IT1043512B - Apparecchiatura per provare matricicincassate - Google Patents
Apparecchiatura per provare matricicincassateInfo
- Publication number
- IT1043512B IT1043512B IT28475/75A IT2847575A IT1043512B IT 1043512 B IT1043512 B IT 1043512B IT 28475/75 A IT28475/75 A IT 28475/75A IT 2847575 A IT2847575 A IT 2847575A IT 1043512 B IT1043512 B IT 1043512B
- Authority
- IT
- Italy
- Prior art keywords
- serials
- equipment
- testing received
- testing
- received
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/48—Arrangements in static stores specially adapted for testing by means external to the store, e.g. using direct memory access [DMA] or using auxiliary access paths
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Semiconductor Integrated Circuits (AREA)
- Tests Of Electronic Circuits (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US05/534,605 US3961251A (en) | 1974-12-20 | 1974-12-20 | Testing embedded arrays |
Publications (1)
Publication Number | Publication Date |
---|---|
IT1043512B true IT1043512B (it) | 1980-02-29 |
Family
ID=24130779
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IT28475/75A IT1043512B (it) | 1974-12-20 | 1975-10-21 | Apparecchiatura per provare matricicincassate |
Country Status (5)
Country | Link |
---|---|
US (1) | US3961251A (it) |
CA (1) | CA1048646A (it) |
DE (1) | DE2555435C2 (it) |
FR (1) | FR2295529A1 (it) |
IT (1) | IT1043512B (it) |
Families Citing this family (43)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4074851A (en) * | 1976-06-30 | 1978-02-21 | International Business Machines Corporation | Method of level sensitive testing a functional logic system with embedded array |
AU530415B2 (en) * | 1978-06-02 | 1983-07-14 | International Standard Electric Corp. | Integrated circuits |
FR2432175A1 (fr) * | 1978-07-27 | 1980-02-22 | Cii Honeywell Bull | Procede pour tester un systeme logique et systeme logique pour la mise en oeuvre de ce procede |
JPS5552581A (en) * | 1978-10-11 | 1980-04-17 | Advantest Corp | Pattern generator |
US4225957A (en) * | 1978-10-16 | 1980-09-30 | International Business Machines Corporation | Testing macros embedded in LSI chips |
DE3029883A1 (de) * | 1980-08-07 | 1982-03-11 | Ibm Deutschland Gmbh, 7000 Stuttgart | Schieberegister fuer pruef- und test-zwecke |
EP0059188A1 (en) * | 1980-09-08 | 1982-09-08 | Mostek Corporation | Tape burn-in circuit |
US4380805A (en) * | 1980-09-08 | 1983-04-19 | Mostek Corporation | Tape burn-in circuit |
US4441075A (en) * | 1981-07-02 | 1984-04-03 | International Business Machines Corporation | Circuit arrangement which permits the testing of each individual chip and interchip connection in a high density packaging structure having a plurality of interconnected chips, without any physical disconnection |
US4808915A (en) * | 1981-10-30 | 1989-02-28 | Honeywell Bull, Inc. | Assembly of electronic components testable by a reciprocal quiescent testing technique |
US4556840A (en) * | 1981-10-30 | 1985-12-03 | Honeywell Information Systems Inc. | Method for testing electronic assemblies |
US4481627A (en) * | 1981-10-30 | 1984-11-06 | Honeywell Information Systems Inc. | Embedded memory testing method and apparatus |
GB2114782B (en) * | 1981-12-02 | 1985-06-05 | Burroughs Corp | Branched-spiral wafer-scale integrated circuit |
US4503386A (en) * | 1982-04-20 | 1985-03-05 | International Business Machines Corporation | Chip partitioning aid (CPA)-A structure for test pattern generation for large logic networks |
DE3241412A1 (de) * | 1982-11-09 | 1984-05-10 | Siemens AG, 1000 Berlin und 8000 München | Vorrichtung zum testen eines hochintegrierten mikroprogramm-gesteuerten elektronischen bauteiles |
US4527115A (en) * | 1982-12-22 | 1985-07-02 | Raytheon Company | Configurable logic gate array |
US4608669A (en) * | 1984-05-18 | 1986-08-26 | International Business Machines Corporation | Self contained array timing |
US4644265A (en) * | 1985-09-03 | 1987-02-17 | International Business Machines Corporation | Noise reduction during testing of integrated circuit chips |
US4669081A (en) * | 1986-02-04 | 1987-05-26 | Raytheon Company | LSI fault insertion |
US4726023A (en) * | 1986-05-14 | 1988-02-16 | International Business Machines Corporation | Determination of testability of combined logic end memory by ignoring memory |
US5025210A (en) * | 1986-07-18 | 1991-06-18 | Kabushiki Kaisha Toshiba | Evaluation facilitating circuit device |
KR880014482A (ko) * | 1987-05-27 | 1988-12-24 | 미다 가쓰시게 | 반도체 집적회로 장치 |
JP2659095B2 (ja) * | 1987-06-30 | 1997-09-30 | 富士通株式会社 | ゲートアレイ及びメモリを有する半導体集積回路装置 |
US4853628A (en) * | 1987-09-10 | 1989-08-01 | Gazelle Microcircuits, Inc. | Apparatus for measuring circuit parameters of a packaged semiconductor device |
JP2521774B2 (ja) * | 1987-10-02 | 1996-08-07 | 株式会社日立製作所 | メモリ内蔵型論理lsi及びそのlsiの試験方法 |
US4878174A (en) * | 1987-11-03 | 1989-10-31 | Lsi Logic Corporation | Flexible ASIC microcomputer permitting the modular modification of dedicated functions and macroinstructions |
US4878209A (en) * | 1988-03-17 | 1989-10-31 | International Business Machines Corporation | Macro performance test |
US4875209A (en) * | 1988-04-04 | 1989-10-17 | Raytheon Company | Transient and intermittent fault insertion |
EP0350538B1 (en) * | 1988-07-13 | 1993-12-01 | Koninklijke Philips Electronics N.V. | Memory device containing a static RAM memory that is adapted for executing a self-test, and integrated circuit containing such a device as an embedded static RAM memory |
US5254940A (en) * | 1990-12-13 | 1993-10-19 | Lsi Logic Corporation | Testable embedded microprocessor and method of testing same |
US5331643A (en) * | 1991-09-04 | 1994-07-19 | International Business Machines Corporation | Self-testing logic with embedded arrays |
GB9417297D0 (en) * | 1994-08-26 | 1994-10-19 | Inmos Ltd | Method and apparatus for testing an integrated circuit device |
US5847561A (en) * | 1994-12-16 | 1998-12-08 | Texas Instruments Incorporated | Low overhead input and output boundary scan cells |
US5574692A (en) * | 1995-06-07 | 1996-11-12 | Lsi Logic Corporation | Memory testing apparatus for microelectronic integrated circuit |
EP0801401B1 (en) * | 1996-04-02 | 2003-08-27 | STMicroelectronics, Inc. | Testing and repair of embedded memory |
US5841784A (en) * | 1996-04-02 | 1998-11-24 | Stmicroelectronics, Inc. | Testing and repair of embedded memory |
DE19735406A1 (de) * | 1997-08-14 | 1999-02-18 | Siemens Ag | Halbleiterbauelement und Verfahren zum Testen und Betreiben eines Halbleiterbauelementes |
JP2000012639A (ja) * | 1998-06-24 | 2000-01-14 | Toshiba Corp | モニターtegのテスト回路 |
DE19911939C2 (de) * | 1999-03-17 | 2001-03-22 | Siemens Ag | Verfahren für den eingebauten Selbsttest einer elektronischen Schaltung |
US6928581B1 (en) | 1999-09-14 | 2005-08-09 | International Business Machines Corporation | Innovative bypass circuit for circuit testing and modification |
US6857088B1 (en) * | 2000-12-06 | 2005-02-15 | Cypress Semiconductor Corporation | Method and system for testing the logic of a complex digital circuit containing embedded memory arrays |
US7103814B2 (en) * | 2002-10-25 | 2006-09-05 | International Business Machines Corporation | Testing logic and embedded memory in parallel |
US6961886B2 (en) * | 2003-04-16 | 2005-11-01 | International Business Machines Corporation | Diagnostic method for structural scan chain designs |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR1315731A (fr) * | 1960-07-29 | 1963-01-25 | Ibm | Dispositif de correction d'erreurs |
US3387276A (en) * | 1965-08-13 | 1968-06-04 | Sperry Rand Corp | Off-line memory test |
US3772595A (en) * | 1971-03-19 | 1973-11-13 | Teradyne Inc | Method and apparatus for testing a digital logic fet by monitoring currents the device develops in response to input signals |
US3758761A (en) * | 1971-08-17 | 1973-09-11 | Texas Instruments Inc | Self-interconnecting/self-repairable electronic systems on a slice |
US3790885A (en) * | 1972-03-27 | 1974-02-05 | Ibm | Serial test patterns for mosfet testing |
US3789205A (en) * | 1972-09-28 | 1974-01-29 | Ibm | Method of testing mosfet planar boards |
US3761695A (en) * | 1972-10-16 | 1973-09-25 | Ibm | Method of level sensitive testing a functional logic system |
US3781670A (en) * | 1972-12-29 | 1973-12-25 | Ibm | Ac performance test for large scale integrated circuit chips |
-
1974
- 1974-12-20 US US05/534,605 patent/US3961251A/en not_active Expired - Lifetime
-
1975
- 1975-10-20 FR FR7533272A patent/FR2295529A1/fr active Granted
- 1975-10-21 IT IT28475/75A patent/IT1043512B/it active
- 1975-11-04 CA CA75239232A patent/CA1048646A/en not_active Expired
- 1975-12-10 DE DE2555435A patent/DE2555435C2/de not_active Expired
Also Published As
Publication number | Publication date |
---|---|
US3961251A (en) | 1976-06-01 |
DE2555435A1 (de) | 1976-06-24 |
DE2555435C2 (de) | 1982-04-08 |
FR2295529A1 (fr) | 1976-07-16 |
FR2295529B1 (it) | 1978-04-07 |
CA1048646A (en) | 1979-02-13 |
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