JP2749913B2 - Resistance measuring device - Google Patents
Resistance measuring deviceInfo
- Publication number
- JP2749913B2 JP2749913B2 JP1326401A JP32640189A JP2749913B2 JP 2749913 B2 JP2749913 B2 JP 2749913B2 JP 1326401 A JP1326401 A JP 1326401A JP 32640189 A JP32640189 A JP 32640189A JP 2749913 B2 JP2749913 B2 JP 2749913B2
- Authority
- JP
- Japan
- Prior art keywords
- measuring
- measurement
- prog
- base
- pin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Description
【発明の詳細な説明】 ［産業上の利用分野］ 本発明は、プリント配線板などの導通試験をする際に
用いる抵抗測定装置に関する。Description: BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a resistance measuring device used for conducting a continuity test on a printed wiring board or the like.
［従来の技術］ プリント配線板の断線を検査するに当たっては、プリ
ント配線板の所定のパターンの端部間の抵抗値を検査し
て断線しているかどうか等の検査をしている。そして、
従来にあっては、ピンプローブから垂下した測定ピンを
プリント配線板の所定のパターンの端部に押し当てて抵
抗値の測定をおこなっていた。[Prior Art] When inspecting a printed wiring board for disconnection, a resistance value between ends of a predetermined pattern of the printed wiring board is inspected to check whether or not the printed wiring board is disconnected. And
In the related art, a measurement pin hanging from a pin probe is pressed against an end of a predetermined pattern of a printed wiring board to measure a resistance value.
［発明が解決しようとする課題］ ところが、従来のようにピンプローブから垂下した針
状の測定ピンをプリント配線板の所定のパターンの端部
に押し当てるものにあっては、単一の測定ピンを用いて
おり、この結果、測定ピンの接触面積を広く取った方が
良い場合や、鋭く一点で取った方が良い場合、あるは弾
性電気良導体で接触させた方が良い場合等プリント配線
板の種類等により測定ピンを選択したい時があるが、こ
のような時に単一の測定ピンでは無理があり、また、交
換する事自体にも信頼性からいっても無理があった。更
に、検査しようとする配線パターンの２点の位置及び２
点間の距離が異なる場合には測定ピンの位置変更及び測
定ピン間の距離を変更しなければならず、手間がかかる
という問題があった。[Problems to be Solved by the Invention] However, in a conventional device in which a needle-like measurement pin hanging from a pin probe is pressed against an end of a predetermined pattern of a printed wiring board, a single measurement pin is used. As a result, when it is better to increase the contact area of the measuring pin, when it is better to take a sharp point, or when it is better to make contact with an elastic electric good conductor, the printed wiring board is used. There is a case where it is desired to select a measuring pin depending on the type of the measuring pin. However, in such a case, it is impossible to use a single measuring pin, and it is also impossible to replace the measuring pin in terms of reliability. Further, the positions of two points of the wiring pattern to be inspected and
If the distance between the points is different, it is necessary to change the position of the measuring pin and the distance between the measuring pins, and there is a problem that it takes time and effort.
本発明は上記の従来例の問題点に鑑みて発明したもの
であって、その目的とするところは異なる種類の測定ピ
ンの中から最適の測定ピンを選択して使用でき、また、
検査しようとする配線パターンの距離が変わっても簡単
に対応することができる抵抗測定装置を提供するにあ
る。The present invention has been made in view of the above-described problems of the conventional example, and the purpose thereof is to select and use an optimum measurement pin from different types of measurement pins,
An object of the present invention is to provide a resistance measuring device that can easily cope with a change in the distance of a wiring pattern to be inspected.
［課題を解決するための手段］ 本発明の抵抗測定装置は、プローグ基体１に平面視で
重複しない位置に測定接触部２の太さや硬度等の異なる
複数の測定ピン３とバフ部材3aとをプローグ基体１に対
して上下移動自在に設け、上記プローグ基体１を前後方
向移動手段４により前後方向に移動自在とし且つ左右方
向移動手段５により左右方向に移動自在とし、上記プロ
ーグ基体１を一対設けて成ることを特徴とするものであ
って、このような構成を採用することで、上記した従来
例の問題点を解決したものである。また、プローブ基体
１が回転装置13により回転自在となっていることが好ま
しい。[Means for Solving the Problems] The resistance measuring device of the present invention includes a plurality of measuring pins 3 and buff members 3a having different thicknesses and hardnesses of the measuring contact portions 2 at positions not overlapping with the prog base 1 in plan view. The prog base 1 is provided so as to be movable up and down, and the prog base 1 is movable in the front-rear direction by the front-rear moving means 4 and is movable in the left-right direction by the left-right moving means 5. By adopting such a configuration, the above-described problem of the conventional example is solved. Preferably, the probe base 1 is rotatable by the rotating device 13.
［作用］ しかして、複数の測定ピン３の中から最適の測定ピン
３を選んで下降させて目的とするプリント配線板６の配
線パターン７の両端部にそれぞれ測定ピン３の測定用接
触部２を接触させて抵抗値をチェックして導通試験をす
るものであり、この場合、前後方向移動手段４、左右方
向移動手段５によりプローグ基体１の前後方向、左右方
向の位置調整をし、複数の測定ピン３のなかから選ぶ最
適の測定ピン３の位置及び当該測定ピン３間の距離を調
整するものであり、また、測定に先立ってバフ部材3aを
下降させて、プリント配線板６の測定すべき表面をバフ
処理し、バフ処理が終わった後にバフ部材3aを上昇さ
せ、次に最適の測定ピン３を下降させて測定することも
できる。[Operation] Then, the most suitable measuring pin 3 is selected from the plurality of measuring pins 3 and lowered, and the measuring contact portions 2 of the measuring pins 3 are respectively provided at both ends of the wiring pattern 7 of the target printed wiring board 6. Are contacted to check the resistance value and conduct a continuity test. In this case, the front-rear direction moving means 4 and the left-right direction moving means 5 adjust the position of the prog base 1 in the front-rear direction and the left-right direction. The position of the optimum measuring pin 3 selected from the measuring pins 3 and the distance between the measuring pins 3 are adjusted. Before the measurement, the buff member 3a is lowered to measure the printed wiring board 6. The surface to be buffed may be buffed, and after the buffing is completed, the buff member 3a may be raised, and then the optimum measuring pin 3 may be lowered for measurement.
［実施例］ 以下本発明を添付図面に示す実施例に基づいて詳述す
る。EXAMPLES The present invention will be described below in detail based on examples shown in the accompanying drawings.
第１図には本発明の抵抗測定装置の一実施例の概略を
示す斜視図が示してあり、第３図には本発明の抵抗測定
装置の他の実施例の概略斜視図が示してあり、第２図に
は抵抗測定装置による測定状態の概略断面図が示してあ
る。FIG. 1 is a perspective view schematically showing an embodiment of the resistance measuring apparatus of the present invention, and FIG. 3 is a schematic perspective view of another embodiment of the resistance measuring apparatus of the present invention. FIG. 2 is a schematic sectional view showing a state of measurement by the resistance measuring device.
第１図、第３図に示すようにプローグ基体１には平面
視で重複しない位置に複数の測定ピン３が設けてあり、
この測定ピン３は上下移動装置９によりそれぞれ独立し
て上下移動するようになっている。プローグ基体１に設
けた複数の測定ピン３は先端の測定接触部２の太ささ硬
度等が異なるものである。例えば、測定ピン３の先端の
測定接触部２が太くて接触面積が広いもの、測定接触部
２の先端が鋭くなったもの、測定接触部２がインダクタ
ンスを最小にするため針よりも毛に近いもの、あるいは
接触圧を強くするため測定接触部２が弾性電気良導体と
なったもの等の複数種のものが用いられる。また、本発
明においてはプローグ基体１には更に上下移動装置9aに
より上下移動自在になったバフ部材3aを設けてある。な
お、第１図に示す実施例では、同一円周上に複数の測定
ピン３及びバフ部材3aを配置したプローグ基体１が回転
装置13により回転自在となっている。As shown in FIGS. 1 and 3, a plurality of measuring pins 3 are provided on the prog base 1 at positions that do not overlap in plan view.
The measuring pins 3 are vertically moved independently by a vertical moving device 9. The plurality of measuring pins 3 provided on the prog base 1 are different in thickness, hardness, etc. of the measuring contact portion 2 at the tip. For example, the measurement contact portion 2 at the tip of the measurement pin 3 is thick and has a large contact area, the measurement contact portion 2 has a sharp tip, and the measurement contact portion 2 is closer to hair than a needle to minimize inductance. Or a plurality of types such as those in which the measuring contact portion 2 is made of an elastic electric good conductor in order to increase the contact pressure. In the present invention, the prog base 1 is further provided with a buff member 3a which can be moved up and down by an up and down moving device 9a. In the embodiment shown in FIG. 1, the prog base 1 in which a plurality of measuring pins 3 and buff members 3a are arranged on the same circumference is rotatable by a rotating device 13.
上記プローグ基体１は一対設けてあり、この一対のプ
ローグ基体１はそれぞれ、前後方向移動手段４により前
後方向に移動自在となっている共に左右方向移動手段５
により左右方向に移動自在となっている。すなわち、前
後方向のレール10に対して左右方向のレール11が前後方
向に移動自在に取り付けてあり、左右方向のレール11に
プローグ基体１が左右方向に移動自在に取り付けてあ
る。そして、上記前後方向のレール10とこれに前後に移
動自在に取り付けた左右方向のレール11とこの移動機構
とで前後方向移動手段４が構成してあり、左右方向のレ
ール11とこれに移動自在に取り付けたプローグ基体３と
この移動機構により左右方向移動手段５が構成してあ
る。A pair of the prog bases 1 is provided, and each of the pair of prog bases 1 is movable in the front-rear direction by the front-rear direction moving unit 4 and the left-right moving unit 5 is provided.
This makes it possible to move in the left-right direction. That is, the left-right rail 11 is attached to the front-rear rail 10 so as to be movable in the front-rear direction, and the prog base 1 is attached to the left-right rail 11 so as to be movable in the left-right direction. The front-rear rail 10 and the left-right rail 11 movably attached to the front-rear rail 10 and the moving mechanism constitute a front-rear direction moving means 4. The left and right direction moving means 5 is constituted by the prog base 3 attached to the first member and the moving mechanism.
しかして、プリント配線板６の導通試験をするに当た
っては、導通試験をしようとするプリント配線板を試験
台の上に載せ、複数の測定ピン３の中から試験をしよう
とするプリント配線板６の配線パターン７に対応する最
適の測定ピン３を選んで上下移動装置９により下降させ
て目的とするプリント配線板６のパターン７の両端部に
それぞれ測定ピン３の測定用接触部２を接触させて抵抗
値をチェックして導通試験をするものである。この場
合、前後方向移動手段４、左右方向移動手段５によりプ
ローグ基体１の前後方向、左右方向の位置調整をし、複
数の測定ピン３のなかから選ぶ最適の測定ピン３の位置
及び当該測定ピン３間の距離を調整するものである。こ
のようにして最適の測定ピン３の先端の測定用接触部２
をプリント配線板６の所定配線パターン７の端部に接触
させ、一対の測定ピン３間の抵抗値を測定回路本体12に
よりチェックし、所定の抵抗値のものは良品とし、所定
の抵抗値でないものは不良品と判別するものである。こ
こで、プリント配線板６を載置する試験台を保温ブース
等の中に入れて、加熱雰囲気中で上記測定を行うように
すると、プリント配線板６に断線がある場合、常温で断
線部分が接触していても断線により自由端となった部分
が加熱により膨張して浮き上がったりして非接触状態と
なり、この非接触状態で検査するので断線が確実に判断
できるようになるのである。勿論、常温で測定をしても
よいものである。Thus, in conducting the continuity test of the printed wiring board 6, the printed wiring board to be subjected to the continuity test is placed on a test stand, and the printed wiring board 6 to be tested from among the plurality of measurement pins 3 is tested. The optimum measuring pin 3 corresponding to the wiring pattern 7 is selected and lowered by the vertical moving device 9 to bring the measuring contact portions 2 of the measuring pin 3 into contact with both ends of the target pattern 7 of the printed wiring board 6 respectively. The continuity test is performed by checking the resistance value. In this case, the position of the prog base 1 in the front-rear direction and the left-right direction is adjusted by the front-rear direction moving means 4 and the left-right direction moving means 5, and the optimum position of the measuring pin 3 selected from the plurality of measuring pins 3 and the measuring pin 3 is adjusted. In this manner, the optimal measuring contact portion 2 at the tip of the measuring pin 3
Is brought into contact with the end of the predetermined wiring pattern 7 of the printed wiring board 6, and the resistance between the pair of measurement pins 3 is checked by the measurement circuit main body 12. The product is determined to be defective. Here, when the test table on which the printed wiring board 6 is mounted is placed in a heat insulation booth or the like and the above measurement is performed in a heated atmosphere, if the printed wiring board 6 has a disconnection, the disconnected portion is at room temperature. Even if it is in contact, the portion that has become a free end due to the disconnection expands and rises due to heating and becomes a non-contact state. Since the inspection is performed in this non-contact state, the disconnection can be reliably determined. Of course, the measurement may be performed at room temperature.
ところで、プローグ基体１にバフ部材3aを設けてある
ので、測定に先立ってバフ部材3aを下降させてプリント
配線板６の配線パターン７の測定すべき部分の表面をバ
フ処理し、バフ処理が終わった後でバフ部材3aを上昇さ
せ、次に最適の測定ピン３を下降させて測定するように
してもよい。この場合、バフ部材3aでバフ処理した後で
バフ部材3aに付設するエアー噴き出し装置（図示せず）
によりエアーを噴き出してバフ処理した表面を清浄にす
るようにしてもよい。By the way, since the buff member 3a is provided on the prog base 1, the buff member 3a is lowered before the measurement to buff the surface of the portion of the printed wiring board 6 to be measured of the wiring pattern 7, and the buffing is completed. After that, the buff member 3a may be raised, and then the optimum measurement pin 3 may be lowered to perform measurement. In this case, an air blowing device (not shown) attached to the buff member 3a after buffing with the buff member 3a
Air may be blown out to clean the buffed surface.
また、第１図に示す実施例では同一円周上に複数の測
定ピン３及びバフ部材3aを配置したプローグ基体１が回
転装置13により回転自在となっており、このようにした
場合、前後移動手段４、左右移動手段５により位置調整
をした後、回転装置13を回転してバフ部材3aを所定の位
置に位置させてバフ部材3aを下降させてバフ処理し、そ
の後バフ部材3aを上昇させた後で回転装置13を回転して
最適の測定ピン３を所定の位置に位置させ、次にこれを
下降させて配線パターン７の所定の位置に接触させて測
定するようにすることができるようになっている。In the embodiment shown in FIG. 1, the prog base 1 on which a plurality of measuring pins 3 and buff members 3a are arranged on the same circumference is rotatable by a rotating device 13. After the position is adjusted by the means 4 and the left and right moving means 5, the rotating device 13 is rotated to position the buff member 3a at a predetermined position, the buff member 3a is lowered and buffed, and then the buff member 3a is raised. After that, the rotating device 13 is rotated so that the optimum measuring pin 3 is located at a predetermined position, and then the measuring pin 3 is lowered to be brought into contact with the predetermined position of the wiring pattern 7 for measurement. It has become.
［発明の効果］ 本発明にあっては、叙述のようにプローグ基体に平面
視で重複しない位置に測定接触部の太さや硬度等の異な
る複数の測定ピンとバフ部材とをプローグ基体に対して
上下移動自在に設け、上記プローグ基体を前後方向移動
手段により前後方向に移動自在とし且つ左右方向移動手
段により左右方向に移動自在とし、上記プローグ基体を
一対設けてあるので、複数の測定ピンの中から最適の測
定ピンを選んで下降させて目的とするプリント配線板の
配線パターンの両端部にそれぞれ測定ピンの測定用接触
部を接触させて抵抗値をチェックして導通試験ができる
ものであり、この結果、異なる種類の測定ピンの中から
最適の測定ピンを選択して使用できるという利点があ
る。また、前後方向移動手段、左右方向移動手段により
プローグ基体の前後方向、左右方向の位置調整をし、複
数の測定ピンのなかから選ぶ最適の測定ピンの位置及び
当該測定ピン間の距離を調整することができるので、プ
リント配線板の種類の違いによる測定位置や測定距離の
違いを簡単に調整できるものである。[Effects of the Invention] In the present invention, as described above, a plurality of measurement pins and buff members having different thicknesses and hardnesses of the measurement contact portions and the buff member are vertically arranged on the prog base with respect to the prog base. It is movably provided, the prog base is movable in the front-rear direction by the front-rear direction moving means, and is movable in the left-right direction by the left-right moving means, and a pair of the prog bases is provided. The optimal measurement pin is selected and lowered, and the measurement contact portions of the measurement pin are brought into contact with both ends of the wiring pattern of the target printed wiring board to check the resistance and conduct a continuity test. As a result, there is an advantage that an optimum measuring pin can be selected and used from different types of measuring pins. In addition, the position of the prog base in the front-rear direction and the left-right direction is adjusted by the front-rear direction moving unit and the left-right direction moving unit, and the optimal measuring pin position selected from among a plurality of measuring pins and the distance between the measuring pins are adjusted. Therefore, it is possible to easily adjust the difference in the measurement position and the measurement distance due to the difference in the type of the printed wiring board.
また、前後方向及び左右方向に移動自在なプローグ基
体に測定ピンと共にバフ部材が上下移動自在に設けてあ
るので、測定ピンによる測定に先立ってバフ部材を下降
させて、プリント配線板の測定すべき表面をバフ処理
し、バフ処理が終わった後にバフ部材を上昇させ、次に
最適の測定ピンを下降させて測定することもできるもの
であり、測定接触部にごみや汚染膜が付着していて測定
不能となったような場合でも、前後方向及び左右方向に
移動自在なプローグ基体に設けたバフ部材でバフ処理す
ることで簡単にごみや汚染膜を除去して測定ピンにより
確実に測定することができるものである。In addition, since the buff member is provided so as to be movable up and down together with the measurement pin on the prog base movable in the front-rear direction and the left-right direction, the buff member must be lowered before the measurement by the measurement pin, and the printed wiring board should be measured. The surface can be buffed, and after the buffing is finished, the buff member can be raised, and then the optimum measuring pin can be lowered for measurement. Even if measurement becomes impossible, buffing can be performed with a buff member provided on the prog base that is movable in the front-rear direction and the left-right direction, so that dirt and contamination films can be easily removed and measurement can be reliably performed using a measurement pin. Can be done.
また、プローブ基体を回転装置により回転自在とする
ことで、前後移動手段、左右移動手段により位置調整を
した後、回転装置を回転してバフ部材を所定の位置に位
置させてバフ部材を下降させてバフ処理し、その後、バ
フ部材を上昇させた後に回転装置を回転して最適の測定
ピンを所定の位置に位置させ、次にこの最適の測定ピン
を下降させて配線パターンの所定位置に接触させて測定
することができ、この結果、前後移動手段、左右移動手
段により位置調整をした後に、プローグ基体を前後方
向、左右方向に移動することなくバフ処理と測定ピンに
よる測定とを順番に行うことができるものである。Further, by making the probe base rotatable by the rotating device, after adjusting the position by the front and rear moving means and the left and right moving means, the rotating device is rotated to position the buff member at a predetermined position and lower the buff member. Then, after raising the buff member, rotate the rotating device to position the optimum measuring pin at a predetermined position, and then lower the optimum measuring pin to contact the predetermined position of the wiring pattern. As a result, after the position is adjusted by the front and rear moving means and the left and right moving means, the buffing and the measurement by the measuring pin are performed in order without moving the prog base in the front and rear direction and the left and right direction. Is what you can do.
第１図は本発明の抵抗測定装置の一実施例の概略を示す
斜視図、第２図は同上の抵抗測定装置による測定状態の
概略断面図、第３図は本発明の抵抗測定装置の他の実施
例の概略斜視図であって、１はプローグ基体、２は測定
接触部、３は測定ピン、４は前後方向移動手段、５は左
右方向移動手段である。FIG. 1 is a perspective view schematically showing an embodiment of the resistance measuring apparatus according to the present invention, FIG. 2 is a schematic sectional view of the resistance measuring apparatus according to the first embodiment, and FIG. 1 is a schematic perspective view of an embodiment of the present invention, wherein 1 is a prog base, 2 is a measuring contact portion, 3 is a measuring pin, 4 is a front-back direction moving means, and 5 is a left-right direction moving means.
Claims (2)
測定接触部の太さや硬度等の異なる複数の測定ピンとバ
フ部材とをプローグ基体に対して上下移動自在に設け、
上記プローグ基体を前後方向移動手段により前後方向に
移動自在とし且つ左右方向移動手段により左右方向に移
動自在とし、上記プローグ基体を一対設けて成ることを
特徴とする抵抗測定装置。1. A plurality of measurement pins and buff members having different thicknesses and hardness of measurement contact portions are provided on a prog base at positions not overlapping in a plan view so as to be vertically movable with respect to the prog base.
A resistance measuring device comprising a pair of the prog bases, wherein the prog base is movable in the front-rear direction by a front-rear direction moving means and is movable in a left-right direction by a left-right moving means.
なっていることを特徴とする請求項１記載の抵抗測定装
置。2. The resistance measuring apparatus according to claim 1, wherein the probe base is rotatable by a rotating device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1326401A JP2749913B2 (en) | 1989-12-15 | 1989-12-15 | Resistance measuring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1326401A JP2749913B2 (en) | 1989-12-15 | 1989-12-15 | Resistance measuring device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH03186773A JPH03186773A (en) | 1991-08-14 |
| JP2749913B2 true JP2749913B2 (en) | 1998-05-13 |
Family
ID=18187384
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1326401A Expired - Fee Related JP2749913B2 (en) | 1989-12-15 | 1989-12-15 | Resistance measuring device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2749913B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002357630A (en) * | 2001-06-04 | 2002-12-13 | Hioki Ee Corp | Probe device and circuit board inspection device |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62195779U (en) * | 1986-06-03 | 1987-12-12 | ||
| JPS63181394A (en) * | 1987-01-23 | 1988-07-26 | 日立精工株式会社 | Printed board tester |
-
1989
- 1989-12-15 JP JP1326401A patent/JP2749913B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH03186773A (en) | 1991-08-14 |
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| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |