HK1038985B - 測試電路的方法和裝置 - Google Patents

測試電路的方法和裝置

Info

Publication number
HK1038985B
HK1038985B HK02100695.6A HK02100695A HK1038985B HK 1038985 B HK1038985 B HK 1038985B HK 02100695 A HK02100695 A HK 02100695A HK 1038985 B HK1038985 B HK 1038985B
Authority
HK
Hong Kong
Prior art keywords
testing
circuit
Prior art date
Application number
HK02100695.6A
Other languages
English (en)
Other versions
HK1038985A1 (en
Inventor
丘昂‧V‧法姆
保羅‧J‧胡普爾
馬克‧A‧米勒
羅斯‧A‧阿拉斯帕
卡賽‧馬沙爾
Original Assignee
自由度半導體公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 自由度半導體公司 filed Critical 自由度半導體公司
Publication of HK1038985A1 publication Critical patent/HK1038985A1/xx
Publication of HK1038985B publication Critical patent/HK1038985B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31707—Test strategies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
HK02100695.6A 2000-01-26 2002-01-29 測試電路的方法和裝置 HK1038985B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/491,433 US6532559B1 (en) 2000-01-26 2000-01-26 Method and apparatus for testing a circuit

Publications (2)

Publication Number Publication Date
HK1038985A1 HK1038985A1 (en) 2002-04-04
HK1038985B true HK1038985B (zh) 2005-05-27

Family

ID=23952198

Family Applications (1)

Application Number Title Priority Date Filing Date
HK02100695.6A HK1038985B (zh) 2000-01-26 2002-01-29 測試電路的方法和裝置

Country Status (6)

Country Link
US (1) US6532559B1 (zh)
CN (1) CN1167117C (zh)
HK (1) HK1038985B (zh)
MY (1) MY129101A (zh)
SG (1) SG101949A1 (zh)
TW (1) TWI265584B (zh)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10028912A1 (de) * 2000-06-10 2001-12-20 Bosch Gmbh Robert Herstellungsverfahren für ein elektronisches Gerät
JP4134567B2 (ja) * 2002-02-05 2008-08-20 沖電気工業株式会社 半導体装置のテスト方法及びテストシステム
CN101159498B (zh) * 2007-11-07 2010-12-29 中兴通讯股份有限公司 一种射频硬件模块的测试方法
CN102901902A (zh) * 2011-07-28 2013-01-30 飞思卡尔半导体公司 半导体器件的并联电源连接的测试方法
TWI453436B (zh) * 2012-05-04 2014-09-21 Raydium Semiconductor Corp 積體電路可靠度測試方法
CN102740332B (zh) * 2012-05-31 2016-01-06 青岛海信移动通信技术股份有限公司 移动终端测试方法及测试装置
US9482718B2 (en) * 2014-01-13 2016-11-01 Texas Instruments Incorporated Integrated circuit
CN104317704A (zh) * 2014-09-30 2015-01-28 中国电子科技集团公司第四十一研究所 一种生产线自动测试***的测量软件集成方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5206582A (en) * 1988-05-18 1993-04-27 Hewlett-Packard Company Control system for automated parametric test equipment
US5717607A (en) * 1995-10-16 1998-02-10 Ford Motor Company Computer program, system and method to reduce sample size in accelerated reliability verification tests
JP2962239B2 (ja) * 1996-09-27 1999-10-12 日本電気株式会社 半導体集積回路検査装置およびその検査方法
US5694402A (en) * 1996-10-22 1997-12-02 Texas Instruments Incorporated System and method for structurally testing integrated circuit devices
KR100299716B1 (ko) * 1997-07-24 2001-09-06 가야시마 고조 Ic시험장치및방법
US6145106A (en) * 1997-12-31 2000-11-07 Nec Usa Inc. State relaxation based subsequence removal method for fast static compaction in sequential circuits
US6167545A (en) * 1998-03-19 2000-12-26 Xilinx, Inc. Self-adaptive test program

Also Published As

Publication number Publication date
CN1167117C (zh) 2004-09-15
CN1309422A (zh) 2001-08-22
MY129101A (en) 2007-03-30
US6532559B1 (en) 2003-03-11
TWI265584B (en) 2006-11-01
SG101949A1 (en) 2004-02-27
HK1038985A1 (en) 2002-04-04

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Legal Events

Date Code Title Description
AS Change of ownership

Owner name: FREESCALE SEMICONDUCTOR, INC.

Free format text: FORMER OWNER(S): MOTOROLA, INC

PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20100123