JP2016161319A - 全反射試料照明装置 - Google Patents
全反射試料照明装置 Download PDFInfo
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- JP2016161319A JP2016161319A JP2015038153A JP2015038153A JP2016161319A JP 2016161319 A JP2016161319 A JP 2016161319A JP 2015038153 A JP2015038153 A JP 2015038153A JP 2015038153 A JP2015038153 A JP 2015038153A JP 2016161319 A JP2016161319 A JP 2016161319A
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- slide glass
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- 239000000758 substrate Substances 0.000 claims abstract description 91
- 239000011521 glass Substances 0.000 claims abstract description 74
- 239000000463 material Substances 0.000 claims abstract description 12
- 238000005286 illumination Methods 0.000 claims description 23
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 claims description 13
- 229910052751 metal Inorganic materials 0.000 claims description 4
- 239000002184 metal Substances 0.000 claims description 4
- 230000000149 penetrating effect Effects 0.000 claims description 2
- 239000010409 thin film Substances 0.000 claims description 2
- 238000000034 method Methods 0.000 abstract description 6
- 238000003332 Raman imaging Methods 0.000 abstract description 2
- 238000005259 measurement Methods 0.000 description 8
- 230000005855 radiation Effects 0.000 description 7
- 230000005284 excitation Effects 0.000 description 5
- 239000007850 fluorescent dye Substances 0.000 description 5
- 238000001069 Raman spectroscopy Methods 0.000 description 3
- 230000007613 environmental effect Effects 0.000 description 3
- 230000002452 interceptive effect Effects 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 238000005520 cutting process Methods 0.000 description 2
- 238000005304 joining Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 238000007654 immersion Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 238000012800 visualization Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N21/6456—Spatial resolved fluorescence measurements; Imaging
- G01N21/6458—Fluorescence microscopy
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N21/648—Specially adapted constructive features of fluorimeters using evanescent coupling or surface plasmon coupling for the excitation of fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/06—Means for illuminating specimens
- G02B21/08—Condensers
- G02B21/10—Condensers affording dark-field illumination
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/16—Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/0088—Inverse microscopes
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Optics & Photonics (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Description
Claims (4)
- レーザー光をスライドガラス内に導入し、前記スライドガラス内でレーザー光を多重全反射させることで当該スライドガラスの上面にエバネッセント波を発生させ、前記スライドガラスの上面に位置する試料をそのエバネッセント波によって照明する全反射試料照明装置であって、
前記スライドガラスと同程度の屈折率を有する材料から形成され、上面と底面との間を貫通する開口が設けられると共に、上面には前記開口を塞ぐようにして前記スライドガラスが配設される装置基板と、
レーザー光源を保持して前記装置基板の上面に固定され、当該レーザー光源が発するレーザー光を前記装置基板の上面に対して所定の角度で入射させる光源ホルダと、
前記装置基板の底面側に設けられ、前記レーザー光源から前記装置基板に入射したレーザー光を反射して前記スライドガラスに入射させ、前記開口に重なった当該スライドガラスの部位内で多重全反射を生じさせる入射用反射面と、
前記装置基板の底面側で前記開口を挟んで入射用反射面と対向する部位に設けられ、前記スライドガラスから前記装置本体に入射したレーザー光を当該装置基板の上面と平行な方向で且つ前記開口と干渉しない方向へ反射する出射用反射面と、
を備えたことを特徴とする全反射試料照明装置。 - 前記装置基板は矩形状に形成され、前記入射用反射面及び前記射出用反射面は前記開口を挟んだ一対の隅角部に設けられていることを特徴とする請求項1記載の全反射試料照明装置。
- 前記装置基板の上面側の周囲には観察ステージに載置される支持板部が設けられると共に、前記支持板部には前記装置基板を前記観察ステージの透孔内に位置決めするためのボスが設けられていることを特徴とする請求項1又は2記載の全反射試料照明装置。
- 前記装置基板は、前記入射用反射面及び前記射出用反射面となる金属薄膜が蒸着されたアクリル板を無色透明な他のアクリル板と接着して形成されていることを特徴とする請求項1乃至3のいずれかに記載の全反射試料照明装置。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2015038153A JP6062980B2 (ja) | 2015-02-27 | 2015-02-27 | 全反射試料照明装置 |
PCT/JP2016/055789 WO2016136937A1 (ja) | 2015-02-27 | 2016-02-26 | 全反射試料照明装置 |
EP16755681.0A EP3264069B1 (en) | 2015-02-27 | 2016-02-26 | Total internal reflection sample illuminating device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2015038153A JP6062980B2 (ja) | 2015-02-27 | 2015-02-27 | 全反射試料照明装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2016161319A true JP2016161319A (ja) | 2016-09-05 |
JP6062980B2 JP6062980B2 (ja) | 2017-01-18 |
Family
ID=56788762
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2015038153A Active JP6062980B2 (ja) | 2015-02-27 | 2015-02-27 | 全反射試料照明装置 |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP3264069B1 (ja) |
JP (1) | JP6062980B2 (ja) |
WO (1) | WO2016136937A1 (ja) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113758901B (zh) * | 2020-06-04 | 2024-04-12 | 中国科学院苏州纳米技术与纳米仿生研究所 | 衍射层析显微成像***及方法 |
CN115097617B (zh) * | 2022-07-15 | 2022-12-30 | 中国科学技术大学 | 一种基于平面芯片的全内反射荧光显微镜*** |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1994000761A1 (en) * | 1992-06-26 | 1994-01-06 | Daikin Industries, Ltd. | Optical measurement instrument |
US5442169A (en) * | 1991-04-26 | 1995-08-15 | Paul Scherrer Institut | Method and apparatus for determining a measuring variable by means of an integrated optical sensor module |
JP2006153643A (ja) * | 2004-11-29 | 2006-06-15 | Toshiba Corp | 測定装置 |
WO2007034796A1 (ja) * | 2005-09-26 | 2007-03-29 | National University Corporation Hamamatsu University School Of Medicine | 複数の観察手法を用いた顕微鏡細胞観察・検査システム |
JP2008309785A (ja) * | 2007-06-13 | 2008-12-25 | Mettler-Toledo Ag | 減衰全反射センサー |
WO2009066515A1 (ja) * | 2007-11-19 | 2009-05-28 | Central Glass Company, Limited | エバネッセント光源 |
JP2012117837A (ja) * | 2010-11-29 | 2012-06-21 | Hamamatsu Photonics Kk | 全反射分光計測装置 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10217098B4 (de) * | 2002-04-17 | 2004-04-15 | Carl Zeiss Jena Gmbh | Auflicht-Beleuchtungsanordnung für ein Mikroskop |
DE102005040833A1 (de) * | 2005-08-25 | 2007-03-08 | Carl Zeiss Jena Gmbh | TIRF-Beleuchtung für Mikroskope |
CN102323218A (zh) * | 2011-05-26 | 2012-01-18 | 浙江大学 | 基于光谱技术的物料实时检测监控装置 |
-
2015
- 2015-02-27 JP JP2015038153A patent/JP6062980B2/ja active Active
-
2016
- 2016-02-26 WO PCT/JP2016/055789 patent/WO2016136937A1/ja active Application Filing
- 2016-02-26 EP EP16755681.0A patent/EP3264069B1/en active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5442169A (en) * | 1991-04-26 | 1995-08-15 | Paul Scherrer Institut | Method and apparatus for determining a measuring variable by means of an integrated optical sensor module |
WO1994000761A1 (en) * | 1992-06-26 | 1994-01-06 | Daikin Industries, Ltd. | Optical measurement instrument |
JP2006153643A (ja) * | 2004-11-29 | 2006-06-15 | Toshiba Corp | 測定装置 |
WO2007034796A1 (ja) * | 2005-09-26 | 2007-03-29 | National University Corporation Hamamatsu University School Of Medicine | 複数の観察手法を用いた顕微鏡細胞観察・検査システム |
JP2008309785A (ja) * | 2007-06-13 | 2008-12-25 | Mettler-Toledo Ag | 減衰全反射センサー |
WO2009066515A1 (ja) * | 2007-11-19 | 2009-05-28 | Central Glass Company, Limited | エバネッセント光源 |
JP2012117837A (ja) * | 2010-11-29 | 2012-06-21 | Hamamatsu Photonics Kk | 全反射分光計測装置 |
Also Published As
Publication number | Publication date |
---|---|
EP3264069B1 (en) | 2019-05-22 |
EP3264069A4 (en) | 2018-06-06 |
EP3264069A1 (en) | 2018-01-03 |
JP6062980B2 (ja) | 2017-01-18 |
WO2016136937A1 (ja) | 2016-09-01 |
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