IL139958A0 - Method and device for opto-electrical acquisition of shapes by axial ellumination - Google Patents
Method and device for opto-electrical acquisition of shapes by axial elluminationInfo
- Publication number
- IL139958A0 IL139958A0 IL13995899A IL13995899A IL139958A0 IL 139958 A0 IL139958 A0 IL 139958A0 IL 13995899 A IL13995899 A IL 13995899A IL 13995899 A IL13995899 A IL 13995899A IL 139958 A0 IL139958 A0 IL 139958A0
- Authority
- IL
- Israel
- Prior art keywords
- opto
- axial
- ellumination
- shapes
- electrical acquisition
- Prior art date
Links
- 238000000034 method Methods 0.000 title abstract 2
- 238000005286 illumination Methods 0.000 abstract 1
- 230000003595 spectral effect Effects 0.000 abstract 1
- 238000010183 spectrum analysis Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/2803—Investigating the spectrum using photoelectric array detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2210/00—Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
- G01B2210/50—Using chromatic effects to achieve wavelength-dependent depth resolution
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Eye Examination Apparatus (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Optical Radar Systems And Details Thereof (AREA)
- Light Receiving Elements (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9807076A FR2779517B1 (fr) | 1998-06-05 | 1998-06-05 | Procede et dispositif d'acquisition opto-electrique de formes par illumination axiale |
PCT/FR1999/001299 WO1999064816A1 (fr) | 1998-06-05 | 1999-06-02 | Procede et dispositif d'acquisition opto-electrique de formes par illumination axiale |
Publications (1)
Publication Number | Publication Date |
---|---|
IL139958A0 true IL139958A0 (en) | 2002-02-10 |
Family
ID=9527049
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IL13995899A IL139958A0 (en) | 1998-06-05 | 1999-06-02 | Method and device for opto-electrical acquisition of shapes by axial ellumination |
Country Status (11)
Country | Link |
---|---|
US (1) | US6327041B1 (xx) |
EP (1) | EP1084379B1 (xx) |
JP (1) | JP2002517742A (xx) |
KR (1) | KR20010071403A (xx) |
AT (1) | ATE305131T1 (xx) |
AU (1) | AU4044599A (xx) |
CA (1) | CA2334225C (xx) |
DE (1) | DE69927367T2 (xx) |
FR (1) | FR2779517B1 (xx) |
IL (1) | IL139958A0 (xx) |
WO (1) | WO1999064816A1 (xx) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1126412B1 (en) | 2000-02-16 | 2013-01-30 | FUJIFILM Corporation | Image capturing apparatus and distance measuring method |
FR2807830B1 (fr) * | 2000-04-14 | 2002-08-16 | Architecture Traitement D Imag | Dispositif d'acquisition d'une forme tridimensionnelle par voie optoelectronique |
US20050174584A1 (en) * | 2000-07-06 | 2005-08-11 | Chalmers Scott A. | Method and apparatus for high-speed thickness mapping of patterned thin films |
DE102004049541A1 (de) * | 2004-10-12 | 2006-04-20 | Precitec Optronik Gmbh | Meßsystem zur Vermessung von Oberflächen sowie Kalibrierverfahren hierfür |
US8328731B2 (en) * | 2006-01-06 | 2012-12-11 | Phonak Ag | Method and system for reconstructing the three-dimensional shape of the surface of at least a portion of an ear canal and/or of a concha |
DE102006026775B4 (de) * | 2006-06-07 | 2008-04-30 | Stiftung Für Lasertechnologien In Der Medizin Und Messtechnik An Der Universität Ulm | Verfahren und Vorrichtung zur Charakterisierung bewegter Oberflächen |
FI119259B (fi) * | 2006-10-18 | 2008-09-15 | Valtion Teknillinen | Pinnan ja paksuuden määrittäminen |
DE102007044530B4 (de) | 2007-09-18 | 2009-06-10 | VMA Gesellschaft für visuelle Meßtechnik und Automatisierung mbH | Anordnung zur Messung der Dicke und des Abstandes transparenter Objekte |
DE202007014435U1 (de) * | 2007-10-16 | 2009-03-05 | Gurny, Eric | Optischer Sensor für eine Messvorrichtung |
US7990522B2 (en) * | 2007-11-14 | 2011-08-02 | Mitutoyo Corporation | Dynamic compensation of chromatic point sensor intensity profile data selection |
GB0809037D0 (en) * | 2008-05-19 | 2008-06-25 | Renishaw Plc | Video Probe |
US7873488B2 (en) * | 2008-12-08 | 2011-01-18 | Mitutoyo Corporation | On-site calibration method and object for chromatic point sensors |
DE102009001086B4 (de) | 2009-02-23 | 2014-03-27 | Sirona Dental Systems Gmbh | Handgehaltene dentale Kamera und Verfahren zur optischen 3D-Vermessung |
US8928892B2 (en) | 2009-03-04 | 2015-01-06 | Elie Meimoun | Wavefront analysis inspection apparatus and method |
US7876456B2 (en) * | 2009-05-11 | 2011-01-25 | Mitutoyo Corporation | Intensity compensation for interchangeable chromatic point sensor components |
US8900126B2 (en) | 2011-03-23 | 2014-12-02 | United Sciences, Llc | Optical scanning device |
US8900125B2 (en) | 2012-03-12 | 2014-12-02 | United Sciences, Llc | Otoscanning with 3D modeling |
Family Cites Families (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3843227A (en) * | 1969-02-08 | 1974-10-22 | Nippon Kogaku Kk | Light dissecting optical system |
CH663466A5 (fr) * | 1983-09-12 | 1987-12-15 | Battelle Memorial Institute | Procede et dispositif pour determiner la position d'un objet par rapport a une reference. |
DE3432252A1 (de) * | 1984-09-01 | 1986-03-06 | Fa. Carl Zeiss, 7920 Heidenheim | Messmikroskop |
NZ223988A (en) * | 1987-03-24 | 1990-11-27 | Commw Scient Ind Res Org | Optical distance measuring |
JPH07107481B2 (ja) * | 1987-05-21 | 1995-11-15 | アンリツ株式会社 | 変位測定装置 |
CH671828A5 (xx) * | 1987-06-26 | 1989-09-29 | Battelle Memorial Institute | |
JPH01188816A (ja) * | 1988-01-25 | 1989-07-28 | Hitachi Ltd | 分光型走査顕微鏡 |
JPH03289293A (ja) * | 1990-04-04 | 1991-12-19 | Mitsubishi Electric Corp | 撮像装置 |
JP2692416B2 (ja) * | 1990-05-23 | 1997-12-17 | 横河電機株式会社 | 共焦点用光スキャナ |
JP2633718B2 (ja) * | 1990-10-03 | 1997-07-23 | 株式会社東芝 | 形状認識装置 |
JP2812371B2 (ja) * | 1991-04-10 | 1998-10-22 | 株式会社高岳製作所 | 表面形状測定装置 |
JPH064611U (ja) * | 1992-06-25 | 1994-01-21 | 株式会社キーエンス | 光学式距離測定装置 |
DE69435333D1 (de) * | 1993-04-21 | 2011-03-24 | Omron Tateisi Electronics Co | Vorrichtung zur visuellen kontrolle von platinen und deren verwendung zur kontrolle und korrektur von lötungen |
JPH0783623A (ja) * | 1993-09-20 | 1995-03-28 | Fujitsu Ltd | 厚み計測方法及び装置 |
US5608529A (en) * | 1994-01-31 | 1997-03-04 | Nikon Corporation | Optical three-dimensional shape measuring apparatus |
JPH07229720A (ja) * | 1994-02-21 | 1995-08-29 | Nec Corp | 3次元形状測定装置 |
JPH07248211A (ja) * | 1994-03-09 | 1995-09-26 | Toyota Central Res & Dev Lab Inc | 表面性状検出装置 |
JP2919267B2 (ja) * | 1994-05-26 | 1999-07-12 | 松下電工株式会社 | 形状検出方法およびその装置 |
JP3385442B2 (ja) * | 1994-05-31 | 2003-03-10 | 株式会社ニュークリエイション | 検査用光学系および検査装置 |
US5701173A (en) * | 1996-02-20 | 1997-12-23 | National Research Council Of Canada | Method and apparatus for reducing the unwanted effects of noise present in a three dimensional color imaging system |
JPH109827A (ja) * | 1996-06-24 | 1998-01-16 | Omron Corp | 高さ判別装置および方法 |
JPH1010419A (ja) * | 1996-06-25 | 1998-01-16 | Nikon Corp | 焦点検出装置 |
IL121267A0 (en) * | 1997-07-09 | 1998-01-04 | Yeda Res & Dev | Method and device for determining the profile of an object |
-
1998
- 1998-06-05 FR FR9807076A patent/FR2779517B1/fr not_active Expired - Fee Related
-
1999
- 1999-06-02 IL IL13995899A patent/IL139958A0/xx unknown
- 1999-06-02 KR KR1020007013751A patent/KR20010071403A/ko not_active Application Discontinuation
- 1999-06-02 JP JP2000553768A patent/JP2002517742A/ja active Pending
- 1999-06-02 CA CA002334225A patent/CA2334225C/en not_active Expired - Fee Related
- 1999-06-02 AT AT99923655T patent/ATE305131T1/de not_active IP Right Cessation
- 1999-06-02 EP EP99923655A patent/EP1084379B1/fr not_active Expired - Lifetime
- 1999-06-02 WO PCT/FR1999/001299 patent/WO1999064816A1/fr active IP Right Grant
- 1999-06-02 AU AU40445/99A patent/AU4044599A/en not_active Abandoned
- 1999-06-02 DE DE69927367T patent/DE69927367T2/de not_active Expired - Fee Related
-
2000
- 2000-11-27 US US09/722,045 patent/US6327041B1/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
CA2334225A1 (en) | 1999-12-16 |
EP1084379B1 (fr) | 2005-09-21 |
DE69927367T2 (de) | 2006-07-06 |
KR20010071403A (ko) | 2001-07-28 |
US6327041B1 (en) | 2001-12-04 |
DE69927367D1 (de) | 2005-10-27 |
JP2002517742A (ja) | 2002-06-18 |
AU4044599A (en) | 1999-12-30 |
EP1084379A1 (fr) | 2001-03-21 |
FR2779517A1 (fr) | 1999-12-10 |
FR2779517B1 (fr) | 2000-08-18 |
CA2334225C (en) | 2005-05-03 |
WO1999064816A1 (fr) | 1999-12-16 |
ATE305131T1 (de) | 2005-10-15 |
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