IN2014CN02540A - - Google Patents

Info

Publication number
IN2014CN02540A
IN2014CN02540A IN2540CHN2014A IN2014CN02540A IN 2014CN02540 A IN2014CN02540 A IN 2014CN02540A IN 2540CHN2014 A IN2540CHN2014 A IN 2540CHN2014A IN 2014CN02540 A IN2014CN02540 A IN 2014CN02540A
Authority
IN
India
Prior art keywords
heights
test pulses
signal indicative
generate
pulses
Prior art date
Application number
Inventor
Booker Roger Steadman
Randall Peter Luhta
Christoph Herrmann
Original Assignee
Koninkl Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninkl Philips Nv filed Critical Koninkl Philips Nv
Publication of IN2014CN02540A publication Critical patent/IN2014CN02540A/en

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/17—Circuit arrangements not adapted to a particular type of detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/247—Detector read-out circuitry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2985—In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T7/00—Details of radiation-measuring instruments
    • G01T7/005—Details of radiation-measuring instruments calibration techniques

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Toxicology (AREA)
  • Pulmonology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Theoretical Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Measurement Of Radiation (AREA)

Abstract

An imaging system (300) includes a detector array (314)with direct conversion detector pixels that detect radiation traversing an examination region of the imaging system and generate a signal indicative of the detected radiation a pulse shaper (316) configured to alternatively process the signal indicative of detected radiation generated by the detector array or a set of test pulses having different and known heights that correspond to different and known energy levels and to generate output pulses having heights indicative of the energy of the processed detected radiation or set of test pulses and a thresholds adjuster (330) configured to analyze the heights of the output pulses corresponding to the set of test pulses in connection with the heights of set of test pulses and a set of predetermined fixed energy thresholds and generate a threshold adjustment signal indicative of a baseline based on a result of the analysis.
IN2540CHN2014 2011-10-19 2012-10-12 IN2014CN02540A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201161548749P 2011-10-19 2011-10-19
PCT/IB2012/055554 WO2013057645A2 (en) 2011-10-19 2012-10-12 Photon counting detector

Publications (1)

Publication Number Publication Date
IN2014CN02540A true IN2014CN02540A (en) 2015-08-07

Family

ID=47428774

Family Applications (1)

Application Number Title Priority Date Filing Date
IN2540CHN2014 IN2014CN02540A (en) 2011-10-19 2012-10-12

Country Status (7)

Country Link
US (1) US9301378B2 (en)
EP (2) EP2745143B1 (en)
JP (1) JP2014530704A (en)
CN (1) CN103890610B (en)
IN (1) IN2014CN02540A (en)
RU (1) RU2594602C2 (en)
WO (1) WO2013057645A2 (en)

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WO2014091278A1 (en) * 2012-12-12 2014-06-19 Koninklijke Philips N.V. Adaptive persistent current compensation for photon counting detectors
JP6242683B2 (en) * 2012-12-27 2017-12-06 東芝メディカルシステムズ株式会社 X-ray CT apparatus and control method
CN105073010B (en) * 2013-04-04 2018-04-03 东芝医疗***株式会社 X-ray computed tomograohy apparatus
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CN105793734B (en) * 2013-11-27 2019-05-07 皇家飞利浦有限公司 For detecting the detecting devices and its method of photon
KR101635980B1 (en) * 2013-12-30 2016-07-05 삼성전자주식회사 Radiation detector and computer tomography apparatus thereof
CN106687825B (en) * 2014-09-02 2020-06-23 皇家飞利浦有限公司 Window-based spectral measurement in spectral CT detectors
US10159450B2 (en) * 2014-10-01 2018-12-25 Toshiba Medical Systems Corporation X-ray CT apparatus including a photon-counting detector, and an image processing apparatus and an image processing method for correcting detection signals detected by the photon-counting detector
KR102266123B1 (en) * 2014-11-10 2021-06-16 프리스매틱 센서즈 에이비 X-ray imaging based on image data from a photon-counting multi bin x-ray detector
KR101725099B1 (en) * 2014-12-05 2017-04-26 삼성전자주식회사 Computed tomography apparatus and control method for the same
US10172577B2 (en) * 2014-12-05 2019-01-08 Koninklijke Philips N.V. X-ray detector device for inclined angle X-ray radiation
JP6277331B1 (en) * 2014-12-11 2018-02-07 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． X-ray detector, imaging apparatus and calibration method
RU2699307C2 (en) * 2014-12-16 2019-09-04 Конинклейке Филипс Н.В. Bias determination of photon detector base line
US10098595B2 (en) * 2015-08-06 2018-10-16 Texas Instruments Incorporated Low power photon counting system
CN108139494B (en) * 2015-10-20 2022-07-26 皇家飞利浦有限公司 Polarization correction for direct conversion x-ray detector
KR102405926B1 (en) * 2015-11-12 2022-06-07 프리스매틱 센서즈 에이비 HIGH-RESOLUTION COMPUTED TOMOGRAPHY USING EDGE-ON DETECTORS WITH TEMPORALLY OFFSET DEPTH-SEGMENTS
KR102605320B1 (en) * 2016-08-31 2023-11-23 프리스매틱 센서즈 에이비 Method and system for estimating relative gain and offset of converters
US10067240B1 (en) * 2017-03-06 2018-09-04 Prismatic Sensors Ab X-ray detector system based on photon counting
CN106989835B (en) * 2017-04-12 2023-07-11 东北大学 Photon counting X-ray energy spectrum detection device and imaging system based on compressed sensing
JP2019010426A (en) * 2017-06-30 2019-01-24 ゼネラル・エレクトリック・カンパニイ Radiation tomography imaging apparatus and program
US10151845B1 (en) 2017-08-02 2018-12-11 Texas Instruments Incorporated Configurable analog-to-digital converter and processing for photon counting
US10024979B1 (en) 2017-11-01 2018-07-17 Texas Instruments Incorporated Photon counting with coincidence detection
CN108897030B (en) * 2018-05-09 2020-12-25 中国科学院近代物理研究所 Timing extraction device and method for signal
CN108903961A (en) * 2018-07-19 2018-11-30 深圳市倍康美医疗电子商务有限公司 A kind of CBCT imaging method, storage medium and system
US11219114B2 (en) * 2018-10-03 2022-01-04 Konica Minolta, Inc. Radiation generation control device, radiation generation control system, and radiography system
US10890674B2 (en) 2019-01-15 2021-01-12 Texas Instruments Incorporated Dynamic noise shaping in a photon counting system
CN110412644A (en) * 2019-08-14 2019-11-05 苏州瑞迈斯医疗科技有限公司 Photoncounting methods and device
CN110456404B (en) * 2019-08-14 2023-07-28 苏州瑞迈斯科技有限公司 Radiation detection device and imaging system

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Also Published As

Publication number Publication date
WO2013057645A2 (en) 2013-04-25
EP2745143B1 (en) 2019-04-03
US20140254749A1 (en) 2014-09-11
RU2014119870A (en) 2015-11-27
EP3290959B1 (en) 2020-05-27
CN103890610B (en) 2017-08-29
EP3290959A1 (en) 2018-03-07
CN103890610A (en) 2014-06-25
JP2014530704A (en) 2014-11-20
US9301378B2 (en) 2016-03-29
WO2013057645A3 (en) 2014-03-06
EP2745143A2 (en) 2014-06-25
RU2594602C2 (en) 2016-08-20

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