HUE050537T2 - Eljárás rendszer indirekt sávréses félvezetõ eszközök lumineszcenciás képalkotás segítségével való tesztelésére - Google Patents

Eljárás rendszer indirekt sávréses félvezetõ eszközök lumineszcenciás képalkotás segítségével való tesztelésére

Info

Publication number
HUE050537T2
HUE050537T2 HUE07718842A HUE07718842A HUE050537T2 HU E050537 T2 HUE050537 T2 HU E050537T2 HU E07718842 A HUE07718842 A HU E07718842A HU E07718842 A HUE07718842 A HU E07718842A HU E050537 T2 HUE050537 T2 HU E050537T2
Authority
HU
Hungary
Prior art keywords
semiconductor devices
bandgap semiconductor
indirect bandgap
luminescence imaging
testing
Prior art date
Application number
HUE07718842A
Other languages
English (en)
Inventor
Thorsten Trupke
Robert Bardos
Original Assignee
Bt Imaging Pty Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from AU2006902366A external-priority patent/AU2006902366A0/en
Application filed by Bt Imaging Pty Ltd filed Critical Bt Imaging Pty Ltd
Publication of HUE050537T2 publication Critical patent/HUE050537T2/hu

Links

Classifications

    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
    • H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
    • H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
    • H02S50/15—Testing of PV devices, e.g. of PV modules or single PV cells using optical means, e.g. using electroluminescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6489—Photoluminescence of semiconductors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9501—Semiconductor wafers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02—Details
    • H01L31/0224—Electrodes
    • H01L31/022408—Electrodes for devices characterised by at least one potential jump barrier or surface barrier
    • H01L31/022425—Electrodes for devices characterised by at least one potential jump barrier or surface barrier for solar cells
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy

Landscapes

  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Photovoltaic Devices (AREA)
HUE07718842A 2006-05-05 2007-05-04 Eljárás rendszer indirekt sávréses félvezetõ eszközök lumineszcenciás képalkotás segítségével való tesztelésére HUE050537T2 (hu)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
AU2006902366A AU2006902366A0 (en) 2006-05-05 Method and system for testing indirect bandgap semiconductor devices using luminescence imaging

Publications (1)

Publication Number Publication Date
HUE050537T2 true HUE050537T2 (hu) 2020-12-28

Family

ID=38667333

Family Applications (1)

Application Number Title Priority Date Filing Date
HUE07718842A HUE050537T2 (hu) 2006-05-05 2007-05-04 Eljárás rendszer indirekt sávréses félvezetõ eszközök lumineszcenciás képalkotás segítségével való tesztelésére

Country Status (6)

Country Link
US (3) US8710860B2 (hu)
EP (1) EP2024716B1 (hu)
JP (2) JP2009536448A (hu)
CN (4) CN101490517B (hu)
HU (1) HUE050537T2 (hu)
WO (1) WO2007128060A1 (hu)

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Also Published As

Publication number Publication date
CN103175814A (zh) 2013-06-26
US9912291B2 (en) 2018-03-06
CN101490517B (zh) 2013-03-27
EP2024716B1 (en) 2020-07-01
CN101490517A (zh) 2009-07-22
CN103185854A (zh) 2013-07-03
EP2024716A1 (en) 2009-02-18
EP2024716A4 (en) 2009-05-13
JP2014241414A (ja) 2014-12-25
CN103185854B (zh) 2015-07-01
US20140191776A1 (en) 2014-07-10
JP5893683B2 (ja) 2016-03-23
CN105675555A (zh) 2016-06-15
JP2009536448A (ja) 2009-10-08
CN103175814B (zh) 2016-02-03
US20090206287A1 (en) 2009-08-20
CN105675555B (zh) 2019-07-12
US20170033736A1 (en) 2017-02-02
US9482625B2 (en) 2016-11-01
WO2007128060A1 (en) 2007-11-15
US8710860B2 (en) 2014-04-29

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