IL124782A - High impedance JTAG measuring circuit - Google Patents

High impedance JTAG measuring circuit

Info

Publication number
IL124782A
IL124782A IL12478296A IL12478296A IL124782A IL 124782 A IL124782 A IL 124782A IL 12478296 A IL12478296 A IL 12478296A IL 12478296 A IL12478296 A IL 12478296A IL 124782 A IL124782 A IL 124782A
Authority
IL
Israel
Prior art keywords
shift register
output enable
bit locations
data
jtag
Prior art date
Application number
IL12478296A
Other languages
English (en)
Hebrew (he)
Other versions
IL124782A0 (en
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of IL124782A0 publication Critical patent/IL124782A0/xx
Publication of IL124782A publication Critical patent/IL124782A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318558—Addressing or selecting of subparts of the device under test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Semiconductor Integrated Circuits (AREA)
IL12478296A 1995-12-19 1996-09-26 High impedance JTAG measuring circuit IL124782A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/574,593 US5631912A (en) 1995-12-19 1995-12-19 High impedance test mode for JTAG
PCT/US1996/014837 WO1997022885A1 (en) 1995-12-19 1996-09-26 High impedance test mode for jtag

Publications (2)

Publication Number Publication Date
IL124782A0 IL124782A0 (en) 1999-01-26
IL124782A true IL124782A (en) 2001-06-14

Family

ID=24296783

Family Applications (1)

Application Number Title Priority Date Filing Date
IL12478296A IL124782A (en) 1995-12-19 1996-09-26 High impedance JTAG measuring circuit

Country Status (11)

Country Link
US (1) US5631912A (ru)
EP (1) EP0868667B1 (ru)
JP (1) JP3565863B2 (ru)
KR (1) KR100262424B1 (ru)
CN (1) CN1119667C (ru)
AU (1) AU7239396A (ru)
DE (1) DE69628034T2 (ru)
IL (1) IL124782A (ru)
RU (1) RU2191396C2 (ru)
TW (1) TW420754B (ru)
WO (1) WO1997022885A1 (ru)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7308629B2 (en) 2004-12-07 2007-12-11 Texas Instruments Incorporated Addressable tap domain selection circuit with TDI/TDO external terminal
US5881254A (en) * 1996-06-28 1999-03-09 Lsi Logic Corporation Inter-bus bridge circuit with integrated memory port
US5937174A (en) * 1996-06-28 1999-08-10 Lsi Logic Corporation Scalable hierarchial memory structure for high data bandwidth raid applications
US5715256A (en) * 1996-09-27 1998-02-03 Sun Microsystems, Inc. Method and apparatus for handling multiplexer contention during scan
US5935266A (en) * 1996-11-15 1999-08-10 Lucent Technologies Inc. Method for powering-up a microprocessor under debugger control
US5781488A (en) * 1997-04-18 1998-07-14 Mosel Vitelic Corporation DRAM with new I/O data path configuration
JP3094983B2 (ja) * 1998-03-12 2000-10-03 日本電気株式会社 システムロジックのテスト回路およびテスト方法
US5982683A (en) * 1998-03-23 1999-11-09 Advanced Micro Devices, Inc. Enhanced method of testing semiconductor devices having nonvolatile elements
US6100743A (en) * 1998-08-25 2000-08-08 Lucent Technologies Inc. Circuit arrangement for adding functionality to a circuit with reduced propagation delays
US6324663B1 (en) * 1998-10-22 2001-11-27 Vlsi Technology, Inc. System and method to test internal PCI agents
US6598178B1 (en) * 1999-06-01 2003-07-22 Agere Systems Inc. Peripheral breakpoint signaler
KR100810549B1 (ko) * 2000-12-20 2008-03-18 톰슨 라이센싱 고속 ｉ2ｃ 버스 통신용의 선택된 집적 회로를 분리하기위한 ｉ2ｃ 버스 제어 장치 및 방법
US7032146B2 (en) * 2002-10-29 2006-04-18 International Business Machines Corporation Boundary scan apparatus and interconnect test method
US20050099832A1 (en) * 2003-11-12 2005-05-12 Agere Systems, Incorporated System and method for securing an integrated circuit as against subsequent reprogramming
CN100370269C (zh) * 2003-11-19 2008-02-20 华为技术有限公司 一种边界扫描测试控制器及边界扫描测试方法
US7219258B2 (en) * 2003-12-10 2007-05-15 International Business Machines Corporation Method, system, and product for utilizing a power subsystem to diagnose and recover from errors
US7395471B2 (en) 2004-06-17 2008-07-01 Texas Instruments Incorporated Connection of auxiliary circuitry to tap and instruction register controls
CN1332208C (zh) * 2005-07-07 2007-08-15 中国航天科技集团公司第五研究院第五一四研究所 数字模拟阻抗标准器
US8332560B2 (en) * 2005-07-11 2012-12-11 Dell Products L.P. System and method for identifying inoperable connection points in a storage enclosure
US8478979B2 (en) * 2010-09-09 2013-07-02 Hewlett-Packard Development Company, L.P. Disable a feature of a computing machine
CN106918724A (zh) * 2015-12-24 2017-07-04 英业达科技有限公司 适用于快捷外设互联标准插槽的测试电路板
CN108363650A (zh) * 2018-01-08 2018-08-03 郑州云海信息技术有限公司 一种多节点服务器自动控制jtag拓扑的***和方法
RU2703493C1 (ru) * 2018-12-28 2019-10-17 федеральное государственное автономное образовательное учреждение высшего образования "Самарский национальный исследовательский университет имени академика С.П. Королёва" Способ локализации дефектов короткого замыкания выводов микросхем JTAG интерфейсом и устройство для его осуществления
KR102170181B1 (ko) 2019-06-05 2020-10-26 에스케이텔레콤 주식회사 통신 품질 모니터링 장치 및 방법

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5084874A (en) * 1988-09-07 1992-01-28 Texas Instruments Incorporated Enhanced test circuit
US5153882A (en) * 1990-03-29 1992-10-06 National Semiconductor Corporation Serial scan diagnostics apparatus and method for a memory device
JP2513904B2 (ja) * 1990-06-12 1996-07-10 株式会社東芝 テスト容易化回路
US5210759A (en) * 1990-11-19 1993-05-11 Motorola, Inc. Data processing system having scan testing using set latches for selectively observing test data
US5455517A (en) * 1992-06-09 1995-10-03 International Business Machines Corporation Data output impedance control

Also Published As

Publication number Publication date
JP2000502445A (ja) 2000-02-29
RU2191396C2 (ru) 2002-10-20
DE69628034D1 (de) 2003-06-12
KR100262424B1 (en) 2000-08-01
DE69628034T2 (de) 2004-02-19
IL124782A0 (en) 1999-01-26
EP0868667B1 (en) 2003-05-07
EP0868667A1 (en) 1998-10-07
CN1219241A (zh) 1999-06-09
US5631912A (en) 1997-05-20
JP3565863B2 (ja) 2004-09-15
WO1997022885A1 (en) 1997-06-26
CN1119667C (zh) 2003-08-27
AU7239396A (en) 1997-07-14
EP0868667A4 (en) 1999-04-07
TW420754B (en) 2001-02-01

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