IL312256A - Charged particle blocking element, exposure apparatus comprising such an element, and method for using such an exposure apparatus - Google Patents

Charged particle blocking element, exposure apparatus comprising such an element, and method for using such an exposure apparatus

Info

Publication number
IL312256A
IL312256A IL312256A IL31225624A IL312256A IL 312256 A IL312256 A IL 312256A IL 312256 A IL312256 A IL 312256A IL 31225624 A IL31225624 A IL 31225624A IL 312256 A IL312256 A IL 312256A
Authority
IL
Israel
Prior art keywords
exposure apparatus
charged particle
particle blocking
blocking element
exposure
Prior art date
Application number
IL312256A
Other languages
Hebrew (he)
Original Assignee
Asml Netherlands Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asml Netherlands Bv filed Critical Asml Netherlands Bv
Publication of IL312256A publication Critical patent/IL312256A/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
    • H01J37/045—Beam blanking or chopping, i.e. arrangements for momentarily interrupting exposure to the discharge
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
    • H01J37/09—Diaphragms; Shields associated with electron or ion-optical arrangements; Compensation of disturbing fields
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
    • H01J37/3174—Particle-beam lithography, e.g. electron beam lithography
    • H01J37/3177—Multi-beam, e.g. fly's eye, comb probe
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/002—Cooling arrangements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/02—Details
    • H01J2237/0203—Protection arrangements
    • H01J2237/0213—Avoiding deleterious effects due to interactions between particles and tube elements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/04—Means for controlling the discharge
    • H01J2237/043—Beam blanking
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/04—Means for controlling the discharge
    • H01J2237/043—Beam blanking
    • H01J2237/0435—Multi-aperture
    • H01J2237/0437—Semiconductor substrate
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/04—Means for controlling the discharge
    • H01J2237/045—Diaphragms
    • H01J2237/0451—Diaphragms with fixed aperture
    • H01J2237/0453—Diaphragms with fixed aperture multiple apertures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/04—Means for controlling the discharge
    • H01J2237/045—Diaphragms
    • H01J2237/0456—Supports

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Beam Exposure (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
IL312256A 2017-08-08 2018-06-21 Charged particle blocking element, exposure apparatus comprising such an element, and method for using such an exposure apparatus IL312256A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201762542310P 2017-08-08 2017-08-08
PCT/JP2018/024475 WO2019031093A1 (en) 2017-08-08 2018-06-21 Charged particle blocking element, exposure apparatus comprising such an element, and method for using such an exposure apparatus

Publications (1)

Publication Number Publication Date
IL312256A true IL312256A (en) 2024-06-01

Family

ID=63405324

Family Applications (2)

Application Number Title Priority Date Filing Date
IL272370A IL272370B1 (en) 2017-08-08 2018-06-21 Charged particle blocking element, exposure apparatus comprising such an element, and method for using such an exposure apparatus
IL312256A IL312256A (en) 2017-08-08 2018-06-21 Charged particle blocking element, exposure apparatus comprising such an element, and method for using such an exposure apparatus

Family Applications Before (1)

Application Number Title Priority Date Filing Date
IL272370A IL272370B1 (en) 2017-08-08 2018-06-21 Charged particle blocking element, exposure apparatus comprising such an element, and method for using such an exposure apparatus

Country Status (8)

Country Link
US (3) US11101099B2 (en)
EP (1) EP3665716A4 (en)
JP (3) JP6934560B2 (en)
KR (3) KR20230154095A (en)
IL (2) IL272370B1 (en)
NL (1) NL2021299B1 (en)
TW (2) TWI793146B (en)
WO (1) WO2019031093A1 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2019031093A1 (en) * 2017-08-08 2019-02-14 Mapper Lithography Ip B.V. Charged particle blocking element, exposure apparatus comprising such an element, and method for using such an exposure apparatus
IL294401A (en) 2020-01-06 2022-08-01 Asml Netherlands Bv Charged particle assessment tool, inspection method
EP4117012A1 (en) * 2021-07-07 2023-01-11 ASML Netherlands B.V. Charged particle-optical device, charged particle apparatus and method
EP4385053A1 (en) * 2021-08-10 2024-06-19 Carl Zeiss MultiSEM GmbH Multi-beam generating unit with increased focusing power

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EP0078336B1 (en) * 1981-10-30 1988-02-03 Ibm Deutschland Gmbh Shadow projecting mask for ion implantation and lithography by ion beam radiation
JP2523931B2 (en) * 1990-04-16 1996-08-14 富士通株式会社 Blanking aperture manufacturing method
JP2555775B2 (en) * 1990-11-28 1996-11-20 富士通株式会社 Charged particle beam deflector and manufacturing method thereof
US6014200A (en) * 1998-02-24 2000-01-11 Nikon Corporation High throughput electron beam lithography system
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JP2001068404A (en) * 1999-08-31 2001-03-16 Nikon Corp Protective member for electron beam transfer mask and electron beam projection aligner
JP2001267207A (en) * 2000-03-15 2001-09-28 Nec Corp Electron beam exposure mask, its manufacturing method, and electron beam exposure system
US6749968B2 (en) * 2001-08-09 2004-06-15 Freescale Semiconductor, Inc. Method for fabricating a thin-membrane stencil mask and method for making a semiconductor device using the same
JP2004259478A (en) * 2003-02-24 2004-09-16 Nikon Corp Electron gun and electron beam exposure device
KR20050001840A (en) 2003-06-26 2005-01-07 주식회사 하이닉스반도체 variable shaped beam aperture of semiconductor device
JP2005303165A (en) * 2004-04-15 2005-10-27 Renesas Technology Corp Charged particle line exposure device and charged particle line exposure method
JP2009215609A (en) * 2008-03-10 2009-09-24 Japan Science & Technology Agency Thin film forming method, sample holder for electron microscope, and its forming method
US9458710B2 (en) 2009-12-31 2016-10-04 Schlumberger Technology Corporation Hydraulic fracturing system
DE102010041156B9 (en) * 2010-09-21 2018-01-25 Carl Zeiss Microscopy Gmbh Aperture unit for a particle beam device and particle beam device
WO2012065941A1 (en) 2010-11-13 2012-05-24 Mapper Lithography Ip B.V. Charged particle lithography system with aperture array cooling
US8586949B2 (en) * 2010-11-13 2013-11-19 Mapper Lithography Ip B.V. Charged particle lithography system with intermediate chamber
TWI593961B (en) * 2010-12-15 2017-08-01 日立全球先端科技股份有限公司 Charged particle line application device, and irradiation method
JP5687157B2 (en) * 2011-08-22 2015-03-18 株式会社日立ハイテクノロジーズ Electron gun, field emission electron gun, charged particle beam apparatus, and transmission electron microscope
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JP5897888B2 (en) * 2011-12-07 2016-04-06 株式会社ニューフレアテクノロジー Charged particle beam lithography system
CN102956420B (en) 2012-10-30 2016-11-16 中国科学院上海应用物理研究所 Electron ray source generation device and the method producing low dose rate electron ray
JP6281234B2 (en) * 2012-12-26 2018-02-21 凸版印刷株式会社 Electron beam drawing device
JP2014154233A (en) * 2013-02-05 2014-08-25 Yamagata Prefecture Heating device with electron beam permeable membrane
NL2010760C2 (en) 2013-05-03 2014-11-04 Mapper Lithography Ip Bv Beam grid layout.
JP2015023286A (en) * 2013-07-17 2015-02-02 アイエムエス ナノファブリケーション アーゲー Pattern definition device having multiple blanking arrays
JP6356538B2 (en) * 2014-08-27 2018-07-11 株式会社アドバンテスト Exposure equipment
JP6500383B2 (en) * 2014-10-03 2019-04-17 株式会社ニューフレアテクノロジー Blanking aperture array and charged particle beam drawing apparatus
JP6709109B2 (en) * 2016-05-31 2020-06-10 株式会社ニューフレアテクノロジー Blanking device for multi-charged particle beam and multi-charged particle beam irradiation device
JP6720861B2 (en) * 2016-12-28 2020-07-08 株式会社ニューフレアテクノロジー Multi-beam aperture set and multi-charged particle beam drawing device
WO2019031093A1 (en) * 2017-08-08 2019-02-14 Mapper Lithography Ip B.V. Charged particle blocking element, exposure apparatus comprising such an element, and method for using such an exposure apparatus

Also Published As

Publication number Publication date
JP7384868B2 (en) 2023-11-21
NL2021299A (en) 2019-02-18
KR20220091613A (en) 2022-06-30
KR102596854B1 (en) 2023-11-02
EP3665716A4 (en) 2021-10-20
KR20200024316A (en) 2020-03-06
TW201918796A (en) 2019-05-16
TWI793146B (en) 2023-02-21
JP2020530203A (en) 2020-10-15
EP3665716A1 (en) 2020-06-17
JP2021185613A (en) 2021-12-09
US20200194214A1 (en) 2020-06-18
IL272370A (en) 2020-03-31
US11728123B2 (en) 2023-08-15
KR20230154095A (en) 2023-11-07
JP2024003134A (en) 2024-01-11
US20230335366A1 (en) 2023-10-19
CN111108582A (en) 2020-05-05
IL272370B1 (en) 2024-06-01
US11101099B2 (en) 2021-08-24
KR102413090B1 (en) 2022-06-24
WO2019031093A1 (en) 2019-02-14
NL2021299B1 (en) 2019-05-29
TW202323994A (en) 2023-06-16
US20210384002A1 (en) 2021-12-09
JP6934560B2 (en) 2021-09-15

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