HK1247672A1 - Illumination device and exposure device - Google Patents
Illumination device and exposure deviceInfo
- Publication number
- HK1247672A1 HK1247672A1 HK18106992.5A HK18106992A HK1247672A1 HK 1247672 A1 HK1247672 A1 HK 1247672A1 HK 18106992 A HK18106992 A HK 18106992A HK 1247672 A1 HK1247672 A1 HK 1247672A1
- Authority
- HK
- Hong Kong
- Prior art keywords
- exposure
- illumination
- illumination device
- exposure device
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70358—Scanning exposure, i.e. relative movement of patterned beam and workpiece during imaging
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70208—Multiple illumination paths, e.g. radiation distribution devices, microlens illumination systems, multiplexers or demultiplexers for single or multiple projection systems
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
- G03F7/2002—Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image
- G03F7/2008—Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image characterised by the reflectors, diffusers, light or heat filtering means or anti-reflective means used
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70091—Illumination settings, i.e. intensity distribution in the pupil plane or angular distribution in the field plane; On-axis or off-axis settings, e.g. annular, dipole or quadrupole settings; Partial coherence control, i.e. sigma or numerical aperture [NA]
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Microscoopes, Condenser (AREA)
- Liquid Crystal (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201261652719P | 2012-05-29 | 2012-05-29 |
Publications (1)
Publication Number | Publication Date |
---|---|
HK1247672A1 true HK1247672A1 (en) | 2018-09-28 |
Family
ID=49673178
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HK18106992.5A HK1247672A1 (en) | 2012-05-29 | 2018-05-29 | Illumination device and exposure device |
Country Status (6)
Country | Link |
---|---|
JP (1) | JPWO2013179977A1 (en) |
KR (1) | KR20150027741A (en) |
CN (4) | CN107315323B (en) |
HK (1) | HK1247672A1 (en) |
TW (1) | TW201409184A (en) |
WO (1) | WO2013179977A1 (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPWO2017158943A1 (en) * | 2016-03-18 | 2019-01-24 | コニカミノルタ株式会社 | PATTERNING APPARATUS AND METHOD FOR MANUFACTURING ORGANIC ELECTROLUMINESCENCE ELEMENT |
CN109116685B (en) * | 2018-09-14 | 2020-11-20 | 重庆惠科金渝光电科技有限公司 | Exposure method and exposure device thereof |
CN109884860B (en) * | 2019-03-22 | 2020-12-04 | 上海微电子装备(集团)股份有限公司 | Multi-station flexible tape exposure device and exposure method |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4923779A (en) * | 1989-01-09 | 1990-05-08 | The Mead Corporation | Color-correcting exposure system for a photosensitive media |
JP3707060B2 (en) * | 1994-06-29 | 2005-10-19 | 株式会社ニコン | Illumination optics |
JPH08330212A (en) * | 1995-05-31 | 1996-12-13 | Nikon Corp | Exposure device |
JP3627355B2 (en) * | 1996-02-22 | 2005-03-09 | ソニー株式会社 | Scanning exposure equipment |
JP2002258489A (en) * | 2000-04-20 | 2002-09-11 | Nikon Corp | Device and method for aligner |
DE10130175A1 (en) * | 2001-06-22 | 2003-01-02 | Bacher Graphische Geraete Gmbh | Illuminating an exposure surface, especially for board manufacture, involves defining gray filter with variable profile over illumination area depending on intensity differences |
KR100471427B1 (en) * | 2001-12-31 | 2005-03-08 | 엘지전자 주식회사 | Exposer with multi lamp |
JP4497382B2 (en) * | 2004-03-02 | 2010-07-07 | 住友重機械工業株式会社 | Laser irradiation device |
JP2006085071A (en) * | 2004-09-17 | 2006-03-30 | Fuji Photo Film Co Ltd | Multi-beam exposure device |
US7638780B2 (en) * | 2005-06-28 | 2009-12-29 | Eastman Kodak Company | UV cure equipment with combined light path |
JP4989180B2 (en) * | 2006-10-13 | 2012-08-01 | キヤノン株式会社 | Illumination optical system and exposure apparatus |
JP5092914B2 (en) * | 2008-06-12 | 2012-12-05 | ウシオ電機株式会社 | Light irradiation device |
JP2011033907A (en) * | 2009-08-04 | 2011-02-17 | Nikon Corp | Illuminating device, exposure device, illuminating method, exposure method, and method for manufacturing device |
US20130027684A1 (en) * | 2010-04-13 | 2013-01-31 | Tohru Kiuchi | Exposure apparatus, substrate processing apparatus, and device manufacturing method |
JP5251994B2 (en) * | 2010-08-06 | 2013-07-31 | ウシオ電機株式会社 | Light irradiation apparatus and light irradiation method |
JP5687013B2 (en) * | 2010-09-14 | 2015-03-18 | 株式会社Screenホールディングス | Exposure apparatus and light source apparatus |
-
2013
- 2013-05-22 CN CN201710648005.9A patent/CN107315323B/en active Active
- 2013-05-22 CN CN201710983508.1A patent/CN107741685A/en active Pending
- 2013-05-22 KR KR20147033207A patent/KR20150027741A/en not_active Application Discontinuation
- 2013-05-22 WO PCT/JP2013/064228 patent/WO2013179977A1/en active Application Filing
- 2013-05-22 CN CN201610291349.4A patent/CN105892237B/en active Active
- 2013-05-22 CN CN201380037678.0A patent/CN104471486B/en active Active
- 2013-05-22 JP JP2014518406A patent/JPWO2013179977A1/en active Pending
- 2013-05-29 TW TW102118872A patent/TW201409184A/en unknown
-
2018
- 2018-05-29 HK HK18106992.5A patent/HK1247672A1/en unknown
Also Published As
Publication number | Publication date |
---|---|
CN105892237A (en) | 2016-08-24 |
CN104471486A (en) | 2015-03-25 |
CN107315323A (en) | 2017-11-03 |
KR20150027741A (en) | 2015-03-12 |
CN105892237B (en) | 2018-05-29 |
JPWO2013179977A1 (en) | 2016-01-21 |
TW201409184A (en) | 2014-03-01 |
CN104471486B (en) | 2017-11-24 |
CN107315323B (en) | 2019-08-13 |
CN107741685A (en) | 2018-02-27 |
WO2013179977A1 (en) | 2013-12-05 |
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