JP2005345464A5 - - Google Patents

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JP2005345464A5
JP2005345464A5 JP2005125454A JP2005125454A JP2005345464A5 JP 2005345464 A5 JP2005345464 A5 JP 2005345464A5 JP 2005125454 A JP2005125454 A JP 2005125454A JP 2005125454 A JP2005125454 A JP 2005125454A JP 2005345464 A5 JP2005345464 A5 JP 2005345464A5
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sample
unit
light
holding
reagent
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JP2005125454A
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JP4184356B2 (en
JP2005345464A (en
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Claims (11)

抗原からなる第1の被検物質およびイオンからなる第2の被検物質を含む試料を保持するための空間を有する試料保持部と、前記空間に連結し、前記試料保持部に前記試料を供給するための試料供給口と、前記試料保持部内に設けられた電気化学測定を行うための検出部と、前記試料保持部内に設けられ、前記試料保持部に入射光を入射させるための光入射部と、前記試料保持部内に設けられ、前記試料保持部内から前記試料保持部外に出射光を出射させるための光出射部と、前記試料保持部内に設けられた、前記光学測定のための抗体からなる試薬を保持するための試薬保持部と、を備え、前記試料供給口から供給された前記試料が前記試料保持部内を流れる方向において、前記試料供給口、前記検出部および前記試薬保持部の順に配置されているセンサを用いる、被検物質の測定方法であって、
(A)前記試料保持部に前記試料を供給する工程と、
(B)前記検出部に電圧を印加する工程と、
(C)前記検出部からの電気信号を測定する工程と、
(D−1)前記工程(C)において測定された前記電気信号に基づいて前記第2の被検物質を定量する工程と、
(D−2)前記試料に含まれる第1の被検物質と、前記試薬保持部に保持された抗体との間で抗原抗体反応を生じさせる工程と、
(E)前記試料保持部内に保持された前記試料に前記光入射部を通して入射光を照射する工程と、
(F)前記入射光の照射に起因して前記試料保持部内から前記試料保持部外に前記光出射部を通して出射した出射光を測定する工程と、
(G)前記工程(F)において測定された前記出射光と、前記第2の被検物質の定量結果に基づいて前記第1の被検物質を定量する工程と、
を含む被検物質の測定方法。
A sample holding part having a space for holding a sample containing a first test substance made of an antigen and a second test substance made of an ion; and a sample holding part connected to the space to supply the sample to the sample holding part A sample supply port, a detection unit provided in the sample holding unit for performing electrochemical measurement, and a light incident unit provided in the sample holding unit for allowing incident light to enter the sample holding unit A light emitting unit provided in the sample holding unit, for emitting outgoing light from the sample holding unit to the outside of the sample holding unit, and an antibody for optical measurement provided in the sample holding unit. comprising comprising a reagent holding part for holding a reagent, a, in the sample supplied from the sample supply inlet flow direction of the sample-holding unit, said sample-supplying port, the order of the detection unit and the reagent holding portion Arranged Used by that sensor, the method of measuring an analyte,
(A) supplying the sample to the sample holder;
(B) applying a voltage to the detection unit;
(C) measuring an electrical signal from the detection unit;
And (D -1) a step of quantitating said second analyte based on said electrical signal measured in the step (C),
(D-2) causing an antigen-antibody reaction between the first test substance contained in the sample and the antibody held in the reagent holding unit;
(E) irradiating the sample held in the sample holding part with incident light through the light incident part;
(F) measuring the emitted light emitted from the sample holding part through the light emitting part due to the irradiation of the incident light and out of the sample holding part;
(G) wherein the emitted light measured in said step (F), a step of quantitating said first analyte based on the quantitation result of the second analyte,
Method for measuring a test substance containing
前記工程(C)において前記電気信号を検知した際に、前記工程(E)において前記入射光を照射する請求項記載の測定方法。 Upon detecting the electrical signal in the step (C), measurement method of claim 1 wherein irradiating the incident light in the step (E). 前記検出部がイオン選択性電極を備えている、請求項1に記載の被検物質の測定方法 The method for measuring a test substance according to claim 1, wherein the detection unit includes an ion selective electrode . 抗原からなる第1の被検物質およびイオンからなる第2の被検物質を含む試料を保持するための空間を有する試料保持部と、
前記空間に連結し、前記試料保持部に前記試料を供給するための試料供給口と、
前記試料保持部内に設けられ、前記第2の被検物質の電気化学測定を行うための検出部と、
前記試料保持部内に設けられ、前記第1の被検物質の光学測定を行うための光学測定部と、
前記試料保持部内に設けられた、前記光学測定のための抗体からなる試薬を保持するための試薬保持部と、を備え、
前記試料供給口から供給された前記試料が前記試料保持部内を流れる方向において、前記試料供給口、前記検出部および前記試薬保持部の順に配置されているセンサ。
A sample holder having a space for holding a sample containing a first test substance made of an antigen and a second test substance made of an ion ;
A sample supply port connected to the space and for supplying the sample to the sample holder;
A detection unit provided in the sample holding unit for performing electrochemical measurement of the second test substance;
An optical measurement unit provided in the sample holding unit, for optical measurement of the first test substance;
A reagent holding unit provided in the sample holding unit for holding a reagent composed of an antibody for optical measurement,
A sensor arranged in the order of the sample supply port, the detection unit, and the reagent holding unit in a direction in which the sample supplied from the sample supply port flows in the sample holding unit.
前記光学測定部が、入射光を入射させるための光入射部と、前記試料保持部内から前記試料保持部外に出射光を出射させるための光出射部と、を備える請求項記載のセンサ。 5. The sensor according to claim 4 , wherein the optical measurement unit includes a light incident unit for entering incident light and a light emitting unit for emitting outgoing light from inside the sample holding unit to outside the sample holding unit. 前記試料供給口から供給された前記試料が前記試料保持部内を流れる方向において、前記光学測定部が、前記試薬保持部と略同じ位置かまたは前記試薬保持部よりも下流側に位置する請求項記載のセンサ。 In the direction in which the sample supplied from the sample supply port flows through the sample-holding unit, according to claim 4, wherein the optical measuring section is located downstream of or substantially the same position as the reagent holder or the reagent holder The sensor described. 前記試薬保持部が、前記被検物質と特異的に反応する試薬を備える請求項記載のセンサ。 The sensor according to claim 4 , wherein the reagent holding unit includes a reagent that specifically reacts with the test substance. 前記検出部が、少なくとも一対の電極を備える請求項記載のセンサ。 The sensor according to claim 4 , wherein the detection unit includes at least a pair of electrodes. 前記検出部が、イオン選択性電極を備える請求項記載のセンサ。 The sensor according to claim 4 , wherein the detection unit includes an ion selective electrode. 請求項記載のセンサを取付けるためのセンサ取付け部と、
前記センサの前記光学測定部に入射する入射光を出射するための光源と、
前記光学測定部から出射した出射光を受光するための受光部と、
前記検出部に電圧を印加するための電圧印加部と、
前記検出部からの電気信号を測定するための電気信号測定部と、
前記受光部により受光された前記出射光および前記電気信号測定部により測定された前記電気信号に基づき、前記被検物質を定量するための演算部と、を備える測定装置。
A sensor mounting portion for mounting the sensor according to claim 4 ;
A light source for emitting incident light incident on the optical measurement unit of the sensor;
A light receiving unit for receiving outgoing light emitted from the optical measurement unit;
A voltage application unit for applying a voltage to the detection unit;
An electrical signal measurement unit for measuring an electrical signal from the detection unit;
Based on the electrical signal measured by the being received emitted light and the electric signal measuring section by the light receiving unit, measuring device and a computing unit for constant amount of the analyte.
前記センサ取付け部に取付けられた前記センサの前記試料保持部内に前記試料を吸引するための吸引部を備える請求項10記載の測定装置。 The measuring apparatus according to claim 10 , further comprising a suction part for sucking the sample into the sample holding part of the sensor attached to the sensor attachment part.
JP2005125454A 2004-05-06 2005-04-22 Sensor, measuring apparatus and measuring method Active JP4184356B2 (en)

Priority Applications (1)

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JP2004137075 2004-05-06
JP2005125454A JP4184356B2 (en) 2004-05-06 2005-04-22 Sensor, measuring apparatus and measuring method

Publications (3)

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JP2005345464A JP2005345464A (en) 2005-12-15
JP2005345464A5 true JP2005345464A5 (en) 2008-09-04
JP4184356B2 JP4184356B2 (en) 2008-11-19

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Publication number Priority date Publication date Assignee Title
WO2007049607A1 (en) * 2005-10-28 2007-05-03 Matsushita Electric Industrial Co., Ltd. Measuring device, measuring instrument and method of measuring
EP2056109B1 (en) * 2006-08-21 2011-06-15 Panasonic Corporation Measuring device, measuring apparatus measuring method
WO2008038597A1 (en) * 2006-09-26 2008-04-03 Panasonic Corporation Immunosensor and determination method using the same
JP2010014403A (en) * 2006-10-26 2010-01-21 Panasonic Corp Measurement device, measurement apparatus, and measurement method
JP5040409B2 (en) * 2007-04-12 2012-10-03 富士ゼロックス株式会社 Sensor chip and inspection device
JP5288768B2 (en) * 2007-10-18 2013-09-11 パナソニック株式会社 Analysis container and analyzer
TW201126162A (en) * 2009-09-18 2011-08-01 Hitachi Chemical Co Ltd Ion selective electrode cartridge
JP6996738B2 (en) * 2017-10-27 2022-01-17 ラピスセミコンダクタ株式会社 measuring device
WO2020152794A1 (en) * 2019-01-23 2020-07-30 佳則 山口 Microsampling tip inspection device
EP4290216A1 (en) * 2022-06-09 2023-12-13 Usense Multi-analysis device and method

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