JP2006113699A - Apparatus with diagnostic function for voltage measuring circuit - Google Patents

Apparatus with diagnostic function for voltage measuring circuit Download PDF

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JP2006113699A
JP2006113699A JP2004298330A JP2004298330A JP2006113699A JP 2006113699 A JP2006113699 A JP 2006113699A JP 2004298330 A JP2004298330 A JP 2004298330A JP 2004298330 A JP2004298330 A JP 2004298330A JP 2006113699 A JP2006113699 A JP 2006113699A
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voltage
circuit
voltage measurement
electronic device
measurement
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Masatoshi Hiramoto
雅敏 平本
Koichi Hasegawa
孝一 長谷川
Noboru Takakura
昇 高倉
Masato Nishikawa
正人 西川
Kazuhiro Soma
一博 相馬
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Hitachi Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To prevent malfunction of an electronic device due to a failure in a voltage measuring circuit without having to double a voltage measuring device in a device having a multichannel voltage measuring circuit for detecting a voltage abnormality such as an overvoltage and a low voltage by monitoring a multiple types of voltages used in the electronic device. <P>SOLUTION: The electronic device having a power supply means and a circuit board is provided with a voltage measuring circuit measuring a voltage applied to the circuit board and a diagnostic circuit verifying that the measuring circuit operates normally during operation of the electronic device on the basis of a voltage value measured by the measuring circuit and a reference value held in a storage means. Providing this self diagnostic function enables the electronic device to verify the measuring circuit without duplexing it. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

本発明は、情報処理装置で使用される電圧測定回路を診断する技術にかかわる。   The present invention relates to a technique for diagnosing a voltage measurement circuit used in an information processing apparatus.

近年,装置の高性能化,低電圧化および,電子部品の低価格化に伴い,安価な装置に対してもマルチプレクサ方式の電圧測定素子及び,A/Dコンバータ素子等の電圧測定デバイスを使用し,装置内で使用している直流電圧の測定を実施する装置が増加している。また,高信頼性を目的とした装置では,この直流電圧の測定結果を用いて,電源装置の故障等によって起こる電圧変動による素子破損や,動作不良に対する電圧監視または,電源装置の故障指摘の精度向上に使用している。   In recent years, with higher performance, lower voltage, and lower prices of electronic components, multiplexer-type voltage measuring elements and voltage measuring devices such as A / D converter elements have been used for inexpensive devices. The number of devices that measure the DC voltage used in the device is increasing. In addition, for devices with high reliability, the DC voltage measurement results can be used to monitor element damage due to voltage fluctuations caused by power supply failure, etc., voltage monitoring for malfunction, or accuracy of power supply failure indication. We use for improvement.

一般的に,高信頼性を目的とした装置では,マルチプレクサ方式の電圧測定素子及び,A/Dコンバータ素子等の電圧測定デバイスおよび,データ集積回路を含む電圧制御回路等の保護機能に関する部品も、二重化または冗長化することにより、装置内でこれらの電圧監視をしている電圧制御回路の部品故障が発生した場合にも,装置を停止することなく安定した運転を実現している。この種の技術は例えば特開平5−56561号(特許文献1)に記載されている。   In general, in a device for high reliability, a voltage measuring device of a multiplexer method, a voltage measuring device such as an A / D converter device, and a component related to a protection function such as a voltage control circuit including a data integrated circuit are also included. By duplicating or making redundant, stable operation is realized without stopping the device even when a component failure of the voltage control circuit that monitors these voltages occurs in the device. This type of technique is described in, for example, Japanese Patent Laid-Open No. 5-56561 (Patent Document 1).

特開平5−56561号公報JP-A-5-56561

上記従来技術のように、装置内で使用している複数種の電圧を監視することにより,過電圧,低電圧等の電圧異常を検出する多チャネルの電圧測定回路を有する装置において,マルチプレクサ方式の電圧測定素子及び,A/Dコンバータ素子等の電圧測定デバイスが故障した時の測定電圧値の妥当性を確保する為には,これら電圧測定デバイスを二重化することが理想的であるが,これらの電圧測定回路系を二重に設けると,部品故障時に対する信頼性は向上するが,二重化等にともなうコストアップ,データ解析コントロールウェアを含む周辺制御回路の複雑化等の問題が発生する。   In a device having a multi-channel voltage measurement circuit that detects voltage anomalies such as overvoltage and undervoltage by monitoring a plurality of types of voltages used in the device as in the above prior art, a multiplexer-type voltage In order to ensure the validity of the measured voltage value when the voltage measuring device such as the measuring element and the A / D converter element fails, it is ideal to duplicate these voltage measuring devices. If the measurement circuit system is provided in duplicate, the reliability in the event of a component failure is improved, but problems such as an increase in cost due to the duplexing and a complicated peripheral control circuit including data analysis controlware occur.

一方で、マルチプレクサ方式の電圧測定素子及び,A/Dコンバータ素子等の電圧測定デバイスの二重化をしていない場合,本来の目的である過電圧,低電圧異常の検出による異常停止ではなく,マルチプレクサ方式の電圧測定素子及び,A/Dコンバータ素子等の電圧測定デバイスに故障が発生した場合に,装置が異常停止される可能性がある。   On the other hand, if the voltage measuring device of the multiplexer method and the voltage measuring device such as the A / D converter device are not duplicated, the multiplexer method is not the abnormal stop due to the detection of the overvoltage or low voltage abnormality which is the original purpose. When a failure occurs in a voltage measuring device such as a voltage measuring element or an A / D converter element, the apparatus may be abnormally stopped.

例えば、電圧測定デバイスの故障により,電圧測定が正常に行われず不正確な電圧測定値が測定データ解析回路に収集された場合に,測定データ解析回路及び,制御プログラムは,収集した測定データのみで電圧の異常を判断するため,この不正確な電圧測定値で測定電圧の異常と誤判断する。   For example, when a voltage measurement device fails and voltage measurement is not performed normally and an inaccurate voltage measurement value is collected in the measurement data analysis circuit, the measurement data analysis circuit and the control program can use only the collected measurement data. In order to judge the voltage abnormality, it is misjudged that the measurement voltage is abnormal with this inaccurate voltage measurement value.

また、電圧測定精度を向上する為に,電圧測定デバイスの校正機能を有する装置においては,基準電圧に割り当てられたマルチプレクサ方式の電圧測定素子チャネルで故障が発生した場合に,正常な校正結果を得ることができず,不正確な測定結果から測定電圧の異常と誤判断する。   In order to improve voltage measurement accuracy, a device having a voltage measurement device calibration function obtains a normal calibration result when a failure occurs in a multiplexer-type voltage measurement element channel assigned to a reference voltage. It cannot be determined that the measured voltage is abnormal based on inaccurate measurement results.

従って、このような電圧測定デバイスを二重化しない装置において,マルチプレクサ方式の電圧測定素子及び,A/Dコンバータ素子等の電圧測定デバイス故障による測定データ解析回路の誤判断を排除し,装置の異常停止を防止することが望まれる。   Therefore, in such an apparatus that does not duplicate the voltage measuring device, the erroneous determination of the measurement data analysis circuit due to the failure of the voltage measuring device such as the multiplexer type voltage measuring element and the A / D converter element is eliminated, and the apparatus is stopped abnormally. It is desirable to prevent it.

上記課題を解決するために、本発明の電源供給手段と回路基板とを有する電子装置では、回路基板に供給される電圧を測定する電圧測定回路と、電子装置稼動中に電圧測定回路が正常に動作していることを検証する診断回路を備える。自己診断機能を備えることで、電圧測定回路を二重化することなく電圧測定回路の検証を行える。   In order to solve the above problems, in an electronic apparatus having a power supply means and a circuit board according to the present invention, the voltage measurement circuit for measuring the voltage supplied to the circuit board, and the voltage measurement circuit normally operating while the electronic apparatus is in operation. A diagnostic circuit for verifying the operation is provided. With the self-diagnosis function, the voltage measurement circuit can be verified without duplicating the voltage measurement circuit.

また、電圧測定の基準値を予め記憶する手段を持たせ、診断回路が、電圧測定回路が測定した電圧値と記憶手段が有する基準値とに基づき電圧測定回路を検証する。   Further, a means for storing a reference value for voltage measurement in advance is provided, and the diagnostic circuit verifies the voltage measurement circuit based on the voltage value measured by the voltage measurement circuit and the reference value possessed by the storage means.

前記診断回路は、電圧測定されるチャネルに電圧が出力されていない状態での電圧測定を実施させ,その結果に基づき前記電圧測定回路の検証を実施する。ことにより。A/Dコンバータ素子が不正なランダムデータを送信してしまう故障及び,マルチプレクサ方式の電圧測定素子測定チャネルの一つがオープン状態になり,測定結果が不正な値になる故障の判断を行なう。   The diagnostic circuit performs voltage measurement in a state where no voltage is output to a channel to be voltage-measured, and verifies the voltage measurement circuit based on the result. By Judgment is made of a failure in which the A / D converter element transmits incorrect random data and a failure in which one of the multiplexer-type voltage measurement element measurement channels is in an open state and the measurement result has an incorrect value.

前記診断回路は、マルチプレクサ方式の電圧測定素子での全てのチャネル測定結果を自己診断回路によって比較することにより、マルチプレクサ方式の電圧測定素子及び,A/Dコンバータ素子が,通信はできるが正常なデータを送信できない状態,例えば,マルチプレクサ方式の電圧測定素子からの測定値に関係なく,A/Dコンバータ素子が常にハイレベルのFFやローレベルの00の同じデータを送信してしまう故障及び,マルチプレクサ方式の電圧測定素子の切り替え部が正常に動作せず,電圧測定結果が常に同じデータになってしまう故障の判断を行なう。   The diagnostic circuit compares all channel measurement results of the multiplexer-type voltage measuring element with a self-diagnostic circuit, so that the multiplexer-type voltage measuring element and the A / D converter element can communicate with each other, but normal data. For example, a failure in which the A / D converter element always transmits the same data of high level FF or low level 00 regardless of the measurement value from the voltage measuring element of the multiplexer type, and the multiplexer type The voltage measurement element switching unit of the above does not operate normally, and a failure is determined in which the voltage measurement results always have the same data.

本発明では電子装置に上記自己診断機能を持たせたことにより、マルチプレクサ方式の電圧測定素子の故障及び、A/Dコンバータ素子の故障による電圧異常誤検出による装置停止を未然に防ぎ,電圧測定回路を複数用いなくても,安価に複数用いている装置と同レベルの装置信頼性を確保することができる。   In the present invention, the electronic device is provided with the above self-diagnosis function, thereby preventing the failure of the multiplexer type voltage measuring element and the stoppage of the apparatus due to the erroneous detection of the voltage abnormality due to the failure of the A / D converter element. Even if a plurality of devices are not used, the same level of device reliability as a device using a plurality of devices can be secured at a low cost.

前記検証は、電子装置の起動時だけでなく、動作中に於いても常に検証することで、不正確な電圧測定値の影響による測定データ解析回路,制御プログラムの誤判断を排除する。   The verification is always performed not only when the electronic device is started but also during operation, thereby eliminating erroneous judgments of the measurement data analysis circuit and the control program due to the influence of inaccurate voltage measurement values.

以下に本発明の実施の形態を説明する。   Embodiments of the present invention will be described below.

図1は,電圧測定回路を搭載した電子装置の構成図である。電子装置6は,複数の論理LSI6-a〜cと論理LSIへ電圧を給電する電源装置5等により構成されている装置であり,データ集積回路4は,電源装置5から論理LSI6-a〜cに繋がっている給電ライン6-d上の電圧を測定する電圧測定デバイスA〜D(C,Dは図1には示してない)とデバイス通信用バス4-aにより繋がっている。   FIG. 1 is a configuration diagram of an electronic device equipped with a voltage measurement circuit. The electronic device 6 is composed of a plurality of logic LSIs 6-a to c and a power supply device 5 that supplies voltage to the logic LSI, and the data integrated circuit 4 is connected to the logic LSIs 6-a to c from the power supply device 5. Are connected by a device communication bus 4-a and voltage measuring devices A to D (C and D are not shown in FIG. 1) for measuring the voltage on the feeder line 6-d.

データ集積回路4は,デバイス通信用バス4-aから集積される測定データにより電子装置6内の電圧状態を監視し,過電圧/低電圧等の電圧異常を判断した場合に電源制御バス4-bを用いて電源装置5の停止等を行い,電源の状態の変化やアラーム等を上位デバイス通信バス4-cを用いて上位制御デバイス7に報告することが可能な回路である。   The data integrated circuit 4 monitors the voltage state in the electronic device 6 based on the measurement data integrated from the device communication bus 4-a, and determines a power supply control bus 4-b when a voltage abnormality such as overvoltage / undervoltage is determined. Is used to stop the power supply device 5 and report a change in power supply state, an alarm, and the like to the host control device 7 using the host device communication bus 4-c.

図2は,データ集積回路4の内部ブロック図である。データ集積回路4は,制御,自己診断用のソフトウェアや電圧基準値データを格納するファームウェアROM4-e、電圧測定デバイスA〜Dから受け取った測定データを保存するためのワーク用のメモリであるMemory4-f及び,ファームウェアROM4-eに格納されたソフトウェアを実行し、測定データの演算や電圧測定診断制御処理の実行主体となる検査制御用のMPU4-dによって構成される。   FIG. 2 is an internal block diagram of the data integrated circuit 4. The data integrated circuit 4 includes control and self-diagnosis software, a firmware ROM 4-e for storing voltage reference value data, and a memory 4-work memory for storing measurement data received from the voltage measurement devices A to D. f and software stored in the firmware ROM 4-e are executed, and it is constituted by an MPU 4-d for inspection control, which is the execution subject of calculation of measurement data and voltage measurement diagnosis control processing.

図3は、電圧測定デバイスの構成図である。また、データ集積回路の記憶素子内に格納されるデータも示す。電圧測定デバイスは、電子装置内に使用している複数の電圧を測定するためにマルチプレクサ方式による複数の電圧を測定する素子2と、データ集積回路との通信用の通信用A/Dコンバータ素子3を備える。複数の電圧を測定する素子上のチャネル数に制限はないが、チャネル(a)〜(d)+α部には、それぞれ電圧値が重ならない様に配列することが望ましい。   FIG. 3 is a configuration diagram of the voltage measuring device. It also shows the data stored in the storage element of the data integrated circuit. The voltage measuring device includes an element 2 that measures a plurality of voltages using a multiplexer method to measure a plurality of voltages used in an electronic apparatus, and an A / D converter element 3 for communication with a data integrated circuit. Is provided. There is no limit to the number of channels on the element for measuring a plurality of voltages, but it is desirable to arrange the channels (a) to (d) + α so that the voltage values do not overlap each other.

本診断機能では,マルチプレクサ方式による複数の電圧を測定する素子2、通信用A/Dコンバータ素子3の故障を、データ集積回路4に送信されるデータ(f)を使用し,測定結果(g)と基準値(h)等を用いて診断する。診断は、ファームウェアROM4-e内のソフトウェアをMPU4-dが読み出して実行することで行われる。前に述べたように基準値(h)はファームウェアROM4-eに予め設定しておく。マルチプレクサ方式電圧測定素子2で測定された結果は,通信A/Dコンバータ素子3を通りデバイス通信用バス4-aを介してデジタル データ(f)としてデータ集積回路4内のMemory4-fに測定結果(g)として格納される。   In this diagnostic function, the failure of the device 2 for measuring a plurality of voltages by the multiplexer method and the communication A / D converter device 3 is measured using the data (f) transmitted to the data integrated circuit 4, and the measurement result (g) And the reference value (h) or the like. The diagnosis is performed by the MPU 4-d reading and executing the software in the firmware ROM 4-e. As described above, the reference value (h) is preset in the firmware ROM 4-e. The result measured by the multiplexer-type voltage measuring element 2 passes through the communication A / D converter element 3 and is sent to the memory 4-f in the data integrated circuit 4 as digital data (f) via the device communication bus 4-a. Stored as (g).

電圧測定素子2と通信A/Dコンバータ素子3の故障モードとしては,以下のモードが考えられる。   As failure modes of the voltage measuring element 2 and the communication A / D converter element 3, the following modes can be considered.

マルチプレクサ方式電圧測定素子2の故障モードとして、複数のチャネルを有する素子内の切り替え部1が一つの測定チャネル(a)とのショートにより、そのほかのチャネルに対し、正常な切り替えが行われずに電圧を測定するチャネル(a)〜(e)部の測定結果(g1)〜(g5)は、常にショートしたチャネルと同じ値の測定結果(g1)となってしまうショート故障モード。   As a failure mode of the multiplexer-type voltage measuring element 2, the switching unit 1 in the element having a plurality of channels is short-circuited with one measurement channel (a), and the voltage is not switched to the other channels without normal switching. The measurement results (g1) to (g5) of the channels (a) to (e) to be measured are short failure modes in which the measurement results (g1) always have the same value as the shorted channel.

マルチプレクサ方式電圧測定素子2の故障モードとして、複数のチャネルを有す素子内の切り替え部1のオープンにより、測定チャネル(a)〜(e)のどこへ切り替えても,常に不正な測定データ(f)が測定結果(g1)〜(g5)に格納されてしまうオープン故障モード。   As a failure mode of the multiplexer-type voltage measuring element 2, the measurement data (f) is always invalid regardless of where the measurement channel (a) to (e) is switched by opening the switching unit 1 in the element having a plurality of channels. ) Is stored in the measurement results (g1) to (g5).

通信用A/Dコンバータ素子3の動作不能故障時に発生する、出力信号部から送信されるデータ(f)にハイレベル(FF)又は、ローレベル(00)しか出力できず,測定結果(g1)〜(g5)に不正なデータが格納されてしまうコンバータ故障モード。   Only the high level (FF) or the low level (00) can be output to the data (f) transmitted from the output signal unit, which occurs when the communication A / D converter element 3 cannot operate, and the measurement result (g1) Converter failure mode in which illegal data is stored in (g5).

通信用A/Dコンバータ素子3が動作不能状態となり,データ集積回路間のデータ(f)の通信が不可能な状態になり,測定結果(g1)〜(g2)にデータが格納できない通信故障モード。   Communication failure mode in which communication A / D converter element 3 becomes inoperable, data (f) cannot be communicated between data integrated circuits, and data cannot be stored in measurement results (g1) to (g2) .

診断ソフトウェアの判断機能としては以下の機能を持たせることになる。   The diagnostic software will have the following functions as judgment functions.

ショート故障モード,オープン故障モード及びコンバータ故障モード等の測定データ(f)が全て同じ値になってしまう故障モードの自己診断機能としては,測定チャネル(a)〜(e)の測定結果(g1)〜(g5)の中から,最大値となる値(k1)と最小値となる値(k2)を求める。この最大値(k1)から最小値(k2)を引いた値(k3)を予めデータ集積回路に設定してある基準範囲値(h2)の範囲以上になっているかを比較し,範囲以下の場合は,測定素子の故障と判断する。   The self-diagnostic function of the failure mode in which the measurement data (f) such as the short failure mode, the open failure mode, and the converter failure mode all have the same value includes the measurement results (g1) of the measurement channels (a) to (e). From (g5), the maximum value (k1) and the minimum value (k2) are obtained. If the value (k3) obtained by subtracting the minimum value (k2) from the maximum value (k1) is equal to or greater than the reference range value (h2) set in the data integrated circuit in advance, and if it is less than the range Is determined to be a failure of the measuring element.

電圧測定デバイスの通信故障等の自己診断としては,マルチプレクサ方式電圧測定素子2の測定チャネルに0Vの基準電圧を測定するチャネル(e)を設けておき,この基準電圧を測定し,測定結果(g)と基準電圧値(h)とを比較することにより,電圧測定デバイスが正常に通信することができているか判断する。   As a self-diagnosis such as a communication failure of the voltage measuring device, a channel (e) for measuring a reference voltage of 0 V is provided in the measurement channel of the multiplexer type voltage measuring element 2, this reference voltage is measured, and a measurement result (g ) And the reference voltage value (h), it is determined whether the voltage measuring device can communicate normally.

図4は,ファームウェアROMに格納されるソフトウェアの自己診断機能の処理フローである。   FIG. 4 is a processing flow of the self-diagnosis function of the software stored in the firmware ROM.

データ集積回路4は、各電圧測定デバイスが電圧測定を開始する前に、各電圧測定デバイスの診断を実施する。診断を実施する電圧測定デバイスを選択し(Step1)、選択した電圧測定デバイスに、基準値となる0Vの測定を実施させる(Step2)。データ集積回路4はまず切り替え部1を基準測定チャネル(e)と接続させ、基準測定チャネルの0v測定値を計測し、データ集積回路4に送信する。データ集積回路4は0vの測定値を受け取ると、0v基準値と比較(Step3)し、正常に電圧測定デバイスが動作しているかを判断する。例えば、測定値<100mVとなっていたら正常と判断する。   The data integrated circuit 4 performs diagnosis of each voltage measuring device before each voltage measuring device starts voltage measurement. A voltage measurement device for performing diagnosis is selected (Step 1), and the selected voltage measurement device is caused to perform measurement of 0 V serving as a reference value (Step 2). The data integrated circuit 4 first connects the switching unit 1 to the reference measurement channel (e), measures the 0v measurement value of the reference measurement channel, and transmits it to the data integrated circuit 4. When the data integrated circuit 4 receives the 0v measurement value, the data integrated circuit 4 compares it with the 0v reference value (Step 3) and determines whether the voltage measurement device is operating normally. For example, if the measured value <100 mV, it is determined as normal.

正常と判断された場合は,電圧測定デバイスに、他のチャネルの測定を指示して他の電圧測定チャネルの電圧測定(Step4)を開始させる。0v基準値の比較で異常と判断した場合は,異常の回数をカウント(Step8)してリトライする。0v基準値との比較において3回連続で異常(Step9)となった場合は,電圧測定デバイスの0vエラーとして上位制御デバイス7に報告する(即ち通信故障モードであることを伝える)(Step10)。   If it is determined to be normal, the voltage measurement device is instructed to measure another channel and starts voltage measurement (Step 4) of the other voltage measurement channel. If it is determined that there is an abnormality in the comparison of the 0v reference value, the number of abnormalities is counted (Step 8) and a retry is performed. If an abnormality (Step 9) occurs three times consecutively in comparison with the 0v reference value, it is reported to the upper control device 7 as a 0v error of the voltage measuring device (that is, a communication failure mode is notified) (Step 10).

0v基準値の自己診断で正常と判断した後,他の電圧測定チャネルの電圧測定(Step4)を実施し、診断対象としている電圧測定デバイスに未測定チャネルの電圧測定結果を報告させる。全ての電圧測定チャネルの測定結果を用いて,最大値と最小値から電圧測定差(Step5)を求め,範囲基準値と比較して正常か否かを判定する。例えば,測定値>80mV以上となっている場合正常と判断する(Step6)。正常と判断した場合は,該当電圧測定デバイスの電圧監視(Step7)を開始する。   After it is determined to be normal by the self-diagnosis of the 0v reference value, voltage measurement (Step 4) of another voltage measurement channel is performed, and the voltage measurement device of the unmeasured channel is reported to the voltage measurement device to be diagnosed. Using the measurement results of all voltage measurement channels, the voltage measurement difference (Step 5) is obtained from the maximum value and the minimum value, and compared with the range reference value to determine whether or not it is normal. For example, when the measured value is greater than 80 mV, it is determined as normal (Step 6). If it is determined to be normal, voltage monitoring (Step 7) of the corresponding voltage measuring device is started.

範囲比較(Step6)にて異常と判断された場合は,0V基準値の異常時と同様に,異常の回数をカウント(Step11)してリトライする。範囲基準値との比較において3回連続で異常(Step12)となった場合は,電圧測定デバイスの範囲エラーとして上位制御デバイス7に報告する(Step13)。即ち、ショート故障モード,オープン故障モード及びコンバータ故障モードのいずれかが発生したことを上位制御デバイスに伝える。ステップ7にて電圧監視が開始されると、上記フローを繰り返して常時診断を実施する。常時診断は例えば所定の時間間隔を設定しておき時間に応じて診断処理を実行する。ステップ7において電圧監視が開始された後、または、ステップ10、13にて上位制御デバイス7へのエラー報告イベント発行処理を終了した後は未診断の他の電圧測定デバイスを選択し上述したステップ1〜13の処理を、診断未実施の電圧測定デバイスがなくなるまで実行する。   If it is determined that there is an abnormality in the range comparison (Step 6), the number of abnormalities is counted (Step 11) and the retry is performed in the same manner as when the 0V reference value is abnormal. If an abnormality (Step 12) occurs three times consecutively in comparison with the range reference value, it is reported to the host control device 7 as a range error of the voltage measurement device (Step 13). That is, it notifies the host control device that any one of the short failure mode, the open failure mode, and the converter failure mode has occurred. When voltage monitoring is started in step 7, the above flow is repeated and diagnosis is always performed. In the continuous diagnosis, for example, a predetermined time interval is set and a diagnosis process is executed according to the time. After voltage monitoring is started in step 7, or after the error report event issuing process to the host control device 7 is completed in steps 10 and 13, another voltage measurement device that has not been diagnosed is selected and the above-described step 1 is performed. The processes of ˜13 are executed until there is no voltage measurement device that has not been diagnosed.

電圧測定回路搭載の電子装置構成図Electronic device configuration diagram with voltage measurement circuit データ集積回路の構成図Data integrated circuit configuration diagram 電圧測定デバイスの構成図Configuration diagram of voltage measurement device 電圧測定回路診断制御フローチャートVoltage measurement circuit diagnostic control flowchart

符号の説明Explanation of symbols

1…チャネル切り替え部、2…電圧測定素子、3…通信用A/Dコンバータ素子、4…データ集積回路、4d…MPU、4e…ファームウェアROM、4f…Memory、5…電源装置、6…電子装置、6a〜6c…論理LSI、7…上位制御デバイス。
DESCRIPTION OF SYMBOLS 1 ... Channel switching part, 2 ... Voltage measuring element, 3 ... Communication A / D converter element, 4 ... Data integrated circuit, 4d ... MPU, 4e ... Firmware ROM, 4f ... Memory, 5 ... Power supply device, 6 ... Electronic device , 6a to 6c: logic LSI, 7: upper control device.

Claims (4)

電源供給手段と回路基板とを有する電子装置において、前記回路基板に供給される電圧を測定する電圧測定回路と、当該電子装置稼動中に前記電圧測定回路が正常に動作していることを検証する診断回路を備えたことを特徴とする電圧測定回路診断機能付電子装置。   In an electronic device having a power supply means and a circuit board, a voltage measuring circuit for measuring a voltage supplied to the circuit board and verifying that the voltage measuring circuit is operating normally while the electronic device is in operation An electronic device with a voltage measurement circuit diagnostic function, comprising a diagnostic circuit. 請求項1において、電圧測定の基準値を予め記憶する手段を備え、前記診断回路は、前記電圧測定回路が測定した電圧値と前記記憶手段が有する基準値とに基づき前記電圧測定回路を検証することを特徴とする電圧測定回路診断機能付電子装置。   2. The voltage measurement circuit according to claim 1, further comprising means for previously storing a reference value for voltage measurement, wherein the diagnostic circuit verifies the voltage measurement circuit based on the voltage value measured by the voltage measurement circuit and the reference value possessed by the storage means. An electronic device with a voltage measurement circuit diagnostic function. 前記診断回路は、前記電圧測定回路が測定するチャネルに電圧が出力されていない状態で電圧測定結果に基づき前記電圧測定回路の検証を実施することを特徴とする請求項1又は2の1に記載の電圧測定回路診断機能付電子装置。   3. The diagnosis circuit according to claim 1, wherein the diagnostic circuit performs verification of the voltage measurement circuit based on a voltage measurement result in a state where no voltage is output to a channel measured by the voltage measurement circuit. Electronic device with voltage measurement circuit diagnostic function. 前記測定回路は複数のチャネルの電圧値を測定するマルチプレクサ方式の電圧測定素子を含み、前記診断回路は前記マルチプレクサ方式の電圧測定素子の複数のチャネルの測定結果に基づき前記測定回路の検証を行うことを特徴とする請求項1ないし3の1に記載の電圧測定回路診断機能付電子装置。
The measurement circuit includes a multiplexer-type voltage measurement element that measures voltage values of a plurality of channels, and the diagnostic circuit verifies the measurement circuit based on the measurement results of the plurality of channels of the multiplexer-type voltage measurement element. 4. The electronic device with a voltage measurement circuit diagnostic function according to claim 1, wherein the voltage measurement circuit has a diagnostic function.
JP2004298330A 2004-10-13 2004-10-13 Apparatus with diagnostic function for voltage measuring circuit Withdrawn JP2006113699A (en)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102012200245A1 (en) 2011-01-19 2012-07-19 Alps Electric Co., Ltd. Electronic self-diagnosing circuit for determining normal operation of electronic circuit, comprises detection circuit and operational amplifier, which causes amplification of detection circuit
JP2014182566A (en) * 2013-03-19 2014-09-29 Nec Computertechno Ltd Electronic device, and monitoring method of electronic device
JP2016134010A (en) * 2015-01-20 2016-07-25 株式会社デンソー Power supply monitoring circuit

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102012200245A1 (en) 2011-01-19 2012-07-19 Alps Electric Co., Ltd. Electronic self-diagnosing circuit for determining normal operation of electronic circuit, comprises detection circuit and operational amplifier, which causes amplification of detection circuit
CN102608376A (en) * 2011-01-19 2012-07-25 阿尔卑斯电气株式会社 Electronic self-diagnosing circuit and magnetic field detection device
DE102012200245B4 (en) 2011-01-19 2021-07-29 Alps Alpine Co., Ltd. Self-diagnostic circuit and magnetic field detection device
JP2014182566A (en) * 2013-03-19 2014-09-29 Nec Computertechno Ltd Electronic device, and monitoring method of electronic device
JP2016134010A (en) * 2015-01-20 2016-07-25 株式会社デンソー Power supply monitoring circuit

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