IN2014CN02540A - - Google Patents
Info
- Publication number
- IN2014CN02540A IN2014CN02540A IN2540CHN2014A IN2014CN02540A IN 2014CN02540 A IN2014CN02540 A IN 2014CN02540A IN 2540CHN2014 A IN2540CHN2014 A IN 2540CHN2014A IN 2014CN02540 A IN2014CN02540 A IN 2014CN02540A
- Authority
- IN
- India
- Prior art keywords
- heights
- test pulses
- signal indicative
- generate
- pulses
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
- H05G1/08—Electrical details
- H05G1/26—Measuring, controlling or protecting
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/17—Circuit arrangements not adapted to a particular type of detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/247—Detector read-out circuitry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
- G01T1/2914—Measurement of spatial distribution of radiation
- G01T1/2985—In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis)
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T7/00—Details of radiation-measuring instruments
- G01T7/005—Details of radiation-measuring instruments calibration techniques
Landscapes
- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Health & Medical Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Engineering & Computer Science (AREA)
- Toxicology (AREA)
- Pulmonology (AREA)
- Radiology & Medical Imaging (AREA)
- Theoretical Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Measurement Of Radiation (AREA)
Abstract
An imaging system (300) includes a detector array (314)with direct conversion detector pixels that detect radiation traversing an examination region of the imaging system and generate a signal indicative of the detected radiation a pulse shaper (316) configured to alternatively process the signal indicative of detected radiation generated by the detector array or a set of test pulses having different and known heights that correspond to different and known energy levels and to generate output pulses having heights indicative of the energy of the processed detected radiation or set of test pulses and a thresholds adjuster (330) configured to analyze the heights of the output pulses corresponding to the set of test pulses in connection with the heights of set of test pulses and a set of predetermined fixed energy thresholds and generate a threshold adjustment signal indicative of a baseline based on a result of the analysis.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201161548749P | 2011-10-19 | 2011-10-19 | |
PCT/IB2012/055554 WO2013057645A2 (en) | 2011-10-19 | 2012-10-12 | Photon counting detector |
Publications (1)
Publication Number | Publication Date |
---|---|
IN2014CN02540A true IN2014CN02540A (en) | 2015-08-07 |
Family
ID=47428774
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IN2540CHN2014 IN2014CN02540A (en) | 2011-10-19 | 2012-10-12 |
Country Status (7)
Country | Link |
---|---|
US (1) | US9301378B2 (en) |
EP (2) | EP2745143B1 (en) |
JP (1) | JP2014530704A (en) |
CN (1) | CN103890610B (en) |
IN (1) | IN2014CN02540A (en) |
RU (1) | RU2594602C2 (en) |
WO (1) | WO2013057645A2 (en) |
Families Citing this family (29)
Publication number | Priority date | Publication date | Assignee | Title |
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JP5593338B2 (en) * | 2012-01-30 | 2014-09-24 | 富士フイルム株式会社 | Radiation irradiation start determination device, radiation image capturing device, radiation image capturing control device, radiation irradiation start determination method, and radiation irradiation start determination program |
WO2014091278A1 (en) * | 2012-12-12 | 2014-06-19 | Koninklijke Philips N.V. | Adaptive persistent current compensation for photon counting detectors |
JP6242683B2 (en) * | 2012-12-27 | 2017-12-06 | 東芝メディカルシステムズ株式会社 | X-ray CT apparatus and control method |
CN105073010B (en) * | 2013-04-04 | 2018-04-03 | 东芝医疗***株式会社 | X-ray computed tomograohy apparatus |
EP2871496B1 (en) * | 2013-11-12 | 2020-01-01 | Samsung Electronics Co., Ltd | Radiation detector and computed tomography apparatus using the same |
CN105793734B (en) * | 2013-11-27 | 2019-05-07 | 皇家飞利浦有限公司 | For detecting the detecting devices and its method of photon |
KR101635980B1 (en) * | 2013-12-30 | 2016-07-05 | 삼성전자주식회사 | Radiation detector and computer tomography apparatus thereof |
CN106687825B (en) * | 2014-09-02 | 2020-06-23 | 皇家飞利浦有限公司 | Window-based spectral measurement in spectral CT detectors |
US10159450B2 (en) * | 2014-10-01 | 2018-12-25 | Toshiba Medical Systems Corporation | X-ray CT apparatus including a photon-counting detector, and an image processing apparatus and an image processing method for correcting detection signals detected by the photon-counting detector |
KR102266123B1 (en) * | 2014-11-10 | 2021-06-16 | 프리스매틱 센서즈 에이비 | X-ray imaging based on image data from a photon-counting multi bin x-ray detector |
KR101725099B1 (en) * | 2014-12-05 | 2017-04-26 | 삼성전자주식회사 | Computed tomography apparatus and control method for the same |
US10172577B2 (en) * | 2014-12-05 | 2019-01-08 | Koninklijke Philips N.V. | X-ray detector device for inclined angle X-ray radiation |
JP6277331B1 (en) * | 2014-12-11 | 2018-02-07 | コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. | X-ray detector, imaging apparatus and calibration method |
RU2699307C2 (en) * | 2014-12-16 | 2019-09-04 | Конинклейке Филипс Н.В. | Bias determination of photon detector base line |
US10098595B2 (en) * | 2015-08-06 | 2018-10-16 | Texas Instruments Incorporated | Low power photon counting system |
CN108139494B (en) * | 2015-10-20 | 2022-07-26 | 皇家飞利浦有限公司 | Polarization correction for direct conversion x-ray detector |
KR102405926B1 (en) * | 2015-11-12 | 2022-06-07 | 프리스매틱 센서즈 에이비 | HIGH-RESOLUTION COMPUTED TOMOGRAPHY USING EDGE-ON DETECTORS WITH TEMPORALLY OFFSET DEPTH-SEGMENTS |
KR102605320B1 (en) * | 2016-08-31 | 2023-11-23 | 프리스매틱 센서즈 에이비 | Method and system for estimating relative gain and offset of converters |
US10067240B1 (en) * | 2017-03-06 | 2018-09-04 | Prismatic Sensors Ab | X-ray detector system based on photon counting |
CN106989835B (en) * | 2017-04-12 | 2023-07-11 | 东北大学 | Photon counting X-ray energy spectrum detection device and imaging system based on compressed sensing |
JP2019010426A (en) * | 2017-06-30 | 2019-01-24 | ゼネラル・エレクトリック・カンパニイ | Radiation tomography imaging apparatus and program |
US10151845B1 (en) | 2017-08-02 | 2018-12-11 | Texas Instruments Incorporated | Configurable analog-to-digital converter and processing for photon counting |
US10024979B1 (en) | 2017-11-01 | 2018-07-17 | Texas Instruments Incorporated | Photon counting with coincidence detection |
CN108897030B (en) * | 2018-05-09 | 2020-12-25 | 中国科学院近代物理研究所 | Timing extraction device and method for signal |
CN108903961A (en) * | 2018-07-19 | 2018-11-30 | 深圳市倍康美医疗电子商务有限公司 | A kind of CBCT imaging method, storage medium and system |
US11219114B2 (en) * | 2018-10-03 | 2022-01-04 | Konica Minolta, Inc. | Radiation generation control device, radiation generation control system, and radiography system |
US10890674B2 (en) | 2019-01-15 | 2021-01-12 | Texas Instruments Incorporated | Dynamic noise shaping in a photon counting system |
CN110412644A (en) * | 2019-08-14 | 2019-11-05 | 苏州瑞迈斯医疗科技有限公司 | Photoncounting methods and device |
CN110456404B (en) * | 2019-08-14 | 2023-07-28 | 苏州瑞迈斯科技有限公司 | Radiation detection device and imaging system |
Family Cites Families (17)
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US5943388A (en) | 1996-07-30 | 1999-08-24 | Nova R & D, Inc. | Radiation detector and non-destructive inspection |
US5804833A (en) | 1996-10-10 | 1998-09-08 | Advanced Scientific Concepts, Inc. | Advanced semiconductor emitter technology photocathodes |
JP2004325183A (en) * | 2003-04-23 | 2004-11-18 | M & C:Kk | Radiation detection method, radiation detector, and radiation imaging system with this detector loaded thereon |
US7599465B2 (en) * | 2004-11-19 | 2009-10-06 | General Electric Company | Detection of thrombi in CT using energy discrimination |
JP2008523872A (en) * | 2004-12-17 | 2008-07-10 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | Pulsed X-ray for continuous detector correction |
US7480362B2 (en) * | 2005-10-28 | 2009-01-20 | Koninklijke Philips Electronics N.V. | Method and apparatus for spectral computed tomography |
JP5340524B2 (en) * | 2006-03-23 | 2013-11-13 | 浜松ホトニクス株式会社 | Radiation detector and radiation detection method |
US8044681B2 (en) * | 2007-10-08 | 2011-10-25 | General Electric Company | Apparatus and method for channel-specific configuration in a readout ASIC |
JP2011521212A (en) * | 2008-04-30 | 2011-07-21 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | Counting detector |
WO2009141760A2 (en) | 2008-05-19 | 2009-11-26 | Koninklijke Philips Electronics N.V. | A photon detector with converter unit |
US8213566B2 (en) * | 2008-07-07 | 2012-07-03 | Koninklijke Philips Electronics N.V. | K-edge imaging |
US20100316184A1 (en) * | 2008-10-17 | 2010-12-16 | Jan Iwanczyk | Silicon photomultiplier detector for computed tomography |
US8198577B2 (en) | 2009-02-25 | 2012-06-12 | Caeleste Cvba | High dynamic range analog X-ray photon counting |
US8384038B2 (en) | 2009-06-24 | 2013-02-26 | General Electric Company | Readout electronics for photon counting and energy discriminating detectors |
JP2011085479A (en) * | 2009-10-15 | 2011-04-28 | Tele Systems:Kk | Calibration device for photon counting type radiation detector and calibration method thereof |
EP2517048B1 (en) * | 2009-12-21 | 2018-02-21 | Koninklijke Philips N.V. | Radiation detector assembly with test circuitry |
US8080780B2 (en) * | 2009-12-29 | 2011-12-20 | Kabushiki Kaisha Toshiba | Apparatus and associated methodology for improving timing resolution in gamma ray detection |
-
2012
- 2012-10-12 IN IN2540CHN2014 patent/IN2014CN02540A/en unknown
- 2012-10-12 EP EP12805762.7A patent/EP2745143B1/en active Active
- 2012-10-12 RU RU2014119870/28A patent/RU2594602C2/en not_active IP Right Cessation
- 2012-10-12 JP JP2014536375A patent/JP2014530704A/en not_active Ceased
- 2012-10-12 EP EP17187549.5A patent/EP3290959B1/en active Active
- 2012-10-12 WO PCT/IB2012/055554 patent/WO2013057645A2/en active Application Filing
- 2012-10-12 CN CN201280051041.2A patent/CN103890610B/en active Active
- 2012-10-12 US US14/350,370 patent/US9301378B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
WO2013057645A2 (en) | 2013-04-25 |
EP2745143B1 (en) | 2019-04-03 |
US20140254749A1 (en) | 2014-09-11 |
RU2014119870A (en) | 2015-11-27 |
EP3290959B1 (en) | 2020-05-27 |
CN103890610B (en) | 2017-08-29 |
EP3290959A1 (en) | 2018-03-07 |
CN103890610A (en) | 2014-06-25 |
JP2014530704A (en) | 2014-11-20 |
US9301378B2 (en) | 2016-03-29 |
WO2013057645A3 (en) | 2014-03-06 |
EP2745143A2 (en) | 2014-06-25 |
RU2594602C2 (en) | 2016-08-20 |
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