JP2018190778A - 波長モニタ装置、光源装置及び光モジュール - Google Patents
波長モニタ装置、光源装置及び光モジュール Download PDFInfo
- Publication number
- JP2018190778A JP2018190778A JP2017089908A JP2017089908A JP2018190778A JP 2018190778 A JP2018190778 A JP 2018190778A JP 2017089908 A JP2017089908 A JP 2017089908A JP 2017089908 A JP2017089908 A JP 2017089908A JP 2018190778 A JP2018190778 A JP 2018190778A
- Authority
- JP
- Japan
- Prior art keywords
- wavelength
- light
- birefringent layer
- input light
- transmission characteristic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 title claims abstract description 89
- BJQHLKABXJIVAM-UHFFFAOYSA-N bis(2-ethylhexyl) phthalate Chemical compound CCCCC(CC)COC(=O)C1=CC=CC=C1C(=O)OCC(CC)CCCC BJQHLKABXJIVAM-UHFFFAOYSA-N 0.000 claims abstract description 139
- 230000010287 polarization Effects 0.000 claims abstract description 93
- 238000012544 monitoring process Methods 0.000 claims abstract description 27
- 230000005540 biological transmission Effects 0.000 claims description 147
- 238000012806 monitoring device Methods 0.000 claims description 20
- 238000000926 separation method Methods 0.000 claims description 2
- 238000001514 detection method Methods 0.000 abstract description 12
- 238000010586 diagram Methods 0.000 description 16
- 230000000737 periodic effect Effects 0.000 description 13
- 239000000463 material Substances 0.000 description 10
- 239000013307 optical fiber Substances 0.000 description 3
- 239000010453 quartz Substances 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- 230000000295 complement effect Effects 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000010606 normalization Methods 0.000 description 1
- 239000005304 optical glass Substances 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
- H01S3/13—Stabilisation of laser output parameters, e.g. frequency or amplitude
- H01S3/1305—Feedback control systems
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0224—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using polarising or depolarising elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0256—Compact construction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/26—Generating the spectrum; Monochromators using multiple reflection, e.g. Fabry-Perot interferometer, variable interference filters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J4/00—Measuring polarisation of light
- G01J4/04—Polarimeters using electric detection means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/004—Systems comprising a plurality of reflections between two or more surfaces, e.g. cells, resonators
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/28—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising
- G02B27/283—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising used for beam splitting or combining
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/28—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising
- G02B27/286—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising for controlling or changing the state of polarisation, e.g. transforming one polarisation state into another
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/20—Filters
- G02B5/28—Interference filters
- G02B5/284—Interference filters of etalon type comprising a resonant cavity other than a thin solid film, e.g. gas, air, solid plates
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/30—Polarising elements
- G02B5/3083—Birefringent or phase retarding elements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/02—Constructional details
- H01S3/04—Arrangements for thermal management
- H01S3/0405—Conductive cooling, e.g. by heat sinks or thermo-electric elements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/005—Optical components external to the laser cavity, specially adapted therefor, e.g. for homogenisation or merging of the beams or for manipulating laser pulses, e.g. pulse shaping
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/005—Optical components external to the laser cavity, specially adapted therefor, e.g. for homogenisation or merging of the beams or for manipulating laser pulses, e.g. pulse shaping
- H01S5/0064—Anti-reflection components, e.g. optical isolators
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/022—Mountings; Housings
- H01S5/0225—Out-coupling of light
- H01S5/02251—Out-coupling of light using optical fibres
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/022—Mountings; Housings
- H01S5/023—Mount members, e.g. sub-mount members
- H01S5/02325—Mechanically integrated components on mount members or optical micro-benches
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/024—Arrangements for thermal management
- H01S5/02407—Active cooling, e.g. the laser temperature is controlled by a thermo-electric cooler or water cooling
- H01S5/02415—Active cooling, e.g. the laser temperature is controlled by a thermo-electric cooler or water cooling by using a thermo-electric cooler [TEC], e.g. Peltier element
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/024—Arrangements for thermal management
- H01S5/02438—Characterized by cooling of elements other than the laser chip, e.g. an optical element being part of an external cavity or a collimating lens
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
- H01S5/068—Stabilisation of laser output parameters
- H01S5/0683—Stabilisation of laser output parameters by monitoring the optical output parameters
- H01S5/0687—Stabilising the frequency of the laser
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Electromagnetism (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Automation & Control Theory (AREA)
- Semiconductor Lasers (AREA)
- Light Receiving Elements (AREA)
- Spectrometry And Color Measurement (AREA)
Abstract
Description
図1は、実施例1に係る波長モニタ装置10の構成の一例を示す図である。図1に示す様に、波長モニタ装置10は、偏波回転素子11、エタロン素子12、偏波ビームスプリッタ(PBS:Polarization Beam Splitter)13及びPD14、15を有する。
Δφ=4π(no−ne)d/λ ・・・ (1)
d=(1/4+k)λ0/{2(no−ne)} ・・・ (2)
実施例2の特徴は、入力光の波長の監視用の2つのモニタ値を入力光の光パワー値で規格化してエタロン素子の2つの透過特性を取得する点である。
実施例3の特徴は、偏波回転素子に代えて偏波切替素子を設け、偏波方向が切り替えられ、かつエタロン素子を透過した入力光を1つのPDで受光することで、装置の小型化を図る点である。
実施例4は、実施例1のエタロン素子のバリエーションに関する。
上記各実施例において説明した波長モニタ装置は、レーザから出力されるレーザ光の波長を予め定められた目標波長に調整する機能を備えた、波長可変光源と呼ばれる光源装置などに適用することができる。図9は、波長可変光源100の構成例を示すブロック図である。なお、図9では、一例として、実施例2に係る波長モニタ装置20が配置された波長可変光源100を説明する。
上記適用例において説明した波長可変光源は、種々の光モジュールに応用することができる。図10は、光モジュール200の構成例を示すブロック図である。図10に示す様に、光モジュール200は、波長可変光源201、データ生成回路202、ドライバ203、光変調器204、波長可変光源205及びレシーバ206を有する。
11 偏波回転素子
12 エタロン素子
12a、12c 複屈折層
12b 単屈折層
13 PBS
14、15、22、32 PD
31 偏波切替素子
Claims (7)
- 入力光の偏波方向を回転させる偏波回転素子と、
第1の複屈折層と、単屈折層、又は光学軸が前記第1の複屈折層の光学軸に対して90度回転して配置された第2の複屈折層とを有するエタロン素子と、
前記偏波回転素子によって偏波方向が回転し、かつ前記エタロン素子を透過した前記入力光から、偏波方向が前記第1の複屈折層の光学軸に平行な第1の光と、偏波方向が前記第1の複屈折層の光学軸に垂直な第2の光とを分離する偏波分離素子と、
前記第1の光を受光して前記入力光の波長の監視用の第1のモニタ値を検出する第1の受光素子と、
前記第2の光を受光して前記入力光の波長の監視用の第2のモニタ値を検出する第2の受光素子と
を有することを特徴とする波長モニタ装置。 - 入力光の偏波方向を切り替える偏波切替素子と、
第1の複屈折層と、単屈折層、又は光学軸が前記第1の複屈折層の光学軸に対して90度回転して配置された第2の複屈折層とを有するエタロン素子と、
前記偏波切替素子によって偏波方向が前記第1の複屈折層の光学軸に平行な方向に切り替えられ、かつ前記エタロン素子を透過した前記入力光を受光して前記入力光の波長の監視用の第1のモニタ値を検出し、前記偏波切替素子によって偏波方向が前記第1の複屈折層の光学軸に垂直な方向に切り替えられ、かつ前記エタロン素子を透過した前記入力光を受光して前記入力光の波長の監視用の第2のモニタ値を検出する受光素子と
を有することを特徴とする波長モニタ装置。 - 前記エタロン素子は、前記第1の複屈折層の光学軸に平行な方向に対応し、前記第1のモニタ値が前記入力光の波長に対して周期的に変化する第1の透過特性と、前記第1の複屈折層の光学軸に垂直な方向に対応し、前記第2のモニタ値が前記入力光の波長に対して周期的に変化する第2の透過特性とを有し、
前記第1の複屈折層の厚さは、前記エタロン素子における前記第1の透過特性と前記第2の透過特性との位相差が(π/2+2kπ)(ただし、kは整数)となる複数の厚さのうち、所定値以下のkに対応する厚さに設定され、
前記第1の複屈折層の厚さと前記単屈折層の厚さとの和は、当該和に反比例する前記第1の透過特性の周期及び前記第2の透過特性の周期が予め定められた目標周期以下となる様に、設定されることを特徴とする請求項1又は2に記載の波長モニタ装置。 - 前記エタロン素子は、前記第1の複屈折層の光学軸に平行な方向に対応し、前記第1のモニタ値が前記入力光の波長に対して周期的に変化する第1の透過特性と、前記第1の複屈折層の光学軸に垂直な方向に対応し、前記第2のモニタ値が前記入力光の波長に対して周期的に変化する第2の透過特性とを有し、
前記第1の複屈折層の厚さと前記第2の複屈折層の厚さとの差は、前記エタロン素子における前記第1の透過特性と前記第2の透過特性との位相差が(π/2+2kπ)(ただし、kは整数)となる複数の厚さのうち、所定値以下のkに対応する厚さに設定され、
前記第1の複屈折層の厚さと前記第2の複屈折層の厚さとの和は、当該和に反比例する前記第1の透過特性の周期及び前記第2の透過特性の周期が予め定められた目標周期以下となる様に、設定されることを特徴とする請求項1又は2に記載の波長モニタ装置。 - 前記エタロン素子を透過していない前記入力光を受光して前記入力光の光パワー値を検出する他の受光素子をさらに有し、
前記エタロン素子における前記第1の透過特性は、前記第1のモニタ値が前記入力光の光パワー値で規格化されることにより、取得され、
前記エタロン素子における前記第2の透過特性は、前記第2のモニタ値が前記入力光の光パワー値で規格化されることにより、取得されることを特徴とする請求項3又は4に記載の波長モニタ装置。 - 出力する光の波長の変更が可能なレーザと、
前記レーザから出力されるレーザ光の波長を監視する、請求項1〜5のいずれか一つに記載の波長モニタ装置と、
前記波長モニタ装置による監視結果に基づいて、前記レーザ光の波長を予め定められた目標波長に調整する波長制御を行う制御部と
を有することを特徴とする光源装置。 - 請求項6に記載の光源装置を有する光モジュール。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017089908A JP7062882B2 (ja) | 2017-04-28 | 2017-04-28 | 波長モニタ装置、光源装置及び光モジュール |
US15/935,886 US10622781B2 (en) | 2017-04-28 | 2018-03-26 | Wavelength monitoring device, light source device, and optical module |
CN201810372011.0A CN108801466B (zh) | 2017-04-28 | 2018-04-24 | 波长监测装置、光源装置以及光模块 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017089908A JP7062882B2 (ja) | 2017-04-28 | 2017-04-28 | 波長モニタ装置、光源装置及び光モジュール |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2018190778A true JP2018190778A (ja) | 2018-11-29 |
JP7062882B2 JP7062882B2 (ja) | 2022-05-09 |
Family
ID=63917503
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2017089908A Active JP7062882B2 (ja) | 2017-04-28 | 2017-04-28 | 波長モニタ装置、光源装置及び光モジュール |
Country Status (3)
Country | Link |
---|---|
US (1) | US10622781B2 (ja) |
JP (1) | JP7062882B2 (ja) |
CN (1) | CN108801466B (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2024095424A1 (ja) * | 2022-11-02 | 2024-05-10 | 三菱電機株式会社 | 波長ロッカー及び波長ロッカー内蔵型波長可変光源 |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7062882B2 (ja) * | 2017-04-28 | 2022-05-09 | 富士通オプティカルコンポーネンツ株式会社 | 波長モニタ装置、光源装置及び光モジュール |
CN109283706A (zh) * | 2018-11-13 | 2019-01-29 | 英诺激光科技股份有限公司 | 混合型光隔离器 |
CN111596395B (zh) * | 2020-06-15 | 2021-07-27 | 山西大学 | 一种光学标准具的自动优化滤波***及方法 |
Citations (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS52108145A (en) * | 1976-03-09 | 1977-09-10 | Mitsubishi Electric Corp | Double refraction filter |
JPH02228625A (ja) * | 1989-03-01 | 1990-09-11 | Toshiba Corp | 半導体レーザ装置 |
JPH0389575A (ja) * | 1989-08-31 | 1991-04-15 | Nec Corp | 半導体レーザ装置の発振周波数安定化装置 |
JPH10339668A (ja) * | 1997-05-02 | 1998-12-22 | Hewlett Packard Co <Hp> | 光波長計及び光波長調整装置 |
JP2001244557A (ja) * | 2000-02-29 | 2001-09-07 | Mitsubishi Electric Corp | 波長モニタ装置、およびその調整方法、並びに波長安定化光源 |
JP2003060292A (ja) * | 2001-08-13 | 2003-02-28 | Kddi Submarine Cable Systems Inc | 波長安定化光源、波長制御装置及び波長計測装置 |
JP2005506264A (ja) * | 2001-10-03 | 2005-03-03 | キネティック リミテッド | 光結合技術 |
JP2005085904A (ja) * | 2003-09-05 | 2005-03-31 | Fujitsu Ltd | 波長ロッカ内蔵光モジュール |
US20120281724A1 (en) * | 2011-05-06 | 2012-11-08 | Finisar Corporation | Tuneable Laser Source |
JP2014165384A (ja) * | 2013-02-26 | 2014-09-08 | Furukawa Electric Co Ltd:The | 半導体レーザモジュール |
JP2015060961A (ja) * | 2013-09-19 | 2015-03-30 | 住友電気工業株式会社 | 波長制御システムおよび波長制御方法 |
US20160116655A1 (en) * | 2014-10-27 | 2016-04-28 | Finisar Corporation | Integrated birefringent gridless wavelength locker |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3719414A (en) * | 1970-08-28 | 1973-03-06 | Westinghouse Electric Corp | Polarization independent light modulation means using birefringent crystals |
US4914664A (en) * | 1988-10-21 | 1990-04-03 | Spectra Physics, Inc. | Tunable dye laser with suppressed frequency shift anomalies |
US5038360A (en) * | 1989-06-05 | 1991-08-06 | Negus Daniel K | Birefringent filter for use in a tunable pulsed laser cavity |
IL147800A (en) * | 1999-08-13 | 2005-03-20 | California Inst Of Techn | In fiber frequency locker |
JP3667694B2 (ja) * | 2000-01-31 | 2005-07-06 | 三菱電機株式会社 | 波長モニタ装置及び波長安定化光源 |
JP2002232050A (ja) * | 2001-02-01 | 2002-08-16 | Hitachi Ltd | 光モジュール |
US7301974B2 (en) * | 2001-05-08 | 2007-11-27 | Mitsubishi Denki Kabushiki Kaisha | Wavelength monitoring apparatus |
JP4222469B2 (ja) | 2002-02-28 | 2009-02-12 | 古河電気工業株式会社 | 波長モニタ及び半導体レーザモジュール |
US6901175B2 (en) * | 2002-02-28 | 2005-05-31 | Engana Ltd. | Tunable wavelength multiplexer |
US7450862B2 (en) * | 2002-03-19 | 2008-11-11 | Axsun Technologies, Inc. | Stray light insensitive detector system and amplifier |
EP1605284B1 (en) * | 2003-03-19 | 2012-12-26 | Mitsubishi Denki Kabushiki Kaisha | Wavelength filter and wavelength monitor device |
US7130320B2 (en) * | 2003-11-13 | 2006-10-31 | Mitutoyo Corporation | External cavity laser with rotary tuning element |
JP4756379B2 (ja) * | 2004-07-15 | 2011-08-24 | 日本電気株式会社 | 外部共振器型波長可変レーザ |
US8054466B1 (en) * | 2005-05-23 | 2011-11-08 | Axsun Technologies, Inc. | Spectroscopy wavelength and amplitude referencing system and method |
JP5414523B2 (ja) * | 2006-10-20 | 2014-02-12 | バイオアキシアル エスエーエス | 内部円錐回折に基づく光学装置 |
JP5566968B2 (ja) | 2011-07-26 | 2014-08-06 | 京セラクリスタルデバイス株式会社 | エタロンフィルタ及びエタロンフィルタの設計方法 |
JP2014150243A (ja) * | 2013-01-08 | 2014-08-21 | Canon Inc | 波長可変レーザおよびそれを用いた光音響装置 |
JP7062882B2 (ja) * | 2017-04-28 | 2022-05-09 | 富士通オプティカルコンポーネンツ株式会社 | 波長モニタ装置、光源装置及び光モジュール |
-
2017
- 2017-04-28 JP JP2017089908A patent/JP7062882B2/ja active Active
-
2018
- 2018-03-26 US US15/935,886 patent/US10622781B2/en active Active
- 2018-04-24 CN CN201810372011.0A patent/CN108801466B/zh active Active
Patent Citations (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS52108145A (en) * | 1976-03-09 | 1977-09-10 | Mitsubishi Electric Corp | Double refraction filter |
JPH02228625A (ja) * | 1989-03-01 | 1990-09-11 | Toshiba Corp | 半導体レーザ装置 |
JPH0389575A (ja) * | 1989-08-31 | 1991-04-15 | Nec Corp | 半導体レーザ装置の発振周波数安定化装置 |
JPH10339668A (ja) * | 1997-05-02 | 1998-12-22 | Hewlett Packard Co <Hp> | 光波長計及び光波長調整装置 |
JP2001244557A (ja) * | 2000-02-29 | 2001-09-07 | Mitsubishi Electric Corp | 波長モニタ装置、およびその調整方法、並びに波長安定化光源 |
JP2003060292A (ja) * | 2001-08-13 | 2003-02-28 | Kddi Submarine Cable Systems Inc | 波長安定化光源、波長制御装置及び波長計測装置 |
JP2005506264A (ja) * | 2001-10-03 | 2005-03-03 | キネティック リミテッド | 光結合技術 |
JP2005085904A (ja) * | 2003-09-05 | 2005-03-31 | Fujitsu Ltd | 波長ロッカ内蔵光モジュール |
US20120281724A1 (en) * | 2011-05-06 | 2012-11-08 | Finisar Corporation | Tuneable Laser Source |
JP2014165384A (ja) * | 2013-02-26 | 2014-09-08 | Furukawa Electric Co Ltd:The | 半導体レーザモジュール |
JP2015060961A (ja) * | 2013-09-19 | 2015-03-30 | 住友電気工業株式会社 | 波長制御システムおよび波長制御方法 |
US20160116655A1 (en) * | 2014-10-27 | 2016-04-28 | Finisar Corporation | Integrated birefringent gridless wavelength locker |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2024095424A1 (ja) * | 2022-11-02 | 2024-05-10 | 三菱電機株式会社 | 波長ロッカー及び波長ロッカー内蔵型波長可変光源 |
Also Published As
Publication number | Publication date |
---|---|
JP7062882B2 (ja) | 2022-05-09 |
CN108801466B (zh) | 2020-08-18 |
CN108801466A (zh) | 2018-11-13 |
US10622781B2 (en) | 2020-04-14 |
US20180316154A1 (en) | 2018-11-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US10622781B2 (en) | Wavelength monitoring device, light source device, and optical module | |
EP0867989B1 (en) | Wavelength tunable semiconductor laser light source | |
US8254732B2 (en) | Phase modulator and optical modulation device | |
US6385217B1 (en) | Compact wavelength-independent wavelength-locker for absolute wavelength stability of a laser diode | |
US7221452B2 (en) | Tunable optical filter, optical apparatus for use therewith and method utilizing same | |
US9885815B2 (en) | Integrated birefringent gridless wavelength locker | |
JP2002202190A (ja) | 波長モニタ及び波長モニタ内蔵型波長可変光源 | |
US20130163621A1 (en) | External cavity tunable laser module | |
US7102120B2 (en) | Optical module with built-in wavelength locker | |
US5956356A (en) | Monitoring wavelength of laser devices | |
JP4124942B2 (ja) | 波長モニタ装置、およびその調整方法、並びに波長安定化光源 | |
US20060038975A1 (en) | Wavelength-tracking dispersion compensator | |
KR20040066888A (ko) | 파장 분할 다중 전송 광학 성능 모니터 | |
EP1605284A1 (en) | Wavelength filter and wavlength monitor device | |
US11984699B2 (en) | Optical semiconductor device and control method of the same | |
US20030053064A1 (en) | Wavelength detector and optical transmitter | |
WO2002091534A1 (fr) | Dispositif de controle de longueur d'onde | |
CN111194528B (zh) | 波长监测和/或控制设备、包括所述设备的激光***及操作所述设备的方法 | |
GB2396249A (en) | Wavelength locker | |
US20020081065A1 (en) | Fabry-perot etalon, wavelength measuring apparatus, and wavelength tunable light source device with built-in wavelength measuring apparatus | |
KR20020012091A (ko) | 파장안정화 광원 모듈 | |
JP3965994B2 (ja) | 外部共振型レーザ | |
JP2004119721A (ja) | 波長ロッカー素子 | |
WO2024095424A1 (ja) | 波長ロッカー及び波長ロッカー内蔵型波長可変光源 | |
WO2003088436A1 (fr) | Appareil de controle de longueur d'onde |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20200106 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20201224 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20210202 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20210329 |
|
A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20210928 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20211227 |
|
C60 | Trial request (containing other claim documents, opposition documents) |
Free format text: JAPANESE INTERMEDIATE CODE: C60 Effective date: 20211227 |
|
A911 | Transfer to examiner for re-examination before appeal (zenchi) |
Free format text: JAPANESE INTERMEDIATE CODE: A911 Effective date: 20220113 |
|
C21 | Notice of transfer of a case for reconsideration by examiners before appeal proceedings |
Free format text: JAPANESE INTERMEDIATE CODE: C21 Effective date: 20220118 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20220322 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20220404 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 7062882 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |