JP2003294809A - Electronic component inspection device - Google Patents
Electronic component inspection deviceInfo
- Publication number
- JP2003294809A JP2003294809A JP2002100090A JP2002100090A JP2003294809A JP 2003294809 A JP2003294809 A JP 2003294809A JP 2002100090 A JP2002100090 A JP 2002100090A JP 2002100090 A JP2002100090 A JP 2002100090A JP 2003294809 A JP2003294809 A JP 2003294809A
- Authority
- JP
- Japan
- Prior art keywords
- electronic component
- light
- mounting table
- unit
- inspection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Tests Of Electronic Circuits (AREA)
- Supply And Installment Of Electrical Components (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、供給手段で電子部
品を搬送手段に運び込み、該搬送手段で該電子部品を搬
送して検査手段で検査し、さらに該搬送手段で該電子部
品を搬送した後に回収手段で該搬送手段から該電子部品
を運び出す電子部品検査装置に関する。特に、本発明
は、かかる電子部品検査装置において、供給手段で電子
部品を搬送手段に運び込む時や、回収手段で電子部品を
搬送手段から取り出す時に、電子部品の有無を正確に検
出することができ、電子部品の取り扱いにミスがあった
か否かを確実に検知できるため、電子部品の検査作業の
安定化と作業効率の向上を図ることができる発明に関す
るものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention conveys an electronic component by a supplying means to a conveying means, conveys the electronic component by the conveying means, inspects by an inspecting means, and further conveys the electronic component by the conveying means. The present invention relates to an electronic component inspection device that carries out the electronic component from the carrying means by a collecting means later. In particular, the present invention is capable of accurately detecting the presence or absence of an electronic component in such an electronic component inspection device when the supplying device carries the electronic component to the conveying device and when the collecting device takes out the electronic component from the conveying device. The present invention relates to an invention capable of reliably detecting whether or not there is a mistake in handling an electronic component, and thus stabilizing the inspection work of the electronic component and improving work efficiency.
【0002】[0002]
【従来の技術】電子部品の検査・校正等のために部品の
搬送と検査を自動化した検査装置が用いられている。一
般的な電子部品検査装置は、未検査の電子部品をストッ
クする電子部品の供給部と、電子部品の検査を行なう検
査部と、測定済みの電子部品をストックする電子部品の
回収部を有している。これら各部間には搬送手段が設け
られており、この搬送部には移動可能な載置台があっ
て、該載置台の上に電子部品を載せて上記各部間を移送
することができる。また、回収部から電子部品を取り出
して搬送手段の載置台に電子部品を供給する供給手段
と、搬送手段の載置台から電子部品を取り出して前記回
収部に回収する回収手段とが設けられている。2. Description of the Related Art An inspection apparatus that automates the transportation and inspection of components is used for inspection and calibration of electronic components. A general electronic component inspection device has an electronic component supply unit that stocks uninspected electronic components, an inspection unit that inspects electronic components, and an electronic component recovery unit that stocks measured electronic components. ing. Conveying means is provided between the respective units, and the conveying unit has a movable mounting table on which electronic parts can be placed and transferred between the respective units. Further, there are provided a supply unit that takes out the electronic component from the collecting unit and supplies the electronic component to the mounting table of the conveying unit, and a collecting unit that takes out the electronic component from the mounting table of the conveying unit and collects it in the collecting unit. .
【0003】かかる検査装置によれば、供給手段が供給
部から未検査の電子部品を取り出して搬送手段の載置台
に載せ、搬送手段は載置台を移動させて該電子部品を検
査部に送る。検査部はこの電子部品を検査する。検査済
みの電子部品は搬送手段によって回収部まで搬送された
後、回収手段に取り出されて回収部に回収される。According to such an inspection apparatus, the supply means takes out an uninspected electronic component from the supply section and places it on the mounting table of the transfer means, and the transfer means moves the mounting table and sends the electronic component to the inspection section. The inspection unit inspects this electronic component. The inspected electronic component is conveyed to the collecting section by the conveying means, then taken out by the collecting means and collected in the collecting section.
【0004】上記従来の電子部品検査装置によれば、電
子部品を取り出し又は運び込む操作が、少なくとも搬送
手段の両端で行なわれる。即ち、供給部と搬送手段の一
端との間及び搬送手段の他端と回収部との間において電
子部品の取り出し及び運び込みが行なわれる。このよう
な電子部品の操作は、電子部品が微小であるためミスが
発生しやすく、ミスを見逃して工程が進行すると後でこ
のミスを回復するために他の工程の処理を待たねばなら
なくなる等、効率的な処理ができないという問題が生じ
る。According to the above conventional electronic component inspection apparatus, the operation of taking out or carrying the electronic component is performed at least at both ends of the carrying means. That is, the electronic components are taken out and carried in between the supply unit and one end of the carrying unit and between the other end of the carrying unit and the collecting unit. Such an electronic component operation is apt to cause a mistake because the electronic component is minute, and if a mistake is overlooked and a process progresses, it is necessary to wait for the process of another process to recover the mistake later. However, there arises a problem that efficient processing cannot be performed.
【0005】そこで、搬送手段から電子部品を取り出す
操作又は搬送手段に電子部品を運び込む操作、つまり電
子部品の搬送手段に対する受け渡し操作がミスなく行な
われたか否かを検出するためのセンサが設けられてい
る。図4は、前記搬送手段において、電子部品1が載置
されて移動する搬送台400を示している。搬送台40
0は、搬送手段の図示しない駆動手段に連結されたブロ
ック体であり、その上面の平坦な載置部に電子部品1を
載置して、所定の経路に沿って往復動することができ
る。この搬送台400の載置部上に電子部品1が載置さ
れたこと (又は載置された電子部品1が取り出されてな
くなったこと)を検知するため、投光素子401と受光
素子402が用いられていた。投光素子401と受光素
子402は、搬送台400の載置部上の電子部品1を挟
む2つの位置に対向して配置され、その光の経路が電子
部品1によって遮断されることを検出して電子部品1の
有無を検知するものである。Therefore, a sensor is provided for detecting whether the operation of taking out the electronic component from the carrying means or the operation of bringing the electronic part into the carrying means, that is, the delivery operation of the electronic part to the carrying means is performed without error. There is. FIG. 4 shows a carrier 400 on which the electronic component 1 is placed and moves in the carrier means. Carrier 40
Reference numeral 0 denotes a block body connected to a drive means (not shown) of the transport means, and the electronic component 1 can be placed on a flat mount portion on the upper surface of the block body to reciprocate along a predetermined path. In order to detect that the electronic component 1 is placed on the placing portion of the carrier 400 (or the placed electronic component 1 is no longer taken out), the light projecting element 401 and the light receiving element 402 are Was used. The light projecting element 401 and the light receiving element 402 are arranged facing each other at two positions sandwiching the electronic component 1 on the mounting portion of the carrier 400, and detect that the light path is blocked by the electronic component 1. The presence or absence of the electronic component 1 is detected.
【0006】[0006]
【発明が解決しようとする課題】しかし、このように、
電子部品1を挟む2つの位置に投光素子401と受光素
子402を対向して配置しただけでは、必ずしも電子部
品1によって光の経路が確実に遮断されるとは限らず、
投光素子401からの光が拡散して電子部品1を迂回す
るようにして回り込み、受光素子402に到達してしま
うこともあり、電子部品1の有無を正確に検出すること
ができない場合があった。[Problems to be Solved by the Invention] However, in this way,
Simply arranging the light projecting element 401 and the light receiving element 402 to face each other at two positions sandwiching the electronic component 1 does not necessarily ensure that the light path is blocked by the electronic component 1.
The light from the light projecting element 401 may diffuse and go around the electronic component 1 so as to bypass the electronic component 1 and reach the light receiving element 402. Therefore, it may not be possible to accurately detect the presence or absence of the electronic component 1. It was
【0007】かかる不都合を回避するため、投光素子4
01と受光素子402の双方又は一方にスリットを設
け、投射される光の幅を絞って拡散を防ぐこともでき
る。しかし、スリットを設けた投光素子と受光素子で検
出可能なように両素子の光軸を正確に合わせて位置決め
することは困難である。さらに、投光、受光素子にスリ
ットを設けた場合、スリットを素子の発光面より細くし
なければ効果があらわれない。素子の発光面は非常に小
さく、スリットはそれ以上に細くしなければならないた
め光量の減少が無視出来なくなり、投光素子自体の発光
輝度を上げる必要がある。In order to avoid such inconvenience, the light projecting element 4
It is also possible to provide a slit in both or one of 01 and the light receiving element 402 to narrow the width of the projected light to prevent diffusion. However, it is difficult to accurately align the optical axes of both the light emitting element and the light receiving element provided with slits so that they can be detected. Further, when a slit is provided in the light projecting and light receiving element, the effect cannot be obtained unless the slit is thinner than the light emitting surface of the element. The light emitting surface of the element is very small, and the slit has to be made thinner than that, so that the decrease in the amount of light cannot be ignored and it is necessary to increase the light emission brightness of the light projecting element itself.
【0008】本発明は、電子部品検査装置において、搬
送手段について供給手段又は回収手段で電子部品の取り
出し・運び込みを行なう際にミスがあったか否かを確実
に検知できる電子部品検査装置を提供することを目的と
している。The present invention provides an electronic component inspection device capable of surely detecting whether or not there is an error in taking out / carrying in an electronic component by the supplying means or the collecting means in the conveying means. It is an object.
【0009】[0009]
【課題を解決するための手段】請求項1に記載された電
子部品検査装置は、電子部品1を供給部2から供給する
供給手段6と、前記電子部品1を回収部3へ回収する回
収手段8と、前記電子部品1を検査する検査手段7と、
前記電子部品1を前記検査手段7を経由して前記供給部
2と前記回収部3との間を搬送する搬送手段4とを備え
た電子部品検査装置であり、次の特徴を有している。即
ち、前記搬送手段は、前記電子部品1を載置する載置部
11を有する載置台10と、前記載置台10の一端側に
設けられた投光素子14と、前記載置台10の他端側に
設けられた受光素子15と、前記載置部11を横断する
ように設けられ且つ前記投光素子14と前記受光素子1
5の光軸を通過させる光通過経路12,13とを備えて
おり、前記載置台10に載置された電子部品1の有無を
正確に検知することができることを特徴としている。An electronic component inspection apparatus according to a first aspect of the present invention includes a supply unit 6 for supplying an electronic component 1 from a supply unit 2 and a recovery unit for recovering the electronic component 1 to a recovery unit 3. 8 and an inspection means 7 for inspecting the electronic component 1,
An electronic component inspection device is provided with a transporting unit 4 that transports the electronic component 1 between the supply unit 2 and the recovery unit 3 via the inspection unit 7, and has the following features. . That is, the carrying means includes a mounting table 10 having a mounting portion 11 on which the electronic component 1 is mounted, a light projecting element 14 provided on one end side of the mounting table 10, and the other end of the mounting table 10. The light receiving element 15 provided on the side, and the light projecting element 14 and the light receiving element 1 which are provided so as to traverse the placing portion 11 described above.
It is characterized in that it is possible to accurately detect the presence / absence of the electronic component 1 mounted on the mounting table 10 by providing the optical transmission paths 12 and 13 that pass the optical axis 5 of FIG.
【0010】請求項2に記載された電子部品検査装置
は、請求項1記載の電子部品検査装置において、前記載
置部が凹部11であり、前記光通過経路が前記載置台1
0に形成された貫通溝12,13であることを特徴とし
ている。According to a second aspect of the present invention, there is provided an electronic component inspection apparatus according to the first aspect, wherein the mounting portion is a recess 11 and the light passage path is the mounting table 1.
It is characterized by the through grooves 12 and 13 formed in 0.
【0011】請求項3に記載された電子部品検査装置
は、請求項2記載の電子部品検査装置において、前記貫
通溝12,13の溝幅寸法が、前記電子部品1の全長よ
りも小さいことを特徴としている。According to a third aspect of the present invention, in the electronic component inspection apparatus according to the second aspect, the groove width dimension of the through grooves 12, 13 is smaller than the entire length of the electronic component 1. It has a feature.
【0012】請求項4に記載された電子部品検査装置
は、請求項1記載の電子部品検査装置において、前記載
置部が凹部11であり、前記光通過経路が前記載置台に
形成された貫通孔であることを特徴としている。According to a fourth aspect of the present invention, there is provided an electronic component inspection apparatus according to the first aspect, wherein the mounting portion is a recess 11 and the light passage path is a penetrating hole formed in the mounting table. It is characterized by being a hole.
【0013】[0013]
【発明の実施の形態】本発明の実施の形態の一例につい
て、その全体構成を模式的に示す平面図である図1と、
その要部を拡大して示す図2を参照して説明する。図1
に示すように、供給部2と回収部3の間には搬送手段4
があり、搬送手段4の略中間には検査手段7があり、こ
の検査手段7の略中央の近傍には検査部5がある。ま
た、供給部2と搬送手段4の一端との間には電子部品を
供給する供給手段6が設けられ、搬送手段4の他端と回
収部3との間には電子部品の回収手段8が設けられてい
る。1 is a plan view schematically showing the overall structure of an example of an embodiment of the present invention;
It will be described with reference to FIG. Figure 1
As shown in FIG.
The inspection means 7 is located approximately in the middle of the transport means 4, and the inspection section 5 is located near the center of the inspection means 7. Further, a supply means 6 for supplying electronic components is provided between the supply section 2 and one end of the transfer means 4, and a recovery means 8 for electronic parts is provided between the other end of the transfer means 4 and the recovery section 3. It is provided.
【0014】本例の搬送手段4は、詳細は図示しない
が、図2に示すような載置台10を有している。この載
置台10は上面に開口した載置部としての凹部11を有
している。凹部11には電子部品1が載置される。載置
台10は、図示しない駆動手段により所定の搬送経路に
沿って往復して移動できる。載置台10の上面には、凹
部11内に載置された電子部品1を挟む二つの位置に、
対向するように一対の光通過経路としての溝12,13
が設けられている。そして、一方の溝12の入口側には
投光素子14が設けられ、他方の溝13の出口側には受
光素子15が設けられている。Although not shown in detail, the conveying means 4 of this example has a mounting table 10 as shown in FIG. The mounting table 10 has a recess 11 as a mounting portion that is open on the upper surface. The electronic component 1 is placed in the recess 11. The mounting table 10 can be moved back and forth along a predetermined transport path by a driving unit (not shown). On the upper surface of the mounting table 10, at two positions sandwiching the electronic component 1 mounted in the recess 11,
Grooves 12, 13 as a pair of light passage paths facing each other
Is provided. A light projecting element 14 is provided on the entrance side of one groove 12, and a light receiving element 15 is provided on the exit side of the other groove 13.
【0015】電子部品1が凹部11内にある時には、投
光素子14から出た光は、一方の溝12を通過した後に
凹部11内の電子部品1に遮断されるので、受光素子1
5には届かない。電子部品1が凹部11内にない時に
は、投光素子14から出た光は、一方の溝12と、凹部
11と、他方の溝13を通過して受光素子15に到達す
る。従って、受光素子15が受光の有無によって出力す
る信号によって、凹部11内に電子部品1があるか否か
判断することができる。When the electronic component 1 is in the concave portion 11, the light emitted from the light projecting element 14 is blocked by the electronic component 1 in the concave portion 11 after passing through the one groove 12, so that the light receiving element 1
I can't reach 5. When the electronic component 1 is not in the recess 11, light emitted from the light projecting element 14 reaches the light receiving element 15 through one groove 12, the recess 11 and the other groove 13. Therefore, it is possible to determine whether or not the electronic component 1 is present in the concave portion 11 based on the signal output by the light receiving element 15 depending on the presence or absence of light reception.
【0016】凹部11の両側に電子部品1を挟んで光通
過経路としての溝12,13を設け、この溝12,13
を介して投光・受光素子14,15を配した本例の構成
によれば、光は溝12から出て凹部11内に入り、溝1
3を経て受光素子15に至るので、投光素子14からの
光が拡散して電子部品1を迂回するようにして回り込む
現象は発生しにくい。即ち、電子部品1の存在によって
光の経路は確実に遮断され、電子部品1の有無を正確に
検出することができる。従って、前記供給手段6で前記
凹部11内に電子部品を運び込み、又は前記回収手段8
で前記凹部11内から電子部品1を取り出す際にミスが
なかったか否かを確実に検知できる。Grooves 12 and 13 as light passage paths are provided on both sides of the recess 11 so as to sandwich the electronic component 1, and the grooves 12 and 13 are provided.
According to the configuration of the present example in which the light projecting / receiving elements 14 and 15 are arranged through the light, the light exits the groove 12 and enters the recess 11, and
Since the light from the light projecting element 14 reaches the light receiving element 15 via 3, the phenomenon in which light from the light projecting element 14 diffuses and goes around the electronic component 1 in a detoured manner is unlikely to occur. That is, the presence of the electronic component 1 reliably blocks the light path, and the presence or absence of the electronic component 1 can be accurately detected. Therefore, the supplying means 6 carries the electronic component into the recess 11 or the collecting means 8
Thus, it is possible to reliably detect whether or not there is a mistake in taking out the electronic component 1 from the recess 11.
【0017】搬送手段4の載置台10から未検査の電子
部品を取り出して前記検査部5に運び込み、また検査済
みの電子部品を前記検査部5から運び出して搬送手段4
の載置台10に載置するのが前記検査手段7である。こ
の検査手段7は、図1に示すように、移動手段としての
位置決め装置である円板20と、該円板20に設けられ
た複数の保持部9を有している。円板20は、回転可能
であり、該円板20には保持部9が下向きに設けられ
て、各保持部9は円板20に対して垂直方向に移動可能
である。An uninspected electronic component is taken out from the mounting table 10 of the conveying means 4 and carried to the inspection section 5, and an inspected electronic component is carried out of the inspection section 5 and conveyed to the conveying means 4.
The inspection means 7 is mounted on the mounting table 10. As shown in FIG. 1, this inspection means 7 has a disc 20 which is a positioning device as a moving means, and a plurality of holding portions 9 provided on the disc 20. The disc 20 is rotatable, and the disc 20 is provided with a holding portion 9 facing downward, and each holding portion 9 is movable in the vertical direction with respect to the disc 20.
【0018】従って、電子部品1を載置した搬送手段4
の載置台10を搬送手段4の略中間にある所定位置に位
置決めし、当該位置に保持部9を下降させて電子部品1
を保持し、その後上昇させて円板20を回転させれば、
該電子部品1を取り出し、後述する検査部5に運び込む
ことができる。また、後述する検査部5で検査された電
子部品1を保持部9で保持し、円板20の回転によって
再び前記所定位置に位置決めし、電子部品1のない載置
台10の凹部11内に向けて当該電子部品1を下降さ
せ、載置すれば、検査済みの電子部品1を載置台10に
運び込むことができる。Therefore, the transport means 4 on which the electronic component 1 is placed
The mounting table 10 is positioned at a predetermined position substantially in the middle of the transport means 4, and the holding part 9 is lowered to the position to move the electronic component 1
Hold, then raise and rotate the disk 20,
The electronic component 1 can be taken out and carried to the inspection unit 5 described later. Further, the electronic component 1 inspected by the inspecting unit 5 described later is held by the holding unit 9, is positioned again at the predetermined position by the rotation of the disc 20, and is directed into the recess 11 of the mounting table 10 without the electronic component 1. If the electronic component 1 is lowered and placed on the mounting table 10, the inspected electronic component 1 can be carried into the mounting table 10.
【0019】搬送手段4の他端から、検査済みの電子部
品1を取り出して回収部3に運び込む回収手段8は、供
給手段6と同様の構成である。また、本装置を構成する
各構成部分は、制御手段に接続されており、全体として
統括されて制御される。The collecting means 8 for taking out the inspected electronic component 1 from the other end of the carrying means 4 and carrying it to the collecting section 3 has the same construction as the supplying means 6. In addition, each component of the present apparatus is connected to the control means and is controlled as a whole as a whole.
【0020】以上の構成における効果を説明する。供給
手段6が、供給部2から未検査の電子部品1を取り出
し、搬送手段4の始端に設定されている載置台10の凹
部11に運び込む。載置台10が移動し、検査手段7に
よる取り出し位置に位置決めされる。検査手段7の保持
部9が載置台10の凹部11から電子部品1を取り出
し、円板20の回転によって該電子部品1を検査部5に
運び込む。検査部5において該電子部品1の検査が行な
われる。検査後、保持部9が電子部品1を保持した状態
で円板20が回転し、該電子部品1を前記取り出し位置
の上方に位置決めし、その後下降して該電子部品1を載
置台10の凹部11内に運び込む。搬送手段4が作動し
て載置台10が末端まで移動する。回収手段8が載置台
10の凹部11から電子部品1を取り出し、回収部3に
運び込む。The effects of the above configuration will be described. The supply unit 6 takes out the uninspected electronic component 1 from the supply unit 2 and carries it into the recess 11 of the mounting table 10 set at the start end of the transport unit 4. The mounting table 10 moves and is positioned at the take-out position by the inspection means 7. The holding unit 9 of the inspection means 7 takes out the electronic component 1 from the recess 11 of the mounting table 10 and carries the electronic component 1 into the inspection unit 5 by rotating the disc 20. The inspection unit 5 inspects the electronic component 1. After the inspection, the disk 20 rotates with the holding part 9 holding the electronic component 1, the electronic component 1 is positioned above the take-out position, and then descends to hold the electronic component 1 in the concave portion of the mounting table 10. Bring it in 11. The transport means 4 operates and the mounting table 10 moves to the end. The collecting means 8 takes out the electronic component 1 from the concave portion 11 of the mounting table 10 and carries it into the collecting portion 3.
【0021】以上の動作において、載置台10の凹部1
1内にある電子部品1を凹部11外に取り出す作業と、
該電子部品1を該凹部11内に運び込む作業は、供給手
段6、回収手段8、及び検査手段7の保持部9によって
行なわれるが、この電子部品の取り扱い作業が、正確に
行なわれたか否かの判断は、載置台10に設けた受光素
子15からの信号に基づいて制御手段で的確に判断する
ことができる。In the above operation, the concave portion 1 of the mounting table 10
The work of taking out the electronic component 1 inside the recess 1 from the recess 11;
The work of carrying the electronic component 1 into the recess 11 is performed by the supply unit 6, the collection unit 8, and the holding unit 9 of the inspection unit 7. Whether or not the work of handling the electronic component is performed correctly. The determination can be accurately made by the control means based on the signal from the light receiving element 15 provided on the mounting table 10.
【0022】即ち、電子部品1が凹部11内にある時に
は、投光素子14からの光は、一方の溝12を通過した
後に凹部11内の電子部品1に遮断されるので、受光素
子15には届かず、受光素子15は受光信号を出力しな
い。従って、取り出し時に所定の経過時間後に受光素子
15が受光信号を出力していなければ、電子部品1は取
り出されておらず、取り出しは失敗したことが分かる。That is, when the electronic component 1 is in the concave portion 11, the light from the light projecting element 14 is blocked by the electronic component 1 in the concave portion 11 after passing through the one groove 12, so that the light receiving element 15 receives the light. Does not reach, and the light receiving element 15 does not output a light receiving signal. Therefore, when the light receiving element 15 does not output the light receiving signal after a predetermined elapsed time at the time of taking out, it is understood that the electronic component 1 has not been taken out and the taking out has failed.
【0023】また、電子部品1が凹部11内にない時
に、投光素子14から出た光は、一方の溝12と、凹部
11と、他方の溝13を通過して受光素子15に到達
し、受光素子15は受光信号を出力する。従って、運び
込み時に所定の経過時間後に受光素子15が受光信号を
出力していれば、電子部品1は正規の状態では運び込ま
れておらず、運び込みは失敗したことが分かる。When the electronic component 1 is not in the recess 11, the light emitted from the light projecting element 14 passes through the groove 12, the recess 11 and the other groove 13 to reach the light receiving element 15. The light receiving element 15 outputs a light receiving signal. Therefore, if the light-receiving element 15 outputs the light-reception signal after a predetermined elapsed time at the time of carrying in, it can be seen that the electronic component 1 is not carried in the normal state and the carrying-in has failed.
【0024】このように、受光素子15の受光信号の有
無によって、凹部11内に現在電子部品1があるか否か
を的確に判断することができる。本例では、供給手段6
が載置台10に未検査の電子部品1を運び込む第1段階
と、検査手段7の保持部9が載置台10から未検査の電
子部品1を取り出す第2段階と、検査手段7の保持部9
が検査済みの電子部品1を載置台10に運び込む第3段
階と、回収手段8が検査済みの電子部品1を載置台10
から取り出す第4段階の4つの段階において、載置台1
0と供給手段6,7,8との間での電子部品1の受け渡
しが前記投光素子14及び受光素子15によって的確に
判断される。As described above, it is possible to accurately determine whether or not the electronic component 1 is present in the concave portion 11 based on the presence or absence of the light receiving signal of the light receiving element 15. In this example, the supply means 6
Carries the uninspected electronic component 1 to the mounting table 10, a second stage in which the holding unit 9 of the inspection means 7 takes out the uninspected electronic component 1 from the mounting table 10, and the holding unit 9 of the inspection unit 7.
The third stage of carrying the inspected electronic component 1 to the mounting table 10, and the collecting means 8 mounting the inspected electronic component 1 on the mounting table 10.
In the four stages of the fourth stage of taking out from the mounting table 1,
Delivery of the electronic component 1 between 0 and the supply means 6, 7, 8 is accurately judged by the light projecting element 14 and the light receiving element 15.
【0025】本例では、第1段階と第3段階において、
供給手段6と検査手段7の保持部9が電子部品1を凹部
11内に運びこんだ後、供給手段6と検査手段7の保持
部9が上昇した後の所定の短時間後に受光素子15の受
光信号を確認し、受光信号の出力がなければ電子部品1
が運び込まれた正規の状態と判断する。なお、投光素子
14は上記所定の時間後にのみ発光させてもよいし、連
続して発光させておいてもよい。In this example, in the first stage and the third stage,
After the supply unit 6 and the holding unit 9 of the inspection unit 7 carry the electronic component 1 into the recess 11, and after a predetermined short time after the holding unit 9 of the supply unit 6 and the inspection unit 7 moves upward, Check the received light signal, and if the received light signal is not output, electronic component 1
Is judged to be in the proper state when it was brought in. The light projecting element 14 may emit light only after the above-mentioned predetermined time, or may emit light continuously.
【0026】また、第2段階と第4段階では、検査手段
7の保持部9と回収手段8が電子部品1を凹部11内か
ら取り出した後、検査手段7の保持部9と回収手段8が
上昇した後の所定の短時間後に受光素子15の受光信号
を確認し、受光信号の出力があれば電子部品1が取り出
された正規の状態と判断する。投光素子14の発光タイ
ミングは第1及び第3段階の場合と同様である。In the second step and the fourth step, the holding part 9 and the collecting means 8 of the inspecting means 7 take out the electronic component 1 from the inside of the recess 11 and then the holding part 9 and the collecting means 8 of the inspecting means 7 are operated. The light receiving signal of the light receiving element 15 is confirmed after a predetermined short time after the temperature rises, and if there is an output of the light receiving signal, it is determined that the electronic component 1 is taken out in a normal state. The light emission timing of the light projecting element 14 is the same as in the first and third stages.
【0027】また、本例において前記凹部11の両側に
設けた溝12,13は、光軸方向に長さを持っているの
で、電子部品1の近傍まで光の拡散を防ぐ効果がある。
このため、前記スリットの幅に比べて前記溝の幅は広く
することができるので、光量の減少を少なくでき、スリ
ットを用いる場合に比べて発光素子の輝度を上げなくて
すむ。従って、輝度の高い発光素子を採用する必要がな
い。Further, in the present example, the grooves 12 and 13 provided on both sides of the recess 11 have a length in the optical axis direction, and therefore have an effect of preventing light diffusion to the vicinity of the electronic component 1.
Therefore, since the width of the groove can be made wider than the width of the slit, the decrease in the amount of light can be reduced, and the brightness of the light emitting element need not be increased as compared with the case of using the slit. Therefore, it is not necessary to employ a light emitting element with high brightness.
【0028】以上説明した例では、載置台10に形成し
た光通過経路は、載置台10の上面に開口した溝12,
13であったが、凹部11の内部と外部を連通させるよ
うに前記載置台10の壁体に貫通して形成した貫通孔で
あってもよい。In the example described above, the light passage path formed on the mounting table 10 is the groove 12 opened on the upper surface of the mounting table 10.
However, it may be a through hole formed by penetrating the wall of the mounting table 10 so as to communicate the inside and the outside of the recess 11.
【0029】以上説明したように、本例の装置では、円
板20に設けた複数の保持部9に電子部品1を保持し、
該円板20の回転によって検査部5に電子部品1を順次
供給しながら、その間は検査部5側から独立して搬送手
段4を自由に稼動させることにより、検査部5が部品待
ちの状態になることなく、検査部5の能力が最大限に発
揮された状態となるようにしている。かかる運転状態で
は、搬送手段4との間で部品の受け渡しが失敗し、それ
に気がつかないと、部品を保持していない保持部9が検
査部5にまで到達して始めて不具合に気づく場合があ
る。その場合、装置全体を初期の状態に戻して検査部5
の能力を最大限に発揮された運転状態とするのには一定
の時間がかかり、能率が悪かった。しかし、本例によれ
ば、かかる不都合の原因となる供給手段6、検査手段7
の保持部9、回収手段8による部品受け渡しの失敗を迅
速・確実に検知することができ、かかる不都合に対する
処置を速やかに採ることが出来るので、ロスタイムが短
くなり検査作業全体の能率を低下させることが少ないと
いう効果がある。As described above, in the apparatus of this example, the electronic component 1 is held by the plurality of holding portions 9 provided on the disc 20.
While the electronic component 1 is sequentially supplied to the inspection unit 5 by the rotation of the disc 20, the conveyance unit 4 is freely operated independently from the inspection unit 5 side during the period, so that the inspection unit 5 waits for components. It is so arranged that the inspection unit 5 is maximized in its ability. In such an operating state, the delivery of the component to and from the transporting means 4 fails, and if the user does not notice it, the holder 9 that does not hold the component may reach the inspection unit 5 and notice the malfunction. In that case, the entire device is returned to the initial state and the inspection unit 5
It took a certain amount of time to reach the operating state in which the ability of was maximized, and the efficiency was poor. However, according to this example, the supply means 6 and the inspection means 7 that cause such inconvenience
Failure to deliver parts by the holding unit 9 and the recovery means 8 can be detected promptly and surely, and measures to deal with such inconvenience can be taken promptly, so that the loss time is shortened and the efficiency of the entire inspection work is reduced. There is an effect that there is little.
【0030】次に、本発明の実施の形態の第2の例につ
いて、図3を参照して説明する。本例では、搬送手段4
の載置台10’に複数の壁部材30によって構成された
光通過経路としての区画光路31が形成されている。即
ち、載置台10’の上面略中央の平坦部を電子部品の載
置部とし、投光素子14と受光素子15の各側に各一対
の壁部材30を設けて区画光路31を形成した。Next, a second example of the embodiment of the present invention will be described with reference to FIG. In this example, the transport means 4
On the mounting table 10 ', a divided optical path 31 as a light passage path formed by a plurality of wall members 30 is formed. That is, a flat portion in the center of the upper surface of the mounting table 10 ′ was used as a mounting portion for the electronic component, and a pair of wall members 30 was provided on each side of the light projecting element 14 and the light receiving element 15 to form the partitioning optical path 31.
【0031】第2の例によれば、投光素子14から出た
光は、一方の区画光路31から出て載置部内に入り、他
方の区画光路31を経て受光素子15に至るので、投光
素子14からの光が拡散して電子部品1を迂回するよう
にして回り込む現象は発生しにくく、電子部品1がある
のに光が受光素子15に到達することは起こりにくい。
従って、第1の例と同様に電子部品1の有無を正確に検
出することができ、載置部から電子部品1を取り出す際
にミスがあったか否かを確実に検知できる。According to the second example, the light emitted from the light projecting element 14 exits from one of the divided light paths 31 and enters the mounting portion, and reaches the light receiving element 15 via the other of the divided light paths 31. The phenomenon in which the light from the optical element 14 diffuses and wraps around the electronic component 1 in a detoured manner is unlikely to occur, and it is unlikely that the light will reach the light receiving element 15 even though the electronic component 1 is present.
Therefore, similarly to the first example, the presence or absence of the electronic component 1 can be accurately detected, and whether or not there is a mistake in taking out the electronic component 1 from the mounting portion can be reliably detected.
【0032】[0032]
【発明の効果】本発明によれば、前記供給部と前記回収
部との間を前記検査手段を経由して搬送手段で電子部品
を搬送する電子部品検査装置において、搬送手段の載置
台に電子部品を収納するための載置部を形成し、該載置
部をを横断する光通過経路に投光・受光素子の光軸を通
過させて設けたので、次のような効果が得られる。即
ち、光は光通過経路から出て載置部に入り、光通過経路
を経て受光素子に至るので、投光素子からの光が拡散し
て電子部品を回り込む現象は発生しにくい。従って、電
子部品があるのに光が受光素子に到達することは起こり
にくく、電子部品の存在によって光の経路は確実に遮断
される。よって、電子部品の有無を正確に検出すること
ができ、取り出し手段で電子部品の取り出し・運び込み
を行なう際にミスがなかったか否かを確実に検知でき
る。According to the present invention, in an electronic component inspection device for transporting an electronic component between the supply unit and the recovery unit via the inspection unit by the transport unit, an electronic device is mounted on the mounting table of the transport unit. Since the mounting portion for accommodating the components is formed and the optical path of the light projecting / receiving element is provided in the light passage path that traverses the mounting portion, the following effects can be obtained. That is, since the light exits from the light passage path and enters the mounting portion and reaches the light receiving element via the light passage path, it is unlikely that the light from the light projecting element diffuses and goes around the electronic component. Therefore, it is unlikely that light will reach the light receiving element despite the presence of the electronic component, and the presence of the electronic component reliably blocks the light path. Therefore, it is possible to accurately detect the presence or absence of the electronic component, and it is possible to reliably detect whether or not there is a mistake when the electronic component is taken out and carried in by the taking-out means.
【図1】本発明の実施の形態の一例である電子部品検査
装置の模式的な平面図である。FIG. 1 is a schematic plan view of an electronic component inspection device that is an example of an embodiment of the present invention.
【図2】本発明の実施の形態の第1の例である電子部品
検査装置の要部を拡大して示す斜視図である。FIG. 2 is an enlarged perspective view showing an essential part of the electronic component inspection device which is the first example of the embodiment of the present invention.
【図3】本発明の実施の形態の第2の例である電子部品
検査装置の要部を拡大して示す斜視図である。FIG. 3 is a perspective view showing an enlarged main part of an electronic component inspection device which is a second example of the embodiment of the present invention.
【図4】従来の電子部品測定装置における載置台の構成
を模式的に示す平面図である。FIG. 4 is a plan view schematically showing a configuration of a mounting table in a conventional electronic component measuring device.
1…電子部品、2…供給部、3…回収部、4…搬送手
段、5…検査部、6…供給手段、7…検査手段、8…回
収手段、9…保持部、10…載置台、11…載置部とし
ての凹部、12,13…光通過経路としての溝、14…
投光素子、15…受光素子、20…位置決め装置として
の円板、30…壁部材、31…光通過経路としての区画
光路。DESCRIPTION OF SYMBOLS 1 ... Electronic component, 2 ... Supply part, 3 ... Collection part, 4 ... Conveying means, 5 ... Inspection part, 6 ... Supplying means, 7 ... Inspection means, 8 ... Collection means, 9 ... Holding part, 10 ... Mounting table, 11 ... Recesses as mounting portions, 12, 13 ... Grooves as light passage paths, 14 ...
Light-projecting element, 15 ... Light-receiving element, 20 ... Disk as positioning device, 30 ... Wall member, 31 ... Sectional optical path as light passage path.
─────────────────────────────────────────────────────
─────────────────────────────────────────────────── ───
【手続補正書】[Procedure amendment]
【提出日】平成14年10月24日(2002.10.
24)[Submission date] October 24, 2002 (2002.10.
24)
【手続補正1】[Procedure Amendment 1]
【補正対象書類名】明細書[Document name to be amended] Statement
【補正対象項目名】0032[Name of item to be corrected] 0032
【補正方法】変更[Correction method] Change
【補正内容】[Correction content]
【0032】[0032]
【発明の効果】本発明によれば、前記供給部と前記回収
部との間を前記検査手段を経由して搬送手段で電子部品
を搬送する電子部品検査装置において、搬送手段の載置
台に電子部品を収納するための載置部を形成し、該載置
部を横断する光通過経路に投光・受光素子の光軸を通過
させて設けたので、次のような効果が得られる。即ち、
光は光通過経路から出て載置部に入り、光通過経路を経
て受光素子に至るので、投光素子からの光が拡散して電
子部品を回り込む現象は発生しにくい。従って、電子部
品があるのに光が受光素子に到達することは起こりにく
く、電子部品の存在によって光の経路は確実に遮断され
る。よって、電子部品の有無を正確に検出することがで
き、取り出し手段で電子部品の取り出し・運び込みを行
なう際にミスがなかったか否かを確実に検知できる。According to the present invention, in an electronic component inspection device for transporting an electronic component between the supply unit and the recovery unit via the inspection unit by the transport unit, an electronic device is mounted on the mounting table of the transport unit. Since the mounting portion for accommodating the components is formed and the optical axis of the light projecting / receiving element is provided in the light passage path that traverses the mounting portion, the following effects can be obtained. That is,
Since the light exits from the light passage path and enters the mounting portion and reaches the light receiving element via the light passage path, it is unlikely that the light from the light projecting element diffuses and goes around the electronic component. Therefore, it is unlikely that light will reach the light receiving element despite the presence of the electronic component, and the presence of the electronic component reliably blocks the light path. Therefore, it is possible to accurately detect the presence or absence of the electronic component, and it is possible to reliably detect whether or not there is a mistake when the electronic component is taken out and carried in by the taking-out means.
フロントページの続き Fターム(参考) 2G003 AA00 AA07 AG11 AG18 2G036 AA28 BB00 BB09 CA03 CA06 2G132 AA00 AE01 AE02 AL01 Continued front page F-term (reference) 2G003 AA00 AA07 AG11 AG18 2G036 AA28 BB00 BB09 CA03 CA06 2G132 AA00 AE01 AE02 AL01
Claims (4)
(6)と、 前記電子部品を回収部へ回収する回収手段(8)と、 前記電子部品を検査する検査手段(7)と、 前記電子部品を前記検査手段を経由して前記供給部と前
記回収部との間を搬送する搬送手段(4)とを備えた電
子部品検査装置において、 前記搬送手段は、 前記電子部品を載置する載置部(11)を有する載置台
(10)と、 前記載置台の一端側に設けられた投光素子(14)と、 前記載置台の他端側に設けられた受光素子(15)と、 前記載置部を横断するように設けられ且つ前記投光素子
と前記受光素子の光軸を通過させる光通過経路(12,
13)とを備え、 前記載置台に載置された電子部品の有無を正確に検知す
ることができることを特徴とする電子部品検査装置。1. A supply unit (6) for supplying an electronic component from a supply unit, a recovery unit (8) for recovering the electronic component to a recovery unit, an inspection unit (7) for inspecting the electronic component, In an electronic component inspection device, comprising: a transport unit (4) for transporting an electronic component between the supply unit and the recovery unit via the inspection unit, the transport unit mounts the electronic component. A mounting table (10) having a mounting part (11), a light projecting element (14) provided on one end side of the mounting table, and a light receiving element (15) disposed on the other end side of the mounting table. , A light passage path (12, which is provided so as to cross the mounting portion and passes through the optical axes of the light projecting element and the light receiving element).
13), and an electronic component inspection apparatus characterized by being able to accurately detect the presence or absence of an electronic component placed on the mounting table.
光通過経路(12,13)が前記載置台に形成された貫
通溝である請求項1記載の電子部品検査装置。2. The electronic component inspection apparatus according to claim 1, wherein the mounting portion (11) is a concave portion, and the light passage paths (12, 13) are through grooves formed in the mounting table.
(1)の全長よりも小さいことを特徴とする請求項2記
載の電子部品検査装置。3. The electronic component inspection apparatus according to claim 2, wherein the groove width dimension of the through groove is smaller than the entire length of the electronic component (1).
光通過経路(12,13)が前記載置台に形成された貫
通孔である請求項1記載の電子部品検査装置。4. The electronic component inspection apparatus according to claim 1, wherein the mounting portion (11) is a concave portion, and the light passage paths (12, 13) are through holes formed in the mounting table.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002100090A JP2003294809A (en) | 2002-04-02 | 2002-04-02 | Electronic component inspection device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002100090A JP2003294809A (en) | 2002-04-02 | 2002-04-02 | Electronic component inspection device |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2003294809A true JP2003294809A (en) | 2003-10-15 |
Family
ID=29241223
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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JP2002100090A Pending JP2003294809A (en) | 2002-04-02 | 2002-04-02 | Electronic component inspection device |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2019203802A (en) * | 2018-05-24 | 2019-11-28 | セイコーエプソン株式会社 | Electronic component conveying device and electronic component inspection device |
CN113671295A (en) * | 2021-09-01 | 2021-11-19 | 南斗六星***集成有限公司 | Linear detection system |
CN113816084A (en) * | 2021-09-01 | 2021-12-21 | 南斗六星***集成有限公司 | Steering method and line body detection method |
CN114226291A (en) * | 2021-12-10 | 2022-03-25 | 南斗六星***集成有限公司 | Intelligence passenger cabin product automatic checkout device |
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2002
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Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2019203802A (en) * | 2018-05-24 | 2019-11-28 | セイコーエプソン株式会社 | Electronic component conveying device and electronic component inspection device |
CN113671295A (en) * | 2021-09-01 | 2021-11-19 | 南斗六星***集成有限公司 | Linear detection system |
CN113816084A (en) * | 2021-09-01 | 2021-12-21 | 南斗六星***集成有限公司 | Steering method and line body detection method |
CN114226291A (en) * | 2021-12-10 | 2022-03-25 | 南斗六星***集成有限公司 | Intelligence passenger cabin product automatic checkout device |
CN114226291B (en) * | 2021-12-10 | 2023-12-22 | 南斗六星***集成有限公司 | Intelligent cabin product automatic detection device |
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