JP2002043846A - Voltage-controlled temperature compensation oscillating device - Google Patents
Voltage-controlled temperature compensation oscillating deviceInfo
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- JP2002043846A JP2002043846A JP2000220755A JP2000220755A JP2002043846A JP 2002043846 A JP2002043846 A JP 2002043846A JP 2000220755 A JP2000220755 A JP 2000220755A JP 2000220755 A JP2000220755 A JP 2000220755A JP 2002043846 A JP2002043846 A JP 2002043846A
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- voltage
- filter
- oscillation
- mos
- crystal oscillator
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Abstract
Description
【０００１】[0001]
【発明の属する技術分野】本発明は、電圧可変容量素子
を用いて発振周波数を調整する電圧制御型温度補償発振
装置に関し、特に、電圧可変容量素子に印加される制御
電圧の調整を高精度かつ短時間で行うことができる電圧
制御型温度補償発振器に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a voltage-controlled temperature-compensated oscillation device for adjusting an oscillation frequency by using a voltage-variable capacitance element, and more particularly, to adjusting a control voltage applied to a voltage-variable capacitance element with high accuracy. The present invention relates to a voltage-controlled temperature-compensated oscillator that can be performed in a short time.
【０００２】[0002]
【従来の技術】多くの電子機器において、クロック信号
の生成等に水晶振動子を用いた発振回路が利用されてい
る。水晶発振回路のフリーラン周波数は、周囲温度Ｔa
の変化に対して概略３次関数で表される変動を示すこと
が知られている。また、水晶振動子の個体差により基準
周波数ｆ0のばらつきが生じることも避けられない。高
精度の電子機器では、このような周囲温度による変動は
重大な問題となるため、温度補償が施される。温度補償
は、例えば特開平９−１５３１０４号公報、特開平１１
−４１１９号公報に示されるように、温度の３次関数で
表される電圧で可変容量素子の容量値を変更することに
より行っている。2. Description of the Related Art In many electronic devices, an oscillation circuit using a crystal oscillator is used for generating a clock signal or the like. The free-run frequency of the crystal oscillation circuit is the ambient temperature Ta
It is known that a change represented by a substantially cubic function is exhibited with respect to a change in. In addition, it is inevitable that the reference frequency f 0 varies due to individual differences of the crystal units. In a high-precision electronic device, such a fluctuation due to the ambient temperature becomes a serious problem, and therefore temperature compensation is performed. The temperature compensation is described in, for example, JP-A-9-153104,
As disclosed in Japanese Patent No. 4119, this is performed by changing the capacitance value of the variable capacitance element with a voltage expressed by a cubic function of temperature.
【０００３】この補償回路では、制御電圧のノイズが発
振周波数を変調し、位相ノイズが表れるという問題があ
る。そのため、制御電圧の出力とその電圧を印加する可
変容量素子との間にローパスフィルタを設けることによ
り、位相ノイズを抑えている。In this compensation circuit, there is a problem that noise of the control voltage modulates the oscillation frequency and phase noise appears. Therefore, a phase noise is suppressed by providing a low-pass filter between the output of the control voltage and the variable capacitance element to which the control voltage is applied.
【０００４】図２は、従来の電圧制御型温度補償発振装
置の概略構成を示したものである。水晶発振器５０は、
印加電圧によって容量が変化する可変容量ダイオード
７、７'、発振回路６、水晶振動子８、カップリングコ
ンデンサ１４、出力バッファ１４、１５、抵抗１９、１
９'を含んでいる。この水晶発振器５０の発振周波数
は、水晶振動子の特性及び可変容量ダイオード７の容量
によって決定され、発振出力は、出力端子３１から取り
出すことができる。FIG. 2 shows a schematic configuration of a conventional voltage-controlled temperature-compensated oscillator. The crystal oscillator 50
Variable capacitance diodes 7, 7 'whose capacitance changes according to the applied voltage, oscillation circuit 6, crystal oscillator 8, coupling capacitor 14, output buffers 14, 15, resistors 19, 1
9 '. The oscillation frequency of the crystal oscillator 50 is determined by the characteristics of the crystal resonator and the capacitance of the variable capacitance diode 7, and the oscillation output can be taken out from the output terminal 31.
【０００５】制御電圧発生部１は、温度の３次関数で表
される制御電圧を発生するもので、内部に温度検出器を
含んでいる。また、３次関数のパラメータは、調整可能
となっている。制御電圧発生部１は、例えば特開平９−
１５３１０４号公報、特開平１１−４１１９号公報に示
されるようなものが利用できる。なお、制御電圧発生部
１は、基準周波数ｆ0のばらつきの調整にも利用され
る。[0005] The control voltage generator 1 generates a control voltage represented by a cubic function of temperature, and includes a temperature detector therein. Also, the parameters of the cubic function can be adjusted. The control voltage generator 1 is disclosed in, for example,
JP-A-153104 and JP-A-11-4119 can be used. The control voltage generator 1 is also used to adjust the variation of the reference frequency f 0.
【０００６】ＲＣフィルタ２０は、抵抗３とコンデンサ
４から構成されるローパスフィルタであり、その時定数
は、位相ノイズの除去のため大きな値に設定される。The RC filter 20 is a low-pass filter composed of a resistor 3 and a capacitor 4, and its time constant is set to a large value for removing phase noise.
【０００７】このように構成した電圧制御型温度補償発
振装置は、水晶振動子８を除いて１チップのＩＣで構成
されるが、最終的な発振器として出荷されるまでには、
通常の２段階の検査を経る。[0007] The voltage-controlled temperature-compensated oscillator configured as described above is constituted by a one-chip IC except for the crystal oscillator 8, but before it is shipped as a final oscillator.
It goes through the usual two-step inspection.
【０００８】第１の検査は、ＩＣチップ単独で温度検出
器のオフセットを調整するためのものである。この検査
は、制御電圧発生部の３次関数パラメータを特定のもの
としたときのＲＣフィルタ２０の出力電圧を制御電圧モ
ニタ端子３２で測定することにより行う。そして、出力
電圧が所定値になるように温度検出センサのトリミング
を行うものである。The first test is for adjusting the offset of the temperature detector using only the IC chip. This inspection is performed by measuring the output voltage of the RC filter 20 at the control voltage monitor terminal 32 when the cubic function parameter of the control voltage generation unit is specified. Then, the temperature detection sensor is trimmed so that the output voltage becomes a predetermined value.
【０００９】第２の検査は、水晶振動子とＩＣチップを
基板に組み込んだ状態で、制御電圧発生部の３次関数パ
ラメータを調整するためのものである。この検査は、複
数の温度状態で、３次関数パラメータを変更したときの
発振周波数を測定することにより行う。そして、最適な
３次関数パラメータを求めて設定するものである。The second test is for adjusting a cubic function parameter of the control voltage generator in a state where the crystal unit and the IC chip are mounted on the substrate. This inspection is performed by measuring the oscillation frequency when the cubic function parameter is changed in a plurality of temperature states. Then, an optimal cubic function parameter is determined and set.
【００１０】温度検出センサは微少電流を出力するもの
であるので、第１の検査においてＲＣフィルタ２０の出
力電圧を測定する際には高精度な測定が要求される。し
かし、水晶発振器５０の出力バッファ１５、１６は自励
発振しやすいため、高精度な電圧測定が困難であり、高
精度のトリミングが困難であった。また、ＲＣフィルタ
２０の時定数は大きな値に設定されるため、検査に時間
がかかるという問題もあった。ＲＣフィルタ２０の時定
数の問題は、第２の検査においては少なくとも数十回の
周波数測定が必要であるため、さらに大きい。Since the temperature detection sensor outputs a very small current, high precision measurement is required when measuring the output voltage of the RC filter 20 in the first inspection. However, since the output buffers 15 and 16 of the crystal oscillator 50 easily oscillate by self-excitation, it is difficult to measure the voltage with high accuracy, and it is difficult to perform trimming with high accuracy. Further, since the time constant of the RC filter 20 is set to a large value, there is a problem that it takes a long time for the inspection. The problem of the time constant of the RC filter 20 is even greater because the second test requires at least several tens of frequency measurements.
【００１１】[0011]
【発明が解決しようとする課題】本発明は、このような
問題点を解決するもので、調整のための検査を高精度か
つ高速に行うことができる電圧制御型温度補償発振器を
提供することを目的とするものである。SUMMARY OF THE INVENTION The present invention has been made to solve the above-mentioned problems, and an object of the present invention is to provide a voltage-controlled temperature-compensated oscillator which can perform a test for adjustment with high accuracy and at high speed. It is the purpose.
【００１２】[0012]
【課題を解決するための手段】本発明は、ＲＣフィルタ
を時定数切換可能にするとともに、水晶発振器の出力バ
ッファの自励発振を停止させる発振停止回路を設けるも
のである。そして、第１及び第２の検査モードで前記Ｒ
Ｃフィルタの時定数を小に切換えるとともに、第１の検
査モードで、発振停止回路を動作させて出力バッファの
自励発振を停止させるようにしたものである。According to the present invention, an RC filter is provided with an oscillation stop circuit for switching the time constant, and for stopping self-excited oscillation of an output buffer of a crystal oscillator. Then, in the first and second inspection modes, the R
The time constant of the C filter is switched to a small value, and the self-excited oscillation of the output buffer is stopped by operating the oscillation stop circuit in the first inspection mode.
【００１３】[0013]
【発明の実施の形態】以下、本発明の実施の形態につい
て、図１を用いて説明する。図１は、本発明の実施の形
態の概略構成を示すものであり、制御電圧発生部１、Ｒ
Ｃフィルタ２、水晶発振器５、第１の制御入力端子３
３、第２の制御入力端子３４を含む。図１において、図
２と同じ要素は、同じ番号を付してある。Embodiments of the present invention will be described below with reference to FIG. FIG. 1 shows a schematic configuration of an embodiment of the present invention.
C filter 2, crystal oscillator 5, first control input terminal 3
3, including a second control input terminal 34; In FIG. 1, the same elements as those in FIG. 2 are given the same numbers.
【００１４】ＲＣフィルタ２は、ＰチャネルＭＯＳ９、
ＮチャネルＭＯＳ１０、インバータ１３、抵抗１２が付
加されている点で図２のＲＣフィルタ２０と異なる。抵
抗１２の値が抵抗３に比較して十分小さいので、論理回
路１８が高レベルとなってＰチャネルＭＯＳ９及びＮチ
ャネルＭＯＳ１０が導通すると、ＲＣフィルタ２の時定
数は、小に切換えられることになる。The RC filter 2 includes a P-channel MOS 9,
2 in that an N-channel MOS 10, an inverter 13, and a resistor 12 are added. Since the value of the resistor 12 is sufficiently smaller than that of the resistor 3, when the logic circuit 18 goes high and the P-channel MOS 9 and the N-channel MOS 10 conduct, the time constant of the RC filter 2 is switched to a small value. .
【００１５】水晶発振器５は、出力バッファの自励発振
を停止させる発振停止回路を構成する抵抗１７、Ｎチャ
ネルＭＯＳ１１が付加されている点で、図２の水晶発振
器５０と異なる。第１の制御入力端子３３が高レベルに
なってＮチャネルＭＯＳ１１が導通すると、出力バッフ
ァ１５の入力が接地され、出力バッファ１５、１６の自
励発振が停止することになる。The crystal oscillator 5 differs from the crystal oscillator 50 shown in FIG. 2 in that a resistor 17 and an N-channel MOS 11 constituting an oscillation stop circuit for stopping the self-excited oscillation of the output buffer are added. When the first control input terminal 33 goes high and the N-channel MOS 11 conducts, the input of the output buffer 15 is grounded, and the self-oscillation of the output buffers 15 and 16 stops.
【００１６】図１の電圧制御型温度補償発振装置の動作
を説明する。通常動作時には、第１の制御入力端子３
３、第２の制御入力端子３４がともに低レベルに設定さ
れ、ＰチャネルＭＯＳ９、ＮチャネルＭＯＳ１０、Ｎチ
ャネルＭＯＳ１１が非導通となる。したがって、ＲＣフ
ィルタ２の時定数は十分大きく位相ノイズを除去するこ
とができ、出力端子３１からは、発振出力が得られる。The operation of the voltage-controlled temperature-compensated oscillator shown in FIG. 1 will be described. During normal operation, the first control input terminal 3
3, the second control input terminal 34 is both set to low level, and the P-channel MOS 9, N-channel MOS 10, and N-channel MOS 11 are turned off. Therefore, the time constant of the RC filter 2 is sufficiently large to remove phase noise, and an oscillation output is obtained from the output terminal 31.
【００１７】第１の制御入力端子３３に高レベル電圧を
印加して第１の検査モードに設定すると、ＰチャネルＭ
ＯＳ９、ＮチャネルＭＯＳ１０、ＮチャネルＭＯＳ１１
が導通し、ＲＣフィルタ２の時定数が小となるととも
に、出力バッファ１５、１６の自励発振を含めて水晶発
振器５は発振停止の状態となる。したがって、ＩＣチッ
プ単独で温度検出器のオフセットを調整する場合に第１
の検査モードとすると、出力バッファ１５、１６の自励
発振の影響及びＲＣフィルタ２０の時定数の影響を回避
でき、高精度かつ高速なトリミングが可能となる。この
検査モードでは、第２の制御入力端子のレベルはどちら
でもよい。When a high-level voltage is applied to the first control input terminal 33 to set the first inspection mode, the P-channel M
OS9, N-channel MOS 10, N-channel MOS 11
Is conducted, the time constant of the RC filter 2 becomes small, and the oscillation of the crystal oscillator 5 including the self-excited oscillation of the output buffers 15 and 16 is stopped. Therefore, when the offset of the temperature detector is adjusted by the IC chip alone, the first
In the test mode, the influence of the self-excited oscillation of the output buffers 15 and 16 and the influence of the time constant of the RC filter 20 can be avoided, and high-precision and high-speed trimming can be performed. In this inspection mode, the level of the second control input terminal may be either.
【００１８】第１の制御入力端子３３を低レベルの状態
にし、第２制御入力端子に高レベル電圧を印加して第２
の検査モードに設定すると、ＰチャネルＭＯＳ９、Ｎチ
ャネルＭＯＳ１０が導通し、ＮチャネルＭＯＳ１１が非
導通となる。このとき、ＲＣフィルタ２の時定数が小と
なり、出力端子３１からは、発振出力が得られる状態と
なるので、制御電圧発生部の３次関数パラメータを調整
する場合に、第２の検査モードに設定すると、高速な調
整が可能となる。３次関数パラメータの調整は、出力端
子３１から安定した周波数信号が得られればよいので、
位相ノイズを除去する必要はない。The first control input terminal 33 is set to a low level, and a high level voltage is applied to the second control input terminal to
When the inspection mode is set, the P-channel MOS 9 and the N-channel MOS 10 are turned on, and the N-channel MOS 11 is turned off. At this time, the time constant of the RC filter 2 becomes small and an oscillation output is obtained from the output terminal 31. Therefore, when adjusting the cubic function parameter of the control voltage generator, the second inspection mode is set. When set, high-speed adjustment is possible. Adjustment of the cubic function parameter is only required to obtain a stable frequency signal from the output terminal 31.
There is no need to remove phase noise.
【００１９】なお、図２のＲＣフィルタ２は、フィルタ
抵抗値を切換えることにより時定数を切換え可能として
いるが、コンデンサを複数設け、フィルタ容量値を切換
えて時定数を切換える構成としてもよい。Although the RC filter 2 shown in FIG. 2 can switch the time constant by switching the filter resistance value, it is also possible to provide a plurality of capacitors and switch the filter capacitance value to switch the time constant.
【００２０】[0020]
【発明の効果】以上の説明から明らかなように、本発明
によれば、発振装置用ＩＣ出荷時の周波数調整用制御電
圧の測定及び温度検出センサの調整が、高精度にかつ安
定して実施することができる。また、周波数調整用の制
御電圧発生部のパラメータ調整のための周波数測定を短
時間で実施することができる。As is apparent from the above description, according to the present invention, the measurement of the frequency adjustment control voltage and the adjustment of the temperature detection sensor at the time of shipment of the oscillator IC are performed with high accuracy and stability. can do. Further, the frequency measurement for adjusting the parameters of the control voltage generator for frequency adjustment can be performed in a short time.
【図１】本発明の実施の形態の概略構成を示す図FIG. 1 is a diagram showing a schematic configuration of an embodiment of the present invention.
【図２】従来の発振装置の概略構成を示す図FIG. 2 is a diagram showing a schematic configuration of a conventional oscillation device.
１・・・制御電圧発生部 ２、２０・・・ＲＣフィルタ ３、１２・・・ＲＣフィルタの抵抗 ４・・・ＲＣフィルタのコンデンサ ５、５０・・・水晶発振器 ６・・・発振回路 ７、７'・・・可変容量ダイオード ８・・・水晶振動子 ９・・・ＰチャネルＭＯＳトランジスタ １０、１１・・・ＮチャンネルＭＯＳトランジスタ １３・・・インバータ １４・・・カップリングコンデンサ １５、１６・・・出力バッファ １７、１９、１９'・・・抵抗 １８・・・オア回路 ３１・・・出力端子 ３２・・・制御電圧モニタ端子 ３３・・・第１の制御入力端子 ３４・・・第２の制御入力端子 DESCRIPTION OF SYMBOLS 1 ... Control voltage generation part 2, 20 ... RC filter 3, 12 ... RC filter resistance 4 ... RC filter capacitor 5, 50 ... Crystal oscillator 6 ... Oscillation circuit 7, 7 ': Variable capacitance diode 8: Crystal oscillator 9: P-channel MOS transistor 10, 11: N-channel MOS transistor 13: Inverter 14: Coupling capacitor 15, 16, ... -Output buffer 17, 19, 19 '... resistor 18 ... OR circuit 31 ... output terminal 32 ... control voltage monitor terminal 33 ... first control input terminal 34 ... second Control input terminal
Claims (1)
含む水晶発振器と、温度に応じた制御電圧を発生し、前
記周波数調整素子に印加する制御電圧発生部とを有する
電圧制御型温度補償発振装置であって、 時定数切換可能なＲＣフィルタと、 前記水晶発振器の出力バッファの自励発振を停止させる
発振停止回路と、 第１及び第２の検査モードを指定する手段とをさらに有
し、 前記制御電圧は、前記ＲＣフィルタを介して前記周波数
調整素子に印加されるものであり、 前記ＲＣフィルタの時定数は、前記第１及び第２の検査
モードに指定されたときに小に切換えられるものであ
り、 前記発振停止回路は、前記第1の検査モードに指定され
たときに前記出力バッファの自励発振を停止させるもの
である電圧制御型温度補償発振装置。1. A voltage-controlled temperature-compensated oscillator comprising: a crystal oscillator including a frequency adjustment element for adjusting an oscillation frequency; and a control voltage generator for generating a control voltage corresponding to a temperature and applying the control voltage to the frequency adjustment element. And further comprising: an RC filter capable of switching a time constant; an oscillation stop circuit for stopping self-excited oscillation of an output buffer of the crystal oscillator; and means for designating first and second inspection modes. The control voltage is applied to the frequency adjusting element via the RC filter, and the time constant of the RC filter is switched to a small value when the first and second inspection modes are designated. Wherein the oscillation stop circuit stops self-excited oscillation of the output buffer when the first test mode is designated.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000220755A JP3877502B2 (en) | 2000-07-21 | 2000-07-21 | Voltage controlled temperature compensated oscillator |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000220755A JP3877502B2 (en) | 2000-07-21 | 2000-07-21 | Voltage controlled temperature compensated oscillator |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2002043846A true JP2002043846A (en) | 2002-02-08 |
| JP3877502B2 JP3877502B2 (en) | 2007-02-07 |
Family
ID=18715302
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000220755A Expired - Fee Related JP3877502B2 (en) | 2000-07-21 | 2000-07-21 | Voltage controlled temperature compensated oscillator |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3877502B2 (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2013146004A (en) * | 2012-01-16 | 2013-07-25 | Seiko Epson Corp | Vibration device and electronic apparatus |
| JP2013232827A (en) * | 2012-05-01 | 2013-11-14 | Seiko Npc Corp | Oscillation circuit |
| CN109756204A (en) * | 2019-03-05 | 2019-05-14 | 广东合微集成电路技术有限公司 | A kind of filter, oscillation generating circuit and electronic device |
-
2000
- 2000-07-21 JP JP2000220755A patent/JP3877502B2/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2013146004A (en) * | 2012-01-16 | 2013-07-25 | Seiko Epson Corp | Vibration device and electronic apparatus |
| JP2013232827A (en) * | 2012-05-01 | 2013-11-14 | Seiko Npc Corp | Oscillation circuit |
| CN109756204A (en) * | 2019-03-05 | 2019-05-14 | 广东合微集成电路技术有限公司 | A kind of filter, oscillation generating circuit and electronic device |
| CN109756204B (en) * | 2019-03-05 | 2023-11-14 | 广东合微集成电路技术有限公司 | Filter, oscillation generating circuit and electronic device |
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