査図板１０の上に、製品回路基板１を載置す
る被検査回路基板取付部１２と、製品回路基板１から引
き出したコネクタを接続する被検査コネクタ接続部１４
と、製品回路基板１と同一の回路構成を有して予め正常
であることを確認したサンプル回路基板２を載置するサ
ンプル回路基板取付部１１と、このサンプル回路基板２
から引き出したコネクタを接続するサンプルコネクタ接
続部１３が設けられている。そして、この導通検査図板
１０には、以下に述べる導通検査回路７が装着されてい
る。DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, the present invention will be described in detail based on embodiments. First, referring to FIG. 1 showing a continuity inspection device of one embodiment of the present invention, a product circuit board 1 of a circuit board to be inspected of this embodiment is
One single-color light-emitting diode 3 and one three-color two-color light-emitting diode 4 are provided, respectively.
And three circuits 6 incorporating three legs of the two-color light emitting diode 4. And
Referring to FIG. 1B, the continuity inspection device for the product circuit board 1 includes a circuit board to be inspected mounting portion 12 for mounting the product circuit board 1 on a continuity inspection board 10 and a product circuit board 1. Inspection connector connection part 14 for connecting the pulled-out connector
A sample circuit board mounting portion 11 on which a sample circuit board 2 having the same circuit configuration as the product circuit board 1 and which has been confirmed to be normal beforehand is placed, and the sample circuit board 2
There is provided a sample connector connecting portion 13 for connecting a connector drawn from the connector. The continuity inspection circuit 10 described below is mounted on the continuity inspection diagram 10.
【００１０】即ち、図１の（Ａ）参照、サンプル回路基
板２と製品回路基板１の単色発光ダイオード３の回路５
の回路端Ｃ・Ｄに両端を接続して、中間に共通のスイッ
チＳ１を有し、スイッチＳ１のオンによって、製品回路
基板１へ検査電流を流す検査側電源Ｂ１と、サンプル回
路基板２へ検査電流を流すサンプル側電源Ｂ２を有する
回路５の検査回路と、同じく、２色発光ダイオード４の
回路６の回路端Ｅ・Ｆ・Ｇに両端を接続すると共に、回
路６の回路端Ｅ・Ｆを導通するスイッチＳ２と回路端Ｆ
・Ｇを導通するスイッチＳ３を有し、さらに、検査側電
源Ｂ１とサンプル側電源Ｂ２を有する回路６の検査回路
からなる導通検査回路７が装着されている。そして、そ
の導通検査回路７には、製品回路基板１の回路５と回路
６間の短絡電流を検知するアラーム回路のブザー回路８
が組み込まれており、そのスイッチＳ１・Ｓ２・Ｓ３と
ブザー回路８のブザー９は、導通検査図板１０の上面に
配設されて、導通検査の操作と検知ができるようになっ
ている。That is, referring to FIG. 1A, the circuit 5 of the monochromatic light emitting diode 3 of the sample circuit board 2 and the product circuit board 1
Both ends are connected to the circuit ends C and D, and a common switch S1 is provided in the middle. When the switch S1 is turned on, an inspection-side power supply B1 that supplies an inspection current to the product circuit board 1 and an inspection is performed on the sample circuit board 2. The test circuit of the circuit 5 having the sample-side power supply B2 through which a current flows is connected to both ends of the circuit end EFG of the circuit 6 of the two-color light-emitting diode 4, and the circuit end EF of the circuit 6 is also connected. Conductive switch S2 and circuit end F
A switch S3 for conducting G is provided, and a continuity test circuit 7 including a test circuit of a circuit 6 having a test-side power supply B1 and a sample-side power supply B2 is mounted. The continuity inspection circuit 7 includes a buzzer circuit 8 of an alarm circuit for detecting a short-circuit current between the circuit 5 and the circuit 6 of the product circuit board 1.
The switches S1, S2, S3 and the buzzer 9 of the buzzer circuit 8 are arranged on the upper surface of the continuity test diagram board 10 so that the continuity test can be operated and detected.
【００１１】そして、以上の導通検査装置によって、製
品回路基板１の導通検査が、以下のとおりなされる。即
ち、サンプル回路基板２をサンプル回路基板取付部１１
に載置して、コネクタをサンプルコネクタ接続部１３に
接続すると共に、製品回路基板１を被検査回路基板取付
部１２に載置してコネクタを被検査コネクタ接続部１４
に接続して検査準備をなす。しかるのち、スイッチＳ１
・Ｓ２・Ｓ３を順次オンになし、最後にスイッチＳ２・
Ｓ３を同時オンして、製品回路基板１の導通検査と回路
間短絡の有無が、確認される。The continuity inspection of the product circuit board 1 is performed as follows by the above continuity inspection apparatus. That is, the sample circuit board 2 is connected to the sample circuit board mounting portion 11.
And the connector is connected to the sample connector connecting portion 13, and the product circuit board 1 is mounted on the circuit board mounting portion 12 to be inspected and the connector is connected to the connector connecting portion 14 to be inspected.
To prepare for inspection. Then, switch S1
S2 and S3 are turned on sequentially, and finally switches S2 and S3 are turned on.
S3 is turned on at the same time, and the continuity inspection of the product circuit board 1 and the presence / absence of a short circuit between the circuits are confirmed.
【００１２】即ち、スイッチＳ１オンによって製品側サ
ンプル側の発光ダイオード３が同色点灯すると、製品回
路基板１の回路５は良好であり、製品側の発光ダイオー
ド３のみが不点灯のときは回路５が導通不良、両者とも
不点灯のときは製品回路基板１以外の不備原因として確
認される。そして、ブザー回路８が作動したときは、回
路５・６間の短絡不良として確認される。以下、続いて
スイッチＳ２・Ｓ３のオンによって、回路５と同様に、
製品回路基板１の回路６の回路端Ｅ・Ｆ間とＦ・Ｇ間の
導通確認がなさる。そして、最後に、スイッチＳ２・Ｓ
３を同時にオンして、回路６の全体に検査電流を流す
と、２色発光ダイオード４が２色の中間色を点灯表示す
るので、その中間色対比によって、製品回路基板１の２
色発光ダイオード４の中間色発光機能の良否が確認され
る。以上の実施例のものは、前記の作用があり、製品回
路基板１の導通不良が正確に検査できると共に、製品回
路基板１の導通不良と回路間短絡不良が層別できるの
で、それ等不良品の対策が的確にして能率的にできる。That is, when the light emitting diode 3 on the product sample side is lit in the same color by turning on the switch S1, the circuit 5 of the product circuit board 1 is good, and when only the light emitting diode 3 on the product side is not lit, the circuit 5 is turned off. If the continuity is poor and both are not lit, it is confirmed as a cause of defects other than the product circuit board 1. When the buzzer circuit 8 is activated, it is confirmed as a short circuit between the circuits 5 and 6. Subsequently, by turning on the switches S2 and S3, similarly to the circuit 5,
The continuity between the circuit ends EF and FG of the circuit 6 of the product circuit board 1 is confirmed. And finally, the switches S2 and S
3 are turned on at the same time, and an inspection current is applied to the entire circuit 6, the two-color light emitting diode 4 lights up and displays two intermediate colors.
The quality of the intermediate color light emitting function of the color light emitting diode 4 is confirmed. The above-described embodiment has the above-described operation, and can accurately inspect the continuity failure of the product circuit board 1 and can classify the continuity failure of the product circuit board 1 and the short circuit failure between the circuits. Measures can be done accurately and efficiently.
【００１３】[0013]
【考案の効果】以上の説明のとおり、本発明の発光ダイ
オードを有する回路基板の導通検査方法と導通検査装置
は、その回路基板の導通不良を極めて正確に検出すると
共に、回路間の短絡不良も同時に層別検出するので、当
該回路基板の検査品質が、従来技術のものより向上す
る。そして、不良検出された回路基板は、導通不良と短
絡不良に層別されるので、その不良対策が的確かつ能率
的に行える。以上の効果がある。As described above, the continuity inspection method and continuity inspection device for a circuit board having a light emitting diode according to the present invention detect the continuity failure of the circuit board very accurately and also detect the short circuit failure between the circuits. At the same time, layer-by-layer detection is performed, so that the inspection quality of the circuit board is improved over that of the prior art. Then, the circuit board in which the failure is detected is classified into a conduction failure and a short-circuit failure, so that the failure countermeasure can be performed accurately and efficiently. The above effects are obtained.
【図１】本発明一実施例の導通検査装置を示し、図中の
（Ａ）はその検査回路の構成図、図中の（Ｂ）はその導
通検査図板の上面のレイアウト図FIG. 1 shows a continuity inspection apparatus according to one embodiment of the present invention, wherein (A) in the figure is a configuration diagram of the inspection circuit, and (B) in the figure is a layout diagram of an upper surface of the continuity inspection board;
１ 製品回路基板 ２ サンプル回路基板 ３ 単色発光ダイオード ４ ２色発光ダイオード ５・６ 基板の回路 ７ 導通検査回路 ８ ブザー回路 ９ ブザー １０ 導通検査図板 １１ サンプル回路基板取付部 １２ 被検査回路基板取付部 １３ サンプルコネクタ接続部 １４ 被検査コネクタ接続部 Ｃ・Ｄ・Ｅ・Ｆ・Ｇ 基板回路の回路端 Ｓ１・Ｓ２・Ｓ３ スイッチ Ｂ１ 検査側電源 Ｂ２ サンプル側電源 DESCRIPTION OF SYMBOLS 1 Product circuit board 2 Sample circuit board 3 Single color light emitting diode 4 Two color light emitting diode 5.6 Circuit of board 7 Continuity inspection circuit 8 Buzzer circuit 9 Buzzer 10 Continuity inspection drawing board 11 Sample circuit board attaching part 12 Inspection circuit board attaching part 13 Sample connector connection 14 Connector to be inspected C, D, E, F, G Circuit end of board circuit S1, S2, S3 Switch B1 Inspection side power supply B2 Sample side power supply
Claims (2)
基板を導通検査するにおいて、被検査回路基板と同一の
回路構成を有して、予め正常であることを確認したサン
プル回路基板と、被検査回路基板に、個別の検査電流を
共通のスイッチによって流すと共に、前記検査電流によ
る前記被検査回路基板の回路間短絡電流を、アラーム回
路によって検知し、前記サンプル回路基板と前記被検査
回路基板の発光ダイオードの発光色対比と、前記被検査
回路基板の発光ダイオードの不点灯によって、前記被検
査回路基板の導通不良を検出すると同時に、前記アラー
ム回路の作動によって、前記被検査回路基板の回路間短
絡を層別検出することを特徴とする発光ダイオードを有
する回路基板の導通検査方法。In a continuity test of a circuit board in which a light emitting diode is incorporated in a circuit, a sample circuit board having the same circuit configuration as a circuit board to be inspected, which is previously confirmed to be normal, and a circuit to be inspected. An individual inspection current is caused to flow through the substrate by a common switch, and a short circuit current between the circuits of the circuit board to be inspected by the inspection current is detected by an alarm circuit, and the light emitting diodes of the sample circuit board and the circuit board to be inspected are detected. The continuity of the circuit board under test is detected by the light emission color contrast of the circuit board and the non-lighting of the light emitting diode of the circuit board under test. A continuity inspection method for a circuit board having a light emitting diode, wherein the continuity is detected separately.
回路基板のサンプルコネクタ接続部と、被検査回路基板
の取付部と該被検査回路基板の被検査コネクタ接続部を
配設し、さらに、前記サンプルコネクタ接続部と前記被
検査コネクタ接続部に個別の検査電源を接続し、かつ、
共通のスイッチによって該検査電源から前記サンプルコ
ネクタ接続部と前記被検査コネクタ接続部に個別の検査
電流を流すと共に、前記被検査回路基板の回路間の短絡
電流のアラーム回路を組み入れた検査回路を設けた構造
を特徴とする請求項１の導通検査方法に用いる発光ダイ
オードを有する回路基板の導通検査装置。A mounting section for the sample circuit board, a sample connector connection section for the sample circuit board, a mounting section for the circuit board to be inspected, and a connector connection section for the circuit board to be inspected; Individual test power supplies are connected to the sample connector connection and the connector connection to be tested, and
An inspection circuit is provided, in which an individual inspection current flows from the inspection power supply to the sample connector connection portion and the connector connection portion to be inspected by a common switch, and an alarm circuit for a short-circuit current between the circuits of the circuit substrate to be inspected is provided. 2. A continuity inspection apparatus for a circuit board having a light emitting diode used in the continuity inspection method according to claim 1, wherein
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP05119177A JP3109325B2 (en) | 1993-04-21 | 1993-04-21 | Method for inspecting continuity of circuit board having light emitting diode and continuity inspection apparatus used for the method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP05119177A JP3109325B2 (en) | 1993-04-21 | 1993-04-21 | Method for inspecting continuity of circuit board having light emitting diode and continuity inspection apparatus used for the method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH06308183A JPH06308183A (en) | 1994-11-04 |
| JP3109325B2 true JP3109325B2 (en) | 2000-11-13 |
Family
ID=14754821
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP05119177A Expired - Fee Related JP3109325B2 (en) | 1993-04-21 | 1993-04-21 | Method for inspecting continuity of circuit board having light emitting diode and continuity inspection apparatus used for the method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3109325B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101424722B (en) * | 2007-10-31 | 2011-01-05 | 鸿富锦精密工业（深圳）有限公司 | LED test system for mainboard and method |
-
1993
- 1993-04-21 JP JP05119177A patent/JP3109325B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH06308183A (en) | 1994-11-04 |
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