HK1053355A1 - Method and circuit for measuring a voltage or a temperature and for generating a voltage with any predeterminable temperature dependence - Google Patents

Method and circuit for measuring a voltage or a temperature and for generating a voltage with any predeterminable temperature dependence

Info

Publication number
HK1053355A1
HK1053355A1 HK03105548A HK03105548A HK1053355A1 HK 1053355 A1 HK1053355 A1 HK 1053355A1 HK 03105548 A HK03105548 A HK 03105548A HK 03105548 A HK03105548 A HK 03105548A HK 1053355 A1 HK1053355 A1 HK 1053355A1
Authority
HK
Hong Kong
Prior art keywords
voltage
transition
circuit
temperature
measuring
Prior art date
Application number
HK03105548A
Other languages
English (en)
Inventor
Torsten Klemm
Gunther Bergk
Original Assignee
Braun Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Braun Gmbh filed Critical Braun Gmbh
Publication of HK1053355A1 publication Critical patent/HK1053355A1/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0084—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring voltage only
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/01—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Secondary Cells (AREA)
  • Read Only Memory (AREA)
  • General Induction Heating (AREA)
HK03105548A 2000-06-21 2003-08-01 Method and circuit for measuring a voltage or a temperature and for generating a voltage with any predeterminable temperature dependence HK1053355A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10029446A DE10029446A1 (de) 2000-06-21 2000-06-21 Verfahren und Schaltungsanordnung zur Messung einer Spannung und/oder einer Temperatur
PCT/EP2001/006972 WO2001098790A1 (de) 2000-06-21 2001-06-20 Verfahren und schaltungsanordnung zur messung einer spannung oder einer temperatur sowie zum erzeugen einer spannung mit einer beliebig vorgebbaren temperaturabhängigkeit

Publications (1)

Publication Number Publication Date
HK1053355A1 true HK1053355A1 (en) 2003-10-17

Family

ID=7645796

Family Applications (1)

Application Number Title Priority Date Filing Date
HK03105548A HK1053355A1 (en) 2000-06-21 2003-08-01 Method and circuit for measuring a voltage or a temperature and for generating a voltage with any predeterminable temperature dependence

Country Status (10)

Country Link
US (1) US20040041573A1 (zh)
EP (1) EP1292835B1 (zh)
JP (1) JP2004501376A (zh)
KR (1) KR20030017531A (zh)
CN (1) CN1249441C (zh)
AT (1) ATE373242T1 (zh)
AU (1) AU2001272494A1 (zh)
DE (2) DE10029446A1 (zh)
HK (1) HK1053355A1 (zh)
WO (1) WO2001098790A1 (zh)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10351843B4 (de) * 2003-11-06 2013-11-21 Converteam Gmbh Verfahren und elektrische Schaltungen zur Ermittlung einer Temperatur eines Leistungshalbleiters
CN100445712C (zh) * 2005-10-24 2008-12-24 圆创科技股份有限公司 通过平移转换参考电平以进行校正的温度测量电路
DE102008055696A1 (de) 2008-01-25 2009-07-30 Continental Teves Ag & Co. Ohg Elektronische Schaltungseinrichtung zur Erfassung eines Detektionselementstroms und/oder einer Temperatur in diesem Detektionselement
EP2336741B1 (en) * 2009-12-18 2016-09-07 Nxp B.V. Self-calibration circuit and method for junction temperature estimation
JP5687134B2 (ja) * 2011-05-26 2015-03-18 三菱電機株式会社 エネルギー計測ユニット
JP5786571B2 (ja) * 2011-09-07 2015-09-30 富士電機株式会社 パワー半導体装置の温度測定装置
JP5744712B2 (ja) * 2011-12-15 2015-07-08 サムソン エレクトロ−メカニックス カンパニーリミテッド． 電力検波回路
US10132696B2 (en) 2014-07-11 2018-11-20 Infineon Technologies Ag Integrated temperature sensor for discrete semiconductor devices
DE102019217376A1 (de) * 2019-11-11 2021-05-12 Continental Automotive Gmbh Verfahren zur Prüfung eines Batteriesensors und Batteriesensor
TWI796190B (zh) * 2022-03-30 2023-03-11 力晶積成電子製造股份有限公司 用於調整記憶體裝置的參考電壓訊號的電壓控制電路

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DD80952A (zh) *
US3212001A (en) * 1961-08-30 1965-10-12 Western Electric Co Electrical circuit for testing the current-voltage relationship of electrical devices
US3812717A (en) * 1972-04-03 1974-05-28 Bell Telephone Labor Inc Semiconductor diode thermometry
DE2414340C3 (de) * 1974-03-25 1980-12-18 Evgenia Iosifovna Chimki Model Geb. Lifschits Verfahren und Einrichtung zur Gütepriifung für Halbleiterbauelemente und integrierte Schaltungen mit mindestens einem isoliert zugänglichen PN-Übergang
US4228684A (en) * 1979-06-04 1980-10-21 General Motors Corporation Remote temperature measuring system with semiconductor junction sensor
US4636092A (en) * 1984-06-19 1987-01-13 Hegyi Dennis J Diode thermometer
JPH05283749A (ja) * 1992-03-31 1993-10-29 Clarion Co Ltd 温度検出装置
DE4434266B4 (de) * 1994-09-24 2005-05-25 Byk Gardner Gmbh Verfahren zur Berücksichtigung der Temperaturabhängigkeit von optoelektronischen Dioden
US6008685A (en) * 1998-03-25 1999-12-28 Mosaic Design Labs, Inc. Solid state temperature measurement

Also Published As

Publication number Publication date
EP1292835B1 (de) 2007-09-12
EP1292835A1 (de) 2003-03-19
ATE373242T1 (de) 2007-09-15
CN1249441C (zh) 2006-04-05
KR20030017531A (ko) 2003-03-03
JP2004501376A (ja) 2004-01-15
US20040041573A1 (en) 2004-03-04
DE50113009D1 (de) 2007-10-25
CN1426537A (zh) 2003-06-25
AU2001272494A1 (en) 2002-01-02
WO2001098790A1 (de) 2001-12-27
DE10029446A1 (de) 2002-01-03

Similar Documents

Publication Publication Date Title
EP2480947B1 (en) Compensated bandgap
HK1053355A1 (en) Method and circuit for measuring a voltage or a temperature and for generating a voltage with any predeterminable temperature dependence
US7481574B2 (en) Thermal flow rate sensor supplying digital output
CN107314830B (zh) 用于修正温度测量信号的设备
US20070103174A1 (en) Direct current test apparatus
US10527655B2 (en) Overload monitoring device and method for overload monitoring
JP2010252252A (ja) 増幅回路、入力バイアス調整方法、及び電源電圧調整方法
TW200501625A (en) Improved bandwidth estimation
WO2019082564A1 (ja) アーク検出回路、ブレーカシステム、接続箱システム、パワーコンディショナ、マイクロインバータ、ｄｃオプティマイザ及びアーク検出方法
JP4388097B2 (ja) 周波数特性測定回路
CN108196217A (zh) 一种用于非车载充电机现校仪的直流计量方法及***
US7123104B2 (en) System and method for measuring current
JPH08313466A (ja) 熱電対劣化検知装置
KR101955245B1 (ko) 리액턴스형 누설전류에 의한 오동작을 개선할 수 있는 누설전류 검출용 집적회로 및 이 집적회로를 갖는 누전차단기
JP4146442B2 (ja) 負荷装置
JP6520678B2 (ja) 制御装置及び制御方法
CN107918434B (zh) 功率放大电路的偏置电流产生电路
CN105204325A (zh) 定时方法和电路
CN203178843U (zh) 温度补偿***
JP2011130562A (ja) ローサイド電流検出回路
JPH06324089A (ja) 出力信号生成装置
JP3196859B2 (ja) ダイオードのオン抵抗測定回路
CN105158430A (zh) 一种基于三端稳压管稳压设计的水质检测电路
Ota et al. The temperature dependence of the forward characteristics of 1n4007 silicon diode
JP2014240796A (ja) ハンダ劣化判断方法およびハンダ劣化判断装置

Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20110620