JP2013195115A5 - - Google Patents
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- JP2013195115A5 JP2013195115A5 JP2012060001A JP2012060001A JP2013195115A5 JP 2013195115 A5 JP2013195115 A5 JP 2013195115A5 JP 2012060001 A JP2012060001 A JP 2012060001A JP 2012060001 A JP2012060001 A JP 2012060001A JP 2013195115 A5 JP2013195115 A5 JP 2013195115A5
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- JP
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- Prior art keywords
- peaks
- peak
- wells
- analysis
- assignment
- Prior art date
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次に、α本のピークについてＭＳ2分析を実行するウェルの数をｘ、β本のピークについてＭＳ2分析を実行するウェルの数をｙと置き、次の連立方程式(1)を解く（ステップＳ１２）。
ｘ＋ ｙ＝Ｍ
αｘ＋βｙ＝Ｎ …(1)
Then, the number of roux E Le perform the MS 2 analysis for α present peak x, the number of wells to perform MS 2 analysis for β present peak placed and y, the following simultaneous equations (1) Solve (step S12).
x + y = M
αx + βy = N (1)
Ｎ、Ｍ、α、βの値に基づいてｘ、ｙが求まったならば、その後に、Ｎ本のピークの中でイオン強度が低いピークからβ本ずつ、総イオン量が多いウェルから順番にｙ個のウェルに割当てを行う。これにより、Ｎ本のピークの中でβｙ本のピークの割当てが決まる。そのあと、残りのピーク（Ｎ−βｙ本）については、イオン強度が低いピークから順にα本ずつ、残りの総イオン量が多いウェルから順番にｘ個のウェルに割当てを行う。これにより、Ｎ本の全てのピークについて、ＭＳ2分析を実行する対象のウェルの割当てが決まる（ステップＳ１３）。
If x and y are obtained based on the values of N, M, α, and β, then β of the N peaks from the peak with the lowest ionic strength, in order from the well with the highest total ion content. Assign to y wells. This determines the assignment of βy peaks among the N peaks. After that, the remaining peaks (N− βy ) are assigned to x wells in order from the peak with the lowest total ion content, sequentially from the peak with the lowest ionic strength. As a result, the assignment of wells to be subjected to MS 2 analysis is determined for all N peaks (step S13).
１…ＬＣ部
１１…移動相容器
１２…送液ポンプ
１３…インジェクタ
１４…カラム
１５…検出器
２…スポッティング装置
２１…サンプルプレート
２２…ウェル
３…試料搬送部
４…ＭＳ部
４１…ステージ
４２…レーザ光源部
４３…イオントラップ
４４…飛行時間型質量分析器
４５…検出器
５…データ処理部
５１…クロマトグラムデータ収集部
５２…ＭＳスペクトルデータ収集部
５３…ＭＳ2スペクトルデータ収集部
５４…プリカーサイオン抽出部
５５…ウェル／プリカーサイオン割当て処理部
６…分析制御部
DESCRIPTION OF SYMBOLS 1 ... LC part 11 ... Mobile phase container 12 ... Liquid feed pump 13 ... Injector 14 ... Column 15 ... Detector 2 ... Spotting device 21 ... Sample plate 22 ... Well 3 ... Sample conveyance part 4 ... MS part 41 ... Stage 42 ... Laser Light source 43 ... Ion trap 44 ... Time-of-flight mass analyzer 45 ... Detector 5 ... Data processing unit 51 ... Chromatogram data collection unit 52 ... MS spectrum data collection unit 53 ... MS 2 spectrum data collection unit 54 ... Precursor ion extraction 55: Well / precursor ion assignment processing unit 6: Analysis control unit
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2012060001A JP5811912B2 (en) | 2012-03-16 | 2012-03-16 | Mass spectrometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2012060001A JP5811912B2 (en) | 2012-03-16 | 2012-03-16 | Mass spectrometer |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2013195115A JP2013195115A (en) | 2013-09-30 |
| JP2013195115A5 true JP2013195115A5 (en) | 2014-07-10 |
| JP5811912B2 JP5811912B2 (en) | 2015-11-11 |
Family
ID=49394266
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012060001A Active JP5811912B2 (en) | 2012-03-16 | 2012-03-16 | Mass spectrometer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP5811912B2 (en) |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4801455B2 (en) * | 2006-01-26 | 2011-10-26 | 株式会社日立ハイテクノロジーズ | Mass spectrometry system |
| JP4900048B2 (en) * | 2007-05-29 | 2012-03-21 | 株式会社島津製作所 | Mass spectrometer |
| JP5636614B2 (en) * | 2010-09-02 | 2014-12-10 | 学校法人立教学院 | Comparative analysis method of data obtained by LC-MALDI |
-
2012
- 2012-03-16 JP JP2012060001A patent/JP5811912B2/en active Active
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