JP2011180135A - 偏光板を貼合した液晶パネルの欠陥検査方法 - Google Patents

偏光板を貼合した液晶パネルの欠陥検査方法 Download PDF

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Publication number
JP2011180135A
JP2011180135A JP2011024657A JP2011024657A JP2011180135A JP 2011180135 A JP2011180135 A JP 2011180135A JP 2011024657 A JP2011024657 A JP 2011024657A JP 2011024657 A JP2011024657 A JP 2011024657A JP 2011180135 A JP2011180135 A JP 2011180135A
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Japan
Prior art keywords
liquid crystal
crystal panel
bonded
polarizing plate
defect
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Withdrawn
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JP2011024657A
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English (en)
Japanese (ja)
Inventor
Keita Imura
圭太 井村
Yasuhiro Watanabe
康弘 渡辺
Yoshitaka Shinomiya
由隆 四宮
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Sumitomo Chemical Co Ltd
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Sumitomo Chemical Co Ltd
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Publication date
Application filed by Sumitomo Chemical Co Ltd filed Critical Sumitomo Chemical Co Ltd
Priority to JP2011024657A priority Critical patent/JP2011180135A/ja
Publication of JP2011180135A publication Critical patent/JP2011180135A/ja
Withdrawn legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/1335—Structural association of cells with optical devices, e.g. polarisers or reflectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9513—Liquid crystal panels
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Nonlinear Science (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Optics & Photonics (AREA)
  • Mathematical Physics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Liquid Crystal (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
JP2011024657A 2010-02-08 2011-02-08 偏光板を貼合した液晶パネルの欠陥検査方法 Withdrawn JP2011180135A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2011024657A JP2011180135A (ja) 2010-02-08 2011-02-08 偏光板を貼合した液晶パネルの欠陥検査方法

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2010025195 2010-02-08
JP2010025195 2010-02-08
JP2011024657A JP2011180135A (ja) 2010-02-08 2011-02-08 偏光板を貼合した液晶パネルの欠陥検査方法

Publications (1)

Publication Number Publication Date
JP2011180135A true JP2011180135A (ja) 2011-09-15

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JP2011024657A Withdrawn JP2011180135A (ja) 2010-02-08 2011-02-08 偏光板を貼合した液晶パネルの欠陥検査方法

Country Status (5)

Country Link
JP (1) JP2011180135A (zh)
KR (1) KR20120115530A (zh)
CN (1) CN102741684A (zh)
TW (1) TW201132963A (zh)
WO (1) WO2011096583A1 (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20140168643A1 (en) * 2012-12-17 2014-06-19 Taiwan Power Testing Technology Co., Ltd. Method for inspecting defects of optical layer elements of a display device

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6041087B2 (ja) * 2012-03-22 2016-12-07 株式会社Ｊｏｌｅｄ 表示パネルの製造方法、その検査装置及び検査方法
KR101366817B1 (ko) * 2013-07-12 2014-02-25 주식회사 에이피에스 디스플레이 패널의 색번짐 광학검사장치와, 이를 포함하는 광학검사시스템 및 이의 운용방법
CN103439339B (zh) * 2013-09-02 2015-11-25 深圳市华星光电技术有限公司 贴附有偏振片的液晶面板的缺陷检测装置及缺陷检测方法
KR101697071B1 (ko) * 2014-04-18 2017-01-17 동우 화인켐 주식회사 광학 필름의 결함 판별 방법
CN106681033B (zh) * 2017-01-09 2022-07-12 京东方科技集团股份有限公司 液晶面板的检测方法和检测装置
US10481097B1 (en) * 2018-10-01 2019-11-19 Guardian Glass, LLC Method and system for detecting inclusions in float glass based on spectral reflectance analysis

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003262843A (ja) * 2002-03-11 2003-09-19 Seiko Epson Corp 液晶パネル検査方法及び装置
JP3762952B2 (ja) * 2002-09-04 2006-04-05 レーザーテック株式会社 光学装置並びにそれを用いた画像測定装置及び検査装置
JP2005265503A (ja) * 2004-03-17 2005-09-29 Seiko Epson Corp ディスプレイの検査方法及びディスプレイの検査装置
JP2006078317A (ja) * 2004-09-09 2006-03-23 Seiko Epson Corp 被検査体の検査方法及びその装置
JP2007256106A (ja) * 2006-03-23 2007-10-04 Sharp Corp 表示パネル検査装置及びそれを用いた表示パネル検査方法
JP2008107100A (ja) * 2006-10-23 2008-05-08 Sharp Corp 液晶パネルの検査装置、及び液晶パネルの検査方法
JP2008175768A (ja) * 2007-01-22 2008-07-31 Seiko Epson Corp 表示パネルの欠陥検査装置および欠陥検査方法
JP5112748B2 (ja) * 2007-05-30 2013-01-09 株式会社日本マイクロニクス 液晶パネル検査方法及び装置
JP4910939B2 (ja) * 2007-08-15 2012-04-04 凸版印刷株式会社 回折像を用いたカラーフィルターの検査方法および装置
JP5181125B2 (ja) * 2008-04-09 2013-04-10 日東電工株式会社 光学表示ユニットの検査方法およびその検査方法を用いた光学表示ユニットの製造方法
JP2010266284A (ja) * 2009-05-13 2010-11-25 Micronics Japan Co Ltd 非点灯検査装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20140168643A1 (en) * 2012-12-17 2014-06-19 Taiwan Power Testing Technology Co., Ltd. Method for inspecting defects of optical layer elements of a display device

Also Published As

Publication number Publication date
TW201132963A (en) 2011-10-01
CN102741684A (zh) 2012-10-17
KR20120115530A (ko) 2012-10-18
WO2011096583A1 (ja) 2011-08-11

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