HK85993A - Exponential decay time constant measurement using frequency of offset-phase locked loop:system and method - Google Patents
Exponential decay time constant measurement using frequency of offset-phase locked loop:system and methodInfo
- Publication number
- HK85993A HK85993A HK859/93A HK85993A HK85993A HK 85993 A HK85993 A HK 85993A HK 859/93 A HK859/93 A HK 859/93A HK 85993 A HK85993 A HK 85993A HK 85993 A HK85993 A HK 85993A
- Authority
- HK
- Hong Kong
- Prior art keywords
- offset
- frequency
- time constant
- locked loop
- phase locked
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6408—Fluorescence; Phosphorescence with measurement of decay time, time resolved fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
- G01N2021/3144—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths for oxymetry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6428—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T436/00—Chemistry: analytical and immunological testing
- Y10T436/20—Oxygen containing
- Y10T436/207497—Molecular oxygen
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T436/00—Chemistry: analytical and immunological testing
- Y10T436/20—Oxygen containing
- Y10T436/207497—Molecular oxygen
- Y10T436/209163—Dissolved or trace oxygen or oxygen content of a sealed environment
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Measurement Of The Respiration, Hearing Ability, Form, And Blood Characteristics Of Living Organisms (AREA)
- Medical Treatment And Welfare Office Work (AREA)
- Measurement Of Unknown Time Intervals (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/047,818 US4716363A (en) | 1987-05-08 | 1987-05-08 | Exponential decay time constant measurement using frequency of offset phase-locked loop: system and method |
Publications (1)
Publication Number | Publication Date |
---|---|
HK85993A true HK85993A (en) | 1993-08-27 |
Family
ID=21951152
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HK859/93A HK85993A (en) | 1987-05-08 | 1993-08-19 | Exponential decay time constant measurement using frequency of offset-phase locked loop:system and method |
Country Status (5)
Country | Link |
---|---|
US (1) | US4716363A (ja) |
EP (1) | EP0294938B1 (ja) |
JP (1) | JP2645270B2 (ja) |
DE (1) | DE3874008T2 (ja) |
HK (1) | HK85993A (ja) |
Families Citing this family (35)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4754216A (en) * | 1987-09-03 | 1988-06-28 | National Semiconductor Corporation | Method and apparatus for qualifying the decode window margin of a phase locked loop data synchronizer |
DK163194C (da) * | 1988-12-22 | 1992-06-22 | Radiometer As | Fremgangsmaade ved fotometrisk in vitro bestemmelse af en blodgasparameter i en blodproeve |
GB2218216B (en) * | 1988-04-29 | 1992-09-23 | Schlumberger Electronics | Improvements in or relating to frequency response analysis |
US4885554A (en) * | 1988-12-16 | 1989-12-05 | Tektronix, Inc. | Phase-offset signal generator |
US5152291A (en) * | 1990-09-07 | 1992-10-06 | Hewlett-Packard Company | Acoustic fiber measurement of intravascular blood |
US5057771A (en) * | 1990-06-18 | 1991-10-15 | Tetronix, Inc. | Phase-locked timebase for electro-optic sampling |
US5107445A (en) * | 1990-12-04 | 1992-04-21 | Luxtron Corporation | Modular luminescence-based measuring system using fast digital signal processing |
US5176882A (en) * | 1990-12-06 | 1993-01-05 | Hewlett-Packard Company | Dual fiberoptic cell for multiple serum measurements |
US5323008A (en) * | 1992-03-23 | 1994-06-21 | Diatron Corporation | Fluorometer detection system |
US5462879A (en) * | 1993-10-14 | 1995-10-31 | Minnesota Mining And Manufacturing Company | Method of sensing with emission quenching sensors |
CA2147561C (en) * | 1994-05-10 | 1997-09-16 | Klaus W. Berndt | Composite optical blood culture sensor |
JP3364333B2 (ja) * | 1994-09-19 | 2003-01-08 | 浜松ホトニクス株式会社 | 減衰特性測定装置 |
US5863460A (en) * | 1996-04-01 | 1999-01-26 | Chiron Diagnostics Corporation | Oxygen sensing membranes and methods of making same |
US6306347B1 (en) | 1998-01-21 | 2001-10-23 | Bayer Corporation | Optical sensor and method of operation |
US6254831B1 (en) | 1998-01-21 | 2001-07-03 | Bayer Corporation | Optical sensors with reflective materials |
US6190612B1 (en) | 1998-01-21 | 2001-02-20 | Bayer Corporation | Oxygen sensing membranes and methods of making same |
US6107083A (en) * | 1998-08-21 | 2000-08-22 | Bayer Corporation | Optical oxidative enzyme-based sensors |
US6157037A (en) * | 1998-12-04 | 2000-12-05 | Photosense, Llc | Sensing device and method for measuring emission time delay during irradiation of targeted samples |
US20030010931A1 (en) * | 2001-07-16 | 2003-01-16 | Pittaro Richard J. | Methods for analyzing arrays |
US6912050B2 (en) | 2003-02-03 | 2005-06-28 | Hach Company | Phase shift measurement for luminescent light |
WO2005033746A2 (en) * | 2003-09-29 | 2005-04-14 | Photosense L.L.C. | Frequency domain luminescence instrumentation |
AU2006315664B2 (en) * | 2005-11-10 | 2012-03-08 | Tautheta Instruments Llc | Apparatus and method for system identification |
US7781221B2 (en) * | 2006-08-18 | 2010-08-24 | Ric Investments, Llc | System and method of compensating for system delay in analyte analyzation |
JP2009250807A (ja) * | 2008-04-07 | 2009-10-29 | Seiko Epson Corp | 周波数測定装置及び測定方法 |
CN102150035A (zh) * | 2008-09-19 | 2011-08-10 | 三井造船株式会社 | 采用强度调制激光的荧光检测装置和荧光检测方法 |
JP4564566B2 (ja) | 2009-02-13 | 2010-10-20 | 三井造船株式会社 | 蛍光検出装置及び蛍光検出方法 |
JP4564567B2 (ja) | 2009-02-13 | 2010-10-20 | 三井造船株式会社 | 蛍光検出装置及び蛍光検出方法 |
JP2010271091A (ja) | 2009-05-20 | 2010-12-02 | Seiko Epson Corp | 周波数測定装置 |
JP5440999B2 (ja) | 2009-05-22 | 2014-03-12 | セイコーエプソン株式会社 | 周波数測定装置 |
JP5517033B2 (ja) | 2009-05-22 | 2014-06-11 | セイコーエプソン株式会社 | 周波数測定装置 |
JP5582447B2 (ja) | 2009-08-27 | 2014-09-03 | セイコーエプソン株式会社 | 電気回路、同電気回路を備えたセンサーシステム、及び同電気回路を備えたセンサーデバイス |
JP5815918B2 (ja) | 2009-10-06 | 2015-11-17 | セイコーエプソン株式会社 | 周波数測定方法、周波数測定装置及び周波数測定装置を備えた装置 |
JP5876975B2 (ja) | 2009-10-08 | 2016-03-02 | セイコーエプソン株式会社 | 周波数測定装置及び周波数測定装置における変速分周信号の生成方法 |
JP5358426B2 (ja) * | 2009-12-24 | 2013-12-04 | 株式会社堀場製作所 | 精製油劣化度測定装置及び精製油劣化度測定方法 |
JP5883558B2 (ja) | 2010-08-31 | 2016-03-15 | セイコーエプソン株式会社 | 周波数測定装置及び電子機器 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3939405A (en) * | 1974-08-19 | 1976-02-17 | Deere & Company | Apparatus and method for making decay rate measurements |
US4109283A (en) * | 1976-05-21 | 1978-08-22 | Rca Corporation | Frequency counter for a television tuning system |
JPS53127709A (en) * | 1977-04-13 | 1978-11-08 | Morita Mfg | Driving system for transducer with resonance circuit |
GB2089029B (en) * | 1980-11-28 | 1984-03-21 | Scintrex Ltd | Method and apparatus for the remote detection of certain minerals of uranium zinc lead and other metals |
JPS57175276A (en) * | 1981-04-21 | 1982-10-28 | Fujitsu Ltd | Delayed time measuring circuit |
US4670887A (en) * | 1985-08-05 | 1987-06-02 | Hayes Microcomputer Products, Inc. | Multiplexed PSK demodulator |
-
1987
- 1987-05-08 US US07/047,818 patent/US4716363A/en not_active Expired - Lifetime
-
1988
- 1988-05-02 JP JP10979588A patent/JP2645270B2/ja not_active Expired - Lifetime
- 1988-05-06 DE DE8888304136T patent/DE3874008T2/de not_active Revoked
- 1988-05-06 EP EP88304136A patent/EP0294938B1/en not_active Expired - Lifetime
-
1993
- 1993-08-19 HK HK859/93A patent/HK85993A/xx unknown
Also Published As
Publication number | Publication date |
---|---|
EP0294938A3 (en) | 1990-03-28 |
EP0294938A2 (en) | 1988-12-14 |
EP0294938B1 (en) | 1992-08-26 |
US4716363A (en) | 1987-12-29 |
JP2645270B2 (ja) | 1997-08-25 |
DE3874008T2 (de) | 1993-04-08 |
DE3874008D1 (de) | 1992-10-01 |
JPS63308596A (ja) | 1988-12-15 |
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