IL154445A0 - Reduction of false alarms in pcb inspection - Google Patents

Reduction of false alarms in pcb inspection

Info

Publication number
IL154445A0
IL154445A0 IL15444500A IL15444500A IL154445A0 IL 154445 A0 IL154445 A0 IL 154445A0 IL 15444500 A IL15444500 A IL 15444500A IL 15444500 A IL15444500 A IL 15444500A IL 154445 A0 IL154445 A0 IL 154445A0
Authority
IL
Israel
Prior art keywords
reduction
false alarms
pcb inspection
pcb
inspection
Prior art date
Application number
IL15444500A
Other languages
English (en)
Original Assignee
Orbotech Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Orbotech Ltd filed Critical Orbotech Ltd
Publication of IL154445A0 publication Critical patent/IL154445A0/xx

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N21/95607—Inspecting patterns on the surface of objects using a comparative method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/309—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of printed or hybrid circuits or circuit substrates
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/20—Image preprocessing
    • G06V10/22—Image preprocessing by selection of a specific region containing or referencing a pattern; Locating or processing of specific regions to guide the detection or recognition
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/40—Extraction of image or video features
    • G06V10/44—Local feature extraction by analysis of parts of the pattern, e.g. by detecting edges, contours, loops, corners, strokes or intersections; Connectivity analysis, e.g. of connected components
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/40—Extraction of image or video features
    • G06V10/56—Extraction of image or video features relating to colour
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10016—Video; Image sequence
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30141—Printed circuit board [PCB]

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Multimedia (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Quality & Reliability (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • General Engineering & Computer Science (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)
IL15444500A 2000-09-10 2000-09-10 Reduction of false alarms in pcb inspection IL154445A0 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/IL2000/000552 WO2002021105A1 (en) 2000-09-10 2000-09-10 Reduction of false alarms in pcb inspection

Publications (1)

Publication Number Publication Date
IL154445A0 true IL154445A0 (en) 2003-09-17

Family

ID=11042995

Family Applications (1)

Application Number Title Priority Date Filing Date
IL15444500A IL154445A0 (en) 2000-09-10 2000-09-10 Reduction of false alarms in pcb inspection

Country Status (7)

Country Link
US (2) US7177458B1 (zh)
JP (1) JP2004509325A (zh)
CN (2) CN1289901C (zh)
AU (1) AU2000270373A1 (zh)
GB (1) GB2388428A (zh)
IL (1) IL154445A0 (zh)
WO (1) WO2002021105A1 (zh)

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US7925074B2 (en) * 2006-10-16 2011-04-12 Teradyne, Inc. Adaptive background propagation method and device therefor
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US7542821B2 (en) 2007-07-26 2009-06-02 3M Innovative Properties Company Multi-unit process spatial synchronization of image inspection systems
JP5236241B2 (ja) * 2007-10-02 2013-07-17 シャープ株式会社 欠陥検査装置、欠陥検査方法、画像処理装置、プログラム、及び該プログラムを記録したコンピュータ読み取り可能な記録媒体
KR20090100615A (ko) * 2008-03-20 2009-09-24 삼성전자주식회사 결함 검출 방법
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US8773140B2 (en) * 2011-07-26 2014-07-08 Photon Dynamics, Inc System and method for inspection of electrical circuits
US20130071006A1 (en) * 2011-09-19 2013-03-21 International Business Machines Corporation Image Analysis of Processor Device Features
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JP6510189B2 (ja) * 2014-06-23 2019-05-08 キヤノンメディカルシステムズ株式会社 医用画像処理装置
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US10586318B2 (en) * 2016-10-07 2020-03-10 Raytheon Company Automated model-based inspection system for screening electronic components
EP3549098B1 (en) * 2016-12-02 2021-11-17 Koninklijke Philips N.V. Apparatus for identifying objects from an object class
US10438340B2 (en) * 2017-03-21 2019-10-08 Test Research, Inc. Automatic optical inspection system and operating method thereof
WO2018176370A1 (zh) * 2017-03-31 2018-10-04 深圳配天智能技术研究院有限公司 一种视觉检测***及方法
KR102309569B1 (ko) * 2017-06-14 2021-10-07 캠텍 리미티드 자동 결함 분류
CN107228860B (zh) * 2017-06-28 2020-04-24 北京因时机器人科技有限公司 一种基于图像旋转周期特性的齿轮缺陷检测方法
US11320385B2 (en) 2018-10-16 2022-05-03 Seagate Technology Llc Intelligent defect identification system
CN109540901A (zh) * 2018-11-02 2019-03-29 英业达(重庆)有限公司 自动光学检测不良信息反馈***及方法
CN109752392B (zh) * 2018-12-24 2021-08-03 苏州江奥光电科技有限公司 一种pcb板缺陷类型检测***和方法
CN109767445B (zh) * 2019-02-01 2020-11-27 佛山市南海区广工大数控装备协同创新研究院 一种高精度的pcb缺陷智能检测方法
CN110579479B (zh) * 2019-08-09 2024-07-16 苏州康代智能科技股份有限公司 一种基于假点缺陷检测的pcb检修***及检修方法
CN110793472B (zh) * 2019-11-11 2021-07-27 桂林理工大学 一种基于四元数奇异值熵指标的磨削表面粗糙度检测方法
CN111079564B (zh) 2019-11-27 2021-06-01 奥特斯科技(重庆)有限公司 处理部件承载件的方法及光学检查设备和计算机可读介质
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Also Published As

Publication number Publication date
GB2388428A (en) 2003-11-12
CN1955717A (zh) 2007-05-02
US7177458B1 (en) 2007-02-13
US20070165939A1 (en) 2007-07-19
CN1955717B (zh) 2011-04-20
AU2000270373A1 (en) 2002-03-22
CN1289901C (zh) 2006-12-13
JP2004509325A (ja) 2004-03-25
CN1468371A (zh) 2004-01-14
WO2002021105A1 (en) 2002-03-14
GB0305457D0 (en) 2003-04-16

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