GB0304664D0 - System and method for testing integrated circuit devices - Google Patents

System and method for testing integrated circuit devices

Info

Publication number
GB0304664D0
GB0304664D0 GBGB0304664.6A GB0304664A GB0304664D0 GB 0304664 D0 GB0304664 D0 GB 0304664D0 GB 0304664 A GB0304664 A GB 0304664A GB 0304664 D0 GB0304664 D0 GB 0304664D0
Authority
GB
United Kingdom
Prior art keywords
integrated circuit
circuit devices
testing integrated
testing
devices
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GBGB0304664.6A
Other versions
GB2382663A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CONCORD IDEA CORP
Original Assignee
CONCORD IDEA CORP
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CONCORD IDEA CORP filed Critical CONCORD IDEA CORP
Publication of GB0304664D0 publication Critical patent/GB0304664D0/en
Publication of GB2382663A publication Critical patent/GB2382663A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/48—Arrangements in static stores specially adapted for testing by means external to the store, e.g. using direct memory access [DMA] or using auxiliary access paths
GB0304664A 2000-10-03 2001-09-26 System and method for testing integrated circuit devices Withdrawn GB2382663A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US67839700A 2000-10-03 2000-10-03
PCT/CA2001/001365 WO2002029824A2 (en) 2000-10-03 2001-09-26 System and method for testing integrated circuit devices

Publications (2)

Publication Number Publication Date
GB0304664D0 true GB0304664D0 (en) 2003-04-02
GB2382663A GB2382663A (en) 2003-06-04

Family

ID=24722608

Family Applications (1)

Application Number Title Priority Date Filing Date
GB0304664A Withdrawn GB2382663A (en) 2000-10-03 2001-09-26 System and method for testing integrated circuit devices

Country Status (6)

Country Link
JP (1) JP2004510171A (en)
AU (1) AU2001293574A1 (en)
CA (1) CA2419939A1 (en)
GB (1) GB2382663A (en)
TW (1) TW580578B (en)
WO (1) WO2002029824A2 (en)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW548414B (en) 2002-01-29 2003-08-21 Via Tech Inc Automatic integrated circuit overall machine testing system, apparatus and its method
US7415270B2 (en) 2002-02-15 2008-08-19 Telefonaktiebolaget L M Ericsson (Publ) Middleware services layer for platform system for mobile terminals
US7363033B2 (en) 2002-02-15 2008-04-22 Telefonaktiebolaget Lm Ericsson (Publ) Method of and system for testing equipment during manufacturing
US8079015B2 (en) 2002-02-15 2011-12-13 Telefonaktiebolaget L M Ericsson (Publ) Layered architecture for mobile terminals
US7536181B2 (en) 2002-02-15 2009-05-19 Telefonaktiebolaget L M Ericsson (Publ) Platform system for mobile terminals
TW567329B (en) * 2002-07-30 2003-12-21 Via Tech Inc Auto system-level test apparatus and method
US7149510B2 (en) 2002-09-23 2006-12-12 Telefonaktiebolaget Lm Ericsson (Publ) Security access manager in middleware
US7350211B2 (en) 2002-09-23 2008-03-25 Telefonaktiebolaget Lm Ericsson (Publ) Middleware application environment
US7478395B2 (en) 2002-09-23 2009-01-13 Telefonaktiebolaget L M Ericsson (Publ) Middleware application message/event model
US7251761B2 (en) * 2003-02-13 2007-07-31 Matsushita Electric Industrial Co., Ltd. Assembly for LSI test and method for the test
DE102004021267B4 (en) 2004-04-30 2008-04-17 Infineon Technologies Ag Method for testing a memory module and test arrangement
US20070058456A1 (en) * 2005-09-09 2007-03-15 Rico Srowik Integrated circuit arrangement
US7539912B2 (en) 2005-12-15 2009-05-26 King Tiger Technology, Inc. Method and apparatus for testing a fully buffered memory module
TWI395960B (en) * 2006-11-27 2013-05-11 Hon Hai Prec Ind Co Ltd Device and method for testing data transfer rate
US7848899B2 (en) 2008-06-09 2010-12-07 Kingtiger Technology (Canada) Inc. Systems and methods for testing integrated circuit devices
JP5487770B2 (en) * 2009-07-21 2014-05-07 ソニー株式会社 Solid-state imaging device
US8356215B2 (en) 2010-01-19 2013-01-15 Kingtiger Technology (Canada) Inc. Testing apparatus and method for analyzing a memory module operating within an application system
US8918686B2 (en) 2010-08-18 2014-12-23 Kingtiger Technology (Canada) Inc. Determining data valid windows in a system and method for testing an integrated circuit device
US9003256B2 (en) 2011-09-06 2015-04-07 Kingtiger Technology (Canada) Inc. System and method for testing integrated circuits by determining the solid timing window
US8724408B2 (en) 2011-11-29 2014-05-13 Kingtiger Technology (Canada) Inc. Systems and methods for testing and assembling memory modules
US9117552B2 (en) 2012-08-28 2015-08-25 Kingtiger Technology(Canada), Inc. Systems and methods for testing memory
CN112363875B (en) * 2020-10-21 2023-04-07 海光信息技术股份有限公司 System defect detection method, device, electronic device and storage medium

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4001818A (en) * 1975-10-22 1977-01-04 Storage Technology Corporation Digital circuit failure detector
CA1163721A (en) * 1980-08-18 1984-03-13 Milan Slamka Apparatus for the dynamic in-circuit testing of electronic digital circuit elements
US6055653A (en) * 1998-04-27 2000-04-25 Compaq Computer Corporation Method and apparatus for testing gang memory modules

Also Published As

Publication number Publication date
WO2002029824A2 (en) 2002-04-11
GB2382663A (en) 2003-06-04
CA2419939A1 (en) 2002-04-11
TW580578B (en) 2004-03-21
WO2002029824A3 (en) 2003-05-01
AU2001293574A1 (en) 2002-04-15
JP2004510171A (en) 2004-04-02

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Legal Events

Date Code Title Description
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)