JP2006179859A - Substrate heating device - Google Patents

Substrate heating device Download PDF

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Publication number
JP2006179859A
JP2006179859A JP2005245055A JP2005245055A JP2006179859A JP 2006179859 A JP2006179859 A JP 2006179859A JP 2005245055 A JP2005245055 A JP 2005245055A JP 2005245055 A JP2005245055 A JP 2005245055A JP 2006179859 A JP2006179859 A JP 2006179859A
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Prior art keywords
substrate
pin
heating
lifter
retracted
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Kazuo Nishizawa
和夫 西澤
Shinkichi Iwasaki
信吉 岩崎
Hiroisa Ohashi
博功 大橋
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Clean Technology Co Ltd
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Clean Technology Co Ltd
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Priority to JP2005245055A priority Critical patent/JP2006179859A/en
Priority to TW094132156A priority patent/TW200618129A/en
Priority to KR1020050105455A priority patent/KR20060059809A/en
Publication of JP2006179859A publication Critical patent/JP2006179859A/en
Pending legal-status Critical Current

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67098Apparatus for thermal treatment
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/68742Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a lifting arrangement, e.g. lift pins

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To provide a substrate heating device capable of coping with changes in size of substrate, and preventing the characteristics of coated film deposited on the substrate from being uneven without locally heating the substrate with lifter pins. <P>SOLUTION: The substrate heating device is provided with a heating section 2 that heats uniformly the almost entire surface of the substrate 1 on which film is formed, a number of the lifter pins 5 that receive and support the substrates which are penetratably-protrudably/sinkably-retreatably provided from a number of pin holes 3 provided in the heater 2, and a substrate receiving mechanism including a pin driver 6 that drives a number of the lifter pins 5 forward and backward, the lifter pins 5 that can be sunk and retreated to load the substrate 1 received and supported by the lifter pins 5 on the heater 2 are configured so as to be able to sink/retreat in the pin driver 6 from the heater 2 further to a lower position without allowing the lifter pins to stand by in the heater 2, and the lifter pins 5 are configured so as to be penetratable/protrudable from a position lower the heater 2. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

本発明は、基板加熱装置に関するものである。   The present invention relates to a substrate heating apparatus.

例えば液晶パネル用のアレイ基板に形成されるTFTは、ガラス基板等の透明基板の表面に薄膜を成膜し、この薄膜上にフォトレジスト膜を成膜した後、この薄膜及びフォトレジスト膜が設けられた基板を加熱装置により加熱して前記フォトレジスト膜を乾燥・硬化せしめ、前記加熱により高温状態となった基板を冷却装置により冷却し、所定部位のフォトレジスト膜を露光・現像してポストベーキングを行った後、前記フォトレジスト膜が除去された部位をエッチングし、未露光の前記フォトレジスト膜を剥離せしめることで所望の回路パターンを形成する所謂フォトリソグラフィー工程を繰り返して行うことで形成されている。尚、一般的にアレイ基板にはポジ型のフォトレジスト膜が採用されるため上記のような工程となるが、例えば前記アレイ基板と組み合わせられるカラーフィルター基板のカラーフィルター部等を形成する際に使用されるネガ型のフォトレジスト膜を採用した場合、現像時に未露光のフォトレジスト膜が全て除去されるため、上記のエッチング工程は不要となる。   For example, a TFT formed on an array substrate for a liquid crystal panel is formed by forming a thin film on the surface of a transparent substrate such as a glass substrate, forming a photoresist film on the thin film, and then providing the thin film and the photoresist film. The resulting substrate is heated by a heating device to dry and cure the photoresist film, the substrate that has been brought to a high temperature by the heating is cooled by a cooling device, and the photoresist film at a predetermined portion is exposed and developed to be post-baked. Is formed by repeatedly performing a so-called photolithography process of forming a desired circuit pattern by etching the portion where the photoresist film has been removed and peeling off the unexposed photoresist film. Yes. In general, a positive type photoresist film is used for the array substrate, and thus the process is as described above. For example, it is used when forming a color filter portion of a color filter substrate combined with the array substrate. When the negative type photoresist film to be used is employed, since the unexposed photoresist film is completely removed at the time of development, the above-described etching process becomes unnecessary.

ところで、上記基板を加熱する基板加熱装置は、一般的に、基板の略全面を均一に加熱する加熱板及びこの加熱板に設けられる均熱板と、この加熱板及び均熱板に設けた多数のピン孔から貫通突出・没入退避自在に設けられる基板受け取り支承用の多数のリフターピンとこの多数のリフターピンを進退駆動するピン駆動部とから成る基板受け取り機構とを備え、この基板受け取り機構は、前記リフターピンを加熱板及び均熱板のピン孔から貫通突出させてこのリフターピンで基板を支承して基板を受け取り、この突出状態のリフターピンを加熱板及び均熱板に没入させることで基板を加熱部に当接若しくは近接状態に載置して加熱部により基板の略全面を均一に加熱する構成である。   By the way, the substrate heating apparatus for heating the substrate is generally a heating plate that uniformly heats substantially the entire surface of the substrate, a soaking plate provided on the heating plate, and a large number provided on the heating plate and the soaking plate. A board receiving mechanism comprising a large number of lifter pins for supporting and receiving a board that are provided so as to be freely projecting through and retracting from the pin holes of the board, and a pin driving unit that drives the multiple lifter pins to move forward and backward. The lifter pin is penetrated and protruded from the pin hole of the heating plate and the soaking plate, the substrate is supported by the lifter pin, the substrate is received, and the protruding lifter pin is immersed in the heating plate and the soaking plate. Is placed in contact with or close to the heating unit, and the heating unit uniformly heats substantially the entire surface of the substrate.

この従来の基板加熱装置においては、加熱板により基板を加熱する際、リフターピンは加熱板若しくは均熱板内に先端部が位置した状態でピン孔内に待機せしめられている。   In this conventional substrate heating apparatus, when the substrate is heated by the heating plate, the lifter pin is made to wait in the pin hole in a state where the tip portion is located in the heating plate or the soaking plate.

しかしながら、上記加熱板及び均熱板は加熱されるため、この加熱板及び均熱板内で待機しているリフターピン、特に基板を支承するこのリフターピンの先端部も加熱されてしまい、この加熱された先端部により基板を受け取り支承すると、この加熱されたリフターピンと当接した基板の一部も熱されることになる。   However, since the heating plate and the soaking plate are heated, the lifter pins waiting in the heating plate and the soaking plate, particularly the tip portions of the lifter pins that support the substrate are also heated. When the substrate is received and supported by the tip, the part of the substrate that is in contact with the heated lifter pin is also heated.

基板の一部が熱されると、基板に形成される薄膜の特性が局所的に変化してしまうため、均一な特性が発揮されないことになり、品質が低下するおそれがある。   When a part of the substrate is heated, the characteristics of the thin film formed on the substrate are locally changed, so that uniform characteristics are not exhibited and the quality may be deteriorated.

具体的には、上記フォトレジスト膜が加熱されることでフォトレジスト膜の硬化が促進し、現像時の現像性(溶解性)が悪化し、本来除去されるべきフォトレジスト膜が残存してしまい、結果として回路パターンの一部の線幅が太くなってしまい、ある領域に線幅が太い部分と細い部分とが混在すると画面に表示ムラが発生してしまう。   Specifically, when the photoresist film is heated, curing of the photoresist film is accelerated, developability (solubility) during development is deteriorated, and a photoresist film that should be originally removed remains. As a result, the line width of a part of the circuit pattern becomes thick, and when a portion having a large line width and a thin portion are mixed in a certain region, display unevenness occurs on the screen.

また、上記アレイ基板及びカラーフィルター基板にインクジェット印刷により形成される配向膜をプリベークする際に前記加熱されたリフターピンで基板を受け取り支承すると、このリフターピンとの当接部分のみ溶媒の揮発条件が変化してムラとなり、局所的に液晶の配向状態が変わることで、このアレイ基板及びカラーフィルター基板を組み合わせて液晶パネルを構成した際、画面に表示ムラが発生してしまう。   Also, when the substrate is received and supported by the heated lifter pin when pre-baking the alignment film formed by inkjet printing on the array substrate and the color filter substrate, the volatilization condition of the solvent changes only at the contact portion with the lifter pin. As a result, the alignment state of the liquid crystal locally changes, and when the liquid crystal panel is configured by combining the array substrate and the color filter substrate, display unevenness occurs on the screen.

そこで、例えば、上述のようなリフターピンを用いずに、基板のエッジ部(外周縁部)を支承する構成も提案されているが、近年では基板の大型化・分割等が要望されていることから、サイズの変更が頻繁に行われるため、予め決まったサイズの基板のエッジ部を支持する構成は汎用性に劣り、また、大型の基板を支承する場合、そのエッジ部のみを支承する構成では安定性を欠き、実用的でない。   Therefore, for example, a configuration for supporting the edge portion (outer peripheral edge portion) of the substrate without using the lifter pins as described above has been proposed, but in recent years, there has been a demand for an increase in size and division of the substrate. Therefore, since the size is frequently changed, the configuration for supporting the edge portion of the substrate of a predetermined size is inferior in versatility, and when supporting a large substrate, only the edge portion is supported. It lacks stability and is not practical.

本発明は上述のような問題点を解決したもので、基板サイズの変更に柔軟に対応できるのは勿論、リフターピンにより基板を局所的に加熱することがなく、基板に成膜した塗布膜等の被膜や積層物の特性が不均一となることを阻止でき、高品質な基板を作製できる極めて実用性に秀れた基板加熱装置を提供するものである。   The present invention solves the above-mentioned problems, and can be flexibly adapted to changes in the size of the substrate, as well as a coating film formed on the substrate without locally heating the substrate with lifter pins. The present invention provides a substrate heating apparatus that can prevent the properties of the coating film and the laminate from becoming non-uniform and can produce a high-quality substrate and is extremely practical.

添付図面を参照して本発明の要旨を説明する。   The gist of the present invention will be described with reference to the accompanying drawings.

表面に被膜を形成若しくは積層物を積層した基板1の略全面を均一に加熱する加熱部2と、この加熱部2に設けた多数のピン孔3から貫通突出・没入退避自在に設けられる基板受け取り支承用の多数のリフターピン5とこの多数のリフターピン5を進退駆動するピン駆動部6とから成る基板受け取り機構とを備え、この基板受け取り機構は、前記リフターピン5を加熱部2のピン孔3から貫通突出させてこのリフターピン5で基板1を支承して基板1を受け取り、この突出状態のリフターピン5を加熱部2に没入させることで基板1を加熱部2に近接状態に載置して加熱部2により基板1の略全面を均一に加熱するように構成した基板加熱装置であって、前記リフターピン5で受け取り支承した前記基板1を加熱部2に載置させるべく没入退避させる前記リフターピン5を、この加熱部2内で待機させることなく加熱部2より更に下方位置まで前記ピン駆動部6により没入退避し得るように構成し、この加熱部2より下方位置からピン駆動部6により前記リフターピン5を加熱部2から貫通突出自在に構成したことを特徴とする基板加熱装置に係るものである。   A heating unit 2 that uniformly heats substantially the entire surface of the substrate 1 on which a film is formed or a laminate is laminated, and a substrate reception that is provided so as to be able to project through and retract from a large number of pin holes 3 provided in the heating unit 2 A substrate receiving mechanism comprising a large number of lifter pins 5 for support and a pin driving unit 6 for driving the large number of lifter pins 5 to advance and retreat, and the substrate receiving mechanism includes the lifter pins 5 in the pin holes of the heating unit 2. 3, the substrate 1 is received by supporting the substrate 1 with the lifter pins 5, and the substrate 1 is placed in the proximity of the heating unit 2 by immersing the protruding lifter pins 5 in the heating unit 2. Then, the heating unit 2 is configured to uniformly heat substantially the entire surface of the substrate 1, and the substrate 1 received and supported by the lifter pins 5 is immersed and retracted to be placed on the heating unit 2. The lifter pin 5 is configured to be retracted and retracted by the pin driving unit 6 to a position further below the heating unit 2 without waiting in the heating unit 2, and the pin is driven from a position below the heating unit 2. The substrate heating apparatus according to the present invention is characterized in that the lifter pin 5 is configured to be freely projecting and protruding from the heating unit 2 by the unit 6.

また、表面にフォトレジスト膜1aや配向膜等の塗布膜が形成された基板1の略全面を均一に加熱する加熱部2と、この加熱部2に設けた多数のピン孔3から貫通突出・没入退避自在に設けられる基板受け取り支承用の多数のリフターピン5とこの多数のリフターピン5を進退駆動するピン駆動部6とから成る基板受け取り機構とを備え、この基板受け取り機構は、前記リフターピン5を加熱部2のピン孔3から貫通突出させてこのリフターピン5で基板1を支承して基板1を受け取り、この突出状態のリフターピン5を加熱部2に没入させることで基板1を加熱部2に当接若しくは近接状態に載置して加熱部2により基板1の略全面を均一に加熱することで前記フォトレジスト膜1aや配向膜等の塗布膜のプリベークを行うように構成した基板加熱装置であって、前記リフターピン5で受け取り支承した前記基板1を加熱部2に載置させるべく没入退避させる前記リフターピン5を、この加熱部2内で待機させることなく加熱部2より更に下方位置まで前記ピン駆動部6により没入退避し得るように構成し、この加熱部2より下方位置からピン駆動部6により前記リフターピン5を加熱部2から貫通突出自在に構成したことを特徴とする基板加熱装置に係るものである。   In addition, a heating unit 2 that uniformly heats substantially the entire surface of the substrate 1 on which a coating film such as a photoresist film 1a or an alignment film is formed, and a plurality of pin holes 3 provided in the heating unit 2 project through and A substrate receiving mechanism comprising a large number of lifter pins 5 for receiving and supporting a substrate, which is provided so as to be retracted and retracted, and a pin drive unit 6 for driving the multiple lifter pins 5 forward and backward. The substrate receiving mechanism is provided with the lifter pins. 5 is inserted through and protruded from the pin hole 3 of the heating unit 2, the substrate 1 is supported by the lifter pin 5 to receive the substrate 1, and the protruding lifter pin 5 is immersed in the heating unit 2 to heat the substrate 1. The substrate 2 is placed in contact with or close to the part 2 and the heating part 2 uniformly heats substantially the entire surface of the substrate 1 so that the coating film such as the photoresist film 1a or the alignment film is pre-baked. It is a plate heating device, and the lifter pin 5 that is retracted and retracted so that the substrate 1 received and supported by the lifter pin 5 is placed on the heating unit 2 from the heating unit 2 without waiting in the heating unit 2. Further, the pin drive unit 6 is configured to be retracted and retracted to a lower position, and the lifter pin 5 is configured to be freely protruded from the heating unit 2 by the pin drive unit 6 from a position lower than the heating unit 2. This relates to a substrate heating apparatus.

また、前記加熱部2に設けたピン孔3と連通する進退用延長ピン孔部4を設け、この進退用延長ピン孔部4及び前記ピン孔3に沿って前記リフターピン5を加熱部2のピン孔3から貫通突出・没入退避自在に設け、この進退用延長ピン孔部4を介してリフターピン5を加熱部2の下方位置まで没入退避し得るように構成したことを特徴とする請求項1,2のいずれか1項に記載の基板加熱装置に係るものである。   Further, an extension / retraction extension pin hole portion 4 communicating with the pin hole 3 provided in the heating portion 2 is provided, and the lifter pin 5 is connected to the heating portion 2 along the extension / retraction extension pin hole portion 4 and the pin hole 3. A pinhole 3 is provided so as to be able to project through and retract, and the lifter pin 5 can be retracted and retracted to a position below the heating unit 2 through the extension pin hole 4 for advancement and retraction. The substrate heating apparatus according to any one of 1 and 2 is provided.

また、前記加熱部2の下方位置に退避した前記リフターピン5を冷却する冷却機構10を備えたことを特徴とする請求項1〜3のいずれか1項に記載の基板加熱装置に係るものである。   4. The substrate heating apparatus according to claim 1, further comprising a cooling mechanism 10 that cools the lifter pin 5 retracted to a position below the heating unit 2. is there.

また、前記冷却機構10に前記進退用延長ピン孔部4を設けて、この進退用延長ピン孔部4まで没入退避させたリフターピン5をこの冷却機構10により冷却し得るように構成したことを特徴とする請求項4記載の基板加熱装置に係るものである。   Further, the forward / backward extension pin hole portion 4 is provided in the cooling mechanism 10 and the lifter pin 5 retracted and retracted to the forward / backward extension pin hole portion 4 can be cooled by the cooling mechanism 10. 5. The substrate heating apparatus according to claim 4, wherein the substrate heating apparatus is characterized.

また、前記加熱部2の下方位置に退避した前記リフターピン5に前記加熱部2の熱の伝導若しくは放射熱を抑制する断熱部7を前記加熱部2と前記退避したリフターピン5との間に介在したことを特徴とする請求項1〜5のいずれか1項に記載の基板加熱装置に係るものである。   Further, a heat insulating portion 7 for suppressing conduction or radiant heat of the heating portion 2 is provided between the heating portion 2 and the retracted lifter pin 5 on the lifter pin 5 retracted to a position below the heating portion 2. The substrate heating apparatus according to claim 1, wherein the substrate heating apparatus is interposed.

また、前記加熱部2の下方位置に退避した前記リフターピン5に前記加熱部2の熱の伝導若しくは放射熱を抑制する断熱部7を前記加熱部2と前記退避したリフターピン5との間に介在せしめ、この断熱部7に前記加熱部2に設けたピン孔3と連通する進退用延長ピン孔部4を設け、この断熱部7に設けた進退用延長ピン孔部4及び前記ピン孔3に沿って前記リフターピン5を加熱部2のピン孔3から貫通突出・没入退避自在に設け、この断熱部7に設けた進退用延長ピン孔部4を介してリフターピン5を加熱部2の下方位置まで没入退避し得るように構成したことを特徴とする請求項2記載の基板加熱装置に係るものである。   Further, a heat insulating portion 7 for suppressing conduction or radiant heat of the heating portion 2 is provided between the heating portion 2 and the retracted lifter pin 5 on the lifter pin 5 retracted to a position below the heating portion 2. An advancing / retreating extension pin hole portion 4 communicating with a pin hole 3 provided in the heating portion 2 is provided in the heat insulating portion 7, and the advancing / retreating extension pin hole portion 4 provided in the heat insulating portion 7 and the pin hole 3 are interposed. The lifter pin 5 is provided so as to be able to project through and retract from the pin hole 3 of the heating unit 2 along the above-described direction, and the lifter pin 5 is connected to the heating unit 2 via the extension pin hole portion 4 provided in the heat insulating unit 7. 3. The substrate heating apparatus according to claim 2, wherein the substrate heating apparatus is configured to be able to immerse and retreat to a lower position.

また、前記加熱部2の下方位置に退避した前記リフターピン5に前記加熱部2の熱の伝導若しくは放射熱を抑制する断熱部7を前記加熱部2と前記退避したリフターピン5との間に介在せしめ、この断熱部7の下方位置に前記リフターピン5を冷却する冷却機構10を設け、前記断熱部7及び冷却機構10に前記進退用延長ピン孔部4を設けて、この冷却機構10に設けた進退用延長ピン孔部4まで没入退避させたリフターピン5をこの冷却機構10により冷却し得るように構成したことを特徴とする請求項5記載の基板加熱装置に係るものである。   Further, a heat insulating portion 7 for suppressing conduction or radiant heat of the heating portion 2 is provided between the heating portion 2 and the retracted lifter pin 5 on the lifter pin 5 retracted to a position below the heating portion 2. A cooling mechanism 10 for cooling the lifter pin 5 is provided at a position below the heat insulating portion 7, and the forward / backward extending pin hole portion 4 is provided in the heat insulating portion 7 and the cooling mechanism 10. 6. The substrate heating apparatus according to claim 5, wherein the lifter pin 5 retracted and retracted to the provided extension / retraction extension pin hole portion 4 can be cooled by the cooling mechanism 10.

また、前記加熱部2上に均熱板8を設け、この加熱部2及び均熱板8に設けた前記ピン孔3から突出した前記リフターピン5によって前記基板1を受け取り支承し、このリフターピン5が均熱板8に没入することで基板1を加熱部2上の均熱板8に当接若しくは近接状態に載置するように構成し、この均熱板8に基板1を支持する多数の突起部9を設けたことを特徴とする請求項1〜8のいずれか1項に記載の基板加熱装置に係るものである。   Further, a soaking plate 8 is provided on the heating unit 2, and the substrate 1 is received and supported by the lifter pins 5 protruding from the pin holes 3 provided in the heating unit 2 and the soaking plate 8, and the lifter pins 5 is immersed in the soaking plate 8 so that the substrate 1 is placed in contact with or in close proximity to the soaking plate 8 on the heating unit 2. 9. The substrate heating apparatus according to claim 1, wherein a projection 9 is provided.

本発明は、上述のように構成したから、基板サイズの変更に柔軟に対応できるのは勿論、リフターピンが退避時に加熱されにくく、これにより基板を局所的に加熱することがなく、基板に成膜した塗布膜等の被膜や積層物の特性が不均一となることを阻止でき、高品質な基板を作製できる極めて実用性に秀れた基板加熱装置となる。   Since the present invention is configured as described above, it can be flexibly adapted to changes in the substrate size, and the lifter pins are not easily heated during retraction, thereby preventing the substrate from being locally heated and being formed on the substrate. This makes it possible to prevent non-uniform characteristics of the coating film such as a coated film or a laminate, and to provide a substrate heating apparatus excellent in practicality capable of producing a high-quality substrate.

また、請求項3に記載の発明においては、簡易な制御でスムーズにリフターピンを進退駆動し得ることになる。   In the invention according to claim 3, the lifter pin can be smoothly driven forward and backward by simple control.

また、請求項4〜8に記載の発明においては、基板が局所的に加熱されることを一層良好に阻止できると共に、加熱部とこの加熱部より更に下方位置に没入退避するリフターピンとの間隔を一層狭くできることになる。   In the inventions according to claims 4 to 8, it is possible to better prevent the substrate from being locally heated, and to set the distance between the heating unit and the lifter pin that is further retracted and retracted to a position below the heating unit. It can be made even narrower.

また、請求項9に記載の発明においては、一層良好に基板の略全面を均一に加熱してより一層高品質の基板を作製できることになる。   In the invention described in claim 9, it is possible to produce a higher quality substrate by heating the substantially entire surface of the substrate more uniformly and more satisfactorily.

好適と考える本発明の実施形態(発明をどのように実施するか)を、図面に基づいて本発明の作用を示して簡単に説明する。   Embodiments of the present invention that are considered suitable (how to carry out the invention) will be briefly described with reference to the drawings, illustrating the operation of the present invention.

成膜装置により塗布膜が積層された基板1を、加熱部2から貫通突出させたリフターピン5で受け取り支承し、このリフターピン5を加熱部2に没入退避させることで基板1を下降させて加熱部2に載置し、この基板1を加熱部2により加熱・乾燥後、リフターピン5を加熱部2から貫通突出させることで基板1を上昇させて外部に受け渡す。   The substrate 1 on which the coating film is laminated by the film forming apparatus is received and supported by the lifter pin 5 penetrating and projecting from the heating unit 2, and the substrate 1 is lowered by retracting and retracting the lifter pin 5 into the heating unit 2. The substrate 1 is placed on the heating unit 2, heated and dried by the heating unit 2, and then lifted by the lifter pins 5 from the heating unit 2 to raise the substrate 1 and deliver it to the outside.

この際、リフターピン5は、加熱部2内で待機させることなく加熱部2より更に下方位置まで没入退避させることができるから、この加熱部2により基板1を加熱する際、この加熱部2より下方位置まで没入退避させておくことで、従来のように加熱部2内で待機させておく場合に比し、リフターピン5は加熱部2により加熱されにくくなる。   At this time, the lifter pin 5 can be retracted and retracted further to a lower position than the heating unit 2 without waiting in the heating unit 2. When the substrate 1 is heated by the heating unit 2, the heating unit 2 By immersing and retreating to the lower position, the lifter pin 5 is less likely to be heated by the heating unit 2 as compared with the case where the heating unit 2 is kept waiting as in the prior art.

従って、リフターピン5により受け取り支承される基板1が局所的に加熱されてしまうことを阻止でき、よって、基板1に形成された塗布膜の品質を均一に保つことが可能となる。   Accordingly, it is possible to prevent the substrate 1 received and supported by the lifter pins 5 from being locally heated, and thus the quality of the coating film formed on the substrate 1 can be kept uniform.

特に、例えば、加熱部2より更に下方位置まで没入退避したリフターピン5を冷却し得る冷却機構10を設けたり、この没入退避したリフターピン5と加熱部2との間に、この加熱部2の熱の伝導若しくは放射熱を抑制する断熱部7を介在したりすることで、このリフターピン5が加熱部2により一層加熱されにくくなり、従来のようにリフターピン5が加熱部3により加熱されず、加熱されたリフターピン5で基板1を受け取り支承するために基板1が局所的に熱されてしまうという問題は生じないから、一層高品質の基板1を簡易に作製できることになり、更に、加熱部2とこの加熱部2より下方位置まで没入退避したリフターピン5との距離が短くても、リフターピン5により基板1が局所的に加熱されることを良好に阻止できるから、加熱部2とこの加熱部2より下方位置まで没入退避せしめるリフターピン5との間隔を狭くして装置のコンパクト化を図れることになる。   In particular, for example, a cooling mechanism 10 that can cool the lifter pin 5 that is immersed and retracted to a position below the heating unit 2 is provided, or between the lifter pin 5 that is retracted and retracted and the heating unit 2, By interposing a heat insulating portion 7 that suppresses heat conduction or radiant heat, the lifter pin 5 becomes more difficult to be heated by the heating unit 2, and the lifter pin 5 is not heated by the heating unit 3 as in the past. Since the substrate 1 is received and supported by the heated lifter pins 5, there is no problem that the substrate 1 is locally heated. Therefore, a higher quality substrate 1 can be easily manufactured, Even if the distance between the part 2 and the lifter pin 5 that has been retracted and retracted to a position below the heating part 2 is short, it is possible to satisfactorily prevent the substrate 1 from being locally heated by the lifter pin 5. So that attained the size of the interval narrowing the apparatus with lifter pins 5 allowed to immersive retracted from the heating portion 2 of the heat portion 2 Toko to the lower position.

また、基板のエッジ部を支承する構成ではなく、多数のリフターピン5により多数点で基板1を支承・搬送する構成であるから、基板1の大きさが変わっても良好に支承できることになり、基板サイズの変更に対応して構造を変更する必要がないのは勿論、大型の基板1であっても確実に支承でき、それだけ汎用性に秀れたものとなる。   Moreover, since it is not the structure which supports the edge part of a board | substrate, but the structure which supports and conveys the board | substrate 1 by many points with many lifter pins 5, it will be able to support favorably even if the magnitude | size of the board | substrate 1 changes, Of course, it is not necessary to change the structure in accordance with the change in the substrate size, and even the large substrate 1 can be supported reliably, and the versatility is excellent.

更に、本発明は、リフターピン5をピン駆動部6により加熱部2に設けたピン孔3から貫通突出・没入退避自在に設ければ良く、特別な構成を付与する必要がないから、コスト安に既存の設備に適用できることになる。   Further, according to the present invention, the lifter pin 5 may be provided so as to be able to project through and retract from the pin hole 3 provided in the heating unit 2 by the pin driving unit 6, and it is not necessary to provide a special configuration. It can be applied to existing equipment.

また、例えば、前記加熱部2に設けたピン孔3と連通する進退用延長ピン孔部4を設け、この進退用延長ピン孔部4及び前記ピン孔3に沿って前記リフターピン5を加熱部2のピン孔3から貫通突出・没入退避自在に設け、この進退延長ピン孔部4を介してリフターピン5を加熱部2の下方位置まで没入退避し得るように構成した場合には、リフターピン5をピン孔3と進退用延長ピン孔部4とにより良好にガイドすることができ、簡易な制御でスムーズにリフターピン5を進退駆動し得ることになる。   Further, for example, an advance / retreat extension pin hole portion 4 communicating with the pin hole 3 provided in the heating portion 2 is provided, and the lifter pin 5 is connected to the heating portion along the advance / retreat extension pin hole portion 4 and the pin hole 3. When the lifter pin 5 is provided so as to be freely projecting through and retracted from the pin hole 3 of 2 and the lifter pin 5 can be retracted and retracted to the lower position of the heating unit 2 through the forward / backward extending pin hole portion 4, 5 can be satisfactorily guided by the pin hole 3 and the advancing / retreating extension pin hole portion 4, and the lifter pin 5 can be smoothly driven forward and backward by simple control.

また、例えば、前記加熱部2上に均熱板8を設け、この加熱部2及び均熱板8に設けた前記ピン孔3から突出した前記リフターピン5によって前記基板1を受け取り支承し、このリフターピン5が均熱板8に没入することで基板1を加熱部2上の均熱板8上に載置するように構成し、この均熱板8に基板1を支持する多数の突起部9を設けた場合には、一層良好に基板1の略全面を均一に加熱してより一層高品質の基板1を作製できることになる。   Further, for example, a soaking plate 8 is provided on the heating unit 2, and the substrate 1 is received and supported by the lifter pins 5 protruding from the pin holes 3 provided in the heating unit 2 and the soaking plate 8. The lifter pins 5 are immersed in the soaking plate 8 so that the substrate 1 is placed on the soaking plate 8 on the heating unit 2, and a large number of protrusions that support the substrate 1 on the soaking plate 8. 9 is provided, the substrate 1 of higher quality can be manufactured by heating the substantially entire surface of the substrate 1 more uniformly and evenly.

従って、本発明は、基板サイズの変更に柔軟に対応できるのは勿論、リフターピンにより基板を局所的に加熱することがなく、基板に成膜した塗布膜等の被膜や積層物の特性が局所的に変化することを阻止でき、高品質な基板を作製できる極めて実用性に秀れた基板加熱装置となる。   Therefore, the present invention can flexibly cope with a change in the substrate size, and does not locally heat the substrate with the lifter pins, so that the characteristics of the coating film such as a coating film formed on the substrate and the characteristics of the laminate are local. Therefore, the substrate heating apparatus is excellent in practicality and can produce a high-quality substrate.

本発明の具体的な実施例について図面に基づいて説明する。   Specific embodiments of the present invention will be described with reference to the drawings.

本実施例は、表面にフォトレジスト膜1aを形成した基板1の略全面を均一に加熱する加熱部2と、この加熱部2に設けた多数のピン孔3から貫通突出・没入退避自在に設けられる基板受け取り支承用の多数のリフターピン5とこの多数のリフターピン5を進退駆動するピン駆動部6とから成る基板受け取り機構とを備え、この基板受け取り機構は、前記リフターピン5を加熱部2のピン孔3から貫通突出させてこのリフターピン5で基板1を支承して基板1を受け取り、この突出状態のリフターピン5を加熱部2に没入させることで基板1を加熱部2に近接状態に載置して加熱部2により基板1の略全面を均一に加熱するように構成した基板加熱装置であって、前記リフターピン5で受け取り支承した前記基板1を加熱部2に載置させるべく没入退避させる前記リフターピン5を、この加熱部2内で待機させることなく加熱部2より更に下方位置まで前記ピン駆動部6により没入退避し得るように構成し、この加熱部2より下方位置からピン駆動部6により前記リフターピン5を加熱部2から貫通突出自在に構成したものである。   In this embodiment, a heating unit 2 that uniformly heats substantially the entire surface of the substrate 1 on which a photoresist film 1a is formed, and a large number of pin holes 3 provided in the heating unit 2 are provided so as to be able to project through and retract. A substrate receiving mechanism comprising a plurality of lifter pins 5 for supporting and receiving the substrate, and a pin driving unit 6 for driving the plurality of lifter pins 5 forward and backward. The substrate receiving mechanism includes a heating unit 2 that moves the lifter pins 5 to the heating unit 2. The substrate 1 is received by supporting the substrate 1 with the lifter pin 5 through the pin hole 3 and the lifter pin 5 in the protruding state is immersed in the heating unit 2 so that the substrate 1 is in the proximity of the heating unit 2. The substrate heating apparatus is configured to uniformly heat substantially the entire surface of the substrate 1 by the heating unit 2, and the substrate 1 received and supported by the lifter pins 5 should be placed on the heating unit 2. The lifter pin 5 to be immersed and retracted is configured to be retracted and retracted by the pin driving unit 6 to a position further below the heating unit 2 without waiting in the heating unit 2, and from the position below the heating unit 2. The lifter pin 5 is configured to be freely protruded from the heating unit 2 by a pin driving unit 6.

本実施例においては、図1に図示したように、筐体20に多段に設けた収納部20aに加熱部2と基板受け取り機構とを夫々設けた構成である。尚、本実施例においては収納部20aを上下方向に並設しているが、左右方向に並設した構成としても良い。   In the present embodiment, as shown in FIG. 1, the heating unit 2 and the substrate receiving mechanism are respectively provided in the storage unit 20 a provided in multiple stages in the housing 20. In the present embodiment, the storage portions 20a are arranged side by side in the vertical direction.

本実施例においては、図2,3に図示したように基板1よりやや広めの加熱部2(加熱板)の上に、この加熱部2と略同じ広さを有する均熱板8を載置重合している。この加熱部2と均熱板8とにはリフターピン5が通過するピン孔3を多数並設状態に穿設している。具体的にはこのピン孔3は平面視格子状となるように加熱部2及び均熱板8に設けている。ピン孔3はリフターピン5が通過し得る径であれば良く、基板1を均一に加熱するために可及的に小さい方が望ましい。   In the present embodiment, as shown in FIGS. 2 and 3, a heat equalizing plate 8 having substantially the same area as the heating unit 2 is placed on the heating unit 2 (heating plate) slightly wider than the substrate 1. Polymerized. A large number of pin holes 3 through which the lifter pins 5 pass are formed in the heating unit 2 and the soaking plate 8 in parallel. Specifically, the pin holes 3 are provided in the heating unit 2 and the soaking plate 8 so as to have a lattice shape in plan view. The pin hole 3 has only to have a diameter through which the lifter pin 5 can pass, and is preferably as small as possible in order to uniformly heat the substrate 1.

この加熱部2としては、通電により発熱するシーズヒータを埋め込んだアルミ板材などの通電発熱材から成るものが採用されており、均熱板8としては、この加熱部2からの熱を基板1(のフォトレジスト膜1a)に均一に付与するために、アルミ板材などの高熱伝導性材料から成るものが採用されている。   The heating unit 2 is made of an energized heating material such as an aluminum plate in which a sheathed heater that generates heat when energized is embedded. As the soaking plate 8, the heat from the heating unit 2 is transferred to the substrate 1 ( In order to uniformly apply to the photoresist film 1a), a material made of a highly heat conductive material such as an aluminum plate material is employed.

具体的には、加熱部2及び均熱板8に設けた前記ピン孔3から突出した前記リフターピン5によって前記基板1を受け取り支承し、このリフターピン5が均熱板8に没入することで基板1を加熱部2上の均熱板8上に載置するように構成し、この均熱板8に基板1を支持する多数の突起部9を平面視格子状となるように並設状態に突設している。   Specifically, the substrate 1 is received and supported by the lifter pins 5 protruding from the pin holes 3 provided in the heating unit 2 and the soaking plate 8, and the lifter pins 5 are immersed in the soaking plate 8. The substrate 1 is configured to be placed on a soaking plate 8 on the heating unit 2, and a large number of protrusions 9 that support the substrate 1 are arranged in parallel on the soaking plate 8 so as to have a lattice shape in plan view. It protrudes to.

この突起部9としては、均熱板8とは反対に、樹脂などの低熱伝導性材料から成るものを採用するのが好ましい。基板1は均熱板8上の多数の突起部9に支承されて載置されることになるが、この場合、基板1の突起部9との当接部のみに熱が伝わりやすく、ムラができてしまうことから、この突起部9からの基板1へ直接熱が伝導することを可及的に防ぐためである。また、この突起部9は、着脱自在に設定されている。   It is preferable to employ a projection made of a low thermal conductivity material such as a resin, as opposed to the soaking plate 8. The substrate 1 is supported and placed on a large number of protrusions 9 on the heat equalizing plate 8. In this case, heat is easily transmitted only to the contact portion of the substrate 1 with the protrusions 9, and unevenness is caused. This is to prevent heat from being directly conducted from the protrusion 9 to the substrate 1 as much as possible. Moreover, this projection part 9 is set so that attachment or detachment is possible.

尚、本実施例においては、ピン孔3及び突起部9を加熱部2若しくは均熱板8に夫々平面視格子状となるように設けているが、千鳥状等、他の配列としても良い。   In the present embodiment, the pin holes 3 and the protrusions 9 are provided on the heating unit 2 or the soaking plate 8 so as to have a lattice shape in plan view, but other arrangements such as a staggered pattern may be used.

また、このピン孔3と連通する進退用延長ピン孔部4を設け、この進退用延長ピン孔部4及び前記ピン孔3に沿って前記リフターピン5を加熱部2のピン孔3から貫通突出・没入退避自在に設け、この進退用延長ピン孔部4を介してリフターピン5を加熱部2の下方位置まで没入退避し得るように構成している。   Further, an extension / retraction extension pin hole portion 4 communicating with the pin hole 3 is provided, and the lifter pin 5 is protruded from the pin hole 3 of the heating portion 2 along the extension / retraction extension pin hole portion 4 and the pin hole 3. -It is provided so as to be able to be retracted and retracted, and the lifter pin 5 can be retracted and retracted to a position below the heating unit 2 via the extension / retraction extension pin hole 4.

具体的には、前記加熱部2の下方に、前記加熱部2の下方位置に退避した前記リフターピン5に前記加熱部2の熱の伝導若しくは放射熱を抑制する断熱材からなる断熱部7を前記加熱部2と前記退避したリフターピン5との間に介在し、この断熱部7に前記進退用延長ピン孔部4を設けている。断熱材としては樹脂などを採用すると良い。   Specifically, a heat insulating portion 7 made of a heat insulating material that suppresses conduction or radiant heat of the heating portion 2 to the lifter pin 5 retracted to a position below the heating portion 2 below the heating portion 2. The advancing / retreating extension pin hole 4 is provided in the heat insulating part 7, which is interposed between the heating part 2 and the retracted lifter pin 5. A resin or the like is preferably used as the heat insulating material.

更に、この断熱部7の下方に、断熱部7の下方位置に退避したリフターピン5の先端部5aを冷却する冷却機構10を設けている。この冷却機構10にも前記進退用延長ピン孔部4を設けている。従って、この冷却機構10に設けた進退用延長ピン孔部4と断熱部7に設けた進退用延長ピン孔部4とを介して細長く不安定なリフターピン5を径小なピン孔3に安定的に且つスムーズに挿入できることになる。   Furthermore, a cooling mechanism 10 is provided below the heat insulating portion 7 to cool the tip portion 5a of the lifter pin 5 retracted to a position below the heat insulating portion 7. The cooling mechanism 10 is also provided with the forward / backward extending pin hole 4. Accordingly, the elongated and unstable lifter pin 5 is stabilized in the small-diameter pin hole 3 through the forward / backward extension pin hole portion 4 provided in the cooling mechanism 10 and the forward / backward extension pin hole portion 4 provided in the heat insulating portion 7. Can be inserted smoothly and smoothly.

この進退用延長ピン孔部4が設けられる断熱部7及び冷却機構10は、図3に図示したように加熱部2及び均熱板8と異なり、板状でなくこの加熱部2と均熱板8とに設けたピン孔3と連通する進退用延長ピン孔部4を囲繞するような筒状体に形成され、多数のピン孔3の下方に夫々設けた構成としている。従って、既存の設備にも簡単に後付することができることになる。尚、断熱部7及び冷却機構10を加熱部2及び均熱板8と同様に板状に設定する等、他の構成としても良い。   As shown in FIG. 3, the heat insulating portion 7 and the cooling mechanism 10 provided with the extending / retracting extension pin hole portion 4 are not plate-shaped, but the heating portion 2 and the heat equalizing plate, unlike the heating portion 2 and the heat equalizing plate 8. 8 is formed in a cylindrical body that surrounds the forward / backward extending pin hole portion 4 communicating with the pin hole 3 provided at 8, and is provided below each of the many pin holes 3. Therefore, it can be easily retrofitted to existing equipment. The heat insulating section 7 and the cooling mechanism 10 may have other configurations such as a plate shape similar to the heating section 2 and the soaking plate 8.

また、進退用延長ピン孔部4は、ピン孔3と同様、リフターピン5が通過し得る径であれば良く、特に、断熱部7の進退用延長ピン孔部4は、加熱部2からのこの加熱部2の下方に位置するリフターピン5への熱の影響を抑制するために可及的に小さい径に設定するのが望ましい。従って、例えば冷却機構10の進退用延長ピン孔部4をやや径大に設定し、断熱部7の進退用延長ピン孔部4及びピン孔3をやや径小に設定することで、加熱部2下方への熱の影響を可及的に少なくしつつリフターピン5の安定的且つスムーズな挿入を達成できることになる。   Further, the advance / retreat extension pin hole portion 4 may have a diameter that allows the lifter pin 5 to pass therethrough as in the case of the pin hole 3. In particular, the advance / retreat extension pin hole portion 4 of the heat insulating portion 7 extends from the heating portion 2. It is desirable to set the diameter as small as possible in order to suppress the influence of heat on the lifter pin 5 located below the heating unit 2. Therefore, for example, by setting the forward / backward extension pin hole 4 of the cooling mechanism 10 to be slightly larger in diameter and setting the forward / backward extension pin hole 4 and the pin hole 3 of the heat insulating part 7 to be slightly smaller in diameter, the heating part 2 Stable and smooth insertion of the lifter pin 5 can be achieved while reducing the influence of the downward heat as much as possible.

本実施例のリフターピン5は、このリフターピン5の先端部5aが、少なくとも加熱部2に設けたピン孔3から抜出する位置まで没入退避し得るように構成している。具体的には、リフターピン5を前記冷却機構10の進退用延長ピン孔部4までピン駆動部6により没入退避し得るように構成し、この冷却機構10の進退用延長ピン孔部4からピン駆動部6によりリフターピン5を加熱部2から貫通突出自在に構成している。   The lifter pin 5 of the present embodiment is configured such that the front end portion 5a of the lifter pin 5 can be retracted and retracted at least to a position where it is extracted from the pin hole 3 provided in the heating unit 2. Specifically, the lifter pin 5 is configured to be retracted and retracted by the pin driving unit 6 up to the advance / retreat extended pin hole 4 of the cooling mechanism 10. The lifter pin 5 is configured to be freely protruded from the heating unit 2 by the driving unit 6.

従って、リフターピン5は、前記加熱部2により基板1を加熱する際、加熱される加熱部2若しくは均熱板8内に位置せしめないように設定することで、リフターピン5が加熱部2により加熱されず、基板1を受け取り支承しても、この基板1のリフターピン5の先端部5aとの当接部が加熱されないことになり、基板1上のフォトリソグラフィー工程時に用いられる公知のフォトレジスト膜1aの特性を可及的に均一にすることができる。即ち、フォトレジスト膜1aの一部の現像性が悪化することが阻止されるから、回路パターンの一部の線幅が太くなってしまうことを防止できることになり、極めて良好な表示品質を達成できることになる。   Accordingly, the lifter pin 5 is set so as not to be positioned in the heated heating unit 2 or the soaking plate 8 when the substrate 1 is heated by the heating unit 2, so that the lifter pin 5 is moved by the heating unit 2. Even if the substrate 1 is received and supported without being heated, the contact portion of the substrate 1 with the tip portion 5a of the lifter pin 5 is not heated, so that a known photoresist used in the photolithography process on the substrate 1 is used. The characteristics of the film 1a can be made as uniform as possible. That is, since it is prevented that the developability of a part of the photoresist film 1a is deteriorated, it is possible to prevent a part of the line width of the circuit pattern from becoming thick and to achieve extremely good display quality. become.

尚、本実施例においては、塗布膜として基板1にスパッタ法やCVD法により成膜された薄膜状にコーター等の適宜な塗布手段により塗布されたフォトレジスト膜1aを採用しているが、例えば配向膜等、他の塗布膜が形成されていても良い。   In this embodiment, a photoresist film 1a applied to the substrate 1 by a suitable coating means such as a coater in the form of a thin film formed on the substrate 1 by sputtering or CVD is used as the coating film. Other coating films such as an alignment film may be formed.

リフターピン5を進退駆動するピン駆動部6は、加熱部2の下方位置に設けられるサーボモータ17と、このサーボモータ17の駆動軸と連結されアーム22を駆動するアーム駆動部21(カムクランク)と、このアーム22と連結され、アーム22の駆動により上下方向に移動せしめられ、複数のリフターピン5の基端部が固定されるピン搬送部18とから成り、サーボモータ17の駆動を適宜に制御してピン搬送部18を上下方向に移動せしめることで、このピン搬送部18に固定される複数のリフターピン5を同時に進退駆動するように構成している。   The pin drive unit 6 that drives the lifter pin 5 forward and backward is a servo motor 17 provided below the heating unit 2 and an arm drive unit 21 (cam crank) that is connected to the drive shaft of the servo motor 17 and drives the arm 22. And a pin transport section 18 connected to the arm 22 and moved in the vertical direction by driving of the arm 22 and to which the base end portions of the plurality of lifter pins 5 are fixed. A plurality of lifter pins 5 fixed to the pin transport unit 18 are simultaneously driven forward and backward by controlling and moving the pin transport unit 18 in the vertical direction.

本実施例においては、図4に図示したように、ピン搬送部18に全てのリフターピン5を固定して全てのリフターピン5を一のサーボモータ17で同時に進退駆動し得るように構成している。   In the present embodiment, as shown in FIG. 4, all lifter pins 5 are fixed to the pin transport unit 18, and all the lifter pins 5 can be driven forward and backward simultaneously by a single servo motor 17. Yes.

従って、各リフターピン5を別個に進退駆動せしめることなく、まとめて制御できることになり、それだけ装置の簡略化を図ることができ、また、各リフターピン5の駆動量をリンクさせることが容易で基板1をより安定的に水平状態で受け取り支承できることになる。   Accordingly, the lifter pins 5 can be collectively controlled without being driven forward and backward separately, so that the apparatus can be simplified, and the drive amount of the lifter pins 5 can be easily linked. 1 can be received and supported in a horizontal state more stably.

具体的には、ピン駆動部6は、リフターピン5を、進退駆動中に途中で止めることなく一連の突出動作で基板1を受け取り支承する位置若しくは一連の没入動作で退避位置(冷却機構10)まで駆動せしめるように構成している。よって、リフターピン5の駆動制御は極めて容易で且つ加熱部2及び均熱板8からの熱の影響を可及的に低減できることになる。   Specifically, the pin driving unit 6 does not stop the lifter pin 5 during advancing and retreating operation, and receives and supports the substrate 1 by a series of protruding operations or a retreating position (cooling mechanism 10) by a series of immersion operations. It is comprised so that it may drive to. Therefore, the drive control of the lifter pin 5 is extremely easy, and the influence of heat from the heating unit 2 and the soaking plate 8 can be reduced as much as possible.

また、本実施例は、上述のような冷却機構10を設けたため、リフターピン5を長くし、且つリフターピン5を加熱部2及び均熱板8内で待機せしめないようにリフターピン5の搬送ストロークを長くしている。そのため、これらに起因して加熱部2の下方空間が拡大してしまうことは避けられない。そこで、この拡大を可及的に抑制するために、図9に図示したように、ピン駆動部6のアーム駆動部21のアーム22と連結する駆動軸23がピン搬送部18の上下可動範囲内、即ちピン搬送部18の可動範囲の下限位置より上方(具体的には上下可動範囲の略中央)に位置するように配設せしめ、また、軸25が挿通するスライドブッシュ26をピン搬送部18の上方に突出した状態で設けた構成としている。   Further, in the present embodiment, since the cooling mechanism 10 as described above is provided, the lifter pin 5 is lengthened and the lifter pin 5 is transported so that the lifter pin 5 does not stand by in the heating unit 2 and the soaking plate 8. The stroke is lengthened. Therefore, it is inevitable that the space below the heating unit 2 is expanded due to these factors. Therefore, in order to suppress this enlargement as much as possible, as shown in FIG. 9, the drive shaft 23 connected to the arm 22 of the arm drive unit 21 of the pin drive unit 6 is within the vertically movable range of the pin transport unit 18. In other words, the slide bushing 26 is disposed so as to be positioned above the lower limit position of the movable range of the pin transport unit 18 (specifically, substantially at the center of the vertical movable range), and the slide bush 26 through which the shaft 25 is inserted is provided. It is set as the structure provided in the state protruded above.

また、アーム22はピン搬送部18と連結体24を介して連結され、この連結体24にはアーム先端部に取り付けられたナット29がスライド自在に保持される溝30が形成されており、アーム22の回転に伴いナット29が溝30内をスライド移動するように構成している。従って、アーム22を駆動することでピン搬送部18は上下方向に水平移動する。尚、図中符号28はアーム駆動部21等が設けられる底板27を支持する柱である。   Further, the arm 22 is connected to the pin conveying portion 18 via a connecting body 24, and the connecting body 24 is formed with a groove 30 in which a nut 29 attached to the tip of the arm is slidably held. The nut 29 is configured to slide in the groove 30 with the rotation of 22. Accordingly, by driving the arm 22, the pin transport unit 18 is moved horizontally in the vertical direction. In the figure, reference numeral 28 denotes a column that supports the bottom plate 27 on which the arm driving portion 21 and the like are provided.

上記図9に図示した構成によれば、図10に図示したような、アーム駆動部53のアーム52と連結する駆動軸51がピン搬送部18の可動範囲の下限位置より下方に位置し、且つ軸25が挿通するスライドブッシュ26がピン搬送部18の下方に突出した状態で設けた従来からある構造のピン駆動部50を採用した場合に比して、アーム駆動部21の駆動軸23より下方のスペースを縮小でき、また、スライドブッシュ26をピン搬送部18の上方に突出した状態とすることで、加熱部2の下方に設けた冷却機構10により形成される無駄な空間を有効利用できるから、加熱部2の下方空間の拡大を可及的に抑制できることになる。尚、図中符号54は、アーム52とピン搬送部18とを連結する連結体である。   According to the configuration shown in FIG. 9, the drive shaft 51 connected to the arm 52 of the arm drive unit 53 as shown in FIG. 10 is located below the lower limit position of the movable range of the pin transport unit 18, and Compared to the case where a pin drive unit 50 having a conventional structure provided with a slide bush 26 through which the shaft 25 is inserted protrudes below the pin conveying unit 18 is lower than the drive shaft 23 of the arm drive unit 21 In addition, since the slide bush 26 protrudes above the pin transport unit 18, the useless space formed by the cooling mechanism 10 provided below the heating unit 2 can be used effectively. The expansion of the space below the heating unit 2 can be suppressed as much as possible. Incidentally, reference numeral 54 in the figure denotes a connecting body that connects the arm 52 and the pin transport section 18.

具体的には、図10に図示した構成のピン駆動部50を採用した場合には加熱部2の下方空間の寸法は434mmとなるところ、図9に図示した構成によれば、前記寸法を310mmとして、124mmの省スペース化を達成でき、それだけ上記構成に起因する加熱部2の下方空間の拡大を抑制できるから、図10のピン搬送部50を採用する場合に比し、収納部20aを筐体20により多段に設けることが可能になる(若しくは筐体20の小型化を図れることになる。)。   Specifically, when the pin driving unit 50 having the configuration illustrated in FIG. 10 is employed, the dimension of the lower space of the heating unit 2 is 434 mm. According to the configuration illustrated in FIG. Thus, a space saving of 124 mm can be achieved, and the expansion of the lower space of the heating unit 2 due to the above configuration can be suppressed accordingly. Therefore, the storage unit 20a is provided in a housing as compared with the case where the pin transport unit 50 of FIG. The body 20 can be provided in multiple stages (or the housing 20 can be downsized).

また、図5に図示したようにリフターピン5の先端部5aは着脱自在に設定されており、上述の均熱板8の突起部9と同様、樹脂などの低熱伝導性材料から成るものを採用している。従って、この点からも基板1上のフォトレジスト膜1aの特性の不均一化は阻止できる。尚、リフターピン5の先端部5a以外の部分も前記低熱伝導性材料で形成するのが望ましい。   Further, as shown in FIG. 5, the tip portion 5a of the lifter pin 5 is set to be detachable, and like the projection portion 9 of the heat equalizing plate 8, the one made of a low heat conductive material such as resin is adopted. is doing. Therefore, also from this point, the non-uniform characteristics of the photoresist film 1a on the substrate 1 can be prevented. In addition, it is desirable to form parts other than the front-end | tip part 5a of the lifter pin 5 with the said low heat conductive material.

本実施例の冷却機構10は、図6に図示したように中心部に進退延長用ピン孔部4が穿設され、リフターピン5の先端側を略囲繞する形状に設定された冷却部11と、この冷却部11に冷却媒体としてのエアーを送風するエアー送風部31とを有し、冷却部11にリフターピン5にエアーを吹き付けるための吹き付け孔11aを設け、このエアー送風部31からのエアーによりリフターピン5を直接冷却し得るように構成している。尚、符号19はエアー送風部31から冷却部11へエアーを送風するための送風路である。また、図4に図示したように、エアーはエアー送風部31から複数の冷却部11に夫々送風される。   As shown in FIG. 6, the cooling mechanism 10 of the present embodiment has a forward and backward extending pin hole portion 4 formed in the center portion, and a cooling portion 11 set in a shape that substantially surrounds the tip end side of the lifter pin 5. The cooling section 11 has an air blowing section 31 for blowing air as a cooling medium, and the cooling section 11 is provided with a blowing hole 11a for blowing air to the lifter pin 5, and the air from the air blowing section 31 is provided. Thus, the lifter pin 5 can be directly cooled. Reference numeral 19 denotes a blower passage for blowing air from the air blower 31 to the cooling unit 11. Further, as illustrated in FIG. 4, air is blown from the air blowing unit 31 to the plurality of cooling units 11.

従って、本実施例は、加熱部2とこの加熱部2より更に下方位置に没入退避したリフターピン5との間に断熱部7を設け、この断熱部7の下方にリフターピン5の先端側を略囲繞する冷却部11を有する冷却機構10を設けたから、加熱部2とリフターピン5との間隔を最小限に抑えつつ、このリフターピン5の加熱部2による加熱を確実に阻止できる構成である。   Therefore, in the present embodiment, the heat insulating portion 7 is provided between the heating portion 2 and the lifter pin 5 that is immersed and retracted further below the heating portion 2, and the tip side of the lifter pin 5 is disposed below the heat insulating portion 7. Since the cooling mechanism 10 having the cooling unit 11 that substantially surrounds is provided, the heating unit 2 can be reliably prevented from being heated by the heating unit 2 while minimizing the distance between the heating unit 2 and the lifter pin 5. .

具体的には、エアー送風部31は、公知のボルテックスチューブとコンプレッサとから成り、このコンプレッサからの圧縮エアーをボルテックスチューブに導入することにより、断熱膨張を利用して冷却せしめたエアーを前記リフターピン5に吹き付けるように構成している。尚、他の手段により冷却したエアーを吹き付けても良い。   Specifically, the air blowing section 31 is composed of a known vortex tube and a compressor, and by introducing the compressed air from the compressor into the vortex tube, the air cooled by adiabatic expansion is used as the lifter pin. 5 is sprayed. Note that air cooled by other means may be blown.

また、本実施例においては、上述のような冷却機構10を採用しているが、他の構成、例えば、図7に図示したように冷却部12に、供給路13から供給される水等の適宜な冷却液を流通せしめる流通孔12aを設けて、この冷却液により冷却部12を冷却することでリフターピン5を冷却する構成や、図8に図示したように冷却部14に冷却面が面接するようにペルチェ素子15を設け、このペルチェ素子15にコード16から電流を流してその吸熱作用により冷却部14を冷却する構成としても良い。この場合には、冷却部12,14により間接的にリフターピン5を冷却する構成であるから、冷却部12,14に穿設される進退用延長ピン孔部4は可及的に径小とするのが望ましい。   Further, in the present embodiment, the cooling mechanism 10 as described above is adopted, but other configurations such as water supplied from the supply path 13 to the cooling unit 12 as illustrated in FIG. A flow hole 12a through which an appropriate cooling liquid is circulated is provided, and the cooling part 12 is cooled by this cooling liquid to cool the lifter pin 5, and the cooling surface is in contact with the cooling part 14 as shown in FIG. Thus, a Peltier element 15 may be provided, and a current may be supplied from the cord 16 to the Peltier element 15 to cool the cooling unit 14 by its heat absorption. In this case, since the lifter pin 5 is indirectly cooled by the cooling portions 12 and 14, the forward and backward extension pin hole portion 4 formed in the cooling portions 12 and 14 has a diameter as small as possible. It is desirable to do.

本実施例は上述のように構成したから、成膜装置によりフォトレジスト膜1aが形成された基板1を、加熱部2から貫通突出させたリフターピン5で受け取り支承し、このリフターピン5を加熱部2に没入退避させることで基板1を下降させて加熱部2に載置し、この基板1を加熱部2により加熱・乾燥後、リフターピン5を加熱部2から貫通突出させることで基板1を上昇させて外部に受け渡す際、リフターピン5は、加熱部2内で待機させることなく加熱部2より更に下方位置まで没入退避させることができるから、この加熱部2により基板1を加熱する際、この加熱部2より下方位置まで没入退避させておくことで、従来のように加熱部2内で待機させておく場合に比し、リフターピン5は加熱部2により加熱されにくくなる。   Since the present embodiment is configured as described above, the substrate 1 on which the photoresist film 1a is formed by the film forming apparatus is received and supported by the lifter pin 5 penetrating and projecting from the heating unit 2, and the lifter pin 5 is heated. The substrate 1 is lowered and placed in the heating unit 2 by being retracted into and retracted from the unit 2, and after the substrate 1 is heated and dried by the heating unit 2, the lifter pin 5 is protruded from the heating unit 2 to protrude through the substrate 1. Since the lifter pin 5 can be retracted to a lower position than the heating unit 2 without waiting in the heating unit 2, the substrate 1 is heated by the heating unit 2. At this time, the lifter pin 5 is less likely to be heated by the heating unit 2 than when it is kept waiting in the heating unit 2 as in the prior art by immersing and retracting to a position below the heating unit 2.

従って、リフターピン5が加熱されにくくなることで、このリフターピン5により受け取り支承される基板1が局所的に加熱されてしまうことを阻止でき、よって、基板1に形成されたフォトレジスト膜1aの品質を均一に保つことが可能となる。   Accordingly, since the lifter pin 5 becomes difficult to be heated, it is possible to prevent the substrate 1 received and supported by the lifter pin 5 from being locally heated. Accordingly, the photoresist film 1a formed on the substrate 1 is prevented from being heated. It becomes possible to keep the quality uniform.

特に、加熱部2より更に下方位置まで没入退避したリフターピン5を冷却し得る冷却機構10を設けると共に、この没入退避したリフターピン5と加熱部2との間に、この加熱部2の熱の伝導若しくは放射熱を抑制する断熱部7を介在したから、このリフターピン5が加熱部2により加熱されることを確実に阻止でき、従来のようにリフターピン5が加熱部3により加熱されず、加熱されたリフターピン5で基板1を受け取り支承するために基板1が局所的に熱されてしまうという問題は生じないから、一層高品質の基板1を簡易に作製できることになり、更に、加熱部2とこの加熱部2より下方位置まで没入退避したリフターピン5との距離が短くても、リフターピン5が加熱されることを阻止できるから、装置のコンパクト化を図れることになる。   In particular, a cooling mechanism 10 that can cool the lifter pin 5 that has been immersed and retracted to a position further below the heating unit 2 is provided, and between the lifter pin 5 that has been retracted and retracted and the heating unit 2, Since the heat insulating part 7 that suppresses conduction or radiant heat is interposed, the lifter pin 5 can be reliably prevented from being heated by the heating part 2, and the lifter pin 5 is not heated by the heating part 3 as in the prior art. Since the substrate 1 is received and supported by the heated lifter pins 5, there is no problem that the substrate 1 is locally heated, so that a higher quality substrate 1 can be easily manufactured. Since the lifter pin 5 can be prevented from being heated even if the distance between the lifter pin 5 and the lifter pin 5 that is retracted and retracted to a position below the heating unit 2 is short, the apparatus can be made compact. It made.

また、基板のエッジ部を支承する構成ではなく、多数のリフターピン5により多数点で基板1を支承・搬送する構成であるから、基板1の大きさが変わっても良好に支承できることになり、基板サイズの変更に対応して構造を変更する必要がないのは勿論、大型の基板1であっても確実に支承でき、それだけ汎用性に秀れたものとなる。   Moreover, since it is not the structure which supports the edge part of a board | substrate, but the structure which supports and conveys the board | substrate 1 by many points with many lifter pins 5, it will be able to support favorably even if the magnitude | size of the board | substrate 1 changes, Of course, it is not necessary to change the structure in accordance with the change in the substrate size, and even the large substrate 1 can be supported reliably, and the versatility is excellent.

更に、本実施例は、リフターピン5をピン駆動部6により加熱部2に設けたピン孔3から貫通突出・没入退避自在に設ければ良く、特別な構成を付与する必要がないから、コスト安に既存の設備に適用できることになる。   Furthermore, in this embodiment, the lifter pin 5 may be provided so as to be able to project through and retract from the pin hole 3 provided in the heating unit 2 by the pin driving unit 6, and it is not necessary to provide a special configuration. It can be applied to existing facilities at low cost.

また、前記加熱部2に設けたピン孔3の下方に断熱部7と冷却機構10とを連設状態に設け、この断熱部7と冷却機構10に夫々前記ピン孔3と連通する進退用延長ピン孔部4を設け、この進退用延長ピン孔部4及び前記ピン孔3に沿って前記リフターピン5を加熱部2のピン孔3から貫通突出・没入退避自在に設け、この進退用延長ピン孔部4を介してリフターピン5を加熱部2の下方位置まで没入退避し得るように構成したから、リフターピン5をピン孔3と進退用延長ピン孔部4とにより良好にガイドすることができ、それだけスムーズにリフターピン5を進退駆動し得ることになる。   Further, a heat insulating portion 7 and a cooling mechanism 10 are provided in a connected state below the pin hole 3 provided in the heating portion 2, and the forward / backward extension that communicates with the pin hole 3 through the heat insulating portion 7 and the cooling mechanism 10, respectively. A pin hole portion 4 is provided, and the lifter pin 5 is provided so as to protrude through and retract from the pin hole 3 of the heating portion 2 along the extension pin hole portion 4 and the pin hole 3. Since the lifter pin 5 can be retracted and retracted to the lower position of the heating unit 2 through the hole 4, the lifter pin 5 can be well guided by the pin hole 3 and the advance / retreat extension pin hole 4. As a result, the lifter pin 5 can be driven forward and backward smoothly.

また、前記加熱部2上に均熱板8を設け、この加熱部2及び均熱板8に設けた前記ピン孔3から突出した前記リフターピン5によって前記基板1を受け取り支承し、このリフターピン5が均熱板8に没入することで基板1を加熱部2上の均熱板8上に載置するように構成し、この均熱板8に基板1を支持する多数の突起部9を設けたから、一層確実に基板1の略全面を均一に加熱してより一層高品質の基板1を作製できることになる。   Further, a soaking plate 8 is provided on the heating unit 2, and the substrate 1 is received and supported by the lifter pins 5 protruding from the pin holes 3 provided in the heating unit 2 and the soaking plate 8, and the lifter pins 5 is immersed in the soaking plate 8 so that the substrate 1 is placed on the soaking plate 8 on the heating unit 2, and a plurality of protrusions 9 that support the substrate 1 are provided on the soaking plate 8. Since it is provided, the substrate 1 of higher quality can be manufactured by heating the substantially entire surface of the substrate 1 more reliably and uniformly.

従って、本実施例は、基板サイズの変更に柔軟に対応できるのは勿論、リフターピンにより基板を局所的に加熱することがなく、基板に成膜した被膜や積層物の特性が局所的に変化することを阻止でき、高品質な基板を作製できる極めて実用性に秀れた基板加熱装置となる。   Therefore, this embodiment can flexibly cope with the change in the substrate size, and does not locally heat the substrate by the lifter pins, and the characteristics of the film or laminate formed on the substrate change locally. Therefore, the substrate heating apparatus is excellent in practicality and capable of producing a high-quality substrate.

尚、本発明は、本実施例に限られるものではなく、各構成要件の具体的構成は適宜設計し得るものである。   The present invention is not limited to the present embodiment, and the specific configuration of each component can be designed as appropriate.

本実施例の概略説明斜視図である。It is a schematic explanatory perspective view of a present Example. 本実施例の構成概略説明図である。It is a structure schematic explanatory drawing of a present Example. 本実施例の要部の拡大概略説明断面図である。It is an expansion outline explanatory sectional view of the important section of this example. 本実施例の一部を切り欠いた概略説明平面図である。It is a schematic explanatory plan view in which a part of the present embodiment is cut out. 本実施例のリフターピンの拡大概略説明図である。It is an expansion schematic explanatory drawing of the lifter pin of a present Example. 本実施例のピン孔及び進退用延長ピン孔部の拡大概略説明断面図である。It is an expansion outline explanation sectional view of a pin hole of this example, and an extension pin hole part for advance and retreat. 別例の冷却機構の構成概略説明断面図であるFIG. 6 is a schematic cross-sectional view of a configuration of another example cooling mechanism. 別例の冷却機構の構成概略説明断面図である。It is a structure schematic explanatory sectional drawing of the cooling mechanism of another example. 本実施例のピン駆動部の拡大概略説明側面図である。It is an expansion outline explanatory side view of the pin drive part of a present Example. 本実施例のピン駆動部の拡大概略説明側面図である。It is an expansion outline explanatory side view of the pin drive part of a present Example.

符号の説明Explanation of symbols

1 基板
1a フォトレジスト膜
2 加熱部
3 ピン孔
4 進退用延長ピン孔部
5 リフターピン
6 ピン駆動部
7 断熱部
8 均熱板
9 突起部
10 冷却機構
DESCRIPTION OF SYMBOLS 1 Substrate 1a Photoresist film 2 Heating part 3 Pin hole 4 Extension pin hole part for advancing / retreating 5 Lifter pin 6 Pin drive part 7 Heat insulation part 8 Heat equalizing plate 9 Protrusion part
10 Cooling mechanism

Claims (9)

表面に被膜を形成若しくは積層物を積層した基板の略全面を均一に加熱する加熱部と、この加熱部に設けた多数のピン孔から貫通突出・没入退避自在に設けられる基板受け取り支承用の多数のリフターピンとこの多数のリフターピンを進退駆動するピン駆動部とから成る基板受け取り機構とを備え、この基板受け取り機構は、前記リフターピンを加熱部のピン孔から貫通突出させてこのリフターピンで基板を支承して基板を受け取り、この突出状態のリフターピンを加熱部に没入させることで基板を加熱部に近接状態に載置して加熱部により基板の略全面を均一に加熱するように構成した基板加熱装置であって、前記リフターピンで受け取り支承した前記基板を加熱部に載置させるべく没入退避させる前記リフターピンを、この加熱部内で待機させることなく加熱部より更に下方位置まで前記ピン駆動部により没入退避し得るように構成し、この加熱部より下方位置からピン駆動部により前記リフターピンを加熱部から貫通突出自在に構成したことを特徴とする基板加熱装置。   A heating unit that uniformly heats almost the entire surface of a substrate on which a film is formed or a laminate is laminated, and a large number of substrate receiving supports that are provided so as to be able to project through and retract from a number of pin holes provided in the heating unit. A substrate receiving mechanism comprising a lifter pin and a pin driving portion for driving the multiple lifter pins forward and backward. The substrate receiving mechanism projects the lifter pin from the pin hole of the heating unit and projects the substrate with the lifter pin. The substrate is received by supporting the substrate, and the protruding lifter pin is immersed in the heating unit so that the substrate is placed in the proximity of the heating unit, and the heating unit heats the substantially entire surface of the substrate uniformly. A substrate heating apparatus, wherein the lifter pin that retracts and retracts the substrate received and supported by the lifter pin to be placed on the heating unit is waited in the heating unit. The pin drive unit is configured to be able to be retracted and retracted to a lower position than the heating unit without causing the lifter pin to be protruded from the heating unit through the pin drive unit from a position below the heating unit. A substrate heating apparatus. 表面にフォトレジスト膜や配向膜等の塗布膜が形成された基板の略全面を均一に加熱する加熱部と、この加熱部に設けた多数のピン孔から貫通突出・没入退避自在に設けられる基板受け取り支承用の多数のリフターピンとこの多数のリフターピンを進退駆動するピン駆動部とから成る基板受け取り機構とを備え、この基板受け取り機構は、前記リフターピンを加熱部のピン孔から貫通突出させてこのリフターピンで基板を支承して基板を受け取り、この突出状態のリフターピンを加熱部に没入させることで基板を加熱部に当接若しくは近接状態に載置して加熱部により基板の略全面を均一に加熱することで前記フォトレジスト膜や配向膜等の塗布膜のプリベークを行うように構成した基板加熱装置であって、前記リフターピンで受け取り支承した前記基板を加熱部に載置させるべく没入退避させる前記リフターピンを、この加熱部内で待機させることなく加熱部より更に下方位置まで前記ピン駆動部により没入退避し得るように構成し、この加熱部より下方位置からピン駆動部により前記リフターピンを加熱部から貫通突出自在に構成したことを特徴とする基板加熱装置。   A heating unit that uniformly heats substantially the entire surface of a substrate having a coating film such as a photoresist film or an alignment film formed on the surface, and a substrate that is provided so as to be able to project through and retreat from a large number of pin holes provided in the heating unit. A substrate receiving mechanism comprising a number of lifter pins for receiving support and a pin drive unit for driving the plurality of lifter pins to advance and retreat, and the substrate receiving mechanism projects the lifter pins through the pin holes of the heating unit. The lifter pin supports the substrate to receive the substrate, and the protruding lifter pin is immersed in the heating portion so that the substrate is brought into contact with or close to the heating portion, and the heating portion covers substantially the entire surface of the substrate. A substrate heating apparatus configured to pre-bake the coating film such as the photoresist film and the alignment film by uniformly heating, wherein the substrate heating apparatus receives and supports the lifter pin. In addition, the lifter pin for immersing and retreating the substrate to be placed on the heating unit is configured to be retracted and retracted by the pin driving unit to a position further below the heating unit without waiting in the heating unit. A substrate heating apparatus, wherein the lifter pin is configured to be freely protruded from the heating unit by a pin driving unit from a position below the unit. 前記加熱部に設けたピン孔と連通する進退用延長ピン孔部を設け、この進退用延長ピン孔部及び前記ピン孔に沿って前記リフターピンを加熱部のピン孔から貫通突出・没入退避自在に設け、この進退用延長ピン孔部を介してリフターピンを加熱部の下方位置まで没入退避し得るように構成したことを特徴とする請求項1,2のいずれか1項に記載の基板加熱装置。   An extension pin hole portion for advancing and retreating that communicates with a pin hole provided in the heating portion is provided, and the lifter pin can be protruded through and retracted from the pin hole of the heating portion along the extension pin hole portion for advancement and retraction and the pin hole. The substrate heating according to any one of claims 1 and 2, wherein the lifter pin can be retracted and retracted to a position below the heating portion through the extension pin hole portion for advancement and retraction. apparatus. 前記加熱部の下方位置に退避した前記リフターピンを冷却する冷却機構を備えたことを特徴とする請求項1〜3のいずれか1項に記載の基板加熱装置。   The substrate heating apparatus according to claim 1, further comprising a cooling mechanism that cools the lifter pin retracted to a position below the heating unit. 前記冷却機構に前記進退用延長ピン孔部を設けて、この進退用延長ピン孔部まで没入退避させたリフターピンをこの冷却機構により冷却し得るように構成したことを特徴とする請求項4記載の基板加熱装置。   5. The advancing / retreating extension pin hole portion is provided in the cooling mechanism, and the lifter pin retracted and retracted to the advancing / retreating extension pin hole portion can be cooled by the cooling mechanism. Substrate heating device. 前記加熱部の下方位置に退避した前記リフターピンに前記加熱部の熱の伝導若しくは放射熱を抑制する断熱部を前記加熱部と前記退避したリフターピンとの間に介在したことを特徴とする請求項1〜5のいずれか1項に記載の基板加熱装置。   The heat sink that suppresses heat conduction or radiant heat of the heating unit is interposed between the heating unit and the retracted lifter pin in the lifter pin retracted to a position below the heating unit. The substrate heating apparatus according to any one of 1 to 5. 前記加熱部の下方位置に退避した前記リフターピンに前記加熱部の熱の伝導若しくは放射熱を抑制する断熱部を前記加熱部と前記退避したリフターピンとの間に介在せしめ、この断熱部に前記加熱部に設けたピン孔と連通する進退用延長ピン孔部を設け、この断熱部に設けた進退用延長ピン孔部及び前記ピン孔に沿って前記リフターピンを加熱部のピン孔から貫通突出・没入退避自在に設け、この断熱部に設けた進退用延長ピン孔部を介してリフターピンを加熱部の下方位置まで没入退避し得るように構成したことを特徴とする請求項2記載の基板加熱装置。   A heat insulating part that suppresses heat conduction or radiant heat of the heating part is interposed between the heating part and the retracted lifter pin on the lifter pin retracted to a position below the heating part, and the heating part is provided with the heating part. An extension pin hole for advancing and retreating that communicates with the pin hole provided in the part is provided, and the lifter pin is protruded from the pin hole of the heating part through the extension pin hole for advancing and retreating provided in the heat insulating part and the pin hole. 3. The substrate heating according to claim 2, wherein the substrate heating is provided so as to be retractable and retractable, and the lifter pin can be retracted and retracted to a position below the heating portion through an extension / retraction extension pin hole provided in the heat insulating portion. apparatus. 前記加熱部の下方位置に退避した前記リフターピンに前記加熱部の熱の伝導若しくは放射熱を抑制する断熱部を前記加熱部と前記退避したリフターピンとの間に介在せしめ、この断熱部の下方位置に前記リフターピンを冷却する冷却機構を設け、前記断熱部及び冷却機構に前記進退用延長ピン孔部を設けて、この冷却機構に設けた進退用延長ピン孔部まで没入退避させたリフターピンをこの冷却機構により冷却し得るように構成したことを特徴とする請求項5記載の基板加熱装置。   A heat insulating part that suppresses conduction or radiant heat of the heating part is interposed between the heating part and the retracted lifter pin on the lifter pin retracted to a position below the heating part, and a position below the heat insulating part Provided with a cooling mechanism for cooling the lifter pin, and provided with the advancing / retreating extension pin hole portion in the heat insulating portion and the cooling mechanism, and the lifter pin that is retracted and retracted to the advancing / retreating extension pin hole portion provided in the cooling mechanism. 6. The substrate heating apparatus according to claim 5, wherein the substrate heating apparatus is configured to be cooled by the cooling mechanism. 前記加熱部上に均熱板を設け、この加熱部及び均熱板に設けた前記ピン孔から突出した前記リフターピンによって前記基板を受け取り支承し、このリフターピンが均熱板に没入することで基板を加熱部上の均熱板に当接若しくは近接状態に載置するように構成し、この均熱板に基板を支持する多数の突起部を設けたことを特徴とする請求項1〜8のいずれか1項に記載の基板加熱装置。
A soaking plate is provided on the heating unit, the substrate is received and supported by the lifter pins protruding from the pin holes provided in the heating unit and the soaking plate, and the lifter pins are immersed in the soaking plate. 9. The substrate is configured to be placed in contact with or in close proximity to a soaking plate on a heating unit, and a plurality of protrusions for supporting the substrate are provided on the soaking plate. The substrate heating apparatus according to any one of the above.
JP2005245055A 2004-11-29 2005-08-25 Substrate heating device Pending JP2006179859A (en)

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KR1020050105455A KR20060059809A (en) 2004-11-29 2005-11-04 Substrate heating apparatus

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JP2009131900A (en) * 2007-11-30 2009-06-18 Komax Holding Ag Hotplate with lifting element

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CN104199256A (en) * 2014-09-25 2014-12-10 上海和辉光电有限公司 Method, device and preliminary drying device for producing photoresist patterns
KR102630782B1 (en) 2016-08-19 2024-01-31 삼성전자주식회사 Substrate treating apparatus
KR102671567B1 (en) * 2021-12-17 2024-05-31 세메스 주식회사 Heating unit and substrate treating apparatus including the same

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009131900A (en) * 2007-11-30 2009-06-18 Komax Holding Ag Hotplate with lifting element

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