JP2002090424A5 - - Google Patents

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Publication number
JP2002090424A5
JP2002090424A5 JP2000280270A JP2000280270A JP2002090424A5 JP 2002090424 A5 JP2002090424 A5 JP 2002090424A5 JP 2000280270 A JP2000280270 A JP 2000280270A JP 2000280270 A JP2000280270 A JP 2000280270A JP 2002090424 A5 JP2002090424 A5 JP 2002090424A5
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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JP2000280270A
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Japanese (ja)
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JP5053479B2 (en
JP2002090424A (en
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Priority to JP2000280270A priority Critical patent/JP5053479B2/en
Priority claimed from JP2000280270A external-priority patent/JP5053479B2/en
Publication of JP2002090424A publication Critical patent/JP2002090424A/en
Publication of JP2002090424A5 publication Critical patent/JP2002090424A5/ja
Application granted granted Critical
Publication of JP5053479B2 publication Critical patent/JP5053479B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2000280270A 2000-09-14 2000-09-14 Matrix array substrate and manufacturing method thereof Expired - Fee Related JP5053479B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000280270A JP5053479B2 (en) 2000-09-14 2000-09-14 Matrix array substrate and manufacturing method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000280270A JP5053479B2 (en) 2000-09-14 2000-09-14 Matrix array substrate and manufacturing method thereof

Publications (3)

Publication Number Publication Date
JP2002090424A JP2002090424A (en) 2002-03-27
JP2002090424A5 true JP2002090424A5 (en) 2007-10-11
JP5053479B2 JP5053479B2 (en) 2012-10-17

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000280270A Expired - Fee Related JP5053479B2 (en) 2000-09-14 2000-09-14 Matrix array substrate and manufacturing method thereof

Country Status (1)

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JP (1) JP5053479B2 (en)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100900537B1 (en) * 2002-08-23 2009-06-02 삼성전자주식회사 Liquid crystal display, testing method thereof and manufacturing method thereof
KR100895311B1 (en) 2002-11-19 2009-05-07 삼성전자주식회사 Liquid crystal display and testing method thereof
KR100479525B1 (en) * 2002-12-31 2005-03-31 엘지.필립스 엘시디 주식회사 substrate for liquid crystal display device including multi array cell and manufacturing method the same
JP3964337B2 (en) * 2003-03-07 2007-08-22 三菱電機株式会社 Image display device
JP2004317885A (en) * 2003-04-17 2004-11-11 Sharp Corp Display panel forming plate and display panel
JP4483224B2 (en) * 2003-08-08 2010-06-16 セイコーエプソン株式会社 Electro-optical panel, electro-optical device, and electronic apparatus
KR100828294B1 (en) 2004-04-29 2008-05-07 엘지디스플레이 주식회사 Substrate for lcd and method of manufacturing lcd using the same
JP2006038988A (en) * 2004-07-23 2006-02-09 Seiko Epson Corp Electrooptical apparatus, electronic device and mounting structural body
JP4476737B2 (en) * 2004-08-06 2010-06-09 東芝モバイルディスプレイ株式会社 Display device, display device inspection method, and display device inspection device
KR101051009B1 (en) * 2004-09-07 2011-07-21 삼성전자주식회사 Display board and manufacturing method thereof
JP2006091239A (en) * 2004-09-22 2006-04-06 Seiko Epson Corp Substrate for electrooptical device, electrooptical device and inspection method
US7342579B2 (en) 2004-10-11 2008-03-11 Chunghwa Picture Tubes, Ltd. Thin film transistor array plate, liquid crystal display panel and method of preventing electrostatic discharge
JP2006267416A (en) * 2005-03-23 2006-10-05 Victor Co Of Japan Ltd Inspection method of active matrix substrate
JP4964444B2 (en) * 2005-08-31 2012-06-27 京セラディスプレイ株式会社 Manufacturing method of display element
KR100916914B1 (en) 2008-04-25 2009-09-09 삼성모바일디스플레이주식회사 Organic light emitting display device
CN102099847B (en) * 2008-07-23 2013-03-13 夏普株式会社 Active matrix substrate, display device, method for inspecting the active matrix substrate, and method for inspecting the display device
CN102540508B (en) * 2010-12-30 2015-02-04 上海天马微电子有限公司 Line detection structure and detection method of liquid crystal display device
JP5738995B2 (en) * 2011-07-19 2015-06-24 シャープ株式会社 Method for manufacturing element substrate
JP6370057B2 (en) * 2014-02-20 2018-08-08 三菱電機株式会社 Array substrate and array substrate inspection method
JP2019191403A (en) * 2018-04-26 2019-10-31 シャープ株式会社 Wiring substrate, and display panel

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0394223A (en) * 1989-09-07 1991-04-19 Sharp Corp Manufacture of active matrix display device
JP2758105B2 (en) * 1992-04-28 1998-05-28 シャープ株式会社 Inspection method and inspection device for active matrix substrate
JP2834935B2 (en) * 1992-06-11 1998-12-14 シャープ株式会社 Active matrix display element and method of manufacturing the same
JP3213472B2 (en) * 1994-04-26 2001-10-02 シャープ株式会社 Active matrix substrate or active matrix liquid crystal panel defect detection and inspection method and defect detection and inspection device
JP2776349B2 (en) * 1995-11-10 1998-07-16 日本電気株式会社 Inspection method of liquid crystal display
JPH10177184A (en) * 1996-12-17 1998-06-30 Sharp Corp Device for manufacturing liquid crystal panel

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