JP3091787B2 - Light emitting element sorting method and light emitting element sorting apparatus - Google Patents
Light emitting element sorting method and light emitting element sorting apparatusInfo
- Publication number
- JP3091787B2 JP3091787B2 JP04073711A JP7371192A JP3091787B2 JP 3091787 B2 JP3091787 B2 JP 3091787B2 JP 04073711 A JP04073711 A JP 04073711A JP 7371192 A JP7371192 A JP 7371192A JP 3091787 B2 JP3091787 B2 JP 3091787B2
- Authority
- JP
- Japan
- Prior art keywords
- light emitting
- emitting element
- cathode
- light
- anode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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- Manufacture Of Electron Tubes, Discharge Lamp Vessels, Lead-In Wires, And The Like (AREA)
- Cathode-Ray Tubes And Fluorescent Screens For Display (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
Description
【０００１】[0001]
【産業上の利用分野】この発明は、大画面ディスプレイ
装置の画素となる各発光素子の輝度むらを判 別して、使
用される発光素子の良否の選別を行う発光素子選別方法
および発光素子選別装置に関するものである。 BACKGROUND OF THE INVENTION This invention, luminance unevenness of the light emitting element becomes the pixel of the large-screen display device to determine another, use
Light emitting element selection method for determining the quality of light emitting elements used
And a light-emitting element selection device.
【０００２】[0002]
【従来の技術】図３は例えば特開昭６２−１０８４９号
公報に示された従来の発光素子を示す分解斜視図であ
り、図において、１ａは蛍光体９が塗布された表示部
材、１ｂはスペーサ、１ｃは各種制御電極が配置された
基板（後部パネル）である。これらは図４に示すように
組み合わせて表示管の真空容器１を構成する。BACKGROUND ART FIG. 3 is an exploded perspective view showing a conventional light emitting element shown in JP-A-62-10849 for example, in FIG, 1a is a display member in which the phosphor 9 is applied, 1 b spacer, 1c denotes a substrate on which various control electrodes are disposed (rear panel). These are combined to form the vacuum vessel 1 of the display tube as shown in FIG.
【０００３】２は線状のカソード、３は第１の制御電極
（走査電極）、４は第２の制御電極（データ電極）、
５，６は制御電極３，４をそれぞれ行方向および列方向
に共通に接続する配線パターン、７は発光部に対応して
開口部が設けられた遮蔽電極、８はその遮蔽電極７に設
けられた開口部、１０は排気部である。また、上記蛍光
体９の上には発光効率を上げるためアルミの薄膜が蒸着
されている。[0003] 2 is a linear cathode, 3 is a first control electrode (scanning electrode), 4 is a second control electrode (data electrode),
Reference numerals 5 and 6 denote wiring patterns for commonly connecting the control electrodes 3 and 4 in the row direction and the column direction, respectively, 7 denotes a shielding electrode provided with an opening corresponding to the light emitting portion, and 8 denotes a shielding electrode 7 provided on the shielding electrode 7. The opening 10 is an exhaust unit. An aluminum thin film is deposited on the phosphor 9 to increase luminous efficiency.
【０００４】図５は２種類の電極３，４の配置および配
線を示す配線図である。Ｓ１〜Ｓ４は行方向に共通に接
続された走査電極３の引き出し部、Ｄ１〜Ｄ４は列方向
に共通に接続されたデータ電極４の引き出し部である。FIG. 5 is a wiring diagram showing the arrangement and wiring of two types of electrodes 3 and 4. S1 to S4 are lead portions of the scanning electrodes 3 commonly connected in the row direction, and D1 to D4 are lead portions of the data electrodes 4 commonly connected in the column direction.
【０００５】また、図６はそれぞれの電極に印加する信
号のタイミングチャート図、図７は画素の配列と電極の
対応関係を示す説明図、図８は各電極の電位と電子の流
れを説明する動作説明図、図９は発光素子を複数個配列
したディスプレイの正面画である。FIG. 6 is a timing chart of signals applied to the respective electrodes, FIG. 7 is an explanatory diagram showing the correspondence between the arrangement of pixels and the electrodes, and FIG. 8 is a diagram illustrating the potential of each electrode and the flow of electrons. FIG. 9 is a front view of a display in which a plurality of light emitting elements are arranged.
【０００６】次に動作について説明する。この種の表示
装置の基本原理は、カソード２から放出された熱電子を
加速し、陽極に衝突させることにより、陽極面に塗布さ
れた蛍光体９を励起し、発光せしめるものである。すな
わち、図７において、カソード２から放出された熱電子
は、走査電極３とデータ電極４の電位の組み合わせによ
り、次のように振舞う。Next, the operation will be described. The basic principle of this type of display device is that the thermoelectrons emitted from the cathode 2 are accelerated and collide with the anode to excite the phosphor 9 applied on the anode surface to emit light. That is, in FIG. 7, the thermoelectrons emitted from the cathode 2 behave as follows depending on the combination of the potentials of the scanning electrode 3 and the data electrode 4.
【０００７】 行方向に接続された走査電極３、およ
び列方向に接続されたデータ電極４がともにカソード２
に対して正の場合、データ電極４の正電位によりカソー
ド２から放出された電子は、走査電極３の電位により偏
向され、所定の開口部８を通過して陽極に達し、蛍光体
９を発光せしめる。The scanning electrodes 3 connected in the row direction and the data electrodes 4 connected in the column direction are both cathodes 2.
Is positive, the electrons emitted from the cathode 2 by the positive potential of the data electrode 4 are deflected by the potential of the scanning electrode 3, pass through a predetermined opening 8, reach the anode, and emit light from the phosphor 9. Let me know.
【０００８】 走査電極３が正で、データ電極４が負
の場合、カソード２に近いデータ電極４の負電位により
カソード２近傍の電位が負になり、熱電子の放出が抑制
される。このため蛍光体９は発光しない。When the scanning electrode 3 is positive and the data electrode 4 is negative, the potential near the cathode 2 becomes negative due to the negative potential of the data electrode 4 near the cathode 2, and the emission of thermoelectrons is suppressed. Therefore, the phosphor 9 does not emit light.
【０００９】 走査電極３が負で、データ電極４が正
の場合、次の２通りの場合がある。ａ 他方の走査電極
３が正の場合は、カソード２から放出された熱電子は走
査電極３の電位により他方の走査電極３側へ偏向され、
蛍光体９は発光しない。When the scanning electrode 3 is negative and the data electrode 4 is positive, there are two cases as follows. a When the other scanning electrode 3 is positive, thermions emitted from the cathode 2 are deflected toward the other scanning electrode 3 by the potential of the scanning electrode 3,
The phosphor 9 does not emit light.
【００１０】ｂ 他方の走査電極３も負の場合は、デー
タ電極４の電位は正であるが、データ電極４の面積が小
さいため、両側の走査電極３の負の電位の影響により、
カソード２近傍は負となり、熱電子の放出が抑制された
蛍光体９は発光しない。B When the other scanning electrode 3 is also negative, the potential of the data electrode 4 is positive, but the area of the data electrode 4 is small.
The vicinity of the cathode 2 becomes negative, and the phosphor 9 whose emission of thermoelectrons is suppressed does not emit light.
【００１１】 走査電極３、データ電極４ともに負の
場合は、カソード２近傍の電位が負になり、熱電子の放
出が抑制され、蛍光体９は発光しない。この結果、図５
の配線関係と、図７の画素の配列との関係により、正の
電位が印加される行の走査電極３および列のデータ電極
４の交点に位置する蛍光体９が発光することになる。When both the scanning electrode 3 and the data electrode 4 are negative, the potential near the cathode 2 becomes negative, the emission of thermoelectrons is suppressed, and the phosphor 9 does not emit light. As a result, FIG.
7, the phosphor 9 located at the intersection of the scanning electrode 3 in the row to which a positive potential is applied and the data electrode 4 in the column emits light.
【００１２】そして、まず、引き出し部Ｓ１に信号が印
加された場合、蛍光部Ｐ１１〜Ｐ１４が選択され、これ
らがデータ電極４の引き出し部Ｄ１〜Ｄ４の電位にした
がって発光する。次に、引き出し部Ｓ２に信号が印加さ
れると蛍光部Ｐ２１〜Ｐ２４が選択され、やはりデータ
電極４の引き出し部Ｄ１〜Ｄ４の電位にしたがって発光
する。First, when a signal is applied to the lead portion S1, the fluorescent portions P11 to P14 are selected, and these emit light according to the potentials of the lead portions D1 to D4 of the data electrode 4. Next, when a signal is applied to the extraction portion S2, the fluorescent portions P21 to P24 are selected, and light emission is performed in accordance with the potentials of the extraction portions D1 to D4 of the data electrode 4.
【００１３】このように走査電極３の各引き出し部Ｓ１
〜Ｓ４に図６に示すような逐次走査信号を印加し、デー
タ電極４の各引き出し部Ｄ１〜Ｄ４のいずれかにデータ
信号を印加することによって、任意の表示を得ることが
できる。As described above, each lead-out portion S1 of the scanning electrode 3
By applying a sequential scanning signal as shown in FIG. 6 to S4 and applying a data signal to any of the lead portions D1 to D4 of the data electrode 4, an arbitrary display can be obtained.
【００１４】図９は発光素子Ａを複数個配列したディス
プレイを示し、各発光素子Ａどうしのつなぎめが目立た
ないように、各発光素子Ａ内の画素間（蛍光体間）に
は、発光素子Ａ周辺部のデッドスペース（幅Ｔ１）の２
倍以上のスペースＴ２が必要となる。また、かかる発光
素子Ａの発光輝度のチェックは、各発光素子Ａの組み立
て後に点灯を行なって実施している。FIG. 9 shows a display in which a plurality of light emitting elements A are arranged. In order to make the connection between the light emitting elements A inconspicuous, a light emitting element is provided between pixels (between phosphors) in each light emitting element A. 2 of dead space (width T1) around A
The space T2 is required twice or more. The light emission luminance of the light emitting elements A is checked by lighting the light emitting elements A after assembling them.
【００１５】[0015]
【発明が解決しようとする課題】多数個のかかる発光素
子を並べた大画面ディスプレイ装置においては、各発光
素子間の輝度むら（輝度のアンバランス）が一定限度以
下になるように調整して出荷する必要がある。従来は、
各発光素子の組立て後に各発光素子の輝度を定格状態で
動作させて、輝度むらを目視で判別し、不良発光素子を
選別していた。しかし、定格状態では良品の発光素子と
不良品の発光素子の輝度の差は少なく、目視による選別
作業は作業者に大きな負担になるばかりでなく、不良品
の選別漏れが発生するなどの問題点あった。 SUMMARY OF THE INVENTION A large number of such luminous elements
In a large-screen display device in which
Luminance unevenness between elements (luminance imbalance) is below a certain limit
It is necessary to ship the product adjusted below. conventionally,
After assembling each light emitting element, the brightness of each light emitting element
Operate to visually determine the uneven brightness and identify defective light emitting elements.
Had been sorted out. However, in the rated state,
Small difference in luminance of defective light emitting elements
The work not only puts a heavy burden on workers, but also
There were problems such as omission of sorting.
【００１６】この発明は、上記のような問題点を解消す
るためになされたもので、温度制限領域内のカソード電
圧を発光素子に印加して輝度の目視判別を行うことによ
り、容易に発光素子の良否を選別できる発光素子選別方
法およびその装置を提供することを目的とする。 The present invention solves the above problems.
The cathode voltage in the temperature-limited region.
Pressure is applied to the light emitting element to visually determine the luminance.
Light-emitting element selection method that can easily determine the quality of light-emitting elements
It is an object of the present invention to provide a method and its apparatus.
【００１７】また、この発明は、輝度を目視判別する代
わりに温度制限領域内でのカソードからの放出電流（即
ち、エミッション電流）を測定し、その値を正常な発光
素子の値と比較することにより、更に容易に不良発光素
子の選別を容易に行うことの できる発光素子選別方法お
よびその装置を提供することを目的とする。 Further , the present invention provides an alternative to visually discriminating luminance.
Instead, the emission current from the cathode in the temperature-limited region (immediately
The emission current) and measure the value
By comparing with the value of the element, the defective light emitting element can be more easily
Light-emitting element selection method and method for easily selecting elements
And its equipment.
【００１８】[0018]
【課題を解決するための手段】請求項１の発明に係る発
光素子選別方法は、真空容器内でカソードからの熱電子
を加速して陽極に衝突させることにより陽極面に塗布さ
れた蛍光体を励起発光させる発光素子を複数個並設し、
この並設された発光素子群の各発光素子のカソードに温
度制限領域内のカソード電圧を印加して各発光素子の輝
度を見ることにより、各発光素子の良否の選別を行うも
のである。 また、請求項２の発明に係る発光素子選別方
法は、真空容器内でカソードからの熱電子を加速して陽
極に衝突させることにより陽極面に塗布された蛍光体を
励起発光させる発光素子のカソードに温度制限領域内の
カソード電圧を印加し、発光素子のカソードからのエミ
ッション電流を測定することにより、各発光素子の良否
の選別を行うものである。 According to the first aspect of the present invention, there is provided:
The optical element selection method uses thermoelectrons from the cathode in a vacuum vessel.
Is applied to the anode surface by accelerating and colliding with the anode.
A plurality of light-emitting elements for exciting and emitting the phosphor thus arranged are arranged in parallel,
The cathode of each light emitting element of the light emitting element group arranged side by side is heated.
The brightness of each light emitting element is
The quality of each light emitting element is determined by checking the degree
It is. A method for selecting a light emitting device according to the invention of claim 2
The method is to accelerate thermionic electrons from the cathode in a vacuum vessel and
By colliding with the pole, the phosphor coated on the anode
The temperature of the cathode of the light-emitting device
A cathode voltage is applied to emit light from the cathode of the light emitting device.
By measuring the charging current, the quality of each light emitting element
Is to be sorted out.
【００１９】また、請求項３の発明に係る発光素子選別
装置は、真空容器内でカソードからの熱電子を加速して
陽極に衝突させることにより陽極面に塗布された蛍光体
を励起発光させる発光素子が複数個並設される発光素子
群と、発光素子群の各発光素子のカソードに通常の定格
カソード電圧と温度制限領域内のカソード電圧を切り替
えて印加することのできるカソード電圧切替手段とを備
えたものである。 また、請求項４の発明に係る発光素子
選別装置は、真空容器内でカソードからの熱電子を加速
して陽極に衝突させることにより陽極面に塗布された蛍
光体を励起発光させる発光素子のカソードに通常の定格
カソード電圧と温度制限領域内のカソード電圧を切り替
えて印加することのできるカソード電圧切替手段と、発
光素子のカソードからのエミッション電流を測定する電
流測定手段とを備えたものである。 Further, the light-emitting element selection according to the third aspect of the present invention.
The device accelerates thermoelectrons from the cathode in a vacuum vessel
Phosphor applied to the anode surface by colliding with the anode
Light emitting element in which a plurality of light emitting elements for exciting and emitting light are arranged in parallel
Group and the normal rating of the cathode of each light emitting element in the light emitting element group
Switching between the cathode voltage and the cathode voltage within the temperature limit area
Means for switching the cathode voltage
It is a thing. Further, a light emitting device according to the invention of claim 4
The sorter accelerates thermoelectrons from the cathode in the vacuum vessel
To strike the anode,
Normal rating for the cathode of the light emitting element that excites the light body
Switching between the cathode voltage and the cathode voltage within the temperature limit area
Cathode voltage switching means capable of applying
An electrode to measure the emission current from the cathode of the optical element
And a flow measuring means.
【００２０】[0020]
【作用】請求項１あるいは請求項３の発明においては、
発光素子群の各発光素子のカソードに温度制限領域内の
カソード電圧を印加するので、不良発光素子の場合には
正常な素子と比べてエミッション電流は著しく少なく、
輝度の差が大きくなり、目視による発光素子の良否の選
別が容易に行える。 また、目視で行うので、たとえエミ
ッション電流の値が正常であっても発光素子内の１画素
のみの輝度が低く暗いというような特殊な不良素子が混
じっていても、これを判別することができるので、発光
素子内の不良素子のみを正常な素子と交換することも可
能となる。 According to the invention of claim 1 or claim 3,
The temperature of the cathode of each light emitting element in the light emitting element group
Since a cathode voltage is applied, in the case of a defective light emitting element,
The emission current is significantly lower than the normal element,
The difference in luminance increases, and the quality of the light-emitting element can be visually checked.
Another can be done easily. Also, since it is done visually,
One pixel in the light emitting element even if the value of the charging current is normal
Special defective elements such as low brightness and dark
Even if you do, you can determine this,
It is also possible to replace only the defective element in the element with a normal element
It works.
【００２１】また、請求項２あるいは請求項４の発明に
おいては、発光素子のカソードに温度制限領域内のカソ
ード電圧を印加して発光素子のカソードからのエミッシ
ョン電流を測定するので、不良発光素子の場合は正常な
素子と比べてエミッション電流は著しく少なくなり、従
ってエミッション電流の測定結果に基づいて発光素子の
良否の選別を目視によらず機械的に容易かつ確実に行う
ことができる。 According to the second or fourth aspect of the present invention,
In this case, the cathode of the light-emitting element is
Emission from the cathode of the light-emitting element
Measurement of the application current.
The emission current is significantly lower than the element,
Of the light emitting element based on the measurement result of the emission current.
Pass / fail judgment is performed mechanically easily and reliably without visual inspection
be able to.
【００２２】[0022]
【実施例】実施例１． 以下、本発明の一実施例を図について説明する。図２に
おいて、２１Ａ，２１Ｂは発光素子Ａの１個毎のカソー
ド特性曲線で、２１Ａは正常な発光素子のカソード特
性、２１Ｂは異常な発光素子のカソード特性をそれぞれ
示す。縦軸はカソード２から放出された熱電子により陽
極へ流れる電流Ｉｐ（＝エミッション電流）を示し、横
軸はカソードの電圧Ｖｆを示す。[Embodiment 1] Hereinafter, an embodiment of the present invention will be described with reference to the drawings. In FIG. 2, 21A and 21B are cathode characteristic curves for each light emitting element A, 21A is a cathode characteristic of a normal light emitting element, and 21B is a cathode characteristic of an abnormal light emitting element. The vertical axis represents the current Ip (= emission current) flowing to the anode due to thermions emitted from the cathode 2, and the horizontal axis represents the voltage Vf of the cathode.
【００２３】また、Ｖは定格動作時の定格カソード電圧
であり、この時の正常な発光素子の陽極電流はＩＡ、異
常な発光素子の陽極電流はＩＢである。同様に、定格動
作の１／２のカソード電圧である１／２Ｖのときの正常
な発光素子の陽極電流はＩＡ（１／２）、異常な発光素
子の陽極電流をＩＢ（１／２）とする。定格電圧の２／
３の時も、同様な表記とする。V is the rated cathode voltage during the rated operation. At this time, the anode current of the normal light emitting element is IA, and the anode current of the abnormal light emitting element is IB. Similarly, when the cathode voltage is 1/2 V, which is half the rated operation, the anode current of the normal light emitting element is IA (1/2), and the anode current of the abnormal light emitting element is IB (1/2). I do. 2 of rated voltage
In the case of 3, the same notation is used.
【００２４】一般に正常な発光素子の場合、定格カソー
ド電圧をＶとすると、１／２Ｖ近傍で陽極電流Ｉｐが流
れ始めるしきい値があり、カソード電圧を増やすにつれ
て急峻に陽極電流Ｉｐが増える。図２はこの様子を示し
ている。この急峻に立ち上がる領域を温度制限領域αと
呼んでいて、これが定格電圧Ｖの大略１／２〜２／３の
範囲にある。一方、温度制限領域α以上にカソード電圧
を増やしていくと、陽極電流Ｉｐの増加がゆるやかにな
ってくる。この領域を空間電荷制限領域βと呼んでい
て、定格カソード電圧Ｖはこの領域βにある。Generally, in the case of a normal light emitting element, assuming that the rated cathode voltage is V, there is a threshold value at which the anode current Ip starts to flow near 1/2 V, and the anode current Ip sharply increases as the cathode voltage increases. FIG. 2 shows this state. This steeply rising region is called a temperature limiting region α, which is approximately in the range of １ ／ to ／ of the rated voltage V. On the other hand, when the cathode voltage is increased beyond the temperature limit region α, the anode current Ip gradually increases. This region is called a space charge limiting region β, and the rated cathode voltage V is in this region β.
【００２５】図２からわかるように、空間電荷制限領域
βに定格カソード電圧Ｖがあるので、この定格カソード
電圧Ｖの時の陽極電流Ｉｐは正常な発光素子の場合と異
常な発光素子の場合とで、それほど大きな差はない。つ
まり、正常な発光素子と異常な発光素子の定格電圧の時
の陽極電流の比ＩＡ／ＩＢは大略１に近く、２倍以上に
なることはない。As can be understood from FIG. 2, since the rated cathode voltage V exists in the space charge limiting region β, the anode current Ip at the rated cathode voltage V is different between the case of the normal light emitting element and the case of the abnormal light emitting element. So there is no big difference. That is, the ratio IA / IB of the anode current between the normal light emitting element and the abnormal light emitting element at the rated voltage is almost equal to 1, and does not become twice or more.
【００２６】それゆえ、定格カソード電圧Ｖで輝度調整
をする限り、正常な発光素子と異常な発光素子とを見極
めるのは困難である。ところが、カソード電圧を定格の
１／２〜２／３に落として、同様に陽極電流の比を見れ
ば（即ち、正常な発光素子と異常な発光素子の陽極電流
を測定すれば）、ＩＡ（１／２）／ＩＢ（１／２）また
はＩＡ（２／３）／ＩＢ（２／３）は１より格段に大き
くなり、正常な発光素子と異常な発光素子との見極めが
容易になる。Therefore, as long as the luminance is adjusted at the rated cathode voltage V, it is difficult to distinguish between a normal light emitting element and an abnormal light emitting element. However, if the cathode voltage is reduced to 1/2 to 2/3 of the rated value and the anode current ratio is similarly observed (that is, the anode current of the normal light emitting element and the abnormal
By measuring the), IA (1/2) / IB (1/2) or IA (2/3) / IB (2/3 ) in the far than 1 become large, normal light emitting element and abnormal light emitting element Is easy to determine.
【００２７】次に、上記のような考えに基づいて構成し
た発光素子選別装置について説明する。図１において、
２２は１６個の発光素子Ａを並べて配置した発光素子
群、２３は定格カソード電圧のカソード電源、２４は定
格カソード電圧Ｖの１／２〜２／３に調整されたカソー
ド電源を示し、これらの各カソード電源２３，２４は切
替スイッチ２５で容易に通常の定格点灯状態とするため
の定格カソード電圧Ｖと温度制限領域での点灯状態とす
るためのこの定格カソード電圧Ｖの約１／２〜２／３の
状態に切替られるようになっている。即ち、発光素子群
２２の各発光素子のカソードに通常の定格カソード電圧
と温度制限領域内のカソード電圧を切り替えて印加する
ことのできるカソード電圧切替手段を備えている。 Next, a description will be given of a light-emitting element sorting apparatus configured based on the above-described concept . In FIG.
Reference numeral 22 denotes a light-emitting element group in which 16 light-emitting elements A are arranged, 23 denotes a cathode power supply having a rated cathode voltage, and 24 denotes a cathode power supply adjusted to 1/2 to 2/3 of the rated cathode voltage V. Each of the cathode power supplies 23 and 24 has a rated cathode voltage V for easily setting a normal rated lighting state by a changeover switch 25 and about 1/2 to 2 of the rated cathode voltage V for setting a lighting state in a temperature limited region. / 3. That is, the light emitting element group
Normal rated cathode voltage at the cathode of each of the 22 light-emitting elements
And apply the cathode voltage in the temperature limited area
And a cathode voltage switching means.
【００２８】次に動作について説明する。まず、切替ス
イッチ２５をカソード電源２３に切替ると、上記のよう
に、一度に１６個の発光素子Ａを定格カソード電圧Ｖに
て光らせることができる。一方、カソード電源２４に切
替ると、定格カソード電圧Ｖの約１／２〜２／３の状態
で光らせることが可能になり、このとき、各発光素子１
の明るさの違いが明確となり、正常な発光素子Ａと異常
な発光素子Ａの区分け（即ち、選別）が、高価な輝度測
定装置を使うことなく、瞬時に目視により行なうことが
できる。Next, the operation will be described. First, when the changeover switch 25 is switched to the cathode power supply 23, 16 light-emitting elements A can be made to emit light at the rated cathode voltage V at a time as described above. On the other hand, switching to the cathode power supply 24 makes it possible to emit light in a state of about 1/2 to 2/3 of the rated cathode voltage V. At this time, each light emitting element 1
This makes the difference in brightness clear, and the normal light emitting element A and abnormal light emitting element A can be separated (that is, sorted) instantly and visually without using an expensive luminance measuring device.
【００２９】次に、このようにして輝度が異常と判定さ
れた発光素子Ａは、正常な他の発光素子と交換して、発
光素子群全体としての輝度を揃えたり、また、必要に応
じ各発光素子Ａごとに設けられた輝度調整部の調整操作
によって輝度調整を行うことで、輝度むらが解消され、
発光素子群全体としての輝度バランスを良好に維持させ
ることができる。Next, the light-emitting element A whose luminance is determined to be abnormal in this way is replaced with another normal light-emitting element, and the luminance of the entire light-emitting element group is made uniform. By performing the brightness adjustment by the adjustment operation of the brightness adjustment unit provided for each light emitting element A, the brightness unevenness is eliminated,
The luminance balance of the entire light emitting element group can be favorably maintained.
【００３０】なお、上記実施例では１６個の発光素子Ａ
を並べた発光素子群２２の場合を示したが、発光素子１
は１６個に限ることはなく、適当な複数個とすることが
でき、上記実施例と同様の効果を奏する。また、上記各
実施例ではカソード電圧を定格カソード電圧の１／２〜
１／３に選定した場合を示したが、陽極電流が急峻に立
ち上がるその付近のカソード電圧（温度制限領域内の）
を任意に選ぶことができる。In the above embodiment, 16 light emitting elements A
Are shown in the case of the light emitting element group 22 in which
The number is not limited to 16, but can be an appropriate number, and the same effects as in the above embodiment can be obtained. Further, in each of the above embodiments, the cathode voltage is set to 1/2 to the rated cathode voltage.
The case where 1/3 is selected is shown, but the cathode voltage in the vicinity where the anode current rises sharply (within the temperature limit area)
Can be arbitrarily selected.
【００３１】[0031]
【発明の効果】以上のように、請求項１および請求項３
の発明によれば、発光素子群の各発光素子のカソードに
温度制限領域内のカソード電圧を印加するので、不良発
光素子は正常な素子と比べてエミッション電流は著しく
少なく、輝度の差が大きくなり、従って目視による発光
素子の良否の選別が容易に行えるという効果がある。 ま
た、目視で行うので、たとえエミッション電流の値が正
常であっても発光素子内の１画素のみの輝度が低く暗い
というような特殊な不良素子が混じっていて も、これを
判別することができるので、発光素子内の不良素子のみ
を正常な素子と交換することが可能になるという効果も
ある。 また、請求項２および請求項４の発明によれば、
発光素子のカソードに温度制限領域内のカソード電圧を
印加して発光素子のカソードからのエミッション電流を
測定するので、不良発光素子の場合は正常な素子と比べ
てエミッション電流は著しく少なくなり、従って発光素
子の良否の選別を目視によらず機械的に容易かつ確実に
行うことができるという効果がある。 As described above, claims 1 and 3 are as described above.
According to the invention, the cathode of each light emitting element of the light emitting element group
Since the cathode voltage within the temperature limit area is applied, defective
Optical devices have significantly higher emission currents than normal devices.
Less, the difference in brightness is larger, and therefore the light emission by visual observation
There is an effect that the quality of the element can be easily determined. Ma
Also, since the measurement is performed visually, even if the emission current value is
Even if it is normal, the brightness of only one pixel in the light emitting element is low and dark
Even if mixed special bad elements, such as that, it
Since it can be determined, only defective elements in the light emitting element
Can be replaced with a normal element.
is there. According to the second and fourth aspects of the present invention,
Apply the cathode voltage in the temperature-limited region to the cathode of the light-emitting element.
The emission current from the cathode of the light-emitting element.
Since the measurement is performed, the defective light emitting element is compared with the normal element.
Emission current is significantly reduced
Easy and reliable mechanical judgment of child quality without visual inspection
There is an effect that can be performed.
【図１】この発明の一実施例による発光素子選別装置を
示すブロック図である。FIG. 1 is a block diagram showing a light emitting element sorting device according to one embodiment of the present invention .
【図２】正常な発光素子および異常な発光素子のカソー
ド特性曲線を示す図である。 FIG. 2 shows a normal light emitting device and an abnormal light emitting device.
FIG. 4 is a diagram illustrating a load characteristic curve.
【図３】従来の発光素子を示す分解斜視図である。FIG. 3 is an exploded perspective view showing a conventional light emitting device.
【図４】従来の発光素子を示す斜視図である。FIG. 4 is a perspective view showing a conventional light emitting device.
【図５】図３における発光素子の電極配置を示す配線図
である。FIG. 5 is a wiring diagram showing an electrode arrangement of the light emitting element in FIG. 3;
【図６】図５における各走査電極およびデータ電極に印
加する信号を示すタイミングチャート図である。FIG. 6 is a timing chart showing signals applied to each scanning electrode and data electrode in FIG. 5;
【図７】図３における発光素子の画素の配列と電極との
対応関係を示す説明図である。FIG. 7 is an explanatory diagram showing the correspondence between the arrangement of the pixels of the light emitting element and the electrodes in FIG. 3;
【図８】図５における各電極の電位と電子の流れを示す
動作説明図である。8 is an operation explanatory diagram showing a potential of each electrode and a flow of electrons in FIG. 5;
【図９】図４の発光素子を並列配置したディスプレイを
示す正面図である。FIG. 9 is a front view showing a display in which the light emitting elements of FIG. 4 are arranged in parallel.
１ 真空容器 ２ カソード ９ 蛍光体 ２２ 発光素子群 ２３，２４ カソード電源 ２５ 切替スイッチ Ａ 発光素子1 vacuum vessel 2 cathodic de 9 phosphors 22 emitting element groups 23, 24 cathode power supply 25 switching switch A light emitting element
───────────────────────────────────────────────────── フロントページの続き (72)発明者 菊田 繁樹 三重県伊勢市上野町字和田700番地 伊 勢電子工業株式会社内 (72)発明者 長谷川 典久 三重県伊勢市上野町字和田700番地 伊 勢電子工業株式会社内 (58)調査した分野(Int.Cl.7，ＤＢ名) H01J 9/44 H01J 31/12 ──────────────────────────────────────────────────続 き Continued on the front page (72) Inventor Shigeki Kikuta 700, Wada, Ueno-cho, Ise City, Mie Prefecture Inside Ise Electronics Industry Co., Ltd. (72) Norihisa Hasegawa 700, Wada, Ueno-cho, Ise City, Mie Prefecture Ise (58) Field surveyed (Int.Cl. 7 , DB name) H01J 9/44 H01J 31/12
Claims (4)
速して陽極に衝突させることにより陽極面に塗布された
蛍光体を励起発光させる発光素子を複数個並設し、この
並設された発光素子群の各発光素子のカソードに温度制
限領域内のカソード電圧を印加して上記各発光素子の輝
度を見ることにより、上記各発光素子の良否の選別を行
うことを特徴とする発光素子選別方法。1. A thermal electrons accelerated to an anode applied to by Rihi pole face to collide phosphor from the cathode in the vacuum vessel plurality juxtaposed light emitting element for excitation emitted, the parallel by applying a cathode voltage of temperature limited region to the cathode of the light emitting elements of set luminescent element group bright of each light emitting element
The quality of each light-emitting element is determined by checking the degree
A method for selecting a light emitting element .
速して陽極に衝突させることにより陽極面に塗布された
蛍光体を励起発光させる発光素子のカソードに温度制限
領域内のカソード電圧を印加し、上記発光素子のカソー
ドからのエミッション電流を測定することにより、上記
各発光素子の良否の選別を行うことを特徴とする発光素
子選別方法。2. A temperature limit thermal electrons accelerated to fluorescence has been applied to by Rihi pole face to collide with the anode body from the cathode in the vacuum vessel to the cathode of the light-emitting element for excitation emitted
Apply the cathode voltage in the region, and
By measuring the emission current from the
A light-emitting element, wherein the quality of each light-emitting element is determined.
Child sorting method .
速して陽極に衝突させることにより陽極面に塗布された
蛍光体を励起発光させる発光素子が複数個並設される発
光素子群と、 上記発光素子群の各発光素子のカソードに通常の定格カ
ソード電圧と温度制限領域内のカソード電圧を切り替え
て印加することのできるカソード電圧切替手段とを備え
たことを特徴とする発光素子選別装置。 3. A thermoelectron from a cathode is applied in a vacuum vessel.
Coated on the anode surface by rapidly colliding with the anode
A plurality of light emitting elements for exciting and emitting phosphors are arranged side by side.
Normal rated power is applied to the optical element group and the cathode of each light emitting element in the above light emitting element group.
Switch between sword voltage and cathode voltage in temperature limited area
And a cathode voltage switching means capable of applying
A light emitting element selection device characterized by the above-mentioned.
速して陽極に衝突させることにより陽極面に塗布された
蛍光体を励起発光させる発光素子のカソードに通常の定
格カソード電圧と温度制限領域内のカソード電圧を切り
替えて印加することのできるカソード電圧切替手段と、 上記発光素子のカソードからのエミッション電流を測定
する電流測定手段とを備えたことを特徴とする発光素子
選別装置。 4. A thermoelectron is applied from a cathode in a vacuum vessel.
Coated on the anode surface by rapidly colliding with the anode
Normal setting is applied to the cathode of the light emitting device that excites the phosphor.
Cut off the rated cathode voltage and the cathode voltage in the temperature limit area.
Cathode voltage switching means that can be applied alternatively, and measures the emission current from the cathode of the light emitting element
Light emitting device, comprising:
Sorting device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP04073711A JP3091787B2 (en) | 1992-03-30 | 1992-03-30 | Light emitting element sorting method and light emitting element sorting apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP04073711A JP3091787B2 (en) | 1992-03-30 | 1992-03-30 | Light emitting element sorting method and light emitting element sorting apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH05283006A JPH05283006A (en) | 1993-10-29 |
| JP3091787B2 true JP3091787B2 (en) | 2000-09-25 |
Family
ID=13526079
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP04073711A Expired - Lifetime JP3091787B2 (en) | 1992-03-30 | 1992-03-30 | Light emitting element sorting method and light emitting element sorting apparatus |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3091787B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104641321A (en) * | 2012-09-19 | 2015-05-20 | Nec卡西欧移动通信株式会社 | Portable terminal, method for controlling same, and program |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3141743B2 (en) * | 1995-07-28 | 2001-03-05 | 双葉電子工業株式会社 | Manufacturing method of vacuum hermetic container |
| JP5066390B2 (en) * | 2007-05-15 | 2012-11-07 | シチズン電子株式会社 | Light emitting device |
-
1992
- 1992-03-30 JP JP04073711A patent/JP3091787B2/en not_active Expired - Lifetime
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104641321A (en) * | 2012-09-19 | 2015-05-20 | Nec卡西欧移动通信株式会社 | Portable terminal, method for controlling same, and program |
| CN104641321B (en) * | 2012-09-19 | 2017-09-29 | 日本电气株式会社 | Mobile terminal, its control method and program |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH05283006A (en) | 1993-10-29 |
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