HK46292A - High throughput circuit tester and test technique avoiding overdriving damage - Google Patents
High throughput circuit tester and test technique avoiding overdriving damageInfo
- Publication number
- HK46292A HK46292A HK462/92A HK46292A HK46292A HK 46292 A HK46292 A HK 46292A HK 462/92 A HK462/92 A HK 462/92A HK 46292 A HK46292 A HK 46292A HK 46292 A HK46292 A HK 46292A
- Authority
- HK
- Hong Kong
- Prior art keywords
- damage
- high throughput
- circuit tester
- test technique
- throughput circuit
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31915—In-circuit Testers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/503,465 US4588945A (en) | 1983-06-13 | 1983-06-13 | High throughput circuit tester and test technique avoiding overdriving damage |
Publications (1)
Publication Number | Publication Date |
---|---|
HK46292A true HK46292A (en) | 1992-07-03 |
Family
ID=24002208
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HK462/92A HK46292A (en) | 1983-06-13 | 1992-06-25 | High throughput circuit tester and test technique avoiding overdriving damage |
Country Status (6)
Country | Link |
---|---|
US (1) | US4588945A (xx) |
EP (1) | EP0128774B1 (xx) |
JP (2) | JPS6013267A (xx) |
DE (1) | DE3485280D1 (xx) |
HK (1) | HK46292A (xx) |
SG (1) | SG34092G (xx) |
Families Citing this family (29)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3543699A1 (de) * | 1985-12-11 | 1987-06-19 | Rohde & Schwarz | Verfahren zum pruefen der einzelnen bauelemente einer leiterplatte (in-circuit-test) |
GB2186701B (en) * | 1986-02-14 | 1990-03-28 | Membrain Ltd | Circuit testers |
SE461939B (sv) * | 1988-09-12 | 1990-04-09 | Kjell Moum | Instrument foer kontroll av ic-kretsar |
US4947113A (en) * | 1989-03-31 | 1990-08-07 | Hewlett-Packard Company | Driver circuit for providing pulses having clean edges |
US5027064A (en) * | 1989-04-19 | 1991-06-25 | Celeritek, Inc. | Method and means for measuring operating temperature of semiconductor devices by monitoring RF characteristics |
US4998026A (en) * | 1989-04-19 | 1991-03-05 | Hewlett-Packard Company | Driver circuit for in-circuit overdrive/functional tester |
US5005008A (en) * | 1989-04-20 | 1991-04-02 | Hewlett Packard Company | Method and apparatus for providing thermodynamic protection of a driver circuit used in an in-circuit tester |
JP2584673B2 (ja) * | 1989-06-09 | 1997-02-26 | 株式会社日立製作所 | テストデータ変更回路を有する論理回路テスト装置 |
US5032789A (en) * | 1989-06-19 | 1991-07-16 | Hewlett-Packard Company | Modular/concurrent board tester |
US5127009A (en) * | 1989-08-29 | 1992-06-30 | Genrad, Inc. | Method and apparatus for circuit board testing with controlled backdrive stress |
US5111137A (en) * | 1990-10-29 | 1992-05-05 | Hewlett-Packard Company | Method and apparatus for the detection of leakage current |
US5321701A (en) * | 1990-12-06 | 1994-06-14 | Teradyne, Inc. | Method and apparatus for a minimal memory in-circuit digital tester |
US5144229A (en) * | 1991-08-30 | 1992-09-01 | Hewlett-Packard Company | Method for selectively conditioning integrated circuit outputs for in-circuit test |
US5184029A (en) * | 1991-10-15 | 1993-02-02 | Hewlett-Packard Company | Driver circuit for circuit tester |
US5260649A (en) * | 1992-01-03 | 1993-11-09 | Hewlett-Packard Company | Powered testing of mixed conventional/boundary-scan logic |
US5448166A (en) * | 1992-01-03 | 1995-09-05 | Hewlett-Packard Company | Powered testing of mixed conventional/boundary-scan logic |
US5761214A (en) * | 1992-10-16 | 1998-06-02 | International Business Machines Corporation | Method for testing integrated circuit devices |
US5808919A (en) * | 1993-11-23 | 1998-09-15 | Hewlett-Packard Company | Diagnostic system |
US5502390A (en) * | 1994-03-15 | 1996-03-26 | International Business Machines Corporation | Adiabatic conductor analyzer method and system |
US5682337A (en) * | 1995-04-13 | 1997-10-28 | Synopsys, Inc. | High speed three-state sampling |
AU1310399A (en) | 1997-11-05 | 1999-05-24 | Robert A. Martin | Chip housing, methods of making same and methods for mounting chips therein |
US6175230B1 (en) | 1999-01-14 | 2001-01-16 | Genrad, Inc. | Circuit-board tester with backdrive-based burst timing |
US7078924B2 (en) * | 2002-09-20 | 2006-07-18 | Lsi Logic Corporation | Methodology to accurately test clock to signal valid and slew rates of PCI signals |
US8227929B2 (en) | 2009-09-25 | 2012-07-24 | General Electric Company | Multi-use energy storage for renewable sources |
KR101570645B1 (ko) * | 2012-08-03 | 2015-11-19 | 에이비비 테크놀로지 아게 | 피크 전력 동작에서의 오버로드 제한 |
JP6633949B2 (ja) * | 2016-03-14 | 2020-01-22 | ヤマハファインテック株式会社 | 基板検査装置及び基板検査方法 |
JP7089440B2 (ja) * | 2018-08-28 | 2022-06-22 | ルネサスエレクトロニクス株式会社 | 半導体装置及びその自己診断の制御方法 |
CN109765479B (zh) * | 2019-01-28 | 2021-10-01 | 合肥京东方视讯科技有限公司 | 一种电路板缺件检测装置和方法 |
US12066483B2 (en) * | 2022-11-11 | 2024-08-20 | Texas Instruments Incorporated | Method for testing an integrated circuit (IC) device at a testing temperature |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3870953A (en) * | 1972-08-01 | 1975-03-11 | Roger Boatman & Associates Inc | In circuit electronic component tester |
JPS56115964A (en) * | 1980-02-18 | 1981-09-11 | Hitachi Ltd | Tester |
JPS57113377A (en) * | 1981-01-07 | 1982-07-14 | Hitachi Ltd | Semiconductor testing device |
US4507576A (en) * | 1982-10-28 | 1985-03-26 | Tektronix, Inc. | Method and apparatus for synthesizing a drive signal for active IC testing including slew rate adjustment |
JPS59221679A (ja) * | 1983-05-31 | 1984-12-13 | Advantest Corp | 論理回路試験装置 |
-
1983
- 1983-06-13 US US06/503,465 patent/US4588945A/en not_active Expired - Lifetime
-
1984
- 1984-06-13 JP JP59122893A patent/JPS6013267A/ja active Pending
- 1984-06-13 EP EP84303974A patent/EP0128774B1/en not_active Expired - Lifetime
- 1984-06-13 DE DE8484303974T patent/DE3485280D1/de not_active Expired - Lifetime
-
1991
- 1991-05-21 JP JP3145649A patent/JP2723382B2/ja not_active Expired - Fee Related
-
1992
- 1992-03-19 SG SG340/92A patent/SG34092G/en unknown
- 1992-06-25 HK HK462/92A patent/HK46292A/xx not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
US4588945A (en) | 1986-05-13 |
DE3485280D1 (de) | 1992-01-02 |
EP0128774B1 (en) | 1991-11-21 |
SG34092G (en) | 1992-06-12 |
EP0128774A2 (en) | 1984-12-19 |
EP0128774A3 (en) | 1987-08-05 |
JPH05188110A (ja) | 1993-07-30 |
JP2723382B2 (ja) | 1998-03-09 |
JPS6013267A (ja) | 1985-01-23 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PE | Patent expired |
Effective date: 20040612 |
|
PE | Patent expired |